{"id":"https://openalex.org/W4239698188","doi":"https://doi.org/10.1109/autest.2004.1436775","title":"Integrating VISA, IVI and ATeasy to migrate legacy test systems","display_name":"Integrating VISA, IVI and ATeasy to migrate legacy test systems","publication_year":2005,"publication_date":"2005-06-07","ids":{"openalex":"https://openalex.org/W4239698188","doi":"https://doi.org/10.1109/autest.2004.1436775"},"language":"en","primary_location":{"id":"doi:10.1109/autest.2004.1436775","doi":"https://doi.org/10.1109/autest.2004.1436775","is_oa":false,"landing_page_url":"https://doi.org/10.1109/autest.2004.1436775","pdf_url":null,"source":{"id":"https://openalex.org/S4210209662","display_name":"IEEE AUTOTESTCON (IEEE Systems Readiness Technology Conference)","issn_l":"1088-7725","issn":["1088-7725","1558-4550"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings AUTOTESTCON 2004.","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5022077187","display_name":"Loofie Gutterman","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Loofie Gutterman","raw_affiliation_strings":["Geotest Marvin Test Systems, Inc., Irvine, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Geotest Marvin Test Systems, Inc., Irvine, CA, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":["https://openalex.org/A5022077187"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.5443,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.69728936,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"76","last_page":"79"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.8130000233650208,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.8130000233650208,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12941","display_name":"Embedded Systems and FPGA Design","score":0.1340000033378601,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.027300000190734863,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/visa","display_name":"Visa","score":0.8740000128746033},{"id":"https://openalex.org/keywords/pxi","display_name":"PXI","score":0.6970000267028809},{"id":"https://openalex.org/keywords/vxi","display_name":"VXI","score":0.7590000033378601},{"id":"https://openalex.org/keywords/gpib","display_name":"GPIB","score":0.9819999933242798},{"id":"https://openalex.org/keywords/instrument-drivers","display_name":"instrument drivers","score":0.8600000143051147},{"id":"https://openalex.org/keywords/test-automation","display_name":"test automation","score":0.3569999933242798}],"concepts":[{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.600488543510437},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5612807869911194},{"id":"https://openalex.org/C105446022","wikidata":"https://www.wikidata.org/wiki/Q445962","display_name":"Legacy system","level":3,"score":0.5510295033454895},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.3556968569755554},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.22096237540245056},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.11264121532440186},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.10225233435630798},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/autest.2004.1436775","doi":"https://doi.org/10.1109/autest.2004.1436775","is_oa":false,"landing_page_url":"https://doi.org/10.1109/autest.2004.1436775","pdf_url":null,"source":{"id":"https://openalex.org/S4210209662","display_name":"IEEE AUTOTESTCON (IEEE Systems Readiness Technology Conference)","issn_l":"1088-7725","issn":["1088-7725","1558-4550"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings AUTOTESTCON 2004.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.8970999717712402}],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2544318720","https://openalex.org/W2163173326","https://openalex.org/W1536523355","https://openalex.org/W1923180216","https://openalex.org/W1835873996","https://openalex.org/W1927764883","https://openalex.org/W2070452665","https://openalex.org/W2099202136","https://openalex.org/W2539338710","https://openalex.org/W1986510409"],"abstract_inverted_index":{"New":[0],"software":[1,65,81],"technologies":[2,153],"such":[3,89],"as":[4,90],"VISA":[5,119,141],"and":[6,30,44,63,75,94,97,114,120,133,165,170],"IVI":[7,121,131],"continue":[8],"to":[9,18,34,49,150],"bring":[10],"the":[11,19,27,35,47,50,59,103,117,128,134,140,147,155,161,167,179],"industry":[12],"towards":[13],"greater":[14],"standardization.":[15],"The":[16,32],"benefit":[17,33],"integrator":[20],"is":[21,38,136],"reduced":[22],"costs":[23,40],"through":[24,46],"reuse":[25],"of":[26,86,105,116,130,163],"same":[28],"hardware":[29],"software.":[31],"customer":[36],"end-user":[37],"lower":[39],"by":[41],"reducing":[42],"modification":[43],"support":[45,71,115],"life-cycle":[48],"test":[51,176],"station.":[52],"However,":[53],"while":[54,109],"we":[55,67,100],"position":[56],"ourselves":[57],"for":[58,72,111,143,173,178],"future":[60],"with":[61,154],"PXI":[62],"these":[64,106,152],"technologies,":[66],"must":[68],"still":[69,137],"provide":[70],"VXI,":[73],"GPIB":[74],"instrument":[76,171],"drivers":[77,132,172],"that":[78],"use":[79,151],"current":[80,156],"technologies.":[82,122],"Using":[83],"a":[84,174],"number":[85],"additional":[87],"tools":[88,107],"National":[91],"Instrument's":[92],"Measurement":[93],"Automation":[95],"Explorer":[96],"Geotest's":[98],"ATEasy,":[99],"can":[101],"have":[102],"power":[104],"today":[108],"waiting":[110],"wider":[112],"acceptance":[113],"newer":[118],"We":[123],"are":[124],"just":[125],"now":[126],"seeing":[127],"development":[129],"ink":[135],"wet":[138],"on":[139],"specification":[142],"PXI.":[144],"ATEasy":[145],"provided":[146],"structure":[148],"necessary":[149],"technology.":[157],"This":[158],"paper":[159],"explores":[160],"process":[162],"implementing":[164],"integrating":[166],"system":[168],"driver":[169],"PXI-based":[175],"station":[177],"TOW2":[180],"optical":[181],"sight":[182],"sensor.":[183]},"counts_by_year":[],"updated_date":"2026-10-26T11:51:55.731654","created_date":"2022-05-12T00:00:00"}