{"id":"https://openalex.org/W4246748052","doi":"https://doi.org/10.1109/isaf.2008.4693799","title":"PI001","display_name":"PI001","publication_year":2008,"publication_date":"2008-02-01","ids":{"openalex":"https://openalex.org/W4246748052","doi":"https://doi.org/10.1109/isaf.2008.4693799"},"language":"en","primary_location":{"id":"doi:10.1109/isaf.2008.4693799","doi":"https://doi.org/10.1109/isaf.2008.4693799","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isaf.2008.4693799","pdf_url":null,"source":{"id":"https://openalex.org/S4210188928","display_name":"IEEE International Symposium on Applications of Ferroelectrics (ISAF)","issn_l":"1099-4734","issn":["1099-4734","2375-0448"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 17th IEEE International Symposium on the Applications of Ferroelectrics","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5004332284","display_name":"Chiwon Kang","orcid":"https://orcid.org/0000-0003-3014-653X","observed_orcids":["https://orcid.org/0000-0003-3014-653X"]},"institutions":[{"id":"https://openalex.org/I82497590","display_name":"Auburn University","ror":"https://ror.org/02v80fc35","country_code":"US","type":"education","lineage":["https://openalex.org/I82497590"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chiwon Kang","raw_affiliation_strings":["Materials Research and Education Center, Aubum University, Auburn, AL, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Materials Research and Education Center, Aubum University, Auburn, AL, USA","institution_ids":["https://openalex.org/I82497590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100697008","display_name":"Jung\u2010Hyun Park","orcid":"https://orcid.org/0000-0002-7970-1904","observed_orcids":["https://orcid.org/0000-0002-7970-1904"]},"institutions":[{"id":"https://openalex.org/I82497590","display_name":"Auburn University","ror":"https://ror.org/02v80fc35","country_code":"US","type":"education","lineage":["https://openalex.org/I82497590"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jung-Hyun Park","raw_affiliation_strings":["Materials Research and Education Center, Aubum University, Auburn, AL, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Materials Research and Education Center, Aubum University, Auburn, AL, USA","institution_ids":["https://openalex.org/I82497590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111656956","display_name":"Dongna Shen","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I82497590","display_name":"Auburn University","ror":"https://ror.org/02v80fc35","country_code":"US","type":"education","lineage":["https://openalex.org/I82497590"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Dongna Shen","raw_affiliation_strings":["Materials Research and Education Center, Aubum University, Auburn, AL, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Materials Research and Education Center, Aubum University, Auburn, AL, USA","institution_ids":["https://openalex.org/I82497590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074142607","display_name":"Hosang Ahn","orcid":"https://orcid.org/0000-0003-3934-1657","observed_orcids":["https://orcid.org/0000-0003-3934-1657"]},"institutions":[{"id":"https://openalex.org/I82497590","display_name":"Auburn University","ror":"https://ror.org/02v80fc35","country_code":"US","type":"education","lineage":["https://openalex.org/I82497590"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Hosang Ahn","raw_affiliation_strings":["Materials Research and Education Center, Aubum University, Auburn, AL, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Materials Research and Education Center, Aubum University, Auburn, AL, USA","institution_ids":["https://openalex.org/I82497590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078100617","display_name":"Howard Clyde Wikle","orcid":"https://orcid.org/0000-0001-9432-3887","observed_orcids":["https://orcid.org/0000-0001-9432-3887"]},"institutions":[{"id":"https://openalex.org/I82497590","display_name":"Auburn University","ror":"https://ror.org/02v80fc35","country_code":"US","type":"education","lineage":["https://openalex.org/I82497590"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Howard C. Wikle","raw_affiliation_strings":["Materials Research and Education Center, Aubum University, Auburn, AL, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Materials Research