{"id":"https://openalex.org/W4200186232","doi":"https://doi.org/10.1002/int.22774","title":"Defective and nondefective classif ication of fabric images using shallow and deep networks","display_name":"Defective and nondefective classif ication of fabric images using shallow and deep networks","publication_year":2021,"publication_date":"2021-12-02","ids":{"openalex":"https://openalex.org/W4200186232","doi":"https://doi.org/10.1002/int.22774"},"language":"en","primary_location":{"id":"doi:10.1002/int.22774","doi":"https://doi.org/10.1002/int.22774","is_oa":false,"landing_page_url":"https://doi.org/10.1002/int.22774","pdf_url":null,"source":{"id":"https://openalex.org/S57950554","display_name":"International Journal of Intelligent Systems","issn_l":"0884-8173","issn":["0884-8173","1098-111X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","ccf-c","cwts-core","dongbi-c","jufo-1","norway-1","poland-100","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Intelligent Systems","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5013271379","display_name":"Mahantesh C. Elemmi","orcid":"https://orcid.org/0000-0002-9972-5321","observed_orcids":["https://orcid.org/0000-0002-9972-5321"]},"institutions":[{"id":"https://openalex.org/I4405260778","display_name":"Jain College of Engineering and Research","ror":"https://ror.org/048tfwf02","country_code":"IN","type":"education","lineage":["https://openalex.org/I4405260778"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Mahantesh C. Elemmi","raw_affiliation_strings":["Department of Computer Science and Engineering, Jain College of Engineering and Research, Belagavi, India"],"raw_orcid":"https://orcid.org/0000-0002-9972-5321","affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, Jain College of Engineering and Research, Belagavi, India","institution_ids":["https://openalex.org/I4405260778"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046620481","display_name":"Basavaraj S. Anami","orcid":"https://orcid.org/0000-0001-6281-8666","observed_orcids":["https://orcid.org/0000-0001-6281-8666"]},"institutions":[{"id":"https://openalex.org/I3132975163","display_name":"KLE Technological University","ror":"https://ror.org/04yh52k23","country_code":"IN","type":"education","lineage":["https://openalex.org/I3132975163"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Basavaraj S. Anami","raw_affiliation_strings":["Department of Computer Science and Engineering, K.L.E. Institute of Technology, Hubballi, India"],"raw_orcid":"https://orcid.org/0000-0001-6281-8666","affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, K.L.E. Institute of Technology, Hubballi, India","institution_ids":["https://openalex.org/I3132975163"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5007196985","display_name":"Naveen Nagendrappa Malvade","orcid":"https://orcid.org/0000-0003-1582-147X","observed_orcids":["https://orcid.org/0000-0003-1582-147X"]},"institutions":[{"id":"https://openalex.org/I204743663","display_name":"University of Mysore","ror":"https://ror.org/012bxv356","country_code":"IN","type":"education","lineage":["https://openalex.org/I204743663"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Naveen N. Malvade","raw_affiliation_strings":["Department of Computer Science and Engineering, A.T.M.E. College of Engineering, Mysuru, India"],"raw_orcid":"https://orcid.org/0000-0003-1582-147X","affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, A.T.M.E. College of Engineering, Mysuru, India","institution_ids":["https://openalex.org/I204743663"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5013271379"],"corresponding_institution_ids":["https://openalex.org/I4405260778"],"apc_list":{"value":3600,"currency":"USD","value_usd":3600},"apc_paid":null,"fwci":1.2969,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.78636815,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"37","issue":"3","first_page":"2293","last_page":"2318"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fabric-defect-detection","display_name":"fabric defect detection","score":0.9850000143051147},{"id":"https://openalex.org/keywords/mobilenet","display_name":"MobileNet","score":0.8970000147819519},{"id":"https://openalex.org/keywords/resnet","display_name":"ResNet","score":0.9819999933242798},{"id":"https://openalex.org/keywords/shallow-neural-networks","display_name":"shallow neural networks","score":0.7940000295639038},{"id":"https://openalex.org/keywords/morphological-features","display_name":"morphological