{"id":"https://openalex.org/W4286377481","doi":"https://doi.org/10.1109/tim.2022.3193172","title":"Measurement Uncertainty in Voltage Coefficients for Compressed-Gas Capacitor Based on a Simplified Tilting Method","display_name":"Measurement Uncertainty in Voltage Coefficients for Compressed-Gas Capacitor Based on a Simplified Tilting Method","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4286377481","doi":"https://doi.org/10.1109/tim.2022.3193172"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2022.3193172","doi":"https://doi.org/10.1109/tim.2022.3193172","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3193172","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-3","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5074000379","display_name":"Huanghui Zhang","orcid":"https://orcid.org/0000-0003-3412-6763","observed_orcids":["https://orcid.org/0000-0003-3412-6763"]},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huanghui Zhang","raw_affiliation_strings":["School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-3412-6763","affiliations":[{"raw_affiliation_string":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001452215","display_name":"Haiming Shao","orcid":"https://orcid.org/0000-0002-3305-4190","observed_orcids":["https://orcid.org/0000-0002-3305-4190"]},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haiming Shao","raw_affiliation_strings":["National Institute of Metrology, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-3305-4190","affiliations":[{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100765811","display_name":"Jiafu Wang","orcid":"https://orcid.org/0000-0003-1092-5712","observed_orcids":["https://orcid.org/0000-0003-1092-5712"]},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiafu Wang","raw_affiliation_strings":["National Institute of Metrology, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-1092-5712","affiliations":[{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102979842","display_name":"Feipeng Lin","orcid":"https://orcid.org/0000-0002-1108-1622","observed_orcids":["https://orcid.org/0000-0002-1108-1622"]},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Feipeng Lin","raw_affiliation_strings":["National Institute of Metrology, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-1108-1622","affiliations":[{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100695572","display_name":"Wei Zhao","orcid":"https://orcid.org/0000-0002-7346-5947","observed_orcids":["https://orcid.org/0000-0002-7346-5947"]},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Zhao","raw_affiliation_strings":["National Institute of Metrology, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-7346-5947","affiliations":[{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078948815","display_name":"Chuansheng Li","orcid":"https://orcid.org/0000-0001-8045-0367","observed_orcids":["https://orcid.org/0000-0001-8045-0367"]},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chuansheng Li","raw_affiliation_strings":["National Institute of Metrology, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0001-8045-0367","affiliations":[{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015475948","display_name":"Tianyu Sun","orcid":"https://orcid.org/0000-0002-6915-4687","observed_orcids":["https://orcid.org/0000-0002-6915-4687"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Tianyu Sun","raw_affiliation_strings":["Liaoning Provincial Institute of Measurement, Shenyang, China"],"raw_orcid":"https://orcid.org/0000-0002-6915-4687","affiliations":[{"raw_affiliation_string":"Liaoning Provincial Institute of Measurement, Shenyang, China","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5090722199","display_name":"Yiqian Wu","orcid":"https://orcid.org/0000-0003-2007-742X","observed_orcids":["https://orcid.org/0000-0003-2007-742X"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yiqian Wu","raw_affiliation_strings":["Beijing Institute of Metrology, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-2007-742X","affiliations":[{"raw_affiliation_string":"Beijing Institute of Metrology, Beijing, China","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2195,"currency":"USD","value_usd":2195},"apc_paid":null,"fwci":0.5261,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.59966134,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":97},"biblio":{"volume":"71","issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.5654000043869019,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.5654000043869019,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.4081999957561493,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.007499999832361937,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/voltage-coefficient-of-capacitance","display_name":"voltage coefficient of capacitance","score":0.9399999976158142},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"measurement uncertainty","score":0.8529999852180481},{"id":"https://openalex.org/keywords/high-voltage-capacitors","display_name":"high-voltage capacitors","score":0.8600000143051147},{"id":"https://openalex.org/keywords/coaxial-cylindrical-electrodes","display_name":"coaxial cylindrical electrodes","score":0.949999988079071},{"id":"https://openalex.org/keywords/experimental-platform","display_name":"experimental