{"id":"https://openalex.org/W4244597403","doi":"https://doi.org/10.1109/vg.2005.194098","title":"A simplified model for inhomogeneous subsurface scattering","display_name":"A simplified model for inhomogeneous subsurface scattering","publication_year":2005,"publication_date":"2005-01-01","ids":{"openalex":"https://openalex.org/W4244597403","doi":"https://doi.org/10.1109/vg.2005.194098"},"language":"en","primary_location":{"id":"doi:10.1109/vg.2005.194098","doi":"https://doi.org/10.1109/vg.2005.194098","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vg.2005.194098","pdf_url":null,"source":{"id":"https://openalex.org/S4210220316","display_name":"International Workshop on Volume Graphics (VG)","issn_l":"1727-8376","issn":["1727-8376"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Fourth International Workshop on Volume Graphics, 2005.","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5075865306","display_name":"Richard Sharp","orcid":"https://orcid.org/0000-0002-9797-472X","observed_orcids":["https://orcid.org/0000-0002-9797-472X"]},"institutions":[{"id":"https://openalex.org/I52357470","display_name":"The Ohio State University","ror":"https://ror.org/00rs6vg23","country_code":"US","type":"education","lineage":["https://openalex.org/I52357470"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. Sharp","raw_affiliation_strings":["Ohio State Uinversity, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ohio State Uinversity, USA","institution_ids":["https://openalex.org/I52357470"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5026429219","display_name":"R. Machiraju","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I52357470","display_name":"The Ohio State University","ror":"https://ror.org/00rs6vg23","country_code":"US","type":"education","lineage":["https://openalex.org/I52357470"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. Machiraju","raw_affiliation_strings":["Ohio State Uinversity, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ohio State Uinversity, USA","institution_ids":["https://openalex.org/I52357470"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I52357470"],"apc_list":null,"apc_paid":null,"fwci":0.2546,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.58736059,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"63","last_page":"228"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10481","display_name":"Computer Graphics and Visualization Techniques","score":0.9574999809265137,"subfield":{"id":"https://openalex.org/subfields/1704","display_name":"Computer Graphics and Computer-Aided Design"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10481","display_name":"Computer Graphics and Visualization Techniques","score":0.9574999809265137,"subfield":{"id":"https://openalex.org/subfields/1704","display_name":"Computer Graphics and Computer-Aided Design"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10977","display_name":"Optical Imaging and Spectroscopy Techniques","score":0.011699999682605267,"subfield":{"id":"https://openalex.org/subfields/2741","display_name":"Radiology, Nuclear Medicine and Imaging"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}},{"id":"https://openalex.org/T12304","display_name":"Radiative Heat Transfer Studies","score":0.010400000028312206,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/diffusion-approximation","display_name":"diffusion approximation","score":0.8029999732971191},{"id":"https://openalex.org/keywords/radiative-transfer-equation","display_name":"radiative transfer equation","score":0.7699999809265137},{"id":"https://openalex.org/keywords/steady-state-transport","display_name":"steady-state transport","score":0.6309999823570251},{"id":"https://openalex.org/keywords/circuit-analysis","display_name":"circuit analysis","score":0.48100000619888306},{"id":"https://openalex.org/keywords/light-transport-simulation","display_name":"light transport simulation","score":0.6370000243186951},{"id":"https://openalex.org/keywords/heterogeneous-materials","display_name":"heterogeneous materials","score":0.7580000162124634},{"id":"https://openalex.org/keywords/complex-geometries","display_name":"complex