{"id":"https://openalex.org/W4239081609","doi":"https://doi.org/10.1557/proc-405-387","title":"Optical and Structural Characterization of Arsenide/ Phosphide Interfaces Formed by Flow Modulation Epitaxy","display_name":"Optical and Structural Characterization of Arsenide/ Phosphide Interfaces Formed by Flow Modulation Epitaxy","publication_year":1995,"publication_date":"1995-01-01","ids":{"openalex":"https://openalex.org/W4239081609","doi":"https://doi.org/10.1557/proc-405-387"},"language":"en","primary_location":{"id":"doi:10.1557/proc-405-387","doi":"https://doi.org/10.1557/proc-405-387","is_oa":false,"landing_page_url":"https://doi.org/10.1557/proc-405-387","pdf_url":null,"source":{"id":"https://openalex.org/S2530005873","display_name":"MRS Proceedings","issn_l":"0272-9172","issn":["0272-9172","1946-4274"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310311721","host_organization_name":"Cambridge University Press","host_organization_lineage":["https://openalex.org/P4310311721","https://openalex.org/P4310311702"],"host_organization_lineage_names":["Cambridge University Press","University of Cambridge"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"MRS Proceedings","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103575237","display_name":"D. T. Emerson","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I205783295","display_name":"Cornell University","ror":"https://ror.org/05bnh6r87","country_code":"US","type":"education","lineage":["https://openalex.org/I205783295"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D. T. Emerson","raw_affiliation_strings":["OMVPE Facility, School of Electrical Engineering, Cornell University, Ithaca, NY, 14850, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"OMVPE Facility, School of Electrical Engineering, Cornell University, Ithaca, NY, 14850, USA","institution_ids":["https://openalex.org/I205783295"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109888699","display_name":"Joseph A. Smart","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I205783295","display_name":"Cornell University","ror":"https://ror.org/05bnh6r87","country_code":"US","type":"education","lineage":["https://openalex.org/I205783295"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. A. Smart","raw_affiliation_strings":["OMVPE Facility, School of Electrical Engineering, Cornell University, Ithaca, NY, 14850, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"OMVPE Facility, School of Electrical Engineering, Cornell University, Ithaca, NY, 14850, USA","institution_ids":["https://openalex.org/I205783295"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070447457","display_name":"Keith L. Whittingham","orcid":"https://orcid.org/0000-0003-1288-4459","observed_orcids":["https://orcid.org/0000-0003-1288-4459"]},"institutions":[{"id":"https://openalex.org/I1283103587","display_name":"AT&T (United States)","ror":"https://ror.org/02bbd5539","country_code":"US","type":"company","lineage":["https://openalex.org/I1283103587"]},{"id":"https://openalex.org/I205783295","display_name":"Cornell University","ror":"https://ror.org/05bnh6r87","country_code":"US","type":"education","lineage":["https://openalex.org/I205783295"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K. L. Whittingham","raw_affiliation_strings":["AT&T Bell Laboratories, 9333 S. John Young Parkway, Orlando, FL, 32819, USA","OMVPE Facility, School of Electrical Engineering, Cornell University, Ithaca, NY, 14850, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"AT&T Bell Laboratories, 9333 S. John Young Parkway, Orlando, FL, 32819, USA","institution_ids":["https://openalex.org/I1283103587"]},{"raw_affiliation_string":"OMVPE Facility, School of Electrical Engineering, Cornell University, Ithaca, NY, 14850, USA","institution_ids":["https://openalex.org/I205783295"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053640449","display_name":"Eduardo M. Chumbes","orcid":"https://orcid.org/0009-0001-2013-7747","observed_orcids":["https://orcid.org/0009-0001-2013-7747"]},"institutions":[{"id":"https://openalex.org/I205783295","display_name":"Cornell University","ror":"https://ror.org/05bnh6r87","country_code":"US","type":"education","lineage":["https://openalex.org/I205783295"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"E. M. Chumbes","raw_affiliation_strings":["OMVPE Facility, School of Electrical Engineering, Cornell University, Ithaca, NY, 14850, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"OMVPE Facility, School of Electrical Engineering, Cornell University, Ithaca, NY, 14850, USA","institution_ids":["https://openalex.org/I205783295"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108135766","display_name":"J. R. Shealy","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I205783295","display_name":"Cornell University","ror":"https://ror.org/05bnh6r87","country_code":"US","type":"education","lineage":["https://openalex.org/I205783295"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. R. Shealy","raw_affiliation_strings":["OMVPE Facility, School of Electrical Engineering, Cornell University, Ithaca, NY, 14850, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"OMVPE Facility, School of Electrical Engineering, Cornell