{"id":"https://openalex.org/W4232180101","doi":"https://doi.org/10.3139/9783446436619.042","title":"Einleitung","display_name":"Einleitung","publication_year":2017,"publication_date":"2017-09-11","ids":{"openalex":"https://openalex.org/W4232180101","doi":"https://doi.org/10.3139/9783446436619.042"},"language":"de","primary_location":{"id":"doi:10.3139/9783446436619.042","doi":"https://doi.org/10.3139/9783446436619.042","is_oa":false,"landing_page_url":"https://doi.org/10.3139/9783446436619.042","pdf_url":null,"source":{"id":"https://openalex.org/S4306486316","display_name":"Carl Hanser Verlag GmbH & Co. KG eBooks","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"ebook platform"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Handbuch Optische Messtechnik","raw_type":"book-chapter"},"volume":{"id":"https://openalex.org/W2755313378","display_name":"Handbuch Optische Messtechnik"},"type":"book-chapter","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5041248590","display_name":"Michael Schuth","orcid":"https://orcid.org/0009-0007-7941-6808","observed_orcids":["https://orcid.org/0009-0007-7941-6808"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Michael Schuth","raw_affiliation_strings":[""],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5015390557","display_name":"Wassili Buerakov","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Wassili Buerakov","raw_affiliation_strings":[""],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.37012448,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"295","last_page":"302"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.8574000000953674,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.8574000000953674,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.12479999661445618,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","score":0.009499999694526196,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/optical-metrology","display_name":"optical metrology","score":0.7440000176429749}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5381646156311035}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.3139/9783446436619.042","doi":"https://doi.org/10.3139/9783446436619.042","is_oa":false,"landing_page_url":"https://doi.org/10.3139/9783446436619.042","pdf_url":null,"source":{"id":"https://openalex.org/S4306486316","display_name":"Carl Hanser Verlag GmbH & Co. KG eBooks","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"ebook platform"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Handbuch Optische Messtechnik","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W4239282766","https://openalex.org/W2755896118","https://openalex.org/W4230318476","https://openalex.org/W4246829656","https://openalex.org/W4230783175","https://openalex.org/W4241020534","https://openalex.org/W2754213659","https://openalex.org/W2754584602","https://openalex.org/W4234446289","https://openalex.org/W4232356148"],"abstract_inverted_index":{"No":[0],"AccessHandbuch":[1],"Optische":[2],"MesstechnikSep":[3],"2017EinleitungMichael":[4],"Schuth,":[5],"Wassili":[6,15],"BuerakovMichael":[7],"SchuthSearch":[8],"for":[9,17],"more":[10,18],"papers":[11,19],"by":[12,20],"this":[13,21],"author,":[14],"BuerakovSearch":[16],"authorhttps://doi.org/10.3139/9783446436619.042SectionsAboutPDF":[22],"ToolsAdd":[23],"to":[24],"FavoritesDownload":[25],"CitationTrack":[26],"CitationsCopy":[27],"LTI":[28],"LinkPDF":[29],"key":[30],"'share":[31],"(en)'":[32],"returned":[33],"an":[34],"object":[35],"instead":[36],"of":[37],"string.FacebookTwitterEmailLinkedIn":[38],"previous":[39],"chapternext":[40],"chapter":[41],"FiguresReferencesRelatedDetails":[42],"2017Pages:":[43],"295-302Print":[44],"ISBN:":[45],"978-3-446-43634-3eISBN:":[46],"978-3-446-43661-9":[47],"Copyright":[48],"&":[49,56],"Permissions\u00a9":[50],"2017":[51],"Carl":[52],"Hanser":[53],"Verlag":[54],"GmbH":[55],"Co.":[57],"KGPDF":[58],"downloadLoading":[59],"...":[60]},"counts_by_year":[],"updated_date":"2026-10-10T09:11:00.788812","created_date":"2022-05-12T00:00:00"}