{"id":"https://openalex.org/W4248031376","doi":"https://doi.org/10.1016/0039-6028(91)90870-x","title":"An X-ray photoelectron spectroscopic study of the electronic properties of ultrathin Ni films on Ru(0001) and Mo(110)","display_name":"An X-ray photoelectron spectroscopic study of the electronic properties of ultrathin Ni films on Ru(0001) and Mo(110)","publication_year":1991,"publication_date":"1991-10-01","ids":{"openalex":"https://openalex.org/W4248031376","doi":"https://doi.org/10.1016/0039-6028(91)90870-x"},"language":"en","primary_location":{"id":"doi:10.1016/0039-6028(91)90870-x","doi":"https://doi.org/10.1016/0039-6028(91)90870-x","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0039-6028(91)90870-x","pdf_url":null,"source":{"id":"https://openalex.org/S137865625","display_name":"Surface Science","issn_l":"0039-6028","issn":["0039-6028","1879-2758"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-100","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Surface Science","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Robert A. Campbell","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Robert A. Campbell","raw_affiliation_strings":["Department of Chemistry, Texas A&M University, College Station, TX 77843-3255, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Chemistry, Texas A&M University, College Station, TX 77843-3255, USA","institution_ids":["https://openalex.org/I91045830"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110897018","display_name":"Jos\u00e9A. Rodriguez","orcid":"https://orcid.org/0000-0002-9273-5762","observed_orcids":["https://orcid.org/0000-0002-9273-5762"]},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jos\u00e9A. Rodriguez","raw_affiliation_strings":["Department of Chemistry, Texas A&M University, College Station, TX 77843-3255, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Chemistry, Texas A&M University, College Station, TX 77843-3255, USA","institution_ids":["https://openalex.org/I91045830"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5107834766","display_name":"D. Wayne Goodman","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"D.Wayne Goodman","raw_affiliation_strings":["Department of Chemistry, Texas A&M University, College Station, TX 77843-3255, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Chemistry, Texas A&M University, College Station, TX 77843-3255, USA","institution_ids":["https://openalex.org/I91045830"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5107834766"],"corresponding_institution_ids":["https://openalex.org/I91045830"],"apc_list":{"value":3340,"currency":"USD","value_usd":3340},"apc_paid":null,"fwci":3.2565,"has_fulltext":false,"cited_by_count":40,"citation_normalized_percentile":{"value":0.92879622,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":88,"max":95},"biblio":{"volume":"256","issue":"3","first_page":"272","last_page":"280"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.5351999998092651,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.5351999998092651,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13531","display_name":"Surface and Thin Film Phenomena","score":0.39010000228881836,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12285","display_name":"Surface Chemistry and Catalysis","score":0.029999999329447746,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ru-0001","display_name":"Ru(0001)","score":0.8949999809265137},{"id":"https://openalex.org/keywords/mo-110","display_name":"Mo(110)","score":0.996999979019165},{"id":"https://openalex.org/keywords/electronic-structure","display_name":"electronic structure","score":0.550000011920929},{"id":"https://openalex.org/keywords/core-level-binding-energy-shifts","display_name":"core-level binding energy shifts","score":0.871999979019165},{"id":"https://openalex.org/keywords/co-chemisorption","display_name":"CO chemisorption","score":0.8519999980926514},{"id":"https://openalex.org/keywords/hydrogen-chemisorption","display_name":"hydrogen chemisorption","score":0.9599999785423279},{"id":"https://openalex.org/keywords/surface-annealing","display_name":"surface annealing","score":0.8600000143051147},{"id":"https://openalex.org/keywords/electron-density","display_name":"electron density","score":0.6830000281333923},{"id":"https://openalex.org/keywords/film-thickness-dependence","display_name":"film thickness dependence","score":0.5490000247955322},{"id":"https://openalex.org/keywords/co-desorption","display_name":"CO desorption","score":0.7400000095367432}],"concepts":[{"id":"https://openalex.org/C175708663","wikidata":"https://www.wikidata.org/wiki/Q899559","display_name":"X-ray photoelectron