{"id":"https://openalex.org/W4285073155","doi":"https://doi.org/10.3788/irla20210297","title":"\u57fa\u4e8e\u56fe\u50cf\u7684\u6fc0\u5149\u5fae\u5c3a\u5ea6\u70e7\u8680\u8d28\u91cf\u4f30\u7b97\u65b9\u6cd5","display_name":"\u57fa\u4e8e\u56fe\u50cf\u7684\u6fc0\u5149\u5fae\u5c3a\u5ea6\u70e7\u8680\u8d28\u91cf\u4f30\u7b97\u65b9\u6cd5","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W4285073155","doi":"https://doi.org/10.3788/irla20210297"},"language":"zh","primary_location":{"id":"doi:10.3788/irla20210297","doi":"https://doi.org/10.3788/irla20210297","is_oa":false,"landing_page_url":"https://doi.org/10.3788/irla20210297","pdf_url":null,"source":{"id":"https://openalex.org/S2764734955","display_name":"Infrared and Laser Engineering","issn_l":"1007-2276","issn":["1007-2276"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["poland-40","russia-white-list-3"],"host_organization":"https://openalex.org/P4320800602","host_organization_name":"Shanghai Institute of Optics and Fine Mechanics","host_organization_lineage":["https://openalex.org/P4320800602","https://openalex.org/P4310311940"],"host_organization_lineage_names":["Shanghai Institute of Optics and Fine Mechanics","Chinese Academy of Sciences"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Infrared and Laser Engineering","raw_type":"journal-article"},"volume":null,"type":"conference-abstract","is_traditional":false,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5070302133","display_name":"\u90ed\u5a01 Guo Wei","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"\u90ed\u5a01 Guo Wei","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091683714","display_name":"\u5e38\u6d69 Chang Hao","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"\u5e38\u6d69 Chang Hao","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071072065","display_name":"Bangdeng Du","orcid":"https://orcid.org/0000-0002-6303-0077","observed_orcids":["https://orcid.org/0000-0002-6303-0077"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"\u675c\u90a6\u767b Du Bangdeng","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5039723138","display_name":"\u4e8e\u7a0b\u6d69 Yu Chenghao","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"\u4e8e\u7a0b\u6d69 Yu Chenghao","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"50","issue":"S2","first_page":"20210297","last_page":"20210297"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10732","display_name":"Laser Material Processing Techniques","score":0.9907000064849854,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10732","display_name":"Laser Material Processing Techniques","score":0.9907000064849854,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11451","display_name":"Advanced Machining and Optimization Techniques","score":0.0019000000320374966,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","score":0.0010999999940395355,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/laser-ablation","display_name":"laser ablation","score":0.7459999918937683},{"id":"https://openalex.org/keywords/image-based-measurement","display_name":"image-based measurement","score":0.7730000019073486},{"id":"https://openalex.org/keywords/laser-micromachining","display_name":"laser micromachining","score":0.6309999823570251}],"concepts":[{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.3458126187324524},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.3289833664894104}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.3788/irla20210297","doi":"https://doi.org/10.3788/irla20210297","is_oa":false,"landing_page_url":"https://doi.org/10.3788/irla20210297","pdf_url":null,"source":{"id":"https://openalex.org/S2764734955","display_name":"Infrared and Laser Engineering","issn_l":"1007-2276","issn":["1007-2276"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["poland-40","russia-white-list-3"],"host_organization":"https://openalex.org/P4320800602","host_organization_name":"Shanghai Institute of Optics and Fine Mechanics","host_organization_lineage":["https://openalex.org/P4320800602","https://openalex.org/P4310311940"],"host_organization_lineage_names":["Shanghai Institute of Optics and Fine Mechanics","Chinese Academy of Sciences"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Infrared and Laser Engineering","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2907888094","https://openalex.org/W6989475036","https://openalex.org/W4205534785","https://openalex.org/W7202363152","https://openalex.org/W2312967364","https://openalex.org/W4285073094","https://openalex.org/W2896700641","https://openalex.org/W7163975383","https://openalex.org/W2334672090","https://openalex.org/W2909133214"],"abstract_inverted_index":null,"counts_by_year":[{"year":2023,"cited_by_count":2}],"updated_date":"2026-09-26T08:19:03.415552","created_date":"2022-07-13T00:00:00"}