features","score":0.8109999895095825},{"id":"https://openalex.org/keywords/feature-selection","display_name":"feature selection","score":0.6830000281333923},{"id":"https://openalex.org/keywords/deep-learning-model-comparison","display_name":"deep learning model comparison","score":0.46000000834465027}],"concepts":[{"id":"https://openalex.org/C2944601119","wikidata":"https://www.wikidata.org/wiki/Q43744058","display_name":"Residual neural network","level":3,"score":0.6970797777175903},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6953538060188293},{"id":"https://openalex.org/C155512373","wikidata":"https://www.wikidata.org/wiki/Q287450","display_name":"Residual","level":2,"score":0.6312574148178101},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6177412271499634},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.5695112943649292},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.491536945104599},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.47323665022850037},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4508990943431854},{"id":"https://openalex.org/C2984842247","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep neural networks","level":3,"score":0.4312676787376404},{"id":"https://openalex.org/C18762648","wikidata":"https://www.wikidata.org/wiki/Q42213","display_name":"Work (physics)","level":2,"score":0.421242356300354},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3374508023262024},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.17297843098640442},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1173596978187561},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1002/int.22774","doi":"https://doi.org/10.1002/int.22774","is_oa":false,"landing_page_url":"https://doi.org/10.1002/int.22774","pdf_url":null,"source":{"id":"https://openalex.org/S57950554","display_name":"International Journal of Intelligent Systems","issn_l":"0884-8173","issn":["0884-8173","1098-111X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","ccf-c","cwts-core","dongbi-c","jufo-1","norway-1","poland-100","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Intelligent Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W2088398118","https://openalex.org/W2202633017","https://openalex.org/W2442169581","https://openalex.org/W2831321715","https://openalex.org/W2895814790","https://openalex.org/W2914534571","https://openalex.org/W2946313203","https://openalex.org/W2998149586","https://openalex.org/W3005857895","https://openalex.org/W3138633203","https://openalex.org/W3172936863"],"related_works":["https://openalex.org/W4297968094","https://openalex.org/W4210675473","https://openalex.org/W2989838758","https://openalex.org/W4385577407","https://openalex.org/W4281400715","https://openalex.org/W2981845603","https://openalex.org/W4390311830","https://openalex.org/W4288080874","https://openalex.org/W3177406193","https://openalex.org/W4405304574"],"abstract_inverted_index":{"The":[0,16,31,48,71,89,103],"defect":[1],"detection":[2],"is":[3],"an":[4],"important":[5],"activity":[6],"in":[7,12,54,107],"quality":[8,110],"analysis":[9,22,57],"and":[10,27,33,44,78,85,100,120],"control":[11],"the":[13,42,68],"fabric":[14,46,55],"industry.":[15],"presented":[17],"work":[18,104],"gives":[19],"a":[20,94],"comparative":[21],"of":[23,75,116],"artificial":[24],"neural":[25],"network":[26,36],"deep":[28,34],"learning":[29],"architectures.":[30,102],"MobileNet":[32,86,90],"residual":[35],"(ResNet)":[37],"are":[38,52,80],"deployed":[39],"to":[40,66],"classify":[41],"defective":[43],"nondefective":[45],"images.":[47],"hand-crafted":[49],"morphological":[50],"features":[51],"used":[53],"image":[56],"along":[58],"with":[59],"feed":[60],"backward":[61],"selection":[62],"feature":[63],"reduction":[64],"method":[65],"obtain":[67],"significant":[69],"features.":[70],"overall":[72],"classification":[73,96],"rates":[74],"95.3%,":[76],"98.2%,":[77],"99.65%":[79],"obtained":[81],"for":[82],"Shallow,":[83],"ResNet,":[84],"architectures,":[87],"respectively.":[88],"model":[91],"has":[92],"given":[93],"maximum":[95],"rate":[97],"than":[98],"Shallow":[99],"ResNet":[101],"finds":[105],"applications":[106],"apparel":[108],"industry,":[109],"analysis,":[111],"cost":[112],"estimation,":[113],"online":[114],"purchase":[115],"fabric,":[117],"Industry":[118],"4.0,":[119],"so":[121],"on.":[122]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":4}],"updated_date":"2026-10-30T12:39:25.321706","created_date":"2021-12-31T00:00:00"}