platform","score":0.5490000247955322}],"concepts":[{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.7931473851203918},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.7329959273338318},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.7301064729690552},{"id":"https://openalex.org/C49324399","wikidata":"https://www.wikidata.org/wiki/Q466758","display_name":"Voltage divider","level":3,"score":0.5950849652290344},{"id":"https://openalex.org/C88182573","wikidata":"https://www.wikidata.org/wiki/Q1139740","display_name":"High voltage","level":3,"score":0.5846610069274902},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5186333060264587},{"id":"https://openalex.org/C203455917","wikidata":"https://www.wikidata.org/wiki/Q5034478","display_name":"Capacitance probe","level":4,"score":0.5090755820274353},{"id":"https://openalex.org/C51221625","wikidata":"https://www.wikidata.org/wiki/Q1751466","display_name":"Coaxial","level":2,"score":0.459989458322525},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4586576819419861},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.4372142255306244},{"id":"https://openalex.org/C23621802","wikidata":"https://www.wikidata.org/wiki/Q171486","display_name":"Reservoir capacitor","level":5,"score":0.430597186088562},{"id":"https://openalex.org/C35196352","wikidata":"https://www.wikidata.org/wiki/Q1532649","display_name":"Decoupling capacitor","level":4,"score":0.3963332772254944},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.3633238971233368},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2888370156288147},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23430243134498596},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2022.3193172","doi":"https://doi.org/10.1109/tim.2022.3193172","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3193172","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-3","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[{"id":"https://openalex.org/G8740519188","display_name":null,"funder_award_id":"2017YFF0205701","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"}],"funders":[{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1968585257","https://openalex.org/W1985139731","https://openalex.org/W1992821664","https://openalex.org/W1999935231","https://openalex.org/W2012822366","https://openalex.org/W2019514496","https://openalex.org/W2036264407","https://openalex.org/W2118324632","https://openalex.org/W2144111029","https://openalex.org/W2151143539","https://openalex.org/W2907717094","https://openalex.org/W3085044723","https://openalex.org/W4238550448"],"related_works":["https://openalex.org/W3085044723","https://openalex.org/W2151143539","https://openalex.org/W3086845807","https://openalex.org/W2907717094","https://openalex.org/W1985139731","https://openalex.org/W2036264407","https://openalex.org/W4385849941","https://openalex.org/W6912936909","https://openalex.org/W2067678302","https://openalex.org/W4285552524"],"abstract_inverted_index":{"High-voltage":[0],"compressed-gas":[1,60],"capacitor":[2,58,96,125,154,193],"is":[3,28,67,174,199,211],"a":[4,48,88,121,141,158,165],"type":[5],"of":[6,18,26,37,55,120,151,170,184,192],"precision":[7],"equipment":[8],"commonly":[9],"used":[10],"in":[11,20,187,201],"high":[12,107],"voltage":[13,16,24,53,80,108,118,149,189],"laboratories.":[14,74],"The":[15,39,94,162,203],"dependence":[17],"capacitance,":[19,27],"other":[21],"words,":[22],"the":[23,34,52,56,79,84,99,114,117,136,148,152,168,171,178,182,188,208],"coefficient":[25,54,81,119,150,190],"an":[29,69],"important":[30],"factor":[31],"to":[32,77,130],"ensure":[33],"measurement":[35,138,172,185],"accuracy":[36],"capacitors.":[38],"simplified":[40,85,196],"tilting":[41,86,197],"method":[42,139,198],"derived":[43],"from":[44],"PTB,":[45],"which":[46],"provides":[47],"solution":[49],"for":[50,72],"measuring":[51],"high-voltage":[57,95,124,143],"with":[59,140,157],"coaxial":[61],"cylindrical":[62],"electrodes":[63],"structure.":[64],"However,":[65],"it":[66,132],"not":[68],"easy":[70],"work":[71],"most":[73],"In":[75,128],"order":[76,129],"evaluate":[78],"based":[82,194],"on":[83,98,113,195],"method,":[87],"special":[89],"experimental":[90],"platform":[91,100],"was":[92,126,133,155],"developed.":[93],"installed":[97],"can":[101],"be":[102,110],"tilted":[103],"and":[104,109,145],"rotated":[105],"at":[106],"remote-controlled.":[111],"Base":[112],"developed":[115],"platform,":[116],"350":[122],"kV":[123],"measured.":[127],"verify,":[131],"re-measured":[134],"by":[135],"direct":[137],"dummy":[142,153],"capacitor,":[144],"before":[146],"that,":[147],"calibrated":[156],"near":[159],"zero-voltage-coefficient":[160],"capacitor.":[161],"results":[163,173,205],"show":[164,206],"good":[166],"agreement,":[167],"consistency":[169],"better":[175,213],"than":[176,214],"1.2\u00d710-6between":[177],"two":[179],"methods.":[180],"Furthermore,":[181],"evaluation":[183,204],"uncertainty":[186,210],"determination":[191],"introduced":[200],"detail.":[202],"that":[207],"expanded":[209],"significantly":[212],"2.0\u00d710-6,":[215],"k=2.":[216]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1}],"updated_date":"2026-11-06T12:05:46.655746","created_date":"2022-07-21T00:00:00"}