{"id":"https://openalex.org/W41289176","doi":null,"title":"USE OF GaAs LIGHT SOURCES FOR CALIBRATING DEVICES WITH SEMICONDUCTOR NUCLEAR-RADIATION DETECTORS.","display_name":"USE OF GaAs LIGHT SOURCES FOR CALIBRATING DEVICES WITH SEMICONDUCTOR NUCLEAR-RADIATION DETECTORS.","publication_year":1966,"publication_date":"1966-01-01","ids":{"openalex":"https://openalex.org/W41289176","mag":"41289176"},"language":"en","primary_location":{"id":"mag:41289176","doi":null,"is_oa":false,"landing_page_url":"https://www.osti.gov/scitech/biblio/4473451-use-gaas-light-sources-calibrating-devices-semiconductor-nuclear-radiation-detectors","pdf_url":null,"source":{"id":"https://openalex.org/S4306402487","display_name":"OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I139351228","host_organization_name":"Office of Scientific and Technical Information","host_organization_lineage":["https://openalex.org/I139351228"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null},"volume":null,"type":"article","is_traditional":true,"indexed_in":[],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5031812764","display_name":"V.I. Naumov","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"V.I. Naumov","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069825352","display_name":"M.N. Omel'yanenko","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"M.N. Omel'yanenko","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5106695931","display_name":"V.I. Rykalin","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"V.I. Rykalin","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":null,"display_name":"Valeriya Titova","orcid":"https://orcid.org/0000-0003-0483-9893","observed_orcids":["https://orcid.org/0000-0003-0483-9893"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Valeriya Titova","raw_affiliation_strings":[],"raw_orcid":"https://orcid.org/0000-0003-0483-9893","affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11216","display_name":"Radiation Detection and Scintillator Technologies","score":0.8095999956130981,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11216","display_name":"Radiation Detection and Scintillator Technologies","score":0.8095999956130981,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.05869999900460243,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13414","display_name":"Radioactive Decay and Measurement Techniques","score":0.053599998354911804,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/detector-calibration","display_name":"detector calibration","score":0.890999972820282},{"id":"https://openalex.org/keywords/radiation-detector-calibration","display_name":"radiation detector calibration","score":0.40700000524520874},{"id":"https://openalex.org/keywords/gallium-arsenide","display_name":"GaAs","score":0.8679999709129333}],"concepts":[{"id":"https://openalex.org/C2992487123","wikidata":"https://www.wikidata.org/wiki/Q186161","display_name":"Nuclear radiation","level":2,"score":0.6441842317581177},{"id":"https://openalex.org/C148704626","wikidata":"https://www.wikidata.org/wiki/Q257415","display_name":"Semiconductor detector","level":3,"score":0.6184179186820984},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.6084688901901245},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6012513041496277},{"id":"https://openalex.org/C183680338","wikidata":"https://www.wikidata.org/wiki/Q736634","display_name":"Particle detector","level":3,"score":0.5510275959968567},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.5362498164176941},{"id":"https://openalex.org/C108225325","wikidata":"https://www.wikidata.org/wiki/Q11456","display_name":"Semiconductor","level":2,"score":0.49895358085632324},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.485115647315979},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.46907302737236023},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.43730151653289795},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.37199825048446655},{"id":"https://openalex.org/C116915560","wikidata":"https://www.wikidata.org/wiki/Q83504","display_name":"Nuclear engineering","level":1,"score":0.17151209712028503},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14199307560920715},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"mag:41289176","doi":null,"is_oa":false,"landing_page_url":"https://www.osti.gov/scitech/biblio/4473451-use-gaas-light-sources-calibrating-devices-semiconductor-nuclear-radiation-detectors","pdf_url":null,"source":{"id":"https://openalex.org/S4306402487","display_name":"OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I139351228","host_organization_name":"Office of Scientific and Technical Information","host_organization_lineage":["https://openalex.org/I139351228"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W136858479","https://openalex.org/W156444994","https://openalex.org/W113826973","https://openalex.org/W110537238","https://openalex.org/W124735952","https://openalex.org/W27343348","https://openalex.org/W110251879","https://openalex.org/W90507148","https://openalex.org/W157311723","https://openalex.org/W163268242"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-09-29T14:09:16.559479","created_date":"2016-06-24T00:00:00"}
