{"id":"https://openalex.org/W4310696748","doi":"https://doi.org/10.1051/epjap/2022220256","title":"Microstructure and electrical transport properties of nanoscale [(CO40Fe40B20)34(SiO2)66/(In2O3)/C]46 multilayers","display_name":"Microstructure and electrical transport properties of nanoscale [(CO40Fe40B20)34(SiO2)66/(In2O3)/C]46 multilayers","publication_year":2022,"publication_date":"2022-12-05","ids":{"openalex":"https://openalex.org/W4310696748","doi":"https://doi.org/10.1051/epjap/2022220256"},"language":"en","primary_location":{"id":"doi:10.1051/epjap/2022220256","doi":"https://doi.org/10.1051/epjap/2022220256","is_oa":false,"landing_page_url":"https://doi.org/10.1051/epjap/2022220256","pdf_url":null,"source":{"id":"https://openalex.org/S201767027","display_name":"The European Physical Journal Applied Physics","issn_l":"1286-0042","issn":["1286-0042","1286-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","norway-1","poland-40","russia-white-list-3","vabb-shw"],"host_organization":"https://openalex.org/P4310319748","host_organization_name":"EDP Sciences","host_organization_lineage":["https://openalex.org/P4310319748","https://openalex.org/P4310319982"],"host_organization_lineage_names":["EDP Sciences","Science Press"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"The European Physical Journal Applied Physics","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5060962486","display_name":"\u041f\u0435\u0448\u043a\u043e\u0432 \u042f\u0440\u043e\u0441\u043b\u0430\u0432 \u0410\u043d\u0430\u0442\u043e\u043b\u044c\u0435\u0432\u0438\u0447","orcid":"https://orcid.org/0000-0003-0939-0466","observed_orcids":["https://orcid.org/0000-0003-0939-0466"]},"institutions":[{"id":"https://openalex.org/I71305448","display_name":"Voronezh State University","ror":"https://ror.org/0543j5e78","country_code":"RU","type":"education","lineage":["https://openalex.org/I71305448"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Yaroslav A. Peshkov","raw_affiliation_strings":["Voronezh State University, 394018 Voronezh, Russia"],"raw_orcid":"https://orcid.org/0000-0003-0939-0466","affiliations":[{"raw_affiliation_string":"Voronezh State University, 394018 Voronezh, Russia","institution_ids":["https://openalex.org/I71305448"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070692298","display_name":"Sergey Alexandrovich Ivkov","orcid":"https://orcid.org/0000-0003-1658-5579","observed_orcids":["https://orcid.org/0000-0003-1658-5579"]},"institutions":[{"id":"https://openalex.org/I71305448","display_name":"Voronezh State University","ror":"https://ror.org/0543j5e78","country_code":"RU","type":"education","lineage":["https://openalex.org/I71305448"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Sergey A. Ivkov","raw_affiliation_strings":["Voronezh State University, 394018 Voronezh, Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Voronezh State University, 394018 Voronezh, Russia","institution_ids":["https://openalex.org/I71305448"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Alexander S. Lenshin","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210106771","display_name":"Voronezh State University of Engineering Technologies","ror":"https://ror.org/01mebf576","country_code":"RU","type":"education","lineage":["https://openalex.org/I4210106771"]},{"id":"https://openalex.org/I71305448","display_name":"Voronezh State University","ror":"https://ror.org/0543j5e78","country_code":"RU","type":"education","lineage":["https://openalex.org/I71305448"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Alexander S. Lenshin","raw_affiliation_strings":["Voronezh State University of Engineering Technologies, 394036 Voronezh, Russia","Voronezh State University, 394018 Voronezh, Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Voronezh State University of Engineering Technologies, 394036 Voronezh, Russia","institution_ids":["https://openalex.org/I4210106771"]},{"raw_affiliation_string":"Voronezh State University, 394018 Voronezh, Russia","institution_ids":["https://openalex.org/I71305448"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005790827","display_name":"\u0410. \u0412. \u0421\u0438\u0442\u043d\u0438\u043a\u043e\u0432","orcid":"https://orcid.org/0000-0002-9438-9234","observed_orcids":["https://orcid.org/0000-0002-9438-9234","https://orcid.org/0000-0002-0639-1685"]},"institutions":[{"id":"https://openalex.org/I4210106257","display_name":"Voronezh State Technical University","ror":"https://ror.org/01m20f643","country_code":"RU","type":"education","lineage":["https://openalex.org/I4210106257"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Alexander