{"id":"https://openalex.org/W4220948466","doi":"https://doi.org/10.1016/j.optlaseng.2022.107020","title":"Flexible lateral shearing interferometry based on polarization gratings for surface figure metrology","display_name":"Flexible lateral shearing interferometry based on polarization gratings for surface figure metrology","publication_year":2022,"publication_date":"2022-03-06","ids":{"openalex":"https://openalex.org/W4220948466","doi":"https://doi.org/10.1016/j.optlaseng.2022.107020"},"language":"en","primary_location":{"id":"doi:10.1016/j.optlaseng.2022.107020","doi":"https://doi.org/10.1016/j.optlaseng.2022.107020","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.optlaseng.2022.107020","pdf_url":null,"source":{"id":"https://openalex.org/S102728161","display_name":"Optics and Lasers in Engineering","issn_l":"0143-8166","issn":["0143-8166","1873-0302"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-c","jufo-1","ki-jl-1","norway-1","poland-140","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Optics and Lasers in Engineering","raw_type":"journal-article"},"parent_works":[],"lineage":["https://openalex.org/W4220948466"],"child_works_count":0,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5025794087","display_name":"Hyo Bin Jeong","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I152238500","display_name":"Chosun University","ror":"https://ror.org/01zt9a375","country_code":"KR","type":"education","lineage":["https://openalex.org/I152238500"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyo Bin Jeong","raw_affiliation_strings":["Department of Photonic Engineering, Chosun University, Gwangju 61452, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Photonic Engineering, Chosun University, Gwangju 61452, South Korea","institution_ids":["https://openalex.org/I152238500"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010488942","display_name":"Hyo Mi Park","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I152238500","display_name":"Chosun University","ror":"https://ror.org/01zt9a375","country_code":"KR","type":"education","lineage":["https://openalex.org/I152238500"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyo Mi Park","raw_affiliation_strings":["Department of Photonic Engineering, Chosun University, Gwangju 61452, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Photonic Engineering, Chosun University, Gwangju 61452, South Korea","institution_ids":["https://openalex.org/I152238500"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058828272","display_name":"Young-Sik Ghim","orcid":"https://orcid.org/0000-0002-4052-4939","observed_orcids":["https://orcid.org/0000-0002-4052-4939"]},"institutions":[{"id":"https://openalex.org/I2799611809","display_name":"Korea Research Institute of Standards and Science","ror":"https://ror.org/01az7b475","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2799611809","https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098"]},{"id":"https://openalex.org/I88761825","display_name":"Korea University of Science and Technology","ror":"https://ror.org/000qzf213","country_code":"KR","type":"education","lineage":["https://openalex.org/I88761825"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Young-Sik Ghim","raw_affiliation_strings":["Department of Science of Measurement, University of Science and Technology (UST), Science Town, Daejeon 34113, South Korea","Optical Imaging and Metrology Team, Advanced Instrumentation Institute, Korea Research Institute of Standards and Science (KRISS), Science Town, Daejeon 34113, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Science of Measurement, University of Science and Technology (UST), Science Town, Daejeon 34113, South Korea","institution_ids":["https://openalex.org/I88761825"]},{"raw_affiliation_string":"Optical Imaging and Metrology Team, Advanced Instrumentation Institute, Korea Research Institute of Standards and Science (KRISS), Science Town, Daejeon 34113, South Korea","institution_ids":["https://openalex.org/I2799611809"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5074703606","display_name":"Ki-Nam Joo","orcid":"https://orcid.org/0000-0001-9484-2644","observed_orcids":["https://orcid.org/0000-0001-9484-2644"]},"institutions":[{"id":"https://openalex.org/I152238500","display_name":"Chosun University","ror":"https://ror.org/01zt9a375","country_code":"KR","type":"education","lineage":["https://openalex.org/I152238500"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Ki-Nam Joo","raw_affiliation_strings":["Department of Photonic Engineering, Chosun University, Gwangju 61452, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Photonic Engineering, Chosun University, Gwangju 61452, South