{"id":"https://openalex.org/W425363607","doi":null,"title":"\u8b1b\u7fa9 III-V\u65cf\u5316\u5408\u7269\u534a\u5c0e\u4f53\u8868\u9762\u53ca\u3073\u786b\u9ec4\u51e6\u7406\u8868\u9762\u5206\u6790--\u7d44\u6210\u3001\u69cb\u9020\u3001\u96fb\u5b50\u72b6\u614b","display_name":"\u8b1b\u7fa9 III-V\u65cf\u5316\u5408\u7269\u534a\u5c0e\u4f53\u8868\u9762\u53ca\u3073\u786b\u9ec4\u51e6\u7406\u8868\u9762\u5206\u6790--\u7d44\u6210\u3001\u69cb\u9020\u3001\u96fb\u5b50\u72b6\u614b","publication_year":2003,"publication_date":"2003-02-01","ids":{"openalex":"https://openalex.org/W425363607","mag":"425363607"},"language":"ja","primary_location":{"id":"mag:425363607","doi":null,"is_oa":false,"landing_page_url":"http://ci.nii.ac.jp/naid/40005792417","pdf_url":null,"source":{"id":"https://openalex.org/S198286467","display_name":"Journal of Surface Analysis","issn_l":"1341-1756","issn":["1341-1756","1347-8400"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":"Journal of Surface Analysis","raw_type":null},"volume":null,"type":"article","is_traditional":true,"indexed_in":[],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5053682780","display_name":"\u5b89\u751f \u798f\u7530","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"\u5b89\u751f \u798f\u7530","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080198285","display_name":"\u52dd \u4e0b\u6751","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"\u52dd \u4e0b\u6751","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5058915927","display_name":"\u5247\u660e \u771e\u7530","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"\u5247\u660e \u771e\u7530","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.04084507,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"10","issue":"1","first_page":"58","last_page":"61"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.5303000211715698,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.5303000211715698,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.18209999799728394,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12166","display_name":"Ion-surface interactions and analysis","score":0.1371999979019165,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/iii-v-semiconductors","display_name":"III-V semiconductors","score":0.953000009059906},{"id":"https://openalex.org/keywords/semiconductor-surfaces","display_name":"semiconductor surfaces","score":0.9419999718666077},{"id":"https://openalex.org/keywords/sulfur-passivation","display_name":"sulfur passivation","score":0.7160000205039978},{"id":"https://openalex.org/keywords/surface-composition","display_name":"surface composition","score":0.878000020980835},{"id":"https://openalex.org/keywords/surface-structure","display_name":"surface structure","score":0.9779999852180481},{"id":"https://openalex.org/keywords/electronic-states","display_name":"electronic states","score":0.7429999709129333},{"id":"https://openalex.org/keywords/surface-analysis","display_name":"surface analysis","score":0.7990000247955322}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.33671241998672485}],"mesh":[],"locations_count":1,"locations":[{"id":"mag:425363607","doi":null,"is_oa":false,"landing_page_url":"http://ci.nii.ac.jp/naid/40005792417","pdf_url":null,"source":{"id":"https://openalex.org/S198286467","display_name":"Journal of Surface Analysis","issn_l":"1341-1756","issn":["1341-1756","1347-8400"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":"Journal of Surface Analysis","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W3119527569","https://openalex.org/W382770854","https://openalex.org/W2998804775","https://openalex.org/W1648406917","https://openalex.org/W2470107480","https://openalex.org/W2156918076","https://openalex.org/W585097297","https://openalex.org/W1582961653","https://openalex.org/W2313348800","https://openalex.org/W560659076"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-09-25T08:18:29.962427","created_date":"2016-06-24T00:00:00"}