V. Sitnikov","raw_affiliation_strings":["Voronezh State Technical University, 394026 Voronezh, Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Voronezh State Technical University, 394026 Voronezh, Russia","institution_ids":["https://openalex.org/I4210106257"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5081567542","display_name":"Yu. A. Yurakov","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I71305448","display_name":"Voronezh State University","ror":"https://ror.org/0543j5e78","country_code":"RU","type":"education","lineage":["https://openalex.org/I71305448"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Yury A. Yurakov","raw_affiliation_strings":["Voronezh State University, 394018 Voronezh, Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Voronezh State University, 394018 Voronezh, Russia","institution_ids":["https://openalex.org/I71305448"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1500,"currency":"EUR","value_usd":1580},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"98","issue":null,"first_page":"6","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":0.9702000021934509,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":0.9702000021934509,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12405","display_name":"Characterization and Applications of Magnetic Nanoparticles","score":0.0013000000035390258,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10886","display_name":"Multiferroics and related materials","score":0.0010999999940395355,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-transport","display_name":"electrical transport","score":0.6000000238418579},{"id":"https://openalex.org/keywords/magnetoresistance","display_name":"magnetoresistance","score":0.9300000071525574},{"id":"https://openalex.org/keywords/amorphous-multilayers","display_name":"amorphous multilayers","score":0.7639999985694885},{"id":"https://openalex.org/keywords/interlayer-thickness","display_name":"interlayer thickness","score":0.7260000109672546},{"id":"https://openalex.org/keywords/microstructure","display_name":"microstructure","score":0.5},{"id":"https://openalex.org/keywords/ion-beam-sputtering","display_name":"ion beam sputtering","score":0.8109999895095825},{"id":"https://openalex.org/keywords/x-ray-reflectivity","display_name":"X-ray reflectivity","score":0.7210000157356262},{"id":"https://openalex.org/keywords/impedance-spectroscopy","display_name":"impedance spectroscopy","score":0.7590000033378601}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8536726236343384},{"id":"https://openalex.org/C87976508","wikidata":"https://www.wikidata.org/wiki/Q1498213","display_name":"Microstructure","level":2,"score":0.729891300201416},{"id":"https://openalex.org/C56052488","wikidata":"https://www.wikidata.org/wiki/Q103382","display_name":"Amorphous solid","level":2,"score":0.7194140553474426},{"id":"https://openalex.org/C117958382","wikidata":"https://www.wikidata.org/wiki/Q58347","display_name":"Magnetoresistance","level":3,"score":0.7068307399749756},{"id":"https://openalex.org/C207114421","wikidata":"https://www.wikidata.org/wiki/Q133900","display_name":"Diffraction","level":2,"score":0.6268675327301025},{"id":"https://openalex.org/C22423302","wikidata":"https://www.wikidata.org/wiki/Q898444","display_name":"Sputtering","level":3,"score":0.4940236210823059},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.46052274107933044},{"id":"https://openalex.org/C82217956","wikidata":"https://www.wikidata.org/wiki/Q184207","display_name":"Ferromagnetism","level":2,"score":0.4343835115432739},{"id":"https://openalex.org/C32891209","wikidata":"https://www.wikidata.org/wiki/Q483666","display_name":"Spectroscopy","level":2,"score":0.4303795099258423},{"id":"https://openalex.org/C50515024","wikidata":"https://www.wikidata.org/wiki/Q826582","display_name":"X-ray crystallography","level":3,"score":0.4124751687049866},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.3153398931026459},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.26314666867256165},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.23338919878005981},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.22329255938529968},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.20684146881103516},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.15241697430610657},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.08070799708366394},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1051/epjap/2022220256","doi":"https://doi.org/10.1051/epjap/2022220256","is_oa":false,"landing_page_url":"https://doi.org/10.1051/epjap/2022220256","pdf_url":null,"source":{"id":"https://openalex.org/S201767027","display_name":"The