and Education Center, Aubum University, Auburn, AL, USA","institution_ids":["https://openalex.org/I82497590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5114859362","display_name":"Minseo Park","orcid":"https://orcid.org/0009-0008-8498-1139","observed_orcids":["https://orcid.org/0009-0008-8498-1139"]},"institutions":[{"id":"https://openalex.org/I82497590","display_name":"Auburn University","ror":"https://ror.org/02v80fc35","country_code":"US","type":"education","lineage":["https://openalex.org/I82497590"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Minseo Park","raw_affiliation_strings":["Department of Physics, Aubum University, Auburn, AL, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics, Aubum University, Auburn, AL, USA","institution_ids":["https://openalex.org/I82497590"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5080191581","display_name":"Dong\u2010Joo Kim","orcid":"https://orcid.org/0000-0001-5013-4005","observed_orcids":["https://orcid.org/0000-0001-5013-4005"]},"institutions":[{"id":"https://openalex.org/I82497590","display_name":"Auburn University","ror":"https://ror.org/02v80fc35","country_code":"US","type":"education","lineage":["https://openalex.org/I82497590"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Dong-Joo Kim","raw_affiliation_strings":["Materials Research and Education Center, Aubum University, Auburn, AL, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Materials Research and Education Center, Aubum University, Auburn, AL, USA","institution_ids":["https://openalex.org/I82497590"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I82497590"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"46","issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10107","display_name":"Ferroelectric and Piezoelectric Materials","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10107","display_name":"Ferroelectric and Piezoelectric Materials","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12155","display_name":"Microwave Dielectric Ceramics Synthesis","score":0.00039999998989515007,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11160","display_name":"Acoustic Wave Resonator Technologies","score":0.0003000000142492354,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/potassium-sodium-niobate","display_name":"potassium sodium niobate","score":0.9049999713897705},{"id":"https://openalex.org/keywords/lead-free-piezoelectric-materials","display_name":"lead-free piezoelectrics","score":0.9419999718666077},{"id":"https://openalex.org/keywords/thin-films","display_name":"thin films","score":0.7409999966621399},{"id":"https://openalex.org/keywords/chemical-solution-deposition","display_name":"chemical solution deposition","score":0.9980000257492065},{"id":"https://openalex.org/keywords/annealing-conditions","display_name":"annealing conditions","score":0.8859999775886536},{"id":"https://openalex.org/keywords/highly-oriented-films","display_name":"highly oriented films","score":0.6420000195503235},{"id":"https://openalex.org/keywords/leakage-current-reduction","display_name":"leakage current reduction","score":0.8539999723434448},{"id":"https://openalex.org/keywords/si-100-substrate","display_name":"Si(100) substrate","score":0.6850000023841858},{"id":"https://openalex.org/keywords/pt-111-substrate","display_name":"Pt(111) substrate","score":0.8519999980926514}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7963931560516357},{"id":"https://openalex.org/C2777855556","wikidata":"https://www.wikidata.org/wiki/Q4339544","display_name":"Annealing (glass)","level":2,"score":0.6741013526916504},{"id":"https://openalex.org/C87976508","wikidata":"https://www.wikidata.org/wiki/Q1498213","display_name":"Microstructure","level":2,"score":0.6233788728713989},{"id":"https://openalex.org/C45119746","wikidata":"https://www.wikidata.org/wiki/Q205949","display_name":"Exothermic reaction","level":2,"score":0.615090548992157},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.5971289277076721},{"id":"https://openalex.org/C100082104","wikidata":"https://www.wikidata.org/wiki/Q183759","display_name":"Piezoelectricity","level":2,"score":0.5761351585388184},{"id":"https://openalex.org/C207114421","wikidata":"https://www.wikidata.org/wiki/Q133900","display_name":"Diffraction","level":2,"score":0.5322527885437012},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.5001413822174072},{"id":"https://openalex.org/C2780228366","wikidata":"https://www.wikidata.org/wiki/Q1069397","display_name":"Chemical