{"id":"https://openalex.org/W4252000935","doi":"https://doi.org/10.2495/feem140451","title":"A new BIST scheme with encoding logic to achieve complete fault coverage","display_name":"A new BIST scheme with encoding logic to achieve complete fault coverage","publication_year":2015,"publication_date":"2015-02-07","ids":{"openalex":"https://openalex.org/W4252000935","doi":"https://doi.org/10.2495/feem140451"},"language":"en","primary_location":{"id":"doi:10.2495/feem140451","doi":"https://doi.org/10.2495/feem140451","is_oa":false,"landing_page_url":"https://doi.org/10.2495/feem140451","pdf_url":null,"source":{"id":"https://openalex.org/S2764928088","display_name":"WIT transactions on engineering sciences","issn_l":"1743-3533","issn":["1743-3533","1746-4471"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310311589","host_organization_name":"WIT Press","host_organization_lineage":["https://openalex.org/P4310311589"],"host_organization_lineage_names":["WIT Press"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"WIT Transactions on Engineering Sciences","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100450759","display_name":"Ling Zhang","orcid":"https://orcid.org/0000-0003-0708-0894","observed_orcids":["https://orcid.org/0000-0003-0708-0894"]},"institutions":[{"id":"https://openalex.org/I4210122157","display_name":"Hubei Polytechnic University","ror":"https://ror.org/01z07eq06","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210122157"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ling Zhang","raw_affiliation_strings":["School of Computer, Hubei Polytechnic University, Huangshi, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Computer, Hubei Polytechnic University, Huangshi, China","institution_ids":["https://openalex.org/I4210122157"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047595007","display_name":"Mei Junjin","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210122157","display_name":"Hubei Polytechnic University","ror":"https://ror.org/01z07eq06","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210122157"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Junjin Mei","raw_affiliation_strings":["School of Computer, Hubei Polytechnic University, Huangshi, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Computer, Hubei Polytechnic University, Huangshi, China","institution_ids":["https://openalex.org/I4210122157"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100771420","display_name":"Guanzhong Wang","orcid":"https://orcid.org/0009-0000-8144-1892","observed_orcids":["https://orcid.org/0009-0000-8144-1892","https://orcid.org/0000-0003-3287-0740"]},"institutions":[{"id":"https://openalex.org/I4210122157","display_name":"Hubei Polytechnic University","ror":"https://ror.org/01z07eq06","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210122157"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guan-zhong Wang","raw_affiliation_strings":["School of Computer, Hubei Polytechnic University, Huangshi, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Computer, Hubei Polytechnic University, Huangshi, China","institution_ids":["https://openalex.org/I4210122157"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5038272969","display_name":"Tonghan Li","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210122157","display_name":"Hubei Polytechnic University","ror":"https://ror.org/01z07eq06","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210122157"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tonghan Li","raw_affiliation_strings":["School of Computer, Hubei Polytechnic University, Huangshi, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Computer, Hubei Polytechnic University, Huangshi, China","institution_ids":["https://openalex.org/I4210122157"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210122157"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"1","issue":null,"first_page":"357","last_page":"364"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"built-in self-test","score":0.972000002861023},{"id":"https://openalex.org/keywords/test-application-time","display_name":"test application time","score":0.6079999804496765},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"fault coverage","score":0.9290000200271606},{"id":"https://openalex.org/keywords/stuck-at-faults","display_name":"stuck-at faults","score":0.9559999704360962},{"id":"https://openalex.org/keywords/test-vector-generation","display_name":"test vector generation","score":0.6520000100135803},{"id":"https://openalex.org/keywords/digital-circuit-testing","display_name":"digital circuit testing","score":0.7260000109672546},{"id":"https://openalex.org/keywords/design-for-testability","display_name":"design for testability","score":0.8309999704360962}],"concepts":[{"id":"https://openalex.org/C125411270","wikidata":"https://www.wikidata.org/wiki/Q18653","display_name":"Encoding (memory)","level":2,"score":0.7478749752044678},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6765564680099487},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.6679667234420776},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.4767269194126129},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.47442951798439026},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.45899254083633423},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.45863497257232666},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.355551540851593},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.32500797510147095},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.32314246892929077},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.2886601686477661},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13669219613075256},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.1277080476284027},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.10703900456428528},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.09216195344924927},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.08965566754341125},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.2495/feem140451","doi":"https://doi.org/10.2495/feem140451","is_oa":false,"landing_page_url":"https://doi.org/10.2495/feem140451","pdf_url":null,"source":{"id":"https://openalex.org/S2764928088","display_name":"WIT transactions on engineering sciences","issn_l":"1743-3533","issn":["1743-3533","1746-4471"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310311589","host_organization_name":"WIT Press","host_organization_lineage":["https://openalex.org/P4310311589"],"host_organization_lineage_names":["WIT Press"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"WIT Transactions on Engineering Sciences","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.1004.336","doi":null,"is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.1004.336","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://atlantis-press.com/php/download_paper.php?id%3D20447","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2115894812","https://openalex.org/W2011363932","https://openalex.org/W2103535888","https://openalex.org/W7097863068","https://openalex.org/W1874778078","https://openalex.org/W3048096308","https://openalex.org/W2161137122","https://openalex.org/W4379115621","https://openalex.org/W2326882369","https://openalex.org/W2134164508"],"abstract_inverted_index":{"Abstract\u2014Built-in":[0],"Self":[1,38,104],"Test(BIST)has":[2],"been":[3],"proved":[4],"as":[5],"one":[6],"of":[7],"the":[8,22,80],"effective":[9],"design":[10],"for":[11,94],"testability":[12],"techniques,":[13],"where":[14],"on-chip":[15],"test":[16,21,28,58,71,86,106],"architectures":[17],"are":[18],"designed":[19],"to":[20,89],"digital":[23],"circuits":[24],"themselves.":[25],"To":[26],"reduce":[27],"application":[29,87,107],"time":[30,88],"and":[31],"improve":[32],"fault":[33,45,92,109],"coverage,":[34],"A":[35],"deterministic":[36],"Built-in":[37],"Test(BIST)":[39],"technique":[40,82],"that":[41,67,79],"can":[42],"get":[43],"complete":[44,91],"coverage":[46,93,110],"without":[47],"using":[48],"any":[49],"storage":[50],"device":[51],"is":[52],"proposed":[53,81],"in":[54,73],"this":[55],"paper.":[56],"The":[57],"architecture":[59],"contains":[60],"a":[61],"novel":[62],"on":[63],"chip":[64],"encoding":[65],"logic":[66],"generates":[68],"all":[69,95],"required":[70],"vectors":[72],"real":[74],"time.":[75],"Experimental":[76],"results":[77],"show":[78],"requires":[83],"much":[84],"less":[85],"achieve":[90],"testable":[96],"stuck-at":[97],"faults":[98],"with":[99],"reasonable":[100],"hardware":[101],"cost.":[102],"Keywords-Built-in":[103],"Test(BIST);":[105],"time;":[108],"I.":[111]},"counts_by_year":[],"updated_date":"2026-11-08T12:12:28.789561","created_date":"2022-05-12T00:00:00"}