Korea","institution_ids":["https://openalex.org/I152238500"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5058828272","https://openalex.org/A5074703606"],"corresponding_institution_ids":["https://openalex.org/I152238500","https://openalex.org/I2799611809","https://openalex.org/I88761825"],"apc_list":{"value":2940,"currency":"USD","value_usd":2940},"apc_paid":null,"fwci":1.2533,"has_fulltext":false,"cited_by_count":22,"citation_normalized_percentile":{"value":0.7912704,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":99},"biblio":{"volume":"154","issue":null,"first_page":"107020","last_page":"107020"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9922000169754028,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9922000169754028,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.005799999926239252,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11484","display_name":"Adaptive optics and wavefront sensing","score":0.00039999998989515007,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/lateral-shearing-interferometry","display_name":"lateral shearing interferometry","score":0.9800000190734863},{"id":"https://openalex.org/keywords/polarization-gratings","display_name":"polarization gratings","score":0.9980000257492065},{"id":"https://openalex.org/keywords/freeform-surfaces","display_name":"free-form surfaces","score":0.7129999995231628},{"id":"https://openalex.org/keywords/polarization-camera","display_name":"polarization camera","score":0.6019999980926514},{"id":"https://openalex.org/keywords/single-shot-measurement","display_name":"single-shot measurement","score":0.6549999713897705}],"concepts":[{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.8144521117210388},{"id":"https://openalex.org/C166689943","wikidata":"https://www.wikidata.org/wiki/Q850283","display_name":"Interferometry","level":2,"score":0.7781894207000732},{"id":"https://openalex.org/C125743686","wikidata":"https://www.wikidata.org/wiki/Q108779","display_name":"Birefringence","level":2,"score":0.757780909538269},{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.6882339715957642},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6848962306976318},{"id":"https://openalex.org/C205049153","wikidata":"https://www.wikidata.org/wiki/Q2698605","display_name":"Polarization (electrochemistry)","level":2,"score":0.6447786092758179},{"id":"https://openalex.org/C152279782","wikidata":"https://www.wikidata.org/wiki/Q13583542","display_name":"Shearing (physics)","level":2,"score":0.6036345362663269},{"id":"https://openalex.org/C2780186746","wikidata":"https://www.wikidata.org/wiki/Q7492198","display_name":"Shearing interferometer","level":4,"score":0.595300018787384},{"id":"https://openalex.org/C23576306","wikidata":"https://www.wikidata.org/wiki/Q17004698","display_name":"Astronomical interferometer","level":3,"score":0.3857027292251587},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.21358007192611694},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.optlaseng.2022.107020","doi":"https://doi.org/10.1016/j.optlaseng.2022.107020","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.optlaseng.2022.107020","pdf_url":null,"source":{"id":"https://openalex.org/S102728161","display_name":"Optics and Lasers in Engineering","issn_l":"0143-8166","issn":["0143-8166","1873-0302"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-c","jufo-1","ki-jl-1","norway-1","poland-140","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Optics and Lasers in Engineering","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[{"id":"https://openalex.org/G3125630949","display_name":null,"funder_award_id":"NRF-2021R1A2C1008661","funder_id":"https://openalex.org/F4320320709","funder_display_name":"National Research Foundation Singapore"}],"funders":[{"id":"https://openalex.org/F4320320709","display_name":"National Research Foundation Singapore","ror":"https://ror.org/03cpyc314"},{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W2003292041","https://openalex.org/W2009518030","https://openalex.org/W2010551215","https://openalex.org/W2013600059","https://openalex.org/W2029795596","https://openalex.org/W2049550935","https://openalex.org/W2065977491","https://openalex.org/W2084349857","https://openalex.org/W2922475513","https://openalex.org/W2923357392","https://openalex.org/W2954856145","https://openalex.org/W2999354253","https://openalex.org/W3209109352"],"related_works":["https://openalex.org/W1982053702","https://openalex.org/W2066394602","https://openalex.org/W2289849478","https://openalex.org/W4223432847","https://openalex.org/W4319593687","https://openalex.org/W2033849310","https://openalex.org/W2584269434","https://openalex.org/W4281263993","https://openalex.org/W2999354253","https://openalex.org/W4221044284"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":9},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":1}],"updated_date":"2026-11-03T10:50:19.383937","created_date":"2022-04-03T00:00:00"}