{"id":"https://openalex.org/W4313201065","doi":"https://doi.org/10.1016/j.mssp.2022.107286","title":"Effects of (Bi0.5Li0.5)TiO3 addition on microstructures, electrical properties and thermal stability of BiFeO3-BaTiO3 piezoelectric ceramics","display_name":"Effects of (Bi0.5Li0.5)TiO3 addition on microstructures, electrical properties and thermal stability of BiFeO3-BaTiO3 piezoelectric ceramics","publication_year":2022,"publication_date":"2022-12-23","ids":{"openalex":"https://openalex.org/W4313201065","doi":"https://doi.org/10.1016/j.mssp.2022.107286"},"language":"en","primary_location":{"id":"doi:10.1016/j.mssp.2022.107286","doi":"https://doi.org/10.1016/j.mssp.2022.107286","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.mssp.2022.107286","pdf_url":null,"source":{"id":"https://openalex.org/S82126420","display_name":"Materials Science in Semiconductor Processing","issn_l":"1369-8001","issn":["1369-8001","1873-4081"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","ki-jl-1","norway-1","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Materials Science in Semiconductor Processing","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5027040199","display_name":"Shibo Guan","orcid":"https://orcid.org/0000-0003-3435-4993","observed_orcids":["https://orcid.org/0000-0003-3435-4993"]},"institutions":[{"id":"https://openalex.org/I115592961","display_name":"Jiangsu University","ror":"https://ror.org/03jc41j30","country_code":"CN","type":"education","lineage":["https://openalex.org/I115592961"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shibo Guan","raw_affiliation_strings":["School of Material Science and Engineering, Jiangsu University, Zhenjiang, 212013, Jiangsu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Material Science and Engineering, Jiangsu University, Zhenjiang, 212013, Jiangsu, China","institution_ids":["https://openalex.org/I115592961"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022009367","display_name":"Huabin Yang","orcid":"https://orcid.org/0000-0001-8382-3552","observed_orcids":["https://orcid.org/0000-0001-8382-3552","https://orcid.org/0009-0001-8232-2542"]},"institutions":[{"id":"https://openalex.org/I5343935","display_name":"Guilin University of Electronic Technology","ror":"https://ror.org/05arjae42","country_code":"CN","type":"education","lineage":["https://openalex.org/I5343935"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Huabin Yang","raw_affiliation_strings":["Engineering Research Center of Electronic Information Materials and Devices, Ministry of Education, Guilin University of Electronic Technology, Guilin, 541004, Guangxi, China","Guangxi Key Laboratory of Information Materials, Guilin University of Electronic Technology, Guilin, 541004, Guangxi, China","School of Material Science and Engineering, Guilin University of Electronic Technology, Guilin, 541004, Guangxi, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Engineering Research Center of Electronic Information Materials and Devices, Ministry of Education, Guilin University of Electronic Technology, Guilin, 541004, Guangxi, China","institution_ids":["https://openalex.org/I5343935"]},{"raw_affiliation_string":"Guangxi Key Laboratory of Information Materials, Guilin University of Electronic Technology, Guilin, 541004, Guangxi, China","institution_ids":["https://openalex.org/I5343935"]},{"raw_affiliation_string":"School of Material Science and Engineering, Guilin University of Electronic Technology, Guilin, 541004, Guangxi, China","institution_ids":["https://openalex.org/I5343935"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024384778","display_name":"Shuai Cheng","orcid":"https://orcid.org/0000-0003-1877-084X","observed_orcids":["https://orcid.org/0000-0003-1877-084X"]},"institutions":[{"id":"https://openalex.org/I5343935","display_name":"Guilin University of Electronic Technology","ror":"https://ror.org/05arjae42","country_code":"CN","type":"education","lineage":["https://openalex.org/I5343935"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shuai Cheng","raw_affiliation_strings":["Engineering Research Center of Electronic Information Materials and Devices, Ministry of Education, Guilin University of Electronic Technology, Guilin, 541004, Guangxi, China","Guangxi Key Laboratory of Information Materials, Guilin University of Electronic Technology, Guilin, 