{"id":"https://openalex.org/W4306835537","doi":"https://doi.org/10.1109/temc.2022.3211458","title":"Application of Probabilistic Models for Multitone Electromagnetic Immunity Analysis","display_name":"Application of Probabilistic Models for Multitone Electromagnetic Immunity Analysis","publication_year":2022,"publication_date":"2022-10-12","ids":{"openalex":"https://openalex.org/W4306835537","doi":"https://doi.org/10.1109/temc.2022.3211458"},"language":"en","primary_location":{"id":"doi:10.1109/temc.2022.3211458","doi":"https://doi.org/10.1109/temc.2022.3211458","is_oa":false,"landing_page_url":"https://doi.org/10.1109/temc.2022.3211458","pdf_url":null,"source":{"id":"https://openalex.org/S163644703","display_name":"IEEE Transactions on Electromagnetic Compatibility","issn_l":"0018-9375","issn":["0018-9375","1558-187X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","norway-1","poland-100","russia-white-list-2"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Electromagnetic Compatibility","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5044690640","display_name":"Lokesh Devaraj","orcid":"https://orcid.org/0000-0002-2421-8368","observed_orcids":["https://orcid.org/0000-0002-2421-8368"]},"institutions":[{"id":"https://openalex.org/I66943878","display_name":"De Montfort University","ror":"https://ror.org/0312pnr83","country_code":"GB","type":"education","lineage":["https://openalex.org/I66943878"]},{"id":"https://openalex.org/I89264055","display_name":"MIRA (United Kingdom)","ror":"https://ror.org/04804s519","country_code":"GB","type":"company","lineage":["https://openalex.org/I89264055"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Lokesh Devaraj","raw_affiliation_strings":["HORIBA MIRA Limited, Nuneaton, U.K","De Montfort University [Leicester, United Kingdom]","HORIBA MIRA Limited"],"raw_orcid":"https://orcid.org/0000-0002-2421-8368","affiliations":[{"raw_affiliation_string":"HORIBA MIRA Limited, Nuneaton, U.K","institution_ids":["https://openalex.org/I89264055"]},{"raw_affiliation_string":"De Montfort University [Leicester, United Kingdom]","institution_ids":["https://openalex.org/I66943878"]},{"raw_affiliation_string":"HORIBA MIRA Limited","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009484946","display_name":"Qazi Mashaal Khan","orcid":"https://orcid.org/0000-0003-2005-7947","observed_orcids":["https://orcid.org/0000-0003-2005-7947"]},"institutions":[{"id":"https://openalex.org/I28221208","display_name":"Institut National des Sciences Appliqu\u00e9es de Rennes","ror":"https://ror.org/04xaa4j22","country_code":"FR","type":"education","lineage":["https://openalex.org/I28221208","https://openalex.org/I56067802"]},{"id":"https://openalex.org/I4210149659","display_name":"\u00c9cole Sup\u00e9rieure d'\u00c9lectronique de l'Ouest","ror":"https://ror.org/04nx9ps90","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210149659"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Qazi Mashaal Khan","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, ESEO School of Engineering, Angers, France","ESEO - RF-EMC","Institut National des Sciences Appliqu\u00e9es - Rennes"],"raw_orcid":"https://orcid.org/0000-0003-2005-7947","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, ESEO School of Engineering, Angers, France","institution_ids":["https://openalex.org/I4210149659"]},{"raw_affiliation_string":"ESEO - RF-EMC","institution_ids":["https://openalex.org/I4210149659"]},{"raw_affiliation_string":"Institut National des Sciences Appliqu\u00e9es - Rennes","institution_ids":["https://openalex.org/I28221208"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041840698","display_name":"Alastair R. Ruddle","orcid":"https://orcid.org/0000-0003-4425-0979","observed_orcids":["https://orcid.org/0000-0003-4425-0979"]},"institutions":[{"id":"https://openalex.org/I89264055","display_name":"MIRA (United Kingdom)","ror":"https://ror.org/04804s519","country_code":"GB","type":"company","lineage":["https://openalex.org/I89264055"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Alastair