{"id":"https://openalex.org/W4232000820","doi":"https://doi.org/10.1016/j.ndteint.2013.09.003","title":"Probabilistic modeling and sizing of embedded flaws in ultrasonic non-destructive inspections for fatigue damage prognostics and structural integrity assessment","display_name":"Probabilistic modeling and sizing of embedded flaws in ultrasonic non-destructive inspections for fatigue damage prognostics and structural integrity assessment","publication_year":2013,"publication_date":"2013-09-17","ids":{"openalex":"https://openalex.org/W4232000820","doi":"https://doi.org/10.1016/j.ndteint.2013.09.003"},"language":"en","primary_location":{"id":"doi:10.1016/j.ndteint.2013.09.003","doi":"https://doi.org/10.1016/j.ndteint.2013.09.003","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.ndteint.2013.09.003","pdf_url":null,"source":{"id":"https://openalex.org/S4210233251","display_name":"NDT & E International","issn_l":"0963-8695","issn":["0963-8695","1879-1174"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-2","norway-1","poland-140","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"NDT & E International","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5007911718","display_name":"Xuefei Guan","orcid":"https://orcid.org/0000-0002-5928-3039","observed_orcids":["https://orcid.org/0000-0002-5928-3039"]},"institutions":[{"id":"https://openalex.org/I4210137693","display_name":"Siemens (United States)","ror":"https://ror.org/04axb7e79","country_code":"US","type":"company","lineage":["https://openalex.org/I1325886976","https://openalex.org/I4210137693"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Xuefei Guan","raw_affiliation_strings":["Corporate Technology, Siemens Corporation, 755 College Rd. E., Princeton, NJ 08540, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Corporate Technology, Siemens Corporation, 755 College Rd. E., Princeton, NJ 08540, USA","institution_ids":["https://openalex.org/I4210137693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101766174","display_name":"Jingdan Zhang","orcid":"https://orcid.org/0009-0006-1038-7589","observed_orcids":["https://orcid.org/0009-0006-1038-7589"]},"institutions":[{"id":"https://openalex.org/I4210137693","display_name":"Siemens (United States)","ror":"https://ror.org/04axb7e79","country_code":"US","type":"company","lineage":["https://openalex.org/I1325886976","https://openalex.org/I4210137693"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jingdan Zhang","raw_affiliation_strings":["Corporate Technology, Siemens Corporation, 755 College Rd. E., Princeton, NJ 08540, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Corporate Technology, Siemens Corporation, 755 College Rd. E., Princeton, NJ 08540, USA","institution_ids":["https://openalex.org/I4210137693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101592407","display_name":"Shaohua Kevin Zhou","orcid":"https://orcid.org/0000-0002-0973-7231","observed_orcids":["https://orcid.org/0000-0002-0973-7231"]},"institutions":[{"id":"https://openalex.org/I4210137693","display_name":"Siemens (United States)","ror":"https://ror.org/04axb7e79","country_code":"US","type":"company","lineage":["https://openalex.org/I1325886976","https://openalex.org/I4210137693"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shaohua Zhou","raw_affiliation_strings":["Corporate Technology, Siemens Corporation, 755 College Rd. E., Princeton, NJ 08540, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Corporate Technology, Siemens Corporation, 755 College Rd. E., Princeton, NJ 08540, USA","institution_ids":["https://openalex.org/I4210137693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018517855","display_name":"El Mahjoub Rasselkorde","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"El Mahjoub Rasselkorde","raw_affiliation_strings":["Siemens Energy, Inc., 841 Old Frankstown Road, Pittsburgh, PA 15239, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Siemens Energy, Inc., 841 Old Frankstown Road, Pittsburgh, PA 15239, USA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5067148931","display_name":"Waheed A. Abbasi","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Waheed Abbasi","raw_affiliation_strings":["Siemens Energy, Inc., 841 Old Frankstown Road, Pittsburgh, PA 15239, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Siemens Energy, Inc., 841 Old Frankstown Road, Pittsburgh, PA 15239, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5007911718"],"corresponding_institution_ids":["https://openalex.org/I4210137693"],"apc_list":{"value":4440,"currency":"USD","value_usd":4440},"apc_paid":null,"fwci":3.5113,"has_fulltext":false,"cited_by_count":44,"citation_normalized_percentile":{"value":0.92100479,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":88,"max":98},"biblio":{"volume":"61","issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10396","display_name":"Fatigue and fracture mechanics","score":0.7387999892234802,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10396","display_name":"Fatigue