{"id":"https://openalex.org/W4376622366","doi":"https://doi.org/10.1039/d3tc01200j","title":"Superior high temperature performance of 8 kV NiO/Ga 2 O 3 vertical heterojunction rectifiers","display_name":"Superior high temperature performance of 8 kV NiO/Ga 2 O 3 vertical heterojunction rectifiers","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4376622366","doi":"https://doi.org/10.1039/d3tc01200j"},"language":"en","primary_location":{"id":"doi:10.1039/d3tc01200j","doi":"https://doi.org/10.1039/d3tc01200j","is_oa":false,"landing_page_url":"https://doi.org/10.1039/d3tc01200j","pdf_url":null,"source":{"id":"https://openalex.org/S2500738039","display_name":"Journal of Materials Chemistry C","issn_l":"2050-7526","issn":["2050-7526","2050-7534"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","ki-jl-1","norway-1","poland-140","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320556","host_organization_name":"Royal Society of Chemistry","host_organization_lineage":["https://openalex.org/P4310320556"],"host_organization_lineage_names":["Royal Society of Chemistry"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Materials Chemistry C","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5031835528","display_name":"Jian-Sian Li","orcid":"https://orcid.org/0000-0002-2817-7612","observed_orcids":["https://orcid.org/0000-0002-2817-7612"]},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jian-Sian Li","raw_affiliation_strings":["Department of Chemical Engineering, University of Florida, Gainesville, FL 32606, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Chemical Engineering, University of Florida, Gainesville, FL 32606, USA","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047622902","display_name":"Chao-Ching Chiang","orcid":"https://orcid.org/0000-0002-0447-8170","observed_orcids":["https://orcid.org/0000-0002-0447-8170"]},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chao-Ching Chiang","raw_affiliation_strings":["Department of Chemical Engineering, University of Florida, Gainesville, FL 32606, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Chemical Engineering, University of Florida, Gainesville, FL 32606, USA","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066656964","display_name":"Xinyi Xia","orcid":"https://orcid.org/0000-0002-8644-8599","observed_orcids":["https://orcid.org/0000-0002-8644-8599"]},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xinyi Xia","raw_affiliation_strings":["Department of Chemical Engineering, University of Florida, Gainesville, FL 32606, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Chemical Engineering, University of Florida, Gainesville, FL 32606, USA","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079992554","display_name":"Hsiao-Hsuan Wan","orcid":"https://orcid.org/0000-0002-6986-8217","observed_orcids":["https://orcid.org/0000-0002-6986-8217"]},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Hsiao-Hsuan Wan","raw_affiliation_strings":["Department of Chemical Engineering, University of Florida, Gainesville, FL 32606, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Chemical Engineering, University of Florida, Gainesville, FL 32606, USA","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100641969","display_name":"Fan Ren","orcid":"https://orcid.org/0000-0001-9234-019X","observed_orcids":["https://orcid.org/0000-0001-9234-019X"]},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Fan Ren","raw_affiliation_strings":["Department of Chemical Engineering, University of Florida, Gainesville, FL 32606, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Chemical Engineering, University of Florida, Gainesville, FL 32606, USA","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5085381025","display_name":"S. J. Pearton","orcid":"https://orcid.org/0000-0001-6498-1256","observed_orcids":["https://orcid.org/0000-0001-6498-1256"]},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"S. J. Pearton","raw_affiliation_strings":["Department of Chemical Engineering, University of Florida, Gainesville, FL 32606, USA","Department of Materials Science and Engineering, University of Florida, Gainesville, FL 32606, USA"],"raw_orcid":"https://orcid.org/0000-0001-6498-1256","affiliations":[{"raw_affiliation_string":"Department of Chemical Engineering, University of Florida, Gainesville, FL 32606, USA","institution_ids":["https://openalex.org/I33213144"]},{"raw_affiliation_string":"Department of Materials Science and Engineering, University of Florida, Gainesville, FL 32606, USA","institution_ids":["https://openalex.org/I33213144"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5085381025"],"corresponding_institution_ids":["https://openalex.org/I33213144"],"apc_list":null,"apc_paid":null,"fwci":2.4098,"has_fulltext":false,"cited_by_count":40,"citation_normalized_percentile":{"value":0.90144538,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":98,"max":99},"biblio":{"volume":"11","issue":"23","first_page":"7750","last_page":"7757"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12529","display_name":"Ga2O3 and related materials","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12529","display_name":"Ga2O3 and related materials","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.0003000000142492354,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/high-breakdown-voltage","display_name":"high breakdown voltage","score":0.8289999961853027},{"id":"https://openalex.org/keywords/high-temperature-performance","display_name":"high-temperature performance","score":0.7099999785423279},{"id":"https://openalex.org/keywords/schottky-rectifiers","display_name":"Schottky rectifiers","score":0.8859999775886536},{"id":"https://openalex.org/keywords/ga2o3","display_name":"gallium oxide","score":0.6399999856948853},{"id":"https://openalex.org/keywords/nickel-oxide","display_name":"nickel oxide","score":0.9179999828338623}],"concepts":[{"id":"https://openalex.org/C74575197","wikidata":"https://www.wikidata.org/wiki/Q9941","display_name":"Non-blocking I/O","level":3,"score":0.8965725898742676},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8494073748588562},{"id":"https://openalex.org/C79794668","wikidata":"https://www.wikidata.org/wiki/Q1616270","display_name":"Heterojunction","level":2,"score":0.79097580909729},{"id":"https://openalex.org/C39353612","wikidata":"https://www.wikidata.org/wiki/Q5283759","display_name":"Atmospheric