{"id":"https://openalex.org/W4309965733","doi":"https://doi.org/10.1109/wipda56483.2022.9955267","title":"Symmetrical VTH/RON Drifts Due to Negative/Positive Gate Stress in p-GaN Power HEMTs","display_name":"Symmetrical VTH/RON Drifts Due to Negative/Positive Gate Stress in p-GaN Power HEMTs","publication_year":2022,"publication_date":"2022-11-07","ids":{"openalex":"https://openalex.org/W4309965733","doi":"https://doi.org/10.1109/wipda56483.2022.9955267"},"language":"en","primary_location":{"id":"doi:10.1109/wipda56483.2022.9955267","doi":"https://doi.org/10.1109/wipda56483.2022.9955267","is_oa":false,"landing_page_url":"https://doi.org/10.1109/wipda56483.2022.9955267","pdf_url":null,"source":{"id":"https://openalex.org/S4306418853","display_name":"IEEE Workshop on Wide Bandgap Power Devices and Applications","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE 9th Workshop on Wide Bandgap Power Devices &amp; Applications (WiPDA)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://hdl.handle.net/11380/1295213","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5007416472","display_name":"Nicol\u00f2 Zagni","orcid":"https://orcid.org/0000-0003-2454-1883","observed_orcids":["https://orcid.org/0000-0003-2454-1883"]},"institutions":[{"id":"https://openalex.org/I122346577","display_name":"University of Modena and Reggio Emilia","ror":"https://ror.org/02d4c4y02","country_code":"IT","type":"education","lineage":["https://openalex.org/I122346577"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Nicol\u00f2 Zagni","raw_affiliation_strings":["University of Modena and Reggio Emilia,\"Enzo Ferrari\",Engineering Department,Modena,Italy,41125"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Modena and Reggio Emilia,\"Enzo Ferrari\",Engineering Department,Modena,Italy,41125","institution_ids":["https://openalex.org/I122346577"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000760228","display_name":"Marcello Cioni","orcid":"https://orcid.org/0000-0001-8302-6641","observed_orcids":["https://orcid.org/0000-0001-8302-6641"]},"institutions":[{"id":"https://openalex.org/I122346577","display_name":"University of Modena and Reggio Emilia","ror":"https://ror.org/02d4c4y02","country_code":"IT","type":"education","lineage":["https://openalex.org/I122346577"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Marcello Cioni","raw_affiliation_strings":["University of Modena and Reggio Emilia,\"Enzo Ferrari\",Engineering Department,Modena,Italy,41125"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Modena and Reggio Emilia,\"Enzo Ferrari\",Engineering Department,Modena,Italy,41125","institution_ids":["https://openalex.org/I122346577"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044409603","display_name":"Maria Eloisa Castagna","orcid":"https://orcid.org/0000-0002-7864-6085","observed_orcids":["https://orcid.org/0000-0002-7864-6085"]},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Maria Eloisa Castagna","raw_affiliation_strings":["STMicroelectronics,Catania,Italy,95121"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Catania,Italy,95121","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069671967","display_name":"Maurizio Moschetti","orcid":"https://orcid.org/0000-0002-3349-1649","observed_orcids":["https://orcid.org/0000-0002-3349-1649"]},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Maurizio Moschetti","raw_affiliation_strings":["STMicroelectronics,Catania,Italy,95121"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Catania,Italy,95121","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110453844","display_name":"Ferdinando Iucolano","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Ferdinando Iucolano","raw_affiliation_strings":["STMicroelectronics,Catania,Italy,95121"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Catania,Italy,95121","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015072881","display_name":"G. Verzellesi","orcid":"https://orcid.org/0000-0001-5770-6512","observed_orcids":["https://orcid.org/0000-0001-5770-6512"]},"institutions":[{"id":"https://openalex.org/I122346577","display_name":"University of Modena and Reggio Emilia","ror":"https://ror.org/02d4c4y02","country_code":"IT","type":"education","lineage":["https://openalex.org/I122346577"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Giovanni Verzellesi","raw_affiliation_strings":["University of Modena and Reggio Emilia,Department of Sciences and Methods for Engineering and EN&#x0026;TECH,Reggio Emilia,Italy,42122"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Modena and Reggio Emilia,Department of Sciences and Methods for Engineering and EN&#x0026;TECH,Reggio Emilia,Italy,42122","institution_ids":["https://openalex.org/I122346577"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5023358290","display_name":"Alessandro Chini","orcid":"https://orcid.org/0000-0002-5865-271X","observed_orcids":["https://orcid.org/0000-0002-5865-271X"]},"institutions":[{"id":"https://openalex.org/I122346577","display_name":"University of Modena and Reggio Emilia","ror":"https://ror.org/02d4c4y02","country_code":"IT","type":"education","lineage":["https://openalex.org/I122346577"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Alessandro Chini","raw_affiliation_strings":["University of Modena and Reggio Emilia,\"Enzo Ferrari\",Engineering