{"id":"https://openalex.org/W4229779291","doi":"https://doi.org/10.1117/12.392562","title":"Low-Cost Microsensors Program","display_name":"Low-Cost Microsensors Program","publication_year":2000,"publication_date":"2000-07-21","ids":{"openalex":"https://openalex.org/W4229779291","doi":"https://doi.org/10.1117/12.392562"},"language":"en","primary_location":{"id":"doi:10.1117/12.392562","doi":"https://doi.org/10.1117/12.392562","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.392562","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"John S. Anderson","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4388891764","display_name":"Raytheon (United States)","ror":"https://ror.org/03gkvrb60","country_code":"US","type":"company","lineage":["https://openalex.org/I1306686416","https://openalex.org/I4388891764"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"John S. Anderson","raw_affiliation_strings":["Raytheon Co. (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Raytheon Co. (United States)","institution_ids":["https://openalex.org/I4388891764"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034597781","display_name":"Daryl Bradley","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4388891764","display_name":"Raytheon (United States)","ror":"https://ror.org/03gkvrb60","country_code":"US","type":"company","lineage":["https://openalex.org/I1306686416","https://openalex.org/I4388891764"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Daryl Bradley","raw_affiliation_strings":["Raytheon Co. (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Raytheon Co. (United States)","institution_ids":["https://openalex.org/I4388891764"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103472409","display_name":"Richard Chin","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4388891764","display_name":"Raytheon (United States)","ror":"https://ror.org/03gkvrb60","country_code":"US","type":"company","lineage":["https://openalex.org/I1306686416","https://openalex.org/I4388891764"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Richard Chin","raw_affiliation_strings":["Raytheon Co. (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Raytheon Co. (United States)","institution_ids":["https://openalex.org/I4388891764"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108207602","display_name":"W. A. Radford","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4388891764","display_name":"Raytheon (United States)","ror":"https://ror.org/03gkvrb60","country_code":"US","type":"company","lineage":["https://openalex.org/I1306686416","https://openalex.org/I4388891764"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"William A. Radford","raw_affiliation_strings":["Raytheon Infrared Ctr. of Excellence (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Raytheon Infrared Ctr. of Excellence (United States)","institution_ids":["https://openalex.org/I4388891764"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070282798","display_name":"Adam Scott Kennedy","orcid":"https://orcid.org/0000-0002-6925-4549","observed_orcids":["https://orcid.org/0000-0002-6925-4549"]},"institutions":[{"id":"https://openalex.org/I4388891764","display_name":"Raytheon (United States)","ror":"https://ror.org/03gkvrb60","country_code":"US","type":"company","lineage":["https://openalex.org/I1306686416","https://openalex.org/I4388891764"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Adam Kennedy","raw_affiliation_strings":["Raytheon Infrared Ctr. of Excellence (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Raytheon Infrared Ctr. of Excellence (United States)","institution_ids":["https://openalex.org/I4388891764"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019081377","display_name":"Daniel F. Murphy","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4388891764","display_name":"Raytheon (United States)","ror":"https://ror.org/03gkvrb60","country_code":"US","type":"company","lineage":["https://openalex.org/I1306686416","https://openalex.org/I4388891764"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Daniel F. Murphy","raw_affiliation_strings":["Raytheon Infrared Ctr. of Excellence (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Raytheon Infrared Ctr. of Excellence (United States)","institution_ids":["https://openalex.org/I4388891764"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025376751","display_name":"Michael J. Ray","orcid":"https://orcid.org/0000-0001-7670-9639","observed_orcids":["https://orcid.org/0000-0001-7670-9639"]},"institutions":[{"id":"https://openalex.org/I4388891764","display_name":"Raytheon (United States)","ror":"https://ror.org/03gkvrb60","country_code":"US","type":"company","lineage":["https://openalex.org/I1306686416","https://openalex.org/I4388891764"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Michael Ray","raw_affiliation_strings":["Raytheon Infrared Ctr. of Excellence (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Raytheon Infrared Ctr. of Excellence (United States)","institution_ids":["https://openalex.org/I4388891764"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109939908","display_name":"Richard Wyles","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4388891764","display_name":"Raytheon (United States)","ror":"https://ror.org/03gkvrb60","country_code":"US","type":"company","lineage":["https://openalex.org/I1306686416","https://openalex.org/I4388891764"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Richard Wyles","raw_affiliation_strings":["Raytheon Infrared Ctr. of Excellence (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Raytheon Infrared Ctr. of Excellence (United States)","institution_ids":["https://openalex.org/I4388891764"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103921725","display_name":"James C. Brown","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210088792","display_name":"United