R. Ruddle","raw_affiliation_strings":["HORIBA MIRA Limited, Nuneaton, U.K","HORIBA MIRA Limited"],"raw_orcid":"https://orcid.org/0000-0003-4425-0979","affiliations":[{"raw_affiliation_string":"HORIBA MIRA Limited, Nuneaton, U.K","institution_ids":["https://openalex.org/I89264055"]},{"raw_affiliation_string":"HORIBA MIRA Limited","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090933806","display_name":"Alistair Duffy","orcid":"https://orcid.org/0000-0002-5074-4273","observed_orcids":["https://orcid.org/0000-0002-5074-4273"]},"institutions":[{"id":"https://openalex.org/I66943878","display_name":"De Montfort University","ror":"https://ror.org/0312pnr83","country_code":"GB","type":"education","lineage":["https://openalex.org/I66943878"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Alistair P. Duffy","raw_affiliation_strings":["De Montfort University, Leicester, U.K","De Montfort University [Leicester, United Kingdom]"],"raw_orcid":"https://orcid.org/0000-0002-5074-4273","affiliations":[{"raw_affiliation_string":"De Montfort University, Leicester, U.K","institution_ids":["https://openalex.org/I66943878"]},{"raw_affiliation_string":"De Montfort University [Leicester, United Kingdom]","institution_ids":["https://openalex.org/I66943878"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078021398","display_name":"Richard Perdriau","orcid":"https://orcid.org/0000-0003-2494-6813","observed_orcids":["https://orcid.org/0000-0003-2494-6813"]},"institutions":[{"id":"https://openalex.org/I4210100151","display_name":"Institut d'\u00c9lectronique et des Technologies du num\u00e9Rique","ror":"https://ror.org/013q33h79","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I28221208","https://openalex.org/I4210095849","https://openalex.org/I4210100151","https://openalex.org/I56067802","https://openalex.org/I97188460"]},{"id":"https://openalex.org/I4210149659","display_name":"\u00c9cole Sup\u00e9rieure d'\u00c9lectronique de l'Ouest","ror":"https://ror.org/04nx9ps90","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210149659"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Richard Perdriau","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, ESEO School of Engineering, Angers, France","ESEO - RF-EMC","Institut d'\u00c9lectronique et des Technologies du num\u00e9Rique"],"raw_orcid":"https://orcid.org/0000-0003-2494-6813","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, ESEO School of Engineering, Angers, France","institution_ids":["https://openalex.org/I4210149659"]},{"raw_affiliation_string":"ESEO - RF-EMC","institution_ids":["https://openalex.org/I4210149659"]},{"raw_affiliation_string":"Institut d'\u00c9lectronique et des Technologies du num\u00e9Rique","institution_ids":["https://openalex.org/I4210100151"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5062778422","display_name":"Mohsen Koohestani","orcid":"https://orcid.org/0000-0003-2194-3799","observed_orcids":["https://orcid.org/0000-0003-2194-3799"]},"institutions":[{"id":"https://openalex.org/I4210100151","display_name":"Institut d'\u00c9lectronique et des Technologies du num\u00e9Rique","ror":"https://ror.org/013q33h79","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I28221208","https://openalex.org/I4210095849","https://openalex.org/I4210100151","https://openalex.org/I56067802","https://openalex.org/I97188460"]},{"id":"https://openalex.org/I4210149659","display_name":"\u00c9cole Sup\u00e9rieure d'\u00c9lectronique de l'Ouest","ror":"https://ror.org/04nx9ps90","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210149659"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Mohsen Koohestani","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, ESEO School of Engineering, Angers, France","ESEO - RF-EMC","Institut d'\u00c9lectronique et des Technologies du num\u00e9Rique"],"raw_orcid":"https://orcid.org/0000-0003-2194-3799","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, ESEO School of