541004, Guangxi, China","School of Material Science and Engineering, Guilin University of Electronic Technology, Guilin, 541004, Guangxi, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Engineering Research Center of Electronic Information Materials and Devices, Ministry of Education, Guilin University of Electronic Technology, Guilin, 541004, Guangxi, China","institution_ids":["https://openalex.org/I5343935"]},{"raw_affiliation_string":"Guangxi Key Laboratory of Information Materials, Guilin University of Electronic Technology, Guilin, 541004, Guangxi, China","institution_ids":["https://openalex.org/I5343935"]},{"raw_affiliation_string":"School of Material Science and Engineering, Guilin University of Electronic Technology, Guilin, 541004, Guangxi, China","institution_ids":["https://openalex.org/I5343935"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103114865","display_name":"Qiaohong Chen","orcid":"https://orcid.org/0009-0009-7334-6284","observed_orcids":["https://orcid.org/0009-0009-7334-6284"]},"institutions":[{"id":"https://openalex.org/I5343935","display_name":"Guilin University of Electronic Technology","ror":"https://ror.org/05arjae42","country_code":"CN","type":"education","lineage":["https://openalex.org/I5343935"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qiaohong Chen","raw_affiliation_strings":["Engineering Research Center of Electronic Information Materials and Devices, Ministry of Education, Guilin University of Electronic Technology, Guilin, 541004, Guangxi, China","Guangxi Key Laboratory of Information Materials, Guilin University of Electronic Technology, Guilin, 541004, Guangxi, China","School of Material Science and Engineering, Guilin University of Electronic Technology, Guilin, 541004, Guangxi, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Engineering Research Center of Electronic Information Materials and Devices, Ministry of Education, Guilin University of Electronic Technology, Guilin, 541004, Guangxi, China","institution_ids":["https://openalex.org/I5343935"]},{"raw_affiliation_string":"Guangxi Key Laboratory of Information Materials, Guilin University of Electronic Technology, Guilin, 541004, Guangxi, China","institution_ids":["https://openalex.org/I5343935"]},{"raw_affiliation_string":"School of Material Science and Engineering, Guilin University of Electronic Technology, Guilin, 541004, Guangxi, China","institution_ids":["https://openalex.org/I5343935"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008873034","display_name":"Lin-Na Yuan","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I5343935","display_name":"Guilin University of Electronic Technology","ror":"https://ror.org/05arjae42","country_code":"CN","type":"education","lineage":["https://openalex.org/I5343935"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Linna Yuan","raw_affiliation_strings":["Engineering Research Center of Electronic Information Materials and Devices, Ministry of Education, Guilin University of Electronic Technology, Guilin, 541004, Guangxi, China","Guangxi Key Laboratory of Information Materials, Guilin University of Electronic Technology, Guilin, 541004, Guangxi, China","School of Material Science and Engineering, Guilin University of Electronic Technology, Guilin, 541004, Guangxi, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Engineering Research Center of Electronic Information Materials and Devices, Ministry of Education, Guilin University of Electronic Technology, Guilin, 541004, Guangxi, China","institution_ids":["https://openalex.org/I5343935"]},{"raw_affiliation_string":"Guangxi Key Laboratory of Information Materials, Guilin University of Electronic Technology, Guilin, 541004, Guangxi, China","institution_ids":["https://openalex.org/I5343935"]},{"raw_affiliation_string":"School of Material Science and Engineering, Guilin University of Electronic Technology, Guilin, 541004, Guangxi, China","institution_ids":["https://openalex.org/I5343935"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032791222","display_name":"Xiao Liu","orcid":"https://orcid.org/0000-0003-3897-5383","observed_orcids":["https://orcid.org/0000-0003-3897-5383"]},"institutions":[{"id":"https://openalex.org/I5343935","display_name":"Guilin University of Electronic