{"id":"https://openalex.org/W4200564149","doi":"https://doi.org/10.1088/1742-6596/2132/1/012039","title":"Error factors of AC-DC conversion circuits accuracy","display_name":"Error factors of AC-DC conversion circuits accuracy","publication_year":2021,"publication_date":"2021-12-01","ids":{"openalex":"https://openalex.org/W4200564149","doi":"https://doi.org/10.1088/1742-6596/2132/1/012039"},"language":"en","primary_location":{"id":"doi:10.1088/1742-6596/2132/1/012039","doi":"https://doi.org/10.1088/1742-6596/2132/1/012039","is_oa":true,"landing_page_url":"https://doi.org/10.1088/1742-6596/2132/1/012039","pdf_url":"https://iopscience.iop.org/article/10.1088/1742-6596/2132/1/012039/pdf","source":{"id":"https://openalex.org/S4210187594","display_name":"Journal of Physics Conference Series","issn_l":"1742-6588","issn":["1742-6588","1742-6596"],"is_oa":true,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-class-a","anvur-scientific","cwts-core","jufo-1","norway-1","poland-40","vabb-shw"],"host_organization":"https://openalex.org/P4310320083","host_organization_name":"IOP Publishing","host_organization_lineage":["https://openalex.org/P4310320083","https://openalex.org/P4310311669"],"host_organization_lineage_names":["IOP Publishing","Institute of Physics"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Physics: Conference Series","raw_type":"journal-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://iopscience.iop.org/article/10.1088/1742-6596/2132/1/012039/pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Dongyu Jia","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4405282447","display_name":"Beijing Orient Institute of Measurement and Test","ror":"https://ror.org/05vhdxq63","country_code":"CN","type":"facility","lineage":["https://openalex.org/I194716290","https://openalex.org/I2802615301","https://openalex.org/I4405282447"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Dongyu Jia","raw_affiliation_strings":["Beijing Orient Institute of Measurement and Test, Beijing, 100094, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beijing Orient Institute of Measurement and Test, Beijing, 100094, China","institution_ids":["https://openalex.org/I4405282447"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101530192","display_name":"Ming Yan","orcid":"https://orcid.org/0000-0003-0077-5749","observed_orcids":["https://orcid.org/0000-0003-0077-5749"]},"institutions":[{"id":"https://openalex.org/I4405282447","display_name":"Beijing Orient Institute of Measurement and Test","ror":"https://ror.org/05vhdxq63","country_code":"CN","type":"facility","lineage":["https://openalex.org/I194716290","https://openalex.org/I2802615301","https://openalex.org/I4405282447"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ming Yan","raw_affiliation_strings":["Beijing Orient Institute of Measurement and Test, Beijing, 100094, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beijing Orient Institute of Measurement and Test, Beijing, 100094, China","institution_ids":["https://openalex.org/I4405282447"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055109084","display_name":"Rongwei Feng","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4405282447","display_name":"Beijing Orient Institute of Measurement and Test","ror":"https://ror.org/05vhdxq63","country_code":"CN","type":"facility","lineage":["https://openalex.org/I194716290","https://openalex.org/I2802615301","https://openalex.org/I4405282447"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Rongwei Feng","raw_affiliation_strings":["Beijing Orient Institute of Measurement and Test, Beijing, 100094, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beijing Orient Institute of Measurement and Test, Beijing, 100094, China","institution_ids":["https://openalex.org/I4405282447"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5112607348","display_name":"Shuangyu Li","orcid":"https://orcid.org/0009-0004-1820-0905","observed_orcids":["https://orcid.org/0009-0004-1820-0905"]},"institutions":[{"id":"https://openalex.org/I4405282447","display_name":"Beijing Orient Institute of Measurement and Test","ror":"https://ror.org/05vhdxq63","country_code":"CN","type":"facility","lineage":["https://openalex.org/I194716290","https://openalex.org/I2802615301","https://openalex.org/I4405282447"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shuangyu Li","raw_affiliation_strings":["Beijing Orient Institute of Measurement and Test, Beijing, 100094, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beijing Orient Institute of Measurement and Test, Beijing, 100094, China","institution_ids":["https://openalex.org/I4405282447"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4405282447"],"apc_list":null,"apc_paid":null,"fwci":0.3854,"has_fulltext":true,"cited_by_count":1,"citation_normalized_percentile":{"value":0.37662828,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"2132","issue":"1","first_page":"012039","last_page":"012039"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9843999743461609,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9843999743461609,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.014000000432133675,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.0003000000142492354,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ac-dc-conversion","display_name":"AC-DC conversion","score":0.9610000252723694},{"id":"https://openalex.org/keywords/precision-rectifier","display_name":"precision rectifier","score":0.8119999766349792},{"id":"https://openalex.org/keywords/full-wave-rectifier","display_name":"full-wave