Engineering, Angers, France","institution_ids":["https://openalex.org/I4210149659"]},{"raw_affiliation_string":"ESEO - RF-EMC","institution_ids":["https://openalex.org/I4210149659"]},{"raw_affiliation_string":"Institut d'\u00c9lectronique et des Technologies du num\u00e9Rique","institution_ids":["https://openalex.org/I4210100151"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2195,"currency":"USD","value_usd":2195},"apc_paid":null,"fwci":0.7485,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.63276335,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":93,"max":97},"biblio":{"volume":"64","issue":"6","first_page":"2067","last_page":"2079"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9179999828338623,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9179999828338623,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.07320000231266022,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.0007999999797903001,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electromagnetic-immunity","display_name":"electromagnetic interference immunity","score":0.765999972820282},{"id":"https://openalex.org/keywords/noisy-or-model","display_name":"noisy-OR model","score":0.7680000066757202},{"id":"https://openalex.org/keywords/bayesian-networks","display_name":"Bayesian networks","score":0.9120000004768372},{"id":"https://openalex.org/keywords/failure-probability-prediction","display_name":"failure probability prediction","score":0.628000020980835},{"id":"https://openalex.org/keywords/oscillator-circuits","display_name":"oscillator circuits","score":0.7590000033378601},{"id":"https://openalex.org/keywords/causal-interaction","display_name":"causal interaction","score":0.4959999918937683},{"id":"https://openalex.org/keywords/electromagnetic-compatibility-testing","display_name":"electromagnetic compatibility testing","score":0.5649999976158142}],"concepts":[{"id":"https://openalex.org/C49937458","wikidata":"https://www.wikidata.org/wiki/Q2599292","display_name":"Probabilistic logic","level":2,"score":0.6875115633010864},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5629547238349915},{"id":"https://openalex.org/C33724603","wikidata":"https://www.wikidata.org/wiki/Q812540","display_name":"Bayesian network","level":2,"score":0.5359277129173279},{"id":"https://openalex.org/C35651441","wikidata":"https://www.wikidata.org/wiki/Q625303","display_name":"Independence (probability theory)","level":2,"score":0.4993479251861572},{"id":"https://openalex.org/C199845137","wikidata":"https://www.wikidata.org/wiki/Q145490","display_name":"Network topology","level":2,"score":0.47357046604156494},{"id":"https://openalex.org/C2780583480","wikidata":"https://www.wikidata.org/wiki/Q1366327","display_name":"Tone (literature)","level":2,"score":0.4260023236274719},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.40759405493736267},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.25202125310897827},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2420245110988617},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.11894729733467102},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C124952713","wikidata":"https://www.wikidata.org/wiki/Q8242","display_name":"Literature","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/temc.2022.3211458","doi":"https://doi.org/10.1109/temc.2022.3211458","is_oa":false,"landing_page_url":"https://doi.org/10.1109/temc.2022.3211458","pdf_url":null,"source":{"id":"https://openalex.org/S163644703","display_name":"IEEE Transactions on Electromagnetic Compatibility","issn_l":"0018-9375","issn":["0018-9375","1558-187X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","norway-1","poland-100","russia-white-list-2"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Electromagnetic Compatibility","raw_type":"journal-article"},{"id":"pmh:oai:HAL:hal-03818708v1","doi":null,"is_oa":false,"landing_page_url":"https://hal.science/hal-03818708","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4405252976","host_organization_name":"Centre pour la