Technology","ror":"https://ror.org/05arjae42","country_code":"CN","type":"education","lineage":["https://openalex.org/I5343935"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiao Liu","raw_affiliation_strings":["Engineering Research Center of Electronic Information Materials and Devices, Ministry of Education, Guilin University of Electronic Technology, Guilin, 541004, Guangxi, China","Guangxi Key Laboratory of Information Materials, Guilin University of Electronic Technology, Guilin, 541004, Guangxi, China","School of Material Science and Engineering, Guilin University of Electronic Technology, Guilin, 541004, Guangxi, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Engineering Research Center of Electronic Information Materials and Devices, Ministry of Education, Guilin University of Electronic Technology, Guilin, 541004, Guangxi, China","institution_ids":["https://openalex.org/I5343935"]},{"raw_affiliation_string":"Guangxi Key Laboratory of Information Materials, Guilin University of Electronic Technology, Guilin, 541004, Guangxi, China","institution_ids":["https://openalex.org/I5343935"]},{"raw_affiliation_string":"School of Material Science and Engineering, Guilin University of Electronic Technology, Guilin, 541004, Guangxi, China","institution_ids":["https://openalex.org/I5343935"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108009601","display_name":"Ling Yang","orcid":"https://orcid.org/0000-0001-7093-5926","observed_orcids":["https://orcid.org/0000-0001-7093-5926"]},"institutions":[{"id":"https://openalex.org/I5343935","display_name":"Guilin University of Electronic Technology","ror":"https://ror.org/05arjae42","country_code":"CN","type":"education","lineage":["https://openalex.org/I5343935"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ling Yang","raw_affiliation_strings":["Engineering Research Center of Electronic Information Materials and Devices, Ministry of Education, Guilin University of Electronic Technology, Guilin, 541004, Guangxi, China","Guangxi Key Laboratory of Information Materials, Guilin University of Electronic Technology, Guilin, 541004, Guangxi, China","School of Material Science and Engineering, Guilin University of Electronic Technology, Guilin, 541004, Guangxi, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Engineering Research Center of Electronic Information Materials and Devices, Ministry of Education, Guilin University of Electronic Technology, Guilin, 541004, Guangxi, China","institution_ids":["https://openalex.org/I5343935"]},{"raw_affiliation_string":"Guangxi Key Laboratory of Information Materials, Guilin University of Electronic Technology, Guilin, 541004, Guangxi, China","institution_ids":["https://openalex.org/I5343935"]},{"raw_affiliation_string":"School of Material Science and Engineering, Guilin University of Electronic Technology, Guilin, 541004, Guangxi, China","institution_ids":["https://openalex.org/I5343935"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018055096","display_name":"Guiwu Liu","orcid":"https://orcid.org/0000-0001-9834-3789","observed_orcids":["https://orcid.org/0000-0001-9834-3789"]},"institutions":[{"id":"https://openalex.org/I115592961","display_name":"Jiangsu University","ror":"https://ror.org/03jc41j30","country_code":"CN","type":"education","lineage":["https://openalex.org/I115592961"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Guiwu Liu","raw_affiliation_strings":["School of Material Science and Engineering, Jiangsu University, Zhenjiang, 212013, Jiangsu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Material Science and Engineering, Jiangsu University, Zhenjiang, 212013, Jiangsu, China","institution_ids":["https://openalex.org/I115592961"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009584953","display_name":"Guanjun Qiao","orcid":"https://orcid.org/0000-0002-4573-090X","observed_orcids":["https://orcid.org/0000-0002-4573-090X"]},"institutions":[{"id":"https://openalex.org/I115592961","display_name":"Jiangsu University","ror":"https://ror.org/03jc41j30","country_code":"CN","type":"education","lineage":["https://openalex.org/I115592961"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Guanjun Qiao","raw_affiliation_strings":["School of Material Science and Engineering, Jiangsu University, Zhenjiang, 212013, Jiangsu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Material Science and Engineering, Jiangsu University, Zhenjiang, 