{"id":"https://openalex.org/W4288768972","doi":"https://doi.org/10.2139/ssrn.4175946","title":"A Novel Slight-Tilt Measure Method Based on Dynamic Vernier Effect Using Dual Fabry-Perot Interferometers on Vertical Cantilever Beam","display_name":"A Novel Slight-Tilt Measure Method Based on Dynamic Vernier Effect Using Dual Fabry-Perot Interferometers on Vertical Cantilever Beam","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4288768972","doi":"https://doi.org/10.2139/ssrn.4175946"},"language":"en","primary_location":{"id":"doi:10.2139/ssrn.4175946","doi":"https://doi.org/10.2139/ssrn.4175946","is_oa":true,"landing_page_url":"https://doi.org/10.2139/ssrn.4175946","pdf_url":null,"source":{"id":"https://openalex.org/S4210172589","display_name":"SSRN Electronic Journal","issn_l":"1556-5068","issn":["1556-5068"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I1318003438","host_organization_name":"RELX Group (Netherlands)","host_organization_lineage":["https://openalex.org/I1318003438"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SSRN Electronic Journal","raw_type":"journal-article"},"volume":null,"type":"preprint","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://doi.org/10.2139/ssrn.4175946","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100747790","display_name":"Songyang Zhang","orcid":"https://orcid.org/0000-0002-0008-609X","observed_orcids":["https://orcid.org/0000-0002-0008-609X"]},"institutions":[{"id":"https://openalex.org/I91125648","display_name":"Wuhan Institute of Technology","ror":"https://ror.org/04jcykh16","country_code":"CN","type":"education","lineage":["https://openalex.org/I91125648"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Songyang Zhang","raw_affiliation_strings":["Wuhan Institute of Technology","Wuhan Institute of Technology, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Wuhan Institute of Technology","institution_ids":["https://openalex.org/I91125648"]},{"raw_affiliation_string":"Wuhan Institute of Technology, China","institution_ids":["https://openalex.org/I91125648"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100424629","display_name":"Shun Wang","orcid":"https://orcid.org/0000-0003-4795-2087","observed_orcids":["https://orcid.org/0000-0003-4795-2087"]},"institutions":[{"id":"https://openalex.org/I91125648","display_name":"Wuhan Institute of Technology","ror":"https://ror.org/04jcykh16","country_code":"CN","type":"education","lineage":["https://openalex.org/I91125648"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Shun Wang","raw_affiliation_strings":["Wuhan Institute of Technology","Wuhan Institute of Technology, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Wuhan Institute of Technology","institution_ids":["https://openalex.org/I91125648"]},{"raw_affiliation_string":"Wuhan Institute of Technology, China","institution_ids":["https://openalex.org/I91125648"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090705028","display_name":"Panting Niu","orcid":"https://orcid.org/0000-0001-5703-7689","observed_orcids":["https://orcid.org/0000-0001-5703-7689"]},"institutions":[{"id":"https://openalex.org/I91125648","display_name":"Wuhan Institute of Technology","ror":"https://ror.org/04jcykh16","country_code":"CN","type":"education","lineage":["https://openalex.org/I91125648"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Panting Niu","raw_affiliation_strings":["Wuhan Institute of Technology","Wuhan Institute of Technology, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Wuhan Institute of Technology","institution_ids":["https://openalex.org/I91125648"]},{"raw_affiliation_string":"Wuhan Institute of Technology, China","institution_ids":["https://openalex.org/I91125648"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054866654","display_name":"Jiyin Cao","orcid":"https://orcid.org/0000-0003-0227-3697","observed_orcids":["https://orcid.org/0000-0003-0227-3697"]},"institutions":[{"id":"https://openalex.org/I91125648","display_name":"Wuhan Institute of Technology","ror":"https://ror.org/04jcykh16","country_code":"CN","type":"education","lineage":["https://openalex.org/I91125648"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiyin Cao","raw_affiliation_strings":["Wuhan Institute of Technology","Wuhan Institute of Technology, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Wuhan Institute of Technology","institution_ids":["https://openalex.org/I91125648"]},{"raw_affiliation_string":"Wuhan Institute of Technology, China","institution_ids":["https://openalex.org/I91125648"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5100424629"],"corresponding_institution_ids":["https://openalex.org/I91125648"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10205","display_name":"Advanced Fiber Optic Sensors","score":0.6596999764442444,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10205","display_name":"Advanced Fiber Optic Sensors","score":0.6596999764442444,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.1348000019788742,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.12700000405311584,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/tilt-measurement","display_name":"tilt measurement","score":0.6980000138282776},{"id":"https://openalex.org/keywords/strain-sensing","display_name":"strain sensing","score":0.4350000023841858},{"id":"https://openalex.org/keywords/cavity-length-variation","display_name":"cavity length