{"id":"https://openalex.org/W4287846865","doi":"https://doi.org/10.1109/eic51169.2022.9833181","title":"Condition Assessments of 50-Year Old Low Voltage Power Cables","display_name":"Condition Assessments of 50-Year Old Low Voltage Power Cables","publication_year":2022,"publication_date":"2022-06-19","ids":{"openalex":"https://openalex.org/W4287846865","doi":"https://doi.org/10.1109/eic51169.2022.9833181"},"language":"en","primary_location":{"id":"doi:10.1109/eic51169.2022.9833181","doi":"https://doi.org/10.1109/eic51169.2022.9833181","is_oa":false,"landing_page_url":"https://doi.org/10.1109/eic51169.2022.9833181","pdf_url":null,"source":{"id":"https://openalex.org/S7407086244","display_name":"IEEE Electrical Insulation Conference (EIC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE Electrical Insulation Conference (EIC)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5026650387","display_name":"Trevor A. Toll","orcid":"https://orcid.org/0000-0002-6587-6383","observed_orcids":["https://orcid.org/0000-0002-6587-6383"]},"institutions":[{"id":"https://openalex.org/I4210149181","display_name":"Analysis and Measurement Services (United States)","ror":"https://ror.org/056s1k160","country_code":"US","type":"company","lineage":["https://openalex.org/I4210149181"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Trevor A. Toll","raw_affiliation_strings":["Analysis and Measurement Services Corporation, Knoxville, TN, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Analysis and Measurement Services Corporation, Knoxville, TN, USA","institution_ids":["https://openalex.org/I4210149181"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042852538","display_name":"Patrick R. Ward","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210149181","display_name":"Analysis and Measurement Services (United States)","ror":"https://ror.org/056s1k160","country_code":"US","type":"company","lineage":["https://openalex.org/I4210149181"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Patrick R. Ward","raw_affiliation_strings":["Analysis and Measurement Services Corporation, Knoxville, TN, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Analysis and Measurement Services Corporation, Knoxville, TN, USA","institution_ids":["https://openalex.org/I4210149181"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024066285","display_name":"Codi R. Ferree","orcid":"https://orcid.org/0000-0001-6133-4416","observed_orcids":["https://orcid.org/0000-0001-6133-4416"]},"institutions":[{"id":"https://openalex.org/I4210149181","display_name":"Analysis and Measurement Services (United States)","ror":"https://ror.org/056s1k160","country_code":"US","type":"company","lineage":["https://openalex.org/I4210149181"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Codi R. Ferree","raw_affiliation_strings":["Analysis and Measurement Services Corporation, Knoxville, TN, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Analysis and Measurement Services Corporation, Knoxville, TN, USA","institution_ids":["https://openalex.org/I4210149181"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047720625","display_name":"Patrick N. Ellis","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210149181","display_name":"Analysis and Measurement Services (United States)","ror":"https://ror.org/056s1k160","country_code":"US","type":"company","lineage":["https://openalex.org/I4210149181"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Patrick N. Ellis","raw_affiliation_strings":["Analysis and Measurement Services Corporation, Knoxville, TN, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Analysis and Measurement Services Corporation, Knoxville, TN, USA","institution_ids":["https://openalex.org/I4210149181"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5032369427","display_name":"Casey D. Sexton","orcid":"https://orcid.org/0000-0002-8193-5857","observed_orcids":["https://orcid.org/0000-0002-8193-5857"]},"institutions":[{"id":"https://openalex.org/I4210149181","display_name":"Analysis and Measurement Services (United States)","ror":"https://ror.org/056s1k160","country_code":"US","type":"company","lineage":["https://openalex.org/I4210149181"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Casey D. Sexton","raw_affiliation_strings":["Analysis and Measurement Services Corporation, Knoxville, TN, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Analysis and Measurement Services Corporation, Knoxville, TN, USA","institution_ids":["https://openalex.org/I4210149181"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210149181"],"apc_list":null,"apc_paid":null,"fwci":0.3923,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.43337581,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":93},"biblio":{"volume":null,"issue":null,"first_page":"50","last_page":"53"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9937000274658203,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9937000274658203,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.002899999963119626,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13171","display_name":"Polymer Science and PVC","score":0.0017000000225380063,"subfield":{"id":"https://openalex.org/subfields/2507","display_name":"Polymers and