Department,Modena,Italy,41125"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Modena and Reggio Emilia,\"Enzo Ferrari\",Engineering Department,Modena,Italy,41125","institution_ids":["https://openalex.org/I122346577"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":6.7077,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.9728419,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"31","last_page":"34"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":0.9916999936103821,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":0.9916999936103821,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.007600000128149986,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/threshold-voltage-shift","display_name":"threshold voltage shift","score":0.7770000100135803},{"id":"https://openalex.org/keywords/temperature-dependence","display_name":"temperature dependence","score":0.5989999771118164},{"id":"https://openalex.org/keywords/activation-energy","display_name":"activation energy","score":0.7200000286102295}],"concepts":[{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4296633005142212},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3541669249534607},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.09581094980239868}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/wipda56483.2022.9955267","doi":"https://doi.org/10.1109/wipda56483.2022.9955267","is_oa":false,"landing_page_url":"https://doi.org/10.1109/wipda56483.2022.9955267","pdf_url":null,"source":{"id":"https://openalex.org/S4306418853","display_name":"IEEE Workshop on Wide Bandgap Power Devices and Applications","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE 9th Workshop on Wide Bandgap Power Devices &amp; Applications (WiPDA)","raw_type":"proceedings-article"},{"id":"pmh:oai:iris.unimore.it:11380/1295213","doi":null,"is_oa":true,"landing_page_url":"https://hdl.handle.net/11380/1295213","pdf_url":null,"source":{"id":"https://openalex.org/S4306400718","display_name":"IRIS UNIMORE (University of Modena and Reggio Emilia)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I122346577","host_organization_name":"University of Modena and Reggio Emilia","host_organization_lineage":["https://openalex.org/I122346577"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":{"id":"pmh:oai:iris.unimore.it:11380/1295213","doi":null,"is_oa":true,"landing_page_url":"https://hdl.handle.net/11380/1295213","pdf_url":null,"source":{"id":"https://openalex.org/S4306400718","display_name":"IRIS UNIMORE (University of Modena and Reggio Emilia)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I122346577","host_organization_name":"University of Modena and Reggio Emilia","host_organization_lineage":["https://openalex.org/I122346577"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W2593495332","https://openalex.org/W2800507758","https://openalex.org/W2801059624","https://openalex.org/W2956189539","https://openalex.org/W2967945770","https://openalex.org/W3006491566","https://openalex.org/W3161601337","https://openalex.org/W3212391347","https://openalex.org/W4205167465","https://openalex.org/W4225295101"],"related_works":["https://openalex.org/W7135409509","https://openalex.org/W4400231677","https://openalex.org/W7164330884","https://openalex.org/W4404332291","https://openalex.org/W4410394938","https://openalex.org/W7203532941","https://openalex.org/W4362714719","https://openalex.org/W7213498473","https://openalex.org/W4411551800","https://openalex.org/W4312050652"],"abstract_inverted_index":{"We":[0,50],"investigate":[1],"the":[2,70,88,96,99,124,139],"drift":[3],"of":[4,33,45,90,123],"threshold":[5],"voltage":[6],"(VTH)":[7],"and":[8,67,145],"on-resistance":[9],"(RON)":[10],"in":[11],"p-GaN":[12],"power":[13],"HEMTs":[14],"after":[15,81],"being":[16],"submitted":[17],"to":[18,40,69,73],"negative/positive":[19],"gate":[20],"stress.":[21],"Negative":[22],"(Positive)":[23],"Gate":[24],"Stress":[25],"(NGS/PGS)":[26],"was":[27,79,128],"applied":[28],"at":[29,47,105],"a":[30,41,112,120],"gate-to-source":[31],"bias":[32],"|VNGS|":[34],"=":[35],"VPGS=":[36],"6":[37],"V":[38],"up":[39],"cumulative":[42],"stress":[43,59,74,85,101],"time":[44],"8\u00d7103s":[46],"room":[48],"temperature.":[49],"found":[51,129],"that":[52],"during":[53,62,118,130,142],"NGS":[54,144],"both":[55,64,143],"VTHand":[56,97],"RONincreased":[57],"over":[58],"time,":[60],"whereas":[61],"PGS":[63,131,146],"parameters":[65],"decreased":[66],"stabilized":[68],"values":[71],"prior":[72],"application.":[75],"This":[76],"symmetric":[77],"behavior":[78],"maintained":[80],"5":[82],"full":[83],"NGS/PGS":[84,100],"cycles,":[86],"indicating":[87],"absence":[89],"permanent":[91],"degradation.":[92],"To":[93],"further":[94],"characterize":[95],"RONtransients,":[98],"cycles":[102],"were":[103],"repeated":[104],"different":[106],"temperatures":[107],"(T=30-105":[108],"\u00b0C).":[109],"While":[110],"VTHexhibited":[111],"strong":[113],"\u03a4-dependence":[114],"(EA\u2248":[115,132,147],"0.6":[116],"eV)":[117],"NGS,":[119],"negligible":[121],"variation":[122],"VTHtransients":[125],"with":[126],"T":[127],"0":[133],"eV).":[134,149],"Instead,":[135],"RONtransients":[136],"exhibited":[137],"approximately":[138],"same":[140],"T-dependence":[141],"0.3-0.4":[148]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":4}],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2022-11-30T00:00:00"}