European Physical Journal Applied Physics","issn_l":"1286-0042","issn":["1286-0042","1286-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","norway-1","poland-40","russia-white-list-3","vabb-shw"],"host_organization":"https://openalex.org/P4310319748","host_organization_name":"EDP Sciences","host_organization_lineage":["https://openalex.org/P4310319748","https://openalex.org/P4310319982"],"host_organization_lineage_names":["EDP Sciences","Science Press"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"The European Physical Journal Applied Physics","raw_type":"journal-article"},{"id":"pmh:oai:edpsciences.org:dkey/10.1051/epjap/2022220256","doi":null,"is_oa":false,"landing_page_url":"https://www.epjap.org/10.1051/epjap/2022220256/pdf","pdf_url":"https://www.epjap.org/10.1051/epjap/2022220256/pdf","source":{"id":"https://openalex.org/S4306400744","display_name":"Springer Link (Chiba Institute of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I8488066","host_organization_name":"Chiba Institute of Technology","host_organization_lineage":["https://openalex.org/I8488066"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"https://doi.org/10.1051/epjap/2022220256","raw_type":"Text"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W212624089","https://openalex.org/W645011244","https://openalex.org/W1511072076","https://openalex.org/W1972782897","https://openalex.org/W1986554247","https://openalex.org/W1996123091","https://openalex.org/W1999330321","https://openalex.org/W2006624183","https://openalex.org/W2009462653","https://openalex.org/W2012695793","https://openalex.org/W2014086321","https://openalex.org/W2040745744","https://openalex.org/W2043171073","https://openalex.org/W2088732846","https://openalex.org/W2118569898","https://openalex.org/W2126705780","https://openalex.org/W2420905470","https://openalex.org/W2742451207","https://openalex.org/W2747356873","https://openalex.org/W2750366697","https://openalex.org/W2884380117","https://openalex.org/W2912295147","https://openalex.org/W2938785282","https://openalex.org/W2976173823","https://openalex.org/W2981297094","https://openalex.org/W2993640068","https://openalex.org/W3017548798","https://openalex.org/W3021697528","https://openalex.org/W3099954590","https://openalex.org/W4300975572"],"related_works":["https://openalex.org/W6884542501","https://openalex.org/W2993640068","https://openalex.org/W2537114135","https://openalex.org/W2203036753","https://openalex.org/W3126840691","https://openalex.org/W2234876807","https://openalex.org/W154683257","https://openalex.org/W1568399830","https://openalex.org/W1965128783","https://openalex.org/W7161954729"],"abstract_inverted_index":{"We":[0],"investigated":[1],"the":[2,11,45,51,88,95],"role":[3],"of":[4,15,44,50,90,103,113],"microstructure":[5],"and":[6,34,64,68,119],"In2O3/C":[7,100],"interlayer":[8,101],"thickness":[9,102],"on":[10],"electrical":[12],"transport":[13],"properties":[14],"[(Co40Fe40B20)34(SiO2)66/(In2O3)/C]46":[16],"multilayers":[17,23,52],"prepared":[18],"using":[19,26],"ion-beam":[20],"sputtering.":[21],"These":[22],"were":[24],"characterized":[25],"an":[27],"X-ray":[28,30,38,54,57],"diffraction,":[29],"reflectivity,":[31],"impedance":[32],"spectroscopy,":[33],"magnetoresistive":[35],"measurements.":[36],"The":[37],"diffraction":[39],"data":[40],"showed":[41],"that":[42],"regardless":[43],"layer":[46],"thickness,":[47],"all":[48],"components":[49],"are":[53,62,70],"amorphous.":[55],"Fitting":[56],"reflectivity":[58],"data,":[59],"multilayer":[60,97],"periodicities":[61],"extracted":[63],"layers":[65],"thicknesses,":[66],"densities":[67],"roughnesses":[69],"determined.":[71],"Impedance":[72],"spectroscopy":[73],"has":[74],"shown":[75],"a":[76,91,111],"resistive-capacitive":[77],"coupling":[78],"between":[79],"electrically":[80],"conductive":[81],"ferromagnetic":[82],"CoFeB":[83],"clusters":[84],"which":[85],"corresponds":[86],"to":[87,109],"model":[89],"prepercolation":[92],"composite.":[93],"For":[94],"thinnest":[96],"with":[98],"nonmagnetic":[99],"about":[104,114],"1.6":[105],"nm,":[106],"we":[107],"managed":[108],"achieve":[110],"magnetoresistance":[112],"0.8%":[115],"at":[116,121],"room":[117],"temperature":[118],"3.2%":[120],"cryogenic":[122],"temperature.":[123]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2022-12-15T00:00:00"}