temperature range","level":2,"score":0.6450017690658569},{"id":"https://openalex.org/C205200001","wikidata":"https://www.wikidata.org/wiki/Q176066","display_name":"Schottky diode","level":3,"score":0.6357245445251465},{"id":"https://openalex.org/C50100734","wikidata":"https://www.wikidata.org/wiki/Q7303176","display_name":"Rectifier (neural networks)","level":5,"score":0.5836708545684814},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.48944297432899475},{"id":"https://openalex.org/C16115445","wikidata":"https://www.wikidata.org/wiki/Q2391942","display_name":"Schottky barrier","level":3,"score":0.4574962258338928},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.43986624479293823},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.42769619822502136},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1574416160583496},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.12659922242164612},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.06743517518043518},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.053522706031799316},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.05336597561836243},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.046003103256225586},{"id":"https://openalex.org/C161790260","wikidata":"https://www.wikidata.org/wiki/Q82264","display_name":"Catalysis","level":2,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.0},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.0},{"id":"https://openalex.org/C86582703","wikidata":"https://www.wikidata.org/wiki/Q7617824","display_name":"Stochastic neural network","level":4,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C147168706","wikidata":"https://www.wikidata.org/wiki/Q1457734","display_name":"Recurrent neural network","level":3,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1039/d3tc01200j","doi":"https://doi.org/10.1039/d3tc01200j","is_oa":false,"landing_page_url":"https://doi.org/10.1039/d3tc01200j","pdf_url":null,"source":{"id":"https://openalex.org/S2500738039","display_name":"Journal of Materials Chemistry C","issn_l":"2050-7526","issn":["2050-7526","2050-7534"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","ki-jl-1","norway-1","poland-140","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320556","host_organization_name":"Royal Society of Chemistry","host_organization_lineage":["https://openalex.org/P4310320556"],"host_organization_lineage_names":["Royal Society of Chemistry"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Materials Chemistry C","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8485000133514404,"display_name":"Affordable and clean energy"}],"study_designs":[],"awards":[{"id":"https://openalex.org/G772299097","display_name":null,"funder_award_id":"HDTRA12-02-0002","funder_id":"https://openalex.org/F4320332186","funder_display_name":"Defense Threat Reduction Agency"},{"id":"https://openalex.org/G7998113783","display_name":"Impact Ionization Coefficients in Ga2O3","funder_award_id":"1856662","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"}],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"},{"id":"https://openalex.org/F4320332186","display_name":"Defense Threat Reduction Agency","ror":"https://ror.org/04tz64554"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":55,"referenced_works":["https://openalex.org/W2325261197","https://openalex.org/W2509570769","https://openalex.org/W2573946860","https://openalex.org/W2897928637","https://openalex.org/W2898201003","https://openalex.org/W2905220617","https://openalex.org/W2923118824","https://openalex.org/W2997369506","https://openalex.org/W3000408756","https://openalex.org/W3004182793","https://openalex.org/W3023030850","https://openalex.org/W3034482888","https://openalex.org/W3036516792","https://openalex.org/W3036625581","https://openalex.org/W3042404654","https://openalex.org/W3042514039","https://openalex.org/W3043082662","https://openalex.org/W3088654479","https://openalex.org/W3096398835","https://openalex.org/W3100478266","https://openalex.org/W3120940837","https://openalex.org/W3122996276","https://openalex.org/W3126641858","https://openalex.org/W3127722150","https://openalex.org/W3135295779","https://openalex.org/W3138188852","https://openalex.org/W3159521356","https://openalex.org/W3162246675","https://openalex.org/W3163500622","https://openalex.org/W3164414943","https://openalex.org/W3169265453","https://openalex.org/W3198076162","https://openalex.org/W3210047568","https://openalex.org/W4200100632","https://openalex.org/W4200248978","https://openalex.org/W4205816089","https://openalex.org/W4210718110","https://openalex.org/W4210901099","https://openalex.org/W4214842737","https://openalex.org/W4214850911","https://openalex.org/W4220849677","https://openalex.org/W4225484429","https://openalex.org/W4284881561","https://openalex.org/W4285011169","https://openalex.org/W4287959398","https://openalex.org/W4293812080","https://openalex.org/W4296916595","https://openalex.org/W4308219690","https://openalex.org/W4312909914","https://openalex.org/W4313648531","https://openalex.org/W4317037160","https://openalex.org/W4323030745","https://openalex.org/W4327852198","https://openalex.org/W4367176179","https://openalex.org/W4380883083"],"related_works":["https://openalex.org/W4378588751","https://openalex.org/W4401695743","https://openalex.org/W4397012162","https://openalex.org/W4410248181","https://openalex.org/W4384025049","https://openalex.org/W4385192303","https://openalex.org/W4287959398","https://openalex.org/W4388945092","https://openalex.org/W4401695772","https://openalex.org/W4386854157"],"abstract_inverted_index":{"NiO/Ga":[0],"2":[1],"O":[2],"3":[3],"heterojunction":[4],"rectifiers":[5],"were":[6],"measured":[7],"over":[8],"a":[9,20],"temperature":[10],"range":[11],"up":[12],"to":[13,18],"600":[14],"K":[15],"and":[16],"found":[17],"exhibit":[19],"near-temperature":[21],"independent":[22],"breakdown":[23],"voltage":[24],"of":[25,31],">7":[26],"kV,":[27],"far":[28],"in":[29],"excess":[30],"previous":[32],"Schottky":[33],"rectifier":[34],"results.":[35]},"counts_by_year":[{"year":2026,"cited_by_count":7},{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":15},{"year":2023,"cited_by_count":11}],"updated_date":"2026-11-05T12:25:35.769452","created_date":"2023-05-17T00:00:00"}