{"id":"https://openalex.org/W4315630516","doi":"https://doi.org/10.1109/tla.2023.10015216","title":"Solar Cell Busbars Surface Defect Detection Based on Deep Convolutional Neural Network","display_name":"Solar Cell Busbars Surface Defect Detection Based on Deep Convolutional Neural Network","publication_year":2023,"publication_date":"2023-01-11","ids":{"openalex":"https://openalex.org/W4315630516","doi":"https://doi.org/10.1109/tla.2023.10015216"},"language":"en","primary_location":{"id":"doi:10.1109/tla.2023.10015216","doi":"https://doi.org/10.1109/tla.2023.10015216","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tla.2023.10015216","pdf_url":null,"source":{"id":"https://openalex.org/S86124554","display_name":"IEEE Latin America Transactions","issn_l":"1548-0992","issn":["1548-0992"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-20","russia-white-list-3"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Latin America Transactions","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5112890145","display_name":"Yavuz Selim Balc o lu","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I109297418","display_name":"Gebze Technical University","ror":"https://ror.org/01sdnnq10","country_code":"TR","type":"education","lineage":["https://openalex.org/I109297418"]}],"countries":["TR"],"is_corresponding":false,"raw_author_name":"Yavuz Selim Balc?o?lu","raw_affiliation_strings":["Gebze Technical University","Gebze Technical University, TR"],"raw_orcid":"https://orcid.org/0000-0001-7138-2972","affiliations":[{"raw_affiliation_string":"Gebze Technical University","institution_ids":["https://openalex.org/I109297418"]},{"raw_affiliation_string":"Gebze Technical University, TR","institution_ids":["https://openalex.org/I109297418"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061819977","display_name":"B\u00fclent Sezen","orcid":"https://orcid.org/0000-0001-7485-3194","observed_orcids":["https://orcid.org/0000-0001-7485-3194"]},"institutions":[{"id":"https://openalex.org/I109297418","display_name":"Gebze Technical University","ror":"https://ror.org/01sdnnq10","country_code":"TR","type":"education","lineage":["https://openalex.org/I109297418"]}],"countries":["TR"],"is_corresponding":false,"raw_author_name":"Bulent Sezen","raw_affiliation_strings":["Gebze Technical University","Gebze Technical University, TR"],"raw_orcid":"https://orcid.org/0000-0001-7485-3194","affiliations":[{"raw_affiliation_string":"Gebze Technical University","institution_ids":["https://openalex.org/I109297418"]},{"raw_affiliation_string":"Gebze Technical University, TR","institution_ids":["https://openalex.org/I109297418"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5037294939","display_name":"Ceren \u00c7ubuk\u00e7u \u00c7erasi","orcid":"https://orcid.org/0000-0002-9253-2826","observed_orcids":["https://orcid.org/0000-0002-9253-2826"]},"institutions":[{"id":"https://openalex.org/I109297418","display_name":"Gebze Technical University","ror":"https://ror.org/01sdnnq10","country_code":"TR","type":"education","lineage":["https://openalex.org/I109297418"]}],"countries":["TR"],"is_corresponding":false,"raw_author_name":"Ceren Cubukcu Cerasi","raw_affiliation_strings":["Gebze Technical University","Gebze Technical University, TR"],"raw_orcid":"https://orcid.org/0000-0002-9253-2826","affiliations":[{"raw_affiliation_string":"Gebze Technical University","institution_ids":["https://openalex.org/I109297418"]},{"raw_affiliation_string":"Gebze Technical University, TR","institution_ids":["https://openalex.org/I109297418"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I109297418"],"apc_list":null,"apc_paid":null,"fwci":1.513,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.80135011,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":93,"max":98},"biblio":{"volume":"21","issue":"2","first_page":"242","last_page":"250"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.0,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/surface-defect-detection","display_name":"surface defect detection","score":0.9789999723434448},{"id":"https://openalex.org/keywords/visual-inspection","display_name":"visual inspection","score":0.699999988079071},{"id":"https://openalex.org/keywords/deep-convolutional-neural-networks","display_name":"deep convolutional neural networks","score":0.9070000052452087},{"id":"https://openalex.org/keywords/cnn-architecture-optimization","display_name":"CNN architecture optimization","score":0.6610000133514404},{"id":"https://openalex.org/keywords/solar-cell-fabrication","display_name":"solar cell fabrication","score":0.7599999904632568},{"id":"https://openalex.org/keywords/automatic-defect-detection","display_name":"automated defect