212013, Jiangsu, China","institution_ids":["https://openalex.org/I115592961"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5009584953","https://openalex.org/A5018055096","https://openalex.org/A5022009367"],"corresponding_institution_ids":["https://openalex.org/I115592961","https://openalex.org/I5343935"],"apc_list":{"value":2580,"currency":"USD","value_usd":2580},"apc_paid":null,"fwci":1.0531,"has_fulltext":false,"cited_by_count":18,"citation_normalized_percentile":{"value":0.7122488,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":99},"biblio":{"volume":"156","issue":null,"first_page":"107286","last_page":"107286"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10107","display_name":"Ferroelectric and Piezoelectric Materials","score":0.9653000235557556,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10107","display_name":"Ferroelectric and Piezoelectric Materials","score":0.9653000235557556,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10886","display_name":"Multiferroics and related materials","score":0.02280000038444996,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12155","display_name":"Microwave Dielectric Ceramics Synthesis","score":0.006500000134110451,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bifeo3-batio3-ceramics","display_name":"BiFeO3-BaTiO3 ceramics","score":0.9070000052452087},{"id":"https://openalex.org/keywords/lead-free-piezoelectric-ceramics","display_name":"lead-free piezoelectric ceramics","score":0.9539999961853027},{"id":"https://openalex.org/keywords/manganese-dioxide","display_name":"manganese dioxide","score":0.8709999918937683},{"id":"https://openalex.org/keywords/sintering-temperature","display_name":"sintering temperature","score":0.7110000252723694},{"id":"https://openalex.org/keywords/grain-size","display_name":"grain size","score":0.6669999957084656},{"id":"https://openalex.org/keywords/rhombohedral-tetragonal-phase-coexistence","display_name":"rhombohedral-tetragonal phase coexistence","score":0.859000027179718},{"id":"https://openalex.org/keywords/piezoelectricity","display_name":"piezoelectric properties","score":0.9229999780654907},{"id":"https://openalex.org/keywords/ferroelectricity","display_name":"ferroelectricity","score":0.9010000228881836},{"id":"https://openalex.org/keywords/dielectric-properties","display_name":"dielectric properties","score":0.8859999775886536},{"id":"https://openalex.org/keywords/thermal-stability","display_name":"thermal stability","score":0.7590000033378601}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.9272724986076355},{"id":"https://openalex.org/C87976508","wikidata":"https://www.wikidata.org/wiki/Q1498213","display_name":"Microstructure","level":2,"score":0.7430199980735779},{"id":"https://openalex.org/C63648874","wikidata":"https://www.wikidata.org/wiki/Q191073","display_name":"Curie temperature","level":3,"score":0.7134366631507874},{"id":"https://openalex.org/C100082104","wikidata":"https://www.wikidata.org/wiki/Q183759","display_name":"Piezoelectricity","level":2,"score":0.6883112788200378},{"id":"https://openalex.org/C2777581544","wikidata":"https://www.wikidata.org/wiki/Q844613","display_name":"Sintering","level":2,"score":0.6542471647262573},{"id":"https://openalex.org/C134132462","wikidata":"https://www.wikidata.org/wiki/Q45621","display_name":"Ceramic","level":2,"score":0.6508362293243408},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.6501131057739258},{"id":"https://openalex.org/C79090758","wikidata":"https://www.wikidata.org/wiki/Q1045739","display_name":"Ferroelectricity","level":3,"score":0.629885733127594},{"id":"https://openalex.org/C135405054","wikidata":"https://www.wikidata.org/wiki/Q7193131","display_name":"Piezoelectric coefficient","level":3,"score":0.6157324910163879},{"id":"https://openalex.org/C192191005","wikidata":"https://www.wikidata.org/wiki/Q466491","display_name":"Grain size","level":2,"score":0.5851529836654663},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.5593509078025818},{"id":"https://openalex.org/C170751736","wikidata":"https://www.wikidata.org/wiki/Q503601","display_name":"Tetragonal crystal system","level":3,"score":0.5496866703033447},{"id":"https://openalex.org/C98390173","wikidata":"https://www.wikidata.org/wiki/Q1492573","display_name":"Grain