bath deposition","level":3,"score":0.49650055170059204},{"id":"https://openalex.org/C42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","level":1,"score":0.46425893902778625},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.37339890003204346},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.3293580412864685},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.30972975492477417},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.10960456728935242},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.10416001081466675},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.07158863544464111},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isaf.2008.4693799","doi":"https://doi.org/10.1109/isaf.2008.4693799","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isaf.2008.4693799","pdf_url":null,"source":{"id":"https://openalex.org/S4210188928","display_name":"IEEE International Symposium on Applications of Ferroelectrics (ISAF)","issn_l":"1099-4734","issn":["1099-4734","2375-0448"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 17th IEEE International Symposium on the Applications of Ferroelectrics","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"},{"id":"https://openalex.org/F4320309904","display_name":"Auburn University","ror":"https://ror.org/02v80fc35"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1492600152","https://openalex.org/W1535002055","https://openalex.org/W1564570021","https://openalex.org/W1648027853","https://openalex.org/W1969166496","https://openalex.org/W1970747270","https://openalex.org/W1974316644","https://openalex.org/W1975040922","https://openalex.org/W1999072253","https://openalex.org/W2004978357","https://openalex.org/W2022836836","https://openalex.org/W2035644463","https://openalex.org/W2042778138","https://openalex.org/W2070162617","https://openalex.org/W2072371871","https://openalex.org/W2075573045","https://openalex.org/W2077562391","https://openalex.org/W2132931549","https://openalex.org/W2216813115","https://openalex.org/W3155600906"],"related_works":["https://openalex.org/W5200241","https://openalex.org/W2011321615","https://openalex.org/W2071394370","https://openalex.org/W2275885152","https://openalex.org/W1673824028","https://openalex.org/W3163293325","https://openalex.org/W2784248207","https://openalex.org/W2067725803","https://openalex.org/W2922414667","https://openalex.org/W7049020586"],"abstract_inverted_index":{"(K,":[0],"Na)NbO3":[1],"(KNN)":[2],"perovskite":[3],"materials":[4],"have":[5],"been":[6],"studied":[7],"as":[8],"a":[9],"promising":[10],"candidate":[11],"for":[12,46],"lead-free":[13],"piezoelectric":[14,22],"material":[15],"due":[16],"to":[17,133],"environmentally":[18],"and":[19,40,58,80,111,126,137],"biologically":[20],"benign":[21],"devices.":[23,50],"However,":[24],"there":[25],"are":[26,43],"few":[27],"reports":[28],"on":[29,56],"the":[30,47],"growth":[31],"of":[32,49,91,116,124],"KNN":[33,51,73,92,117],"thin":[34,52],"films":[35,53],"by":[36,62,85,95,103],"chemical":[37,63],"solution":[38,64],"deposition,":[39],"their":[41,139],"properties":[42,115],"still":[44],"insufficient":[45],"application":[48],"were":[54,83],"fabricated":[55],"SiO2/Si(100)":[57],"Pt(111)/SiO2/":[59],"Si(100)":[60],"substrates":[61],"deposition.":[65],"By":[66],"applying":[67],"different":[68],"annealing":[69],"conditions":[70],"highly":[71],"oriented":[72],"was":[74,93,101,118,129],"achieved":[75],"from":[76],"550\u00b0C.":[77],"Weight":[78],"loss":[79],"exothermic":[81],"peaks":[82],"confirmed":[84],"thermal":[86],"analysis":[87],"(TG-DTA).":[88],"Structural":[89],"characterization":[90],"measured":[94],"X-ray":[96],"diffraction.":[97],"The":[98,121],"surface":[99],"morphology":[100],"evaluated":[102],"SEM.":[104],"At":[105],"optimized":[106],"condition":[107],"SEM":[108],"showed":[109],"uniform":[110],"dense":[112],"microstructures.":[113],"Electrical":[114],"also":[119],"measured.":[120],"excessive":[122],"amount":[123],"Na":[125],"K":[127],"ions":[128],"added":[130],"in":[131],"order":[132],"reduce":[134],"leakage":[135],"current":[136],"compensate":[138],"volatile":[140],"nature.":[141]},"counts_by_year":[],"updated_date":"2026-10-26T11:51:55.731654","created_date":"2022-05-12T00:00:00"}