geometries","score":0.531000018119812}],"concepts":[{"id":"https://openalex.org/C191486275","wikidata":"https://www.wikidata.org/wiki/Q210028","display_name":"Scattering","level":2,"score":0.7001981735229492},{"id":"https://openalex.org/C17456955","wikidata":"https://www.wikidata.org/wiki/Q343279","display_name":"Convection\u2013diffusion equation","level":2,"score":0.6632230281829834},{"id":"https://openalex.org/C571446","wikidata":"https://www.wikidata.org/wiki/Q6510183","display_name":"Diffusion equation","level":3,"score":0.6107010841369629},{"id":"https://openalex.org/C120456961","wikidata":"https://www.wikidata.org/wiki/Q210028","display_name":"Light scattering","level":3,"score":0.5771509408950806},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.5214037895202637},{"id":"https://openalex.org/C69357855","wikidata":"https://www.wikidata.org/wiki/Q163214","display_name":"Diffusion","level":2,"score":0.5118622183799744},{"id":"https://openalex.org/C68709404","wikidata":"https://www.wikidata.org/wiki/Q1134475","display_name":"Flux (metallurgy)","level":2,"score":0.46684297919273376},{"id":"https://openalex.org/C8171440","wikidata":"https://www.wikidata.org/wiki/Q903414","display_name":"Steady state (chemistry)","level":2,"score":0.45786479115486145},{"id":"https://openalex.org/C57879066","wikidata":"https://www.wikidata.org/wiki/Q41217","display_name":"Mechanics","level":1,"score":0.43002766370773315},{"id":"https://openalex.org/C66882249","wikidata":"https://www.wikidata.org/wiki/Q169336","display_name":"Homogeneous","level":2,"score":0.41800329089164734},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.39606523513793945},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3754490613937378},{"id":"https://openalex.org/C121864883","wikidata":"https://www.wikidata.org/wiki/Q677916","display_name":"Statistical physics","level":1,"score":0.3399273455142975},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.26467224955558777},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.2182040512561798},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1300746202468872},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.12006247043609619},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0952146053314209},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.0},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vg.2005.194098","doi":"https://doi.org/10.1109/vg.2005.194098","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vg.2005.194098","pdf_url":null,"source":{"id":"https://openalex.org/S4210220316","display_name":"International Workshop on Volume Graphics (VG)","issn_l":"1727-8376","issn":["1727-8376"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Fourth International Workshop on Volume Graphics, 2005.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W7100939957","https://openalex.org/W4385490334","https://openalex.org/W2030023387","https://openalex.org/W2293436189","https://openalex.org/W137476405","https://openalex.org/W7098087190","https://openalex.org/W141070222","https://openalex.org/W2090482630","https://openalex.org/W2014042552","https://openalex.org/W1515417805"],"abstract_inverted_index":{"There":[0],"has":[1],"been":[2],"considerable":[3],"interest":[4],"in":[5,11,31,91],"modeling":[6],"realistic":[7],"subsurface":[8],"light":[9,57,89],"scattering":[10,36],"materials":[12,93],"such":[13],"as":[14,59],"marble,":[15],"human":[16],"skin,":[17],"or":[18,34],"clouds.":[19],"Many":[20],"of":[21],"these":[22],"models":[23],"provide":[24,48],"a":[25,32,44,49],"solution":[26,51],"for":[27,73],"the":[28,53,74,81],"transport":[29,54,77,90],"equation":[30,78],"homogeneous":[33],"layered":[35],"media.":[37],"The":[38],"model":[39,86],"we":[40,61],"present":[41],"here":[42],"exploits":[43],"diffusion":[45],"mechanism":[46],"to":[47,52,70],"simpler":[50],"equation.":[55],"Treating":[56],"flux":[58],"current":[60],"can":[62,87],"use":[63],"circuit":[64],"analysis":[65],"techniques":[66],"and":[67,79,94],"linear":[68],"systems":[69],"solve":[71],"directly":[72],"steady":[75],"state":[76],"ignore":[80],"transient":[82],"values.":[83],"Thus":[84],"our":[85],"simulate":[88],"heterogeneous":[92],"complex":[95],"geometry.":[96]},"counts_by_year":[],"updated_date":"2026-10-28T10:33:24.094632","created_date":"2022-05-12T00:00:00"}