growth","level":3,"score":0.511218786239624},{"id":"https://openalex.org/C59061564","wikidata":"https://www.wikidata.org/wiki/Q7783071","display_name":"Thermal stability","level":2,"score":0.507321298122406},{"id":"https://openalex.org/C82455628","wikidata":"https://www.wikidata.org/wiki/Q11027905","display_name":"Relative density","level":3,"score":0.44945138692855835},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.38952067494392395},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.3748892545700073},{"id":"https://openalex.org/C42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","level":1,"score":0.10090669989585876},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.06021794676780701},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.05070549249649048},{"id":"https://openalex.org/C82217956","wikidata":"https://www.wikidata.org/wiki/Q184207","display_name":"Ferromagnetism","level":2,"score":0.04065215587615967},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.mssp.2022.107286","doi":"https://doi.org/10.1016/j.mssp.2022.107286","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.mssp.2022.107286","pdf_url":null,"source":{"id":"https://openalex.org/S82126420","display_name":"Materials Science in Semiconductor Processing","issn_l":"1369-8001","issn":["1369-8001","1873-4081"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","ki-jl-1","norway-1","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Materials Science in Semiconductor Processing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":66,"referenced_works":["https://openalex.org/W1492795181","https://openalex.org/W1762631474","https://openalex.org/W1969702471","https://openalex.org/W1969943400","https://openalex.org/W1973200422","https://openalex.org/W1985851327","https://openalex.org/W1989546949","https://openalex.org/W1993502820","https://openalex.org/W2009125685","https://openalex.org/W2014926933","https://openalex.org/W2040151238","https://openalex.org/W2045360307","https://openalex.org/W2045943972","https://openalex.org/W2054645346","https://openalex.org/W2059641363","https://openalex.org/W2060083723","https://openalex.org/W2064045945","https://openalex.org/W2066248699","https://openalex.org/W2078353661","https://openalex.org/W2082016465","https://openalex.org/W2084542777","https://openalex.org/W2094727638","https://openalex.org/W2119322385","https://openalex.org/W2120511375","https://openalex.org/W2190649384","https://openalex.org/W2326611479","https://openalex.org/W2473763749","https://openalex.org/W2475230163","https://openalex.org/W2521031057","https://openalex.org/W2533920736","https://openalex.org/W2564455392","https://openalex.org/W2620846997","https://openalex.org/W2764080463","https://openalex.org/W2767026643","https://openalex.org/W2768624856","https://openalex.org/W2769385832","https://openalex.org/W2782344971","https://openalex.org/W2785316023","https://openalex.org/W2789927572","https://openalex.org/W2793294437","https://openalex.org/W2808997687","https://openalex.org/W2885058592","https://openalex.org/W2888080848","https://openalex.org/W2903242663","https://openalex.org/W2942786101","https://openalex.org/W2946547049","https://openalex.org/W2953346946","https://openalex.org/W2973211793","https://openalex.org/W2983642725","https://openalex.org/W3004563694","https://openalex.org/W3016083633","https://openalex.org/W3018658473","https://openalex.org/W3043335789","https://openalex.org/W3048226877","https://openalex.org/W3107287661","https://openalex.org/W3133077007","https://openalex.org/W3137210097","https://openalex.org/W3174444459","https://openalex.org/W3182432656","https://openalex.org/W3195967408","https://openalex.org/W3197858347","https://openalex.org/W3208468724","https://openalex.org/W3217609772","https://openalex.org/W4220766120","https://openalex.org/W4283579191","https://openalex.org/W6800992477"],"related_works":["https://openalex.org/W2983642725","https://openalex.org/W1985710286","https://openalex.org/W2037747098","https://openalex.org/W2885058592","https://openalex.org/W2283279528","https://openalex.org/W4386819175","https://openalex.org/W2381662184","https://openalex.org/W2058494772","https://openalex.org/W2090124327","https://openalex.org/W4308345161"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":8},{"year":2023,"cited_by_count":4}],"updated_date":"2026-10-12T09:40:04.860316","created_date":"2023-01-06T00:00:00"}