detection","score":0.5709999799728394}],"concepts":[{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.8592407703399658},{"id":"https://openalex.org/C2780824857","wikidata":"https://www.wikidata.org/wiki/Q58803","display_name":"Solar cell","level":2,"score":0.7344226241111755},{"id":"https://openalex.org/C192690417","wikidata":"https://www.wikidata.org/wiki/Q1030817","display_name":"Busbar","level":2,"score":0.7113997936248779},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6132786273956299},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5439798831939697},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.5326093435287476},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5250083208084106},{"id":"https://openalex.org/C2781195486","wikidata":"https://www.wikidata.org/wiki/Q289436","display_name":"Texture (cosmology)","level":3,"score":0.5104755163192749},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4397071897983551},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.43744584918022156},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3793209195137024},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2453051209449768},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.21386629343032837},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.19848531484603882},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.11704272031784058},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tla.2023.10015216","doi":"https://doi.org/10.1109/tla.2023.10015216","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tla.2023.10015216","pdf_url":null,"source":{"id":"https://openalex.org/S86124554","display_name":"IEEE Latin America Transactions","issn_l":"1548-0992","issn":["1548-0992"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-20","russia-white-list-3"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Latin America Transactions","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.75}],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2904870462","https://openalex.org/W4309154448","https://openalex.org/W2379539369","https://openalex.org/W3020260850","https://openalex.org/W4401071416","https://openalex.org/W4225304650","https://openalex.org/W3215417335","https://openalex.org/W4366281507","https://openalex.org/W3110233964","https://openalex.org/W3112349555"],"abstract_inverted_index":{"Defect":[0],"detection":[1,37,48],"of":[2,76,91,114,120,149,189,204],"the":[3,43,72,77,80,89,111,146,150,171,202,210],"solar":[4,16,108,121,178,194,205],"cell":[5,17,122,179,195,206],"surface":[6,180],"with":[7],"texture":[8,113,156],"and":[9,35,74,94,116,159,166,208],"complicated":[10,155],"background":[11,112,157],"is":[12,59,85,142],"a":[13,33,45,52,67,102],"challenge":[14],"for":[15],"manufacturing.":[18],"The":[19,118,138,187],"classic":[20],"manufacturing":[21,207,211],"process":[22,212],"relies":[23],"on":[24,51,100],"human":[25],"eye":[26],"detection,":[27],"which":[28],"requires":[29],"many":[30],"workers":[31],"without":[32],"steady":[34],"good":[36],"effect.":[38],"In":[39,193],"order":[40],"to":[41,104,144,152],"solve":[42],"problem,":[44],"visual":[46],"defect":[47,160,190],"method":[49],"based":[50],"new":[53,172],"deep":[54,139,173],"convolutional":[55],"neural":[56],"network":[57],"(CNN)":[58],"designed":[60],"in":[61,107,135],"this":[62],"paper.":[63],"First,":[64],"we":[65],"develop":[66],"CNN":[68,82,140,174],"model":[69,83,141,151,175],"by":[70,87],"adjusting":[71],"depth":[73,93],"width":[75,95],"model.":[78],"Then,":[79],"optimal":[81],"structure":[84],"developed":[86],"comparing":[88],"performance":[90],"different":[92,132],"combinations.":[96],"This":[97],"research":[98],"focuses":[99],"finding":[101],"way":[103],"distinguish":[105,153],"defects":[106,130,181],"cells":[109],"from":[110],"busbars":[115],"fingers.":[117],"characteristics":[119,134],"color":[123],"images":[124],"are":[125],"analyzed.":[126],"We":[127],"find":[128],"that":[129,170],"exhibited":[131],"distinguishable":[133],"various":[136],"structures.":[137],"constructed":[143],"enhance":[145],"discrimination":[147],"capacity":[148],"between":[154],"features":[158],"features.":[161],"Finally,":[162],"some":[163],"experimental":[164],"results":[165],"K-fold":[167],"cross-validation":[168],"show":[169],"can":[176,200],"detect":[177],"more":[182],"effectively":[183],"than":[184],"other":[185],"models.":[186],"accuracy":[188],"recognitionreaches":[191],"85.80%.":[192],"manufacturing,":[196],"such":[197],"an":[198],"algorithm":[199],"increase":[201],"productivity":[203],"make":[209],"smarter.":[213]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":7},{"year":2023,"cited_by_count":2}],"updated_date":"2026-11-01T11:40:01.658920","created_date":"2023-01-12T00:00:00"}