{"id":"https://openalex.org/W4318428362","doi":"https://doi.org/10.2139/ssrn.4341730","title":"Phase Unwrapping Applied to Comparative Measurement in Speckle Interferometry Using a Single Reference Beam Technique with Linbo3 Crystal as a Recording Mediumphase Unwrapping Applied to Comparative Measurement in Speckle Interferometry Using a Single Reference Beam Technique with Linbo3 Crystal as a Recording Medium","display_name":"Phase Unwrapping Applied to Comparative Measurement in Speckle Interferometry Using a Single Reference Beam Technique with Linbo3 Crystal as a Recording Mediumphase Unwrapping Applied to Comparative Measurement in Speckle Interferometry Using a Single Reference Beam Technique with Linbo3 Crystal as a Recording Medium","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4318428362","doi":"https://doi.org/10.2139/ssrn.4341730"},"language":"en","primary_location":{"id":"doi:10.2139/ssrn.4341730","doi":"https://doi.org/10.2139/ssrn.4341730","is_oa":true,"landing_page_url":"https://doi.org/10.2139/ssrn.4341730","pdf_url":null,"source":{"id":"https://openalex.org/S4210172589","display_name":"SSRN Electronic Journal","issn_l":"1556-5068","issn":["1556-5068"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I1318003438","host_organization_name":"RELX Group (Netherlands)","host_organization_lineage":["https://openalex.org/I1318003438"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":null,"raw_type":"posted-content"},"volume":null,"type":"preprint","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://doi.org/10.2139/ssrn.4341730","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5076729331","display_name":"Nasser A. Moustafa","orcid":"https://orcid.org/0000-0001-5699-6490","observed_orcids":["https://orcid.org/0000-0001-5699-6490"]},"institutions":[{"id":"https://openalex.org/I139787848","display_name":"Capital University","ror":"https://ror.org/00jy9e726","country_code":"US","type":"education","lineage":["https://openalex.org/I139787848"]},{"id":"https://openalex.org/I84058292","display_name":"Helwan University","ror":"https://ror.org/00h55v928","country_code":"EG","type":"education","lineage":["https://openalex.org/I84058292"]}],"countries":["EG","US"],"is_corresponding":true,"raw_author_name":"Nasser  Aly Moustafa","raw_affiliation_strings":["Capital University","Capital University, ayn helwan, cairo, Cairo, AL 12566, Egypt","Helwan University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Capital University","institution_ids":["https://openalex.org/I139787848"]},{"raw_affiliation_string":"Capital University, ayn helwan, cairo, Cairo, AL 12566, Egypt","institution_ids":[]},{"raw_affiliation_string":"Helwan University","institution_ids":["https://openalex.org/I84058292"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5076729331"],"corresponding_institution_ids":["https://openalex.org/I139787848","https://openalex.org/I84058292"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11897","display_name":"Digital Holography and Microscopy","score":0.0007999999797903001,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11050","display_name":"Photorefractive and Nonlinear Optics","score":0.0006000000284984708,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/phase-unwrapping","display_name":"phase unwrapping","score":0.9660000205039978},{"id":"https://openalex.org/keywords/speckle-interferometry","display_name":"speckle interferometry","score":0.8220000267028809},{"id":"https://openalex.org/keywords/comparative-measurement","display_name":"comparative measurement","score":0.800000011920929},{"id":"https://openalex.org/keywords/displacement-measurement","display_name":"displacement measurement","score":0.7829999923706055}],"concepts":[{"id":"https://openalex.org/C166689943","wikidata":"https://www.wikidata.org/wiki/Q850283","display_name":"Interferometry","level":2,"score":0.8662610650062561},{"id":"https://openalex.org/C102290492","wikidata":"https://www.wikidata.org/wiki/Q7575045","display_name":"Speckle pattern","level":2,"score":0.8567945957183838},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.7004329562187195},{"id":"https://openalex.org/C99507719","wikidata":"https://www.wikidata.org/wiki/Q1504755","display_name":"Speckle imaging","level":3,"score":0.6777327656745911},{"id":"https://openalex.org/C172991262","wikidata":"https://www.wikidata.org/wiki/Q5358427","display_name":"Electronic speckle pattern interferometry","level":3,"score":0.6114991307258606},{"id":"https://openalex.org/C3020654733","wikidata":"https://www.wikidata.org/wiki/Q6038852","display_name":"Phase unwrapping","level":3,"score":0.600096583366394},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.39326804876327515},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.37439972162246704},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.3367825150489807}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.2139/ssrn.4341730","doi":"https://doi.org/10.2139/ssrn.4341730","is_oa":true,"landing_page_url":"https://doi.org/10.2139/ssrn.4341730","pdf_url":null,"source":{"id":"https://openalex.org/S4210172589","display_name":"SSRN Electronic Journal","issn_l":"1556-5068","issn":["1556-5068"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I1318003438","host_organization_name":"RELX Group (Netherlands)","host_organization_lineage":["https://openalex.org/I1318003438"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":null,"raw_type":"posted-content"}],"best_oa_location":{"id":"doi:10.2139/ssrn.4341730","doi":"https://doi.org/10.2139/ssrn.4341730","is_oa":true,"landing_page_url":"https://doi.org/10.2139/ssrn.4341730","pdf_url":null,"source":{"id":"https://openalex.org/S4210172589","display_name":"SSRN Electronic Journal","issn_l":"1556-5068","issn":["1556-5068"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I1318003438","host_organization_name":"RELX Group (Netherlands)","host_organization_lineage":["https://openalex.org/I1318003438"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":null,"raw_type":"posted-content"},"sustainable_development_goals":[],"sustainable_development_goals_aurora":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2127635065","https://openalex.org/W2093785611","https://openalex.org/W4308576158","https://openalex.org/W1977022979","https://openalex.org/W2055824452","https://openalex.org/W1977048961","https://openalex.org/W2149054638","https://openalex.org/W3001550249","https://openalex.org/W2026627027","https://openalex.org/W1993608561"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-09-26T08:19:03.415552","created_date":"2025-10-10T00:00:00"}