Communication Scientifique Directe","host_organization_lineage":["https://openalex.org/I4405252976"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Transactions on Electromagnetic Compatibility, 2022, 64 (6), pp.2067-2079. ⟨10.1109/TEMC.2022.3211458⟩","raw_type":"info:eu-repo/semantics/article"},{"id":"pmh:oai:dora.dmu.ac.uk:2086/22245","doi":null,"is_oa":false,"landing_page_url":"https://dora.dmu.ac.uk/bitstreams/a4e710b4-a21b-43e2-9805-6e563f752330/download","pdf_url":null,"source":{"id":"https://openalex.org/S4306400394","display_name":"DMU Open Research Archive (De Montfort University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I66943878","host_organization_name":"De Montfort University","host_organization_lineage":["https://openalex.org/I66943878"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W114565888","https://openalex.org/W627421446","https://openalex.org/W1529600134","https://openalex.org/W1545563183","https://openalex.org/W1988904099","https://openalex.org/W2068809917","https://openalex.org/W2085048344","https://openalex.org/W2117242650","https://openalex.org/W2124544176","https://openalex.org/W2137703130","https://openalex.org/W2289004713","https://openalex.org/W2291053413","https://openalex.org/W2295540756","https://openalex.org/W2520141872","https://openalex.org/W2524565580","https://openalex.org/W2532525987","https://openalex.org/W3204336262","https://openalex.org/W4213351213","https://openalex.org/W4224279823","https://openalex.org/W4280597908","https://openalex.org/W4290715558","https://openalex.org/W6634664096"],"related_works":["https://openalex.org/W4290715558","https://openalex.org/W4280597908","https://openalex.org/W4224293482","https://openalex.org/W4403278470","https://openalex.org/W2295540756","https://openalex.org/W4406094625","https://openalex.org/W4406262551","https://openalex.org/W2499020450","https://openalex.org/W2291053413","https://openalex.org/W2737810734"],"abstract_inverted_index":{"The":[0,22],"operational":[1],"environment":[2],"of":[3,24,68,88,107,119,146],"modern":[4],"electronic":[5],"systems":[6],"may":[7],"include":[8],"multiple":[9],"frequency":[10],"electromagnetic":[11],"disturbances.":[12],"However,":[13],"immunity":[14,43],"measurements":[15],"usually":[16],"employ":[17],"single-frequency":[18],"continuous":[19],"waveforms":[20],"(i.e.,single-tones).":[21],"performances":[23],"two":[25,114],"oscillator":[26],"circuits":[27],"with":[28],"different":[29],"topologies":[30],"(one":[31],"simulated":[32],"and":[33,91,127],"one":[34],"measured)":[35],"were":[36,100],"used":[37,63,102],"as":[38],"case":[39,115],"studies":[40],"to":[41,44,64,103,141],"investigate":[42],"simultaneous":[45],"single-tone":[46,126],"disturbances":[47],"(i.e.,multitones)":[48],"using":[49,124],"probabilistic":[50],"Bayesian":[51],"network":[52],"models.":[53],"For":[54,112],"the":[55,58,66,79,85,89,105,113,117,125,143],"multitone":[56,110,148],"analysis,":[57],"noisy-OR":[59,81,90,136],"model":[60,137],"was":[61,122,138],"first":[62],"identify":[65],"type":[67],"causal":[69,94],"interactions":[70],"between":[71,96],"simultaneously":[72,97],"occurring":[73,98],"single-tones.":[74],"Probabilistic":[75],"theories":[76],"derived":[77],"from":[78,151],"recursive":[80,135],"model,":[82],"which":[83],"inherits":[84],"independence":[86],"assumptions":[87],"any":[92],"known":[93],"dependence":[95],"single-tones,":[99],"then":[101],"predict":[104],"probability":[106,118,130],"higher":[108],"order":[109],"failures.":[111],"studies,":[116],"three-tone":[120],"failures":[121],"estimated":[123],"two-tone":[128],"failure":[129,149],"values.":[131],"An":[132],"improved":[133],"adaptive":[134],"also":[139],"proposed":[140],"overcome":[142],"practical":[144],"difficulties":[145],"obtaining":[147],"probabilities,":[150],"either":[152],"simulations":[153],"or":[154],"measurements.":[155]},"counts_by_year":[{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":2}],"updated_date":"2026-10-25T09:29:13.331239","created_date":"2022-10-20T00:00:00"}