and fracture mechanics","score":0.7387999892234802,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.1014999970793724,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12086","display_name":"Structural Integrity and Reliability Analysis","score":0.06270000338554382,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/detection-probability","display_name":"detection probability","score":0.7480000257492065},{"id":"https://openalex.org/keywords/fatigue-life-prediction","display_name":"fatigue life prediction","score":0.7900000214576721},{"id":"https://openalex.org/keywords/uncertainty-quantification","display_name":"uncertainty quantification","score":0.8889999985694885},{"id":"https://openalex.org/keywords/ultrasonic-nondestructive-testing","display_name":"ultrasonic nondestructive evaluation","score":0.6600000262260437},{"id":"https://openalex.org/keywords/structural-integrity-assessment","display_name":"structural integrity assessment","score":0.7360000014305115},{"id":"https://openalex.org/keywords/turbine-rotor","display_name":"turbine rotor","score":0.7519999742507935},{"id":"https://openalex.org/keywords/error-analysis","display_name":"error analysis","score":0.5210000276565552}],"concepts":[{"id":"https://openalex.org/C2777767291","wikidata":"https://www.wikidata.org/wiki/Q1080291","display_name":"Sizing","level":2,"score":0.6636269688606262},{"id":"https://openalex.org/C129364497","wikidata":"https://www.wikidata.org/wiki/Q3042561","display_name":"Prognostics","level":2,"score":0.6353658437728882},{"id":"https://openalex.org/C49937458","wikidata":"https://www.wikidata.org/wiki/Q2599292","display_name":"Probabilistic logic","level":2,"score":0.6145912408828735},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.606572151184082},{"id":"https://openalex.org/C56529433","wikidata":"https://www.wikidata.org/wiki/Q626700","display_name":"Nondestructive testing","level":2,"score":0.5493929386138916},{"id":"https://openalex.org/C2776247918","wikidata":"https://www.wikidata.org/wiki/Q1423713","display_name":"Structural health monitoring","level":2,"score":0.4531169831752777},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.44714152812957764},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.41524386405944824},{"id":"https://openalex.org/C207201462","wikidata":"https://www.wikidata.org/wiki/Q182505","display_name":"Bayes' theorem","level":3,"score":0.41467130184173584},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3400934338569641},{"id":"https://openalex.org/C107673813","wikidata":"https://www.wikidata.org/wiki/Q812534","display_name":"Bayesian probability","level":2,"score":0.3385002613067627},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.3231402039527893},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.13753563165664673},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C126838900","wikidata":"https://www.wikidata.org/wiki/Q77604","display_name":"Radiology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.ndteint.2013.09.003","doi":"https://doi.org/10.1016/j.ndteint.2013.09.003","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.ndteint.2013.09.003","pdf_url":null,"source":{"id":"https://openalex.org/S4210233251","display_name":"NDT & E International","issn_l":"0963-8695","issn":["0963-8695","1879-1174"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-2","norway-1","poland-140","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"NDT & E International","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1496625989","https://openalex.org/W1692394121","https://openalex.org/W1966667501","https://openalex.org/W1974932712","https://openalex.org/W1982471512","https://openalex.org/W1983330367","https://openalex.org/W1994229366","https://openalex.org/W2013196923","https://openalex.org/W2032751439","https://openalex.org/W2043273981","https://openalex.org/W2049251004","https://openalex.org/W2053786598","https://openalex.org/W2057533129","https://openalex.org/W2062613656","https://openalex.org/W2064198248","https://openalex.org/W2065455715","https://openalex.org/W2069188628","https://openalex.org/W2075759156","https://openalex.org/W2078843958","https://openalex.org/W2086308087","https://openalex.org/W2106474383","https://openalex.org/W2107645931","https://openalex.org/W2110898696","https://openalex.org/W2142926772","https://openalex.org/W2470553341","https://openalex.org/W4211177544"],"related_works":["https://openalex.org/W2013781784","https://openalex.org/W1988038418","https://openalex.org/W1966667501","https://openalex.org/W2337638087","https://openalex.org/W4322501919","https://openalex.org/W1988771083","https://openalex.org/W2013196923","https://openalex.org/W613164093","https://openalex.org/W6982547901","https://openalex.org/W7167285274"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":6},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":4},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":1}],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2022-05-12T00:00:00"}