{"id":"https://openalex.org/W4243676423","doi":"https://doi.org/10.1007/978-1-4757-9110-5_20","title":"Resolution Enhancement for Cu K\u03b1 Emission of Y-Ba-Cu-O Compounds","display_name":"Resolution Enhancement for Cu K\u03b1 Emission of Y-Ba-Cu-O Compounds","publication_year":1989,"publication_date":"1989-01-01","ids":{"openalex":"https://openalex.org/W4243676423","doi":"https://doi.org/10.1007/978-1-4757-9110-5_20"},"language":"en","primary_location":{"id":"doi:10.1007/978-1-4757-9110-5_20","doi":"https://doi.org/10.1007/978-1-4757-9110-5_20","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-1-4757-9110-5_20","pdf_url":null,"source":{"id":"https://openalex.org/S4306463937","display_name":"Springer eBooks","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"ebook platform"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Advances in X-Ray Analysis","raw_type":"book-chapter"},"volume":{"id":"https://openalex.org/W4232387910","display_name":"Advances in X-Ray Analysis"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111688790","display_name":"Naoki Saitoh","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"N. Saitoh","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017970234","display_name":"Yasuhiro Higashi","orcid":"https://orcid.org/0000-0003-0784-7960","observed_orcids":["https://orcid.org/0000-0003-0784-7960"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Y. Higashi","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110887266","display_name":"M. Minami","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"M. Minami","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077305842","display_name":"Sei Fukushima","orcid":"https://orcid.org/0000-0003-0252-349X","observed_orcids":["https://orcid.org/0000-0003-0252-349X"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"S. Fukushima","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113534228","display_name":"Y. Gohshi","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Y. Gohshi","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021987376","display_name":"Shigemi Kohiki","orcid":"https://orcid.org/0000-0002-1543-4114","observed_orcids":["https://orcid.org/0000-0002-1543-4114"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"S. Kohiki","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5048756005","display_name":"Takahiro Wada","orcid":"https://orcid.org/0000-0001-8456-8282","observed_orcids":["https://orcid.org/0000-0001-8456-8282"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"T. Wada","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.62311558,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"155","last_page":"165"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11733","display_name":"X-ray Spectroscopy and Fluorescence Analysis","score":0.4487000107765198,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11733","display_name":"X-ray Spectroscopy and Fluorescence Analysis","score":0.4487000107765198,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12613","display_name":"X-ray Diffraction in Crystallography","score":0.33959999680519104,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.1492999941110611,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resolution-enhancement","display_name":"resolution enhancement","score":0.7020000219345093},{"id":"https://openalex.org/keywords/high-temperature-superconductors","display_name":"high-temperature superconductors","score":0.8019999861717224},{"id":"https://openalex.org/keywords/x-ray-diffraction","display_name":"X-ray diffraction","score":0.6949999928474426}],"concepts":[{"id":"https://openalex.org/C138268822","wikidata":"https://www.wikidata.org/wiki/Q1051925","display_name":"Resolution (logic)","level":2,"score":0.6606369018554688},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5315197706222534},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.43635955452919006},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.2625483274459839},{"id":"https://openalex.org/C107872376","wikidata":"https://www.wikidata.org/wiki/Q321355","display_name":"Environmental chemistry","level":1,"score":0.12041831016540527},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.1052379310131073},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.045164674520492554}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-1-4757-9110-5_20","doi":"https://doi.org/10.1007/978-1-4757-9110-5_20","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-1-4757-9110-5_20","pdf_url":null,"source":{"id":"https://openalex.org/S4306463937","display_name":"Springer eBooks","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"ebook platform"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Advances in X-Ray Analysis","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W1676678064","https://openalex.org/W1973596658","https://openalex.org/W2012752122"],"related_works":["https://openalex.org/W3138168597","https://openalex.org/W2315488646","https://openalex.org/W2056131257","https://openalex.org/W1789839120","https://openalex.org/W7014562964","https://openalex.org/W4246381392","https://openalex.org/W3022481808","https://openalex.org/W3010605460","https://openalex.org/W3096414114","https://openalex.org/W4238446973"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-10-16T09:59:22.235173","created_date":"2022-05-12T00:00:00"}