University, Ithaca, NY, 14850, USA","institution_ids":["https://openalex.org/I205783295"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"405","issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10022","display_name":"Semiconductor Quantum Structures and Devices","score":0.98580002784729,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10022","display_name":"Semiconductor Quantum Structures and Devices","score":0.98580002784729,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12309","display_name":"solar cell performance optimization","score":0.005799999926239252,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.0031999999191612005,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/single-quantum-well","display_name":"single quantum well","score":0.8309999704360962},{"id":"https://openalex.org/keywords/lattice-mismatch","display_name":"lattice mismatch","score":0.42399999499320984},{"id":"https://openalex.org/keywords/strain","display_name":"strain","score":0.37299999594688416},{"id":"https://openalex.org/keywords/longitudinal-acoustic-phonons","display_name":"longitudinal acoustic phonons","score":0.9380000233650208},{"id":"https://openalex.org/keywords/pseudomorphic-layers","display_name":"pseudomorphic layers","score":0.6000000238418579},{"id":"https://openalex.org/keywords/interfacial-composition","display_name":"interfacial composition","score":0.5960000157356262},{"id":"https://openalex.org/keywords/type-ii-band-alignment","display_name":"type-II band alignment","score":0.781000018119812},{"id":"https://openalex.org/keywords/band-alignment","display_name":"band alignment","score":0.6499999761581421},{"id":"https://openalex.org/keywords/gaas-substrate","display_name":"GaAs substrate","score":0.5509999990463257},{"id":"https://openalex.org/keywords/inp-substrate","display_name":"InP substrate","score":0.925000011920929}],"concepts":[{"id":"https://openalex.org/C105382558","wikidata":"https://www.wikidata.org/wiki/Q332431","display_name":"Superlattice","level":2,"score":0.8655227422714233},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8361102342605591},{"id":"https://openalex.org/C79794668","wikidata":"https://www.wikidata.org/wiki/Q1616270","display_name":"Heterojunction","level":2,"score":0.7674902677536011},{"id":"https://openalex.org/C85080765","wikidata":"https://www.wikidata.org/wiki/Q614893","display_name":"Photoluminescence","level":2,"score":0.7007104158401489},{"id":"https://openalex.org/C169573571","wikidata":"https://www.wikidata.org/wiki/Q466824","display_name":"Raman scattering","level":3,"score":0.6480057239532471},{"id":"https://openalex.org/C110738630","wikidata":"https://www.wikidata.org/wiki/Q1135540","display_name":"Epitaxy","level":3,"score":0.5595671534538269},{"id":"https://openalex.org/C40003534","wikidata":"https://www.wikidata.org/wiki/Q862228","display_name":"Raman spectroscopy","level":2,"score":0.5266280770301819},{"id":"https://openalex.org/C24169881","wikidata":"https://www.wikidata.org/wiki/Q186608","display_name":"Phonon","level":2,"score":0.500042200088501},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4779339134693146},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.45284736156463623},{"id":"https://openalex.org/C207114421","wikidata":"https://www.wikidata.org/wiki/Q133900","display_name":"Diffraction","level":2,"score":0.4307716190814972},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2858009934425354},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.14839047193527222},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1557/proc-405-387","doi":"https://doi.org/10.1557/proc-405-387","is_oa":false,"landing_page_url":"https://doi.org/10.1557/proc-405-387","pdf_url":null,"source":{"id":"https://openalex.org/S2530005873","display_name":"MRS Proceedings","issn_l":"0272-9172","issn":["0272-9172","1946-4274"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310311721","host_organization_name":"Cambridge University Press","host_organization_lineage":["https://openalex.org/P4310311721","https://openalex.org/P4310311702"],"host_organization_lineage_names":["Cambridge University Press","University of Cambridge"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"MRS Proceedings","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1522649052","https://openalex.org/W1540665917","https://openalex.org/W1972231838","https://openalex.org/W1979555155","https://openalex.org/W2001751274","https://openalex.org/W2010127859","https://openalex.org/W2033633666","https://openalex.org/W2035772808","https://openalex.org/W2042445818","https://openalex.org/W2054548640","https://openalex.org/W2083574300","https://openalex.org/W2086174079","https://openalex.org/W2140065674","https://openalex.org/W2994827402"],"related_works":["https://openalex.org/W2328366755","https://openalex.org/W3019986402","https://openalex.org/W1992606880","https://openalex.org/W2067291464","https://openalex.org/W2028332962","https://openalex.org/W2163777110","https://openalex.org/W1983872641","https://openalex.org/W2093829764","https://openalex.org/W1524577058","https://openalex.org/W1972231838"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-09-23T05:00:35.095934","created_date":"2022-05-12T00:00:00"}