Plastics"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/low-voltage-power-cables","display_name":"low-voltage power cables","score":0.9819999933242798},{"id":"https://openalex.org/keywords/cable-insulation-degradation","display_name":"cable insulation degradation","score":0.8619999885559082},{"id":"https://openalex.org/keywords/root-cause-analysis","display_name":"root cause analysis","score":0.7360000014305115},{"id":"https://openalex.org/keywords/thermal-stability","display_name":"thermal stability","score":0.5649999976158142},{"id":"https://openalex.org/keywords/mechanical-properties","display_name":"mechanical properties","score":0.6259999871253967},{"id":"https://openalex.org/keywords/chemical-degradation","display_name":"chemical degradation","score":0.5830000042915344}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6744369268417358},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.6291435360908508},{"id":"https://openalex.org/C58396970","wikidata":"https://www.wikidata.org/wiki/Q212749","display_name":"Cracking","level":2,"score":0.56564861536026},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.500432014465332},{"id":"https://openalex.org/C160892712","wikidata":"https://www.wikidata.org/wiki/Q901559","display_name":"Fourier transform infrared spectroscopy","level":2,"score":0.4731862545013428},{"id":"https://openalex.org/C521977710","wikidata":"https://www.wikidata.org/wiki/Q81163","display_name":"Polymer","level":2,"score":0.42233315110206604},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.41014382243156433},{"id":"https://openalex.org/C77595967","wikidata":"https://www.wikidata.org/wiki/Q3151013","display_name":"Forensic engineering","level":1,"score":0.39749136567115784},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.21193784475326538},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10323503613471985},{"id":"https://openalex.org/C42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","level":1,"score":0.0997593104839325}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/eic51169.2022.9833181","doi":"https://doi.org/10.1109/eic51169.2022.9833181","is_oa":false,"landing_page_url":"https://doi.org/10.1109/eic51169.2022.9833181","pdf_url":null,"source":{"id":"https://openalex.org/S7407086244","display_name":"IEEE Electrical Insulation Conference (EIC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE Electrical Insulation Conference (EIC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.5378999710083008,"id":"https://metadata.un.org/sdg/9"}],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W2060422862","https://openalex.org/W3144588033"],"related_works":["https://openalex.org/W7062361780","https://openalex.org/W4415406731","https://openalex.org/W3144588033","https://openalex.org/W7206167950","https://openalex.org/W4238177721","https://openalex.org/W4413354523","https://openalex.org/W7220324935","https://openalex.org/W1501725888","https://openalex.org/W4285013015","https://openalex.org/W2563449076"],"abstract_inverted_index":{"This":[0,136],"paper":[1],"presents":[2],"the":[3,36,43,74,111,123,129,132,160,164,181,193,197],"results":[4,66,175],"of":[5,22,35,42,67,73,79,89,97,105,122,131,159,163,176],"laboratory":[6,29,139],"condition":[7,112],"assessments":[8,178],"conducted":[9,119],"for":[10,120],"six":[11,75],"low":[12,91],"voltage":[13],"power":[14],"cables":[15,76,126],"removed":[16],"from":[17],"service":[18,194],"after":[19],"50":[20],"years":[21],"operation":[23],"in":[24,167,184],"an":[25,32,157],"industrial":[26],"facility.":[27,198],"The":[28,65,174],"work":[30],"involved":[31,138],"in-depth":[33],"evaluation":[34,137,158],"mechanical,":[37],"thermal,":[38],"and":[39,58,61,94,142],"chemical":[40,98],"properties":[41],"cable":[44],"insulation":[45,81,134,165],"polymers":[46,166],"using":[47,144],"techniques":[48],"such":[49,146],"as":[50,102,147],"elongation":[51],"at":[52,196],"break,":[53],"oxidation":[54],"induction":[55],"temperature,":[56],"visual":[57],"microscope":[59],"inspections,":[60],"Fourier-transform":[62],"infrared":[63],"spectroscopy.":[64,154],"this":[68],"testing":[69],"revealed":[70,179],"that":[71,100,180],"four":[72,124],"exhibited":[77],"evidence":[78],"substantial":[80],"degradation":[82,182],"including":[83],"poor":[84],"mechanical":[85],"properties,":[86],"significant":[87],"amounts":[88],"cracking,":[90],"thermal":[92],"stability,":[93],"high":[95],"concentrations":[96],"compounds":[99],"form":[101],"a":[103,114],"result":[104],"age-related":[106],"degradation.":[107,135],"In":[108,155],"addition":[109],"to":[110,127,192],"assessments,":[113],"root":[115],"cause":[116],"analysis":[117,143],"was":[118,172,187],"two":[121],"degraded":[125],"identify":[128],"source":[130],"extensive":[133],"materials":[140,186],"characterization":[141],"tests":[145],"scanning":[148],"electron":[149],"microscopy":[150],"with":[151],"energy":[152],"dispersive":[153],"addition,":[156],"operating":[161,170],"lifetime":[162],"their":[168],"nominal":[169],"environment":[171],"performed.":[173],"these":[177,185],"observed":[183],"caused":[188],"by":[189],"long-term":[190],"exposure":[191],"conditions":[195]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-10-30T12:39:25.321706","created_date":"2022-07-26T00:00:00"}