spectroscopy","level":2,"score":0.8737515211105347},{"id":"https://openalex.org/C33790079","wikidata":"https://www.wikidata.org/wiki/Q899417","display_name":"Chemisorption","level":3,"score":0.8310589790344238},{"id":"https://openalex.org/C7070889","wikidata":"https://www.wikidata.org/wiki/Q902488","display_name":"Monolayer","level":2,"score":0.6426740884780884},{"id":"https://openalex.org/C2777855556","wikidata":"https://www.wikidata.org/wiki/Q4339544","display_name":"Annealing (glass)","level":2,"score":0.5751173496246338},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.4793446958065033},{"id":"https://openalex.org/C93282013","wikidata":"https://www.wikidata.org/wiki/Q420754","display_name":"Binding energy","level":2,"score":0.47892841696739197},{"id":"https://openalex.org/C150394285","wikidata":"https://www.wikidata.org/wiki/Q180254","display_name":"Adsorption","level":2,"score":0.4678440988063812},{"id":"https://openalex.org/C162711632","wikidata":"https://www.wikidata.org/wiki/Q905514","display_name":"Desorption","level":3,"score":0.43969613313674927},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.437456876039505},{"id":"https://openalex.org/C33893257","wikidata":"https://www.wikidata.org/wiki/Q905243","display_name":"Electron spectroscopy","level":3,"score":0.41265496611595154},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.39614710211753845},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.38452115654945374},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.27695173025131226},{"id":"https://openalex.org/C184779094","wikidata":"https://www.wikidata.org/wiki/Q26383","display_name":"Atomic physics","level":1,"score":0.19137680530548096},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.13608819246292114},{"id":"https://openalex.org/C46141821","wikidata":"https://www.wikidata.org/wiki/Q209402","display_name":"Nuclear magnetic resonance","level":1,"score":0.12245145440101624},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.095152348279953},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/0039-6028(91)90870-x","doi":"https://doi.org/10.1016/0039-6028(91)90870-x","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0039-6028(91)90870-x","pdf_url":null,"source":{"id":"https://openalex.org/S137865625","display_name":"Surface Science","issn_l":"0039-6028","issn":["0039-6028","1879-2758"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-100","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Surface Science","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306196","display_name":"Welch Foundation","ror":"https://ror.org/00np6vq88"},{"id":"https://openalex.org/F4320337480","display_name":"Basic Energy Sciences","ror":"https://ror.org/05mg91w61"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":44,"referenced_works":["https://openalex.org/W215294686","https://openalex.org/W1963760907","https://openalex.org/W1964068513","https://openalex.org/W1964147912","https://openalex.org/W1976694407","https://openalex.org/W1977988692","https://openalex.org/W1982312874","https://openalex.org/W1986270733","https://openalex.org/W1990100889","https://openalex.org/W1998108281","https://openalex.org/W2000058907","https://openalex.org/W2000198398","https://openalex.org/W2006253255","https://openalex.org/W2011585970","https://openalex.org/W2012557214","https://openalex.org/W2020648035","https://openalex.org/W2021840086","https://openalex.org/W2025195817","https://openalex.org/W2026751292","https://openalex.org/W2029179301","https://openalex.org/W2032517687","https://openalex.org/W2036549760","https://openalex.org/W2038809270","https://openalex.org/W2039288330","https://openalex.org/W2043175512","https://openalex.org/W2043270732","https://openalex.org/W2056797340","https://openalex.org/W2062342199","https://openalex.org/W2067104857","https://openalex.org/W2067298154","https://openalex.org/W2074866008","https://openalex.org/W2080523818","https://openalex.org/W2081387878","https://openalex.org/W2083442933","https://openalex.org/W2087604287","https://openalex.org/W2092337911","https://openalex.org/W2102208611","https://openalex.org/W2129836732","https://openalex.org/W2148741397","https://openalex.org/W2157488476","https://openalex.org/W2164744234","https://openalex.org/W2320461683","https://openalex.org/W2498277057","https://openalex.org/W2950231293"],"related_works":["https://openalex.org/W2129836732","https://openalex.org/W2116955450","https://openalex.org/W2011585970","https://openalex.org/W2050397279","https://openalex.org/W1970589586","https://openalex.org/W2164744234","https://openalex.org/W2003677424","https://openalex.org/W2037148981","https://openalex.org/W2043175512","https://openalex.org/W2040473587"],"abstract_inverted_index":null,"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2018,"cited_by_count":1}],"updated_date":"2026-10-16T09:59:22.235173","created_date":"2022-05-12T00:00:00"}