rectifier","score":0.8019999861717224}],"concepts":[{"id":"https://openalex.org/C50100734","wikidata":"https://www.wikidata.org/wiki/Q7303176","display_name":"Rectifier (neural networks)","level":5,"score":0.6946268677711487},{"id":"https://openalex.org/C50942859","wikidata":"https://www.wikidata.org/wiki/Q4967193","display_name":"Rectification","level":3,"score":0.6673208475112915},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5433819890022278},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5358791351318359},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5134878754615784},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.4928774833679199},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.45843157172203064},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.45481905341148376},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.43988385796546936},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23772555589675903},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.09677127003669739},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.0},{"id":"https://openalex.org/C86582703","wikidata":"https://www.wikidata.org/wiki/Q7617824","display_name":"Stochastic neural network","level":4,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C147168706","wikidata":"https://www.wikidata.org/wiki/Q1457734","display_name":"Recurrent neural network","level":3,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1088/1742-6596/2132/1/012039","doi":"https://doi.org/10.1088/1742-6596/2132/1/012039","is_oa":true,"landing_page_url":"https://doi.org/10.1088/1742-6596/2132/1/012039","pdf_url":"https://iopscience.iop.org/article/10.1088/1742-6596/2132/1/012039/pdf","source":{"id":"https://openalex.org/S4210187594","display_name":"Journal of Physics Conference Series","issn_l":"1742-6588","issn":["1742-6588","1742-6596"],"is_oa":true,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-class-a","anvur-scientific","cwts-core","jufo-1","norway-1","poland-40","vabb-shw"],"host_organization":"https://openalex.org/P4310320083","host_organization_name":"IOP Publishing","host_organization_lineage":["https://openalex.org/P4310320083","https://openalex.org/P4310311669"],"host_organization_lineage_names":["IOP Publishing","Institute of Physics"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Physics: Conference Series","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1088/1742-6596/2132/1/012039","doi":"https://doi.org/10.1088/1742-6596/2132/1/012039","is_oa":true,"landing_page_url":"https://doi.org/10.1088/1742-6596/2132/1/012039","pdf_url":"https://iopscience.iop.org/article/10.1088/1742-6596/2132/1/012039/pdf","source":{"id":"https://openalex.org/S4210187594","display_name":"Journal of Physics Conference Series","issn_l":"1742-6588","issn":["1742-6588","1742-6596"],"is_oa":true,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-class-a","anvur-scientific","cwts-core","jufo-1","norway-1","poland-40","vabb-shw"],"host_organization":"https://openalex.org/P4310320083","host_organization_name":"IOP Publishing","host_organization_lineage":["https://openalex.org/P4310320083","https://openalex.org/P4310311669"],"host_organization_lineage_names":["IOP Publishing","Institute of Physics"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Physics: Conference Series","raw_type":"journal-article"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4200564149.pdf","grobid_xml":"https://content.openalex.org/works/W4200564149.grobid-xml"},"referenced_works_count":5,"referenced_works":["https://openalex.org/W1973970579","https://openalex.org/W1988738449","https://openalex.org/W2085467474","https://openalex.org/W2113228378","https://openalex.org/W3026197110"],"related_works":["https://openalex.org/W6917986514","https://openalex.org/W2120671953","https://openalex.org/W2146424637","https://openalex.org/W3211781395","https://openalex.org/W2393449107","https://openalex.org/W2064250546","https://openalex.org/W2098265918","https://openalex.org/W1928731799","https://openalex.org/W2155247682","https://openalex.org/W2108906941"],"abstract_inverted_index":{"Abstract":[0],"Voltage":[1],"standard":[2,27],"source":[3,28],"is":[4,29],"an":[5],"important":[6,19],"basic":[7],"instrument":[8],"in":[9,110,128],"the":[10,54,66,69,74,81,93,105,111,123,129],"electrical":[11],"measurement":[12],"and":[13,16,59,77,104],"testing":[14],"field,":[15],"it":[17],"has":[18],"guarantee":[20],"significance":[21],"for":[22,121],"many":[23],"industries.":[24],"AC":[25,42],"voltage":[26],"based":[30],"on":[31,65,80],"AC-DC":[32,52,126],"conversion":[33,127],"technology":[34],"to":[35,46],"achieve":[36],"output":[37,71,88,94],"function":[38],"of":[39,51,68,95,107,125,131],"high":[40],"precision":[41,98,112],"voltage.":[43],"In":[44],"order":[45],"get":[47],"a":[48,62,119],"better":[49],"effect":[50],"conversion,":[53],"three":[55],"factors\u2014operational":[56],"amplifier,":[57],"resistance":[58],"diode\u2014that":[60],"have":[61],"greater":[63],"impact":[64],"accuracy":[67,124],"rectifier":[70,113,134],"were":[72,84],"taken":[73],"research":[75],"object,":[76],"their":[78],"impacts":[79],"circuit":[82,100,114],"error":[83,109],"analyzed":[85],"respectively.":[86],"The":[87],"result":[89],"was":[90,115],"compared":[91],"with":[92],"full":[96,132],"wave":[97,133],"rectification":[99],"under":[101],"ideal":[102],"state,":[103],"scheme":[106],"reducing":[108],"summarized,":[116],"which":[117],"provides":[118],"reference":[120],"improving":[122],"design":[130],"circuit.":[135]},"counts_by_year":[{"year":2023,"cited_by_count":1}],"updated_date":"2026-10-16T09:59:22.235173","created_date":"2021-12-31T00:00:00"}