{"id":"https://openalex.org/W4293869332","doi":"https://doi.org/10.1109/icd53806.2022.9863226","title":"Statistical analysis techniques for Partial Discharges measurement under DC voltage","display_name":"Statistical analysis techniques for Partial Discharges measurement under DC voltage","publication_year":2022,"publication_date":"2022-07-03","ids":{"openalex":"https://openalex.org/W4293869332","doi":"https://doi.org/10.1109/icd53806.2022.9863226"},"language":"en","primary_location":{"id":"doi:10.1109/icd53806.2022.9863226","doi":"https://doi.org/10.1109/icd53806.2022.9863226","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icd53806.2022.9863226","pdf_url":null,"source":{"id":"https://openalex.org/S4363607955","display_name":"IEEE International Conference on Dielectrics (ICD)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE 4th International Conference on Dielectrics (ICD)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5091226243","display_name":"Alessio Di Fatta","orcid":"https://orcid.org/0000-0001-9507-654X","observed_orcids":["https://orcid.org/0000-0001-9507-654X"]},"institutions":[{"id":"https://openalex.org/I900890020","display_name":"University of Palermo","ror":"https://ror.org/044k9ta02","country_code":"IT","type":"education","lineage":["https://openalex.org/I900890020"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Alessio Di Fatta","raw_affiliation_strings":["University of Palermo,L.E.PR.E. H.V. Laboratory,Department of Engineering,Italy","Department of Engineering, L.E.PR.E. H.V. Laboratory, University of Palermo, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Palermo,L.E.PR.E. H.V. Laboratory,Department of Engineering,Italy","institution_ids":["https://openalex.org/I900890020"]},{"raw_affiliation_string":"Department of Engineering, L.E.PR.E. H.V. Laboratory, University of Palermo, Italy","institution_ids":["https://openalex.org/I900890020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004499605","display_name":"Pietro Romano","orcid":"https://orcid.org/0000-0002-8482-9144","observed_orcids":["https://orcid.org/0000-0002-8482-9144"]},"institutions":[{"id":"https://openalex.org/I900890020","display_name":"University of Palermo","ror":"https://ror.org/044k9ta02","country_code":"IT","type":"education","lineage":["https://openalex.org/I900890020"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Pietro Romano","raw_affiliation_strings":["University of Palermo,L.E.PR.E. H.V. Laboratory,Department of Engineering,Italy","Department of Engineering, L.E.PR.E. H.V. Laboratory, University of Palermo, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Palermo,L.E.PR.E. H.V. Laboratory,Department of Engineering,Italy","institution_ids":["https://openalex.org/I900890020"]},{"raw_affiliation_string":"Department of Engineering, L.E.PR.E. H.V. Laboratory, University of Palermo, Italy","institution_ids":["https://openalex.org/I900890020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011554355","display_name":"Antonino Imburgia","orcid":"https://orcid.org/0000-0001-5983-0883","observed_orcids":["https://orcid.org/0000-0001-5983-0883"]},"institutions":[{"id":"https://openalex.org/I900890020","display_name":"University of Palermo","ror":"https://ror.org/044k9ta02","country_code":"IT","type":"education","lineage":["https://openalex.org/I900890020"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Antonino Imburgia","raw_affiliation_strings":["University of Palermo,L.E.PR.E. H.V. Laboratory,Department of Engineering,Italy","Department of Engineering, L.E.PR.E. H.V. Laboratory, University of Palermo, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Palermo,L.E.PR.E. H.V. Laboratory,Department of Engineering,Italy","institution_ids":["https://openalex.org/I900890020"]},{"raw_affiliation_string":"Department of Engineering, L.E.PR.E. H.V. Laboratory, University of Palermo, Italy","institution_ids":["https://openalex.org/I900890020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041117804","display_name":"Giuseppe Rizzo","orcid":"https://orcid.org/0000-0002-2787-5531","observed_orcids":["https://orcid.org/0000-0002-2787-5531"]},"institutions":[{"id":"https://openalex.org/I4210095782","display_name":"Prysmian Group (Italy)","ror":"https://ror.org/01kh3en48","country_code":"IT","type":"company","lineage":["https://openalex.org/I4210095782"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Giuseppe Rizzo","raw_affiliation_strings":["Prysmian Electronics, Palermo, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Prysmian Electronics, Palermo, Italy","institution_ids":["https://openalex.org/I4210095782"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071923848","display_name":"Vincenzo Li Vigni","orcid":"https://orcid.org/0000-0002-6879-0200","observed_orcids":["https://orcid.org/0000-0002-6879-0200"]},"institutions":[{"id":"https://openalex.org/I4210095782","display_name":"Prysmian Group (Italy)","ror":"https://ror.org/01kh3en48","country_code":"IT","type":"company","lineage":["https://openalex.org/I4210095782"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Vincenzo Li Vigni","raw_affiliation_strings":["Prysmian Electronics, Palermo, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Prysmian Electronics, Palermo, Italy","institution_ids":["https://openalex.org/I4210095782"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012417346","display_name":"Marco Albertini","orcid":"https://orcid.org/0000-0003-3490-473X","observed_orcids":["https://orcid.org/0000-0003-3490-473X"]},"institutions":[{"id":"https://openalex.org/I4210095782","display_name":"Prysmian Group (Italy)","ror":"https://ror.org/01kh3en48","country_code":"IT","type":"company","lineage":["https://openalex.org/I4210095782"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Marco Albertini","raw_affiliation_strings":["Prysmian Group, Milan, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Prysmian Group, Milan, Italy","institution_ids":["https://openalex.org/I4210095782"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5050419938","display_name":"Stefano Franchi Bononi","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210095782","display_name":"Prysmian Group (Italy)","ror":"https://ror.org/01kh3en48","country_code":"IT","type":"company","lineage":["https://openalex.org/I4210095782"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Stefano Franchi Bononi","raw_affiliation_strings":["Prysmian Group, Milan, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Prysmian Group, Milan, Italy","institution_ids":["https://openalex.org/I4210095782"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.7771,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.57455919,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":93,"max":95},"biblio":{"volume":"19","issue":null,"first_page":"344","last_page":"347"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9843999743461609,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9843999743461609,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.002099999925121665,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.0010000000474974513,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/partial-discharge","display_name":"partial discharge","score":0.9509999752044678},{"id":"https://openalex.org/keywords/dc-voltage","display_name":"DC voltage","score":0.7860000133514404},{"id":"https://openalex.org/keywords/hvdc-systems","display_name":"HVDC systems","score":0.9539999961853027},{"id":"https://openalex.org/keywords/time-frequency-maps","display_name":"time-frequency maps","score":0.8289999961853027},{"id":"https://openalex.org/keywords/density-based-clustering","display_name":"density-based clustering","score":0.9959999918937683},{"id":"https://openalex.org/keywords/noise-rejection","display_name":"noise rejection","score":0.953000009059906}],"concepts":[{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5379972457885742},{"id":"https://openalex.org/C130143024","wikidata":"https://www.wikidata.org/wiki/Q1929972","display_name":"Partial discharge","level":3,"score":0.5359625816345215},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.43866637349128723},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4307636618614197},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.34235507249832153},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3283756971359253},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2242169976234436}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/icd53806.2022.9863226","doi":"https://doi.org/10.1109/icd53806.2022.9863226","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icd53806.2022.9863226","pdf_url":null,"source":{"id":"https://openalex.org/S4363607955","display_name":"IEEE International Conference on Dielectrics (ICD)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE 4th International Conference on Dielectrics (ICD)","raw_type":"proceedings-article"},{"id":"pmh:oai:iris.unipa.it:10447/569645","doi":null,"is_oa":false,"landing_page_url":"http://hdl.handle.net/10447/569645","pdf_url":null,"source":{"id":"https://openalex.org/S4306401065","display_name":"Nova Science Publishers (Nova Science Publishers, Inc.)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/bookPart"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1527701214","https://openalex.org/W1673310716","https://openalex.org/W1945855309","https://openalex.org/W2000511252","https://openalex.org/W2121685735","https://openalex.org/W2188563164","https://openalex.org/W2736175750","https://openalex.org/W2916741935","https://openalex.org/W3210570594"],"related_works":["https://openalex.org/W4312036044","https://openalex.org/W4386174039","https://openalex.org/W2745177180","https://openalex.org/W2101373115","https://openalex.org/W2121685735","https://openalex.org/W2130360612","https://openalex.org/W2072294052","https://openalex.org/W2569236848","https://openalex.org/W7002421194","https://openalex.org/W4414124430"],"abstract_inverted_index":{"Partial":[0],"discharges":[1],"(PD)":[2],"phenomenon":[3],"for":[4,30,56],"HVAC":[5],"(High-Voltage-Alternating-Current)":[6],"systems":[7,47],"has":[8,19],"already":[9],"been":[10,20],"widely":[11],"studied":[12],"in":[13],"literature":[14],"and":[15,32,96],"from":[16,64],"this":[17,60,87],"it":[18],"possible":[21,90],"to":[22,91],"produce":[23],"a":[24,78,93],"regulatory":[25],"document":[26],"that":[27],"provides":[28],"indications":[29],"description":[31],"identification":[33],"of":[34,38,44,52,100],"the":[35,41,50,73],"different":[36,101],"types":[37],"discharges.":[39],"However,":[40],"growing":[42],"diffusion":[43],"HVDC":[45],"(High-Voltage-Direct-Current)":[46],"makes":[48],"necessary":[49],"development":[51],"analysis":[53],"techniques":[54],"also":[55],"DC":[57,68],"case.":[58],"In":[59],"paper":[61],"data":[62],"obtained":[63],"PD":[65,98],"measurement":[66],"under":[67],"voltage":[69],"were":[70],"analyzed":[71],"through":[72],"time-frequency":[74],"map":[75],"combined":[76],"with":[77,86],"density-based":[79],"clustering":[80],"algorithm.":[81],"The":[82],"results":[83],"show":[84],"that,":[85],"approach,":[88],"it\u2019s":[89],"perform":[92],"noise":[94],"rejection":[95],"recognize":[97],"pulses":[99],"sources.":[102]},"counts_by_year":[{"year":2023,"cited_by_count":2}],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2022-09-01T00:00:00"}