variation","score":0.625},{"id":"https://openalex.org/keywords/inclinometer","display_name":"inclinometer","score":0.746999979019165},{"id":"https://openalex.org/keywords/structural-deformation-monitoring","display_name":"structural deformation monitoring","score":0.8949999809265137},{"id":"https://openalex.org/keywords/temperature-insensitivity","display_name":"temperature insensitivity","score":0.9259999990463257}],"concepts":[{"id":"https://openalex.org/C69710193","wikidata":"https://www.wikidata.org/wiki/Q14946576","display_name":"Vernier scale","level":2,"score":0.8699873685836792},{"id":"https://openalex.org/C141354745","wikidata":"https://www.wikidata.org/wiki/Q17227","display_name":"Cantilever","level":2,"score":0.8592764139175415},{"id":"https://openalex.org/C169268690","wikidata":"https://www.wikidata.org/wiki/Q1359945","display_name":"Fabry\u2013P\u00e9rot interferometer","level":3,"score":0.8128789067268372},{"id":"https://openalex.org/C2779844322","wikidata":"https://www.wikidata.org/wiki/Q2919140","display_name":"Tilt (camera)","level":2,"score":0.7938902378082275},{"id":"https://openalex.org/C23576306","wikidata":"https://www.wikidata.org/wiki/Q17004698","display_name":"Astronomical interferometer","level":3,"score":0.6631940603256226},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.657192587852478},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.6388884782791138},{"id":"https://openalex.org/C2780980858","wikidata":"https://www.wikidata.org/wiki/Q110022","display_name":"Dual (grammatical number)","level":2,"score":0.6317094564437866},{"id":"https://openalex.org/C168834538","wikidata":"https://www.wikidata.org/wiki/Q3705329","display_name":"Beam (structure)","level":2,"score":0.4620235860347748},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4002763032913208},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.394302099943161},{"id":"https://openalex.org/C166689943","wikidata":"https://www.wikidata.org/wiki/Q850283","display_name":"Interferometry","level":2,"score":0.33686962723731995},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.16231560707092285},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1494770646095276},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.1483028531074524},{"id":"https://openalex.org/C6260449","wikidata":"https://www.wikidata.org/wiki/Q41364","display_name":"Wavelength","level":2,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C124952713","wikidata":"https://www.wikidata.org/wiki/Q8242","display_name":"Literature","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.2139/ssrn.4175946","doi":"https://doi.org/10.2139/ssrn.4175946","is_oa":true,"landing_page_url":"https://doi.org/10.2139/ssrn.4175946","pdf_url":null,"source":{"id":"https://openalex.org/S4210172589","display_name":"SSRN Electronic Journal","issn_l":"1556-5068","issn":["1556-5068"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I1318003438","host_organization_name":"RELX Group (Netherlands)","host_organization_lineage":["https://openalex.org/I1318003438"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SSRN Electronic Journal","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.2139/ssrn.4175946","doi":"https://doi.org/10.2139/ssrn.4175946","is_oa":true,"landing_page_url":"https://doi.org/10.2139/ssrn.4175946","pdf_url":null,"source":{"id":"https://openalex.org/S4210172589","display_name":"SSRN Electronic Journal","issn_l":"1556-5068","issn":["1556-5068"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I1318003438","host_organization_name":"RELX Group (Netherlands)","host_organization_lineage":["https://openalex.org/I1318003438"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SSRN Electronic Journal","raw_type":"journal-article"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":35,"referenced_works":["https://openalex.org/W2009529702","https://openalex.org/W2016009744","https://openalex.org/W2032520695","https://openalex.org/W2039184193","https://openalex.org/W2043310028","https://openalex.org/W2067951898","https://openalex.org/W2068957297","https://openalex.org/W2129016298","https://openalex.org/W2158584109","https://openalex.org/W2165584003","https://openalex.org/W2566954347","https://openalex.org/W2772317219","https://openalex.org/W2785467113","https://openalex.org/W2790559521","https://openalex.org/W2895372596","https://openalex.org/W2897535180","https://openalex.org/W2901393292","https://openalex.org/W2914039640","https://openalex.org/W2943520408","https://openalex.org/W2948688154","https://openalex.org/W2955366020","https://openalex.org/W3000319006","https://openalex.org/W3004492792","https://openalex.org/W3007201217","https://openalex.org/W3048111744","https://openalex.org/W3097442856","https://openalex.org/W3111885280","https://openalex.org/W3114173643","https://openalex.org/W3124776816","https://openalex.org/W3160541656","https://openalex.org/W3166551432","https://openalex.org/W3193372225","https://openalex.org/W3203915915","https://openalex.org/W4200247053","https://openalex.org/W4205817485"],"related_works":["https://openalex.org/W2895372596","https://openalex.org/W4392267240","https://openalex.org/W3009059172","https://openalex.org/W2790559521","https://openalex.org/W3004492792","https://openalex.org/W3135500652","https://openalex.org/W4402978322","https://openalex.org/W4399526328","https://openalex.org/W2765241072","https://openalex.org/W2905484366"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2022-07-30T00:00:00"}