States Army","ror":"https://ror.org/00afsp483","country_code":"US","type":"government","lineage":["https://openalex.org/I1304082316","https://openalex.org/I1330347796","https://openalex.org/I4210088792"]},{"id":"https://openalex.org/I4405270705","display_name":"Night Vision and Electronic Sensors Directorate","ror":"https://ror.org/016s8wt97","country_code":"US","type":"government","lineage":["https://openalex.org/I4405270705"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"James C. Brown","raw_affiliation_strings":["U.S. Army Night Vision & Electronic Sensors Directorate (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"U.S. Army Night Vision & Electronic Sensors Directorate (United States)","institution_ids":["https://openalex.org/I4210088792","https://openalex.org/I4405270705"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5065636941","display_name":"Gwendolyn W. Newsome","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210088792","display_name":"United States Army","ror":"https://ror.org/00afsp483","country_code":"US","type":"government","lineage":["https://openalex.org/I1304082316","https://openalex.org/I1330347796","https://openalex.org/I4210088792"]},{"id":"https://openalex.org/I4405270705","display_name":"Night Vision and Electronic Sensors Directorate","ror":"https://ror.org/016s8wt97","country_code":"US","type":"government","lineage":["https://openalex.org/I4405270705"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Gwendolyn W. Newsome","raw_affiliation_strings":["U.S. Army Night Vision & Electronic Sensors Directorate (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"U.S. Army Night Vision & Electronic Sensors Directorate (United States)","institution_ids":["https://openalex.org/I4210088792","https://openalex.org/I4405270705"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.52899106,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"4040","issue":null,"first_page":"31","last_page":"36"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.9740999937057495,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.9740999937057495,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.021199999377131462,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","score":0.0006000000284984708,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/uncooled-infrared-detectors","display_name":"uncooled infrared detectors","score":0.9490000009536743},{"id":"https://openalex.org/keywords/low-cost-infrared-sensors","display_name":"low-cost infrared sensors","score":0.6499999761581421},{"id":"https://openalex.org/keywords/sensor-miniaturization","display_name":"sensor miniaturization","score":0.7670000195503235}],"concepts":[{"id":"https://openalex.org/C57528182","wikidata":"https://www.wikidata.org/wiki/Q1271842","display_name":"Miniaturization","level":2,"score":0.7174089550971985},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.49123042821884155},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.4723963439464569},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4577982723712921},{"id":"https://openalex.org/C2780478481","wikidata":"https://www.wikidata.org/wiki/Q1189460","display_name":"Large format","level":2,"score":0.41188615560531616},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.39607730507850647},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3642891049385071},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3206120729446411},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.16679638624191284},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.15089115500450134},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.10110017657279968}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1117/12.392562","doi":"https://doi.org/10.1117/12.392562","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.392562","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2007297717","https://openalex.org/W2101761709","https://openalex.org/W1999109210","https://openalex.org/W1600073047","https://openalex.org/W2042029969","https://openalex.org/W2063827624","https://openalex.org/W2547750997","https://openalex.org/W1970398330","https://openalex.org/W2026519026","https://openalex.org/W2065527762"],"abstract_inverted_index":{"The":[0,10,38,56,74,95,106],"objectives":[1],"of":[2,108,121,130],"the":[3,116,128],"Low":[4],"Cost":[5],"Microsensors":[6],"Program":[7],"are":[8],"twofold.":[9],"first":[11],"is":[12,40,61,70,79,85,99,112],"to":[13,41,63,113,126,137],"develop":[14,42],"and":[15,66,69,92,119,125,139],"deliver":[16],"a":[17,48,71],"long-range":[18,64],"infrared":[19],"(IR)":[20],"sensor":[21,60,78],"built":[22,46],"upon":[23,47],"an":[24,43],"uncooled":[25,122],"vanadium":[26],"oxide":[27],"(VOx)":[28],"640":[29,57],"X":[30,51,58,76,97],"480":[31,59],"format":[32,53],"focal":[33],"plane":[34],"array":[35],"(FPA)":[36],"engine.":[37,55],"second":[39],"expendable":[44,103],"microsensor":[45],"VOx":[49],"160":[50,75,96],"120":[52,77,98],"FPA":[54],"applicable":[62],"surveillance":[65],"targeting":[67],"missions":[68],"reusable":[72],"asset.":[73],"designed":[80],"for":[81,102],"applications":[82],"where":[83],"miniaturization":[84],"required":[86],"as":[87,89],"well":[88],"low":[90,93],"cost":[91],"power.":[94],"also":[100],"intended":[101],"military":[104,138],"applications.":[105],"intent":[107],"this":[109],"DUS&T":[110],"effort":[111],"further":[114],"reduce":[115],"cost,":[117],"weight,":[118],"power":[120],"IR":[123],"sensors,":[124,132],"increase":[127],"capability":[129],"these":[131],"thereby":[133],"expanding":[134],"their":[135],"applicability":[136],"commercial":[140],"markets":[141],"never":[142],"before":[143],"addressed":[144],"by":[145],"thermal":[146],"imaging.":[147]},"counts_by_year":[],"updated_date":"2026-10-27T15:51:10.671819","created_date":"2022-05-11T00:00:00"}