{"id":"https://openalex.org/W344840985","doi":"https://doi.org/10.2172/5126571","title":"Preliminary measurements of gamma ray effects on characteristics of broad-band GaAs field-effect transistor preamplifiers","display_name":"Preliminary measurements of gamma ray effects on characteristics of broad-band GaAs field-effect transistor preamplifiers","publication_year":1985,"publication_date":"1985-01-01","ids":{"openalex":"https://openalex.org/W344840985","doi":"https://doi.org/10.2172/5126571","mag":"344840985"},"language":"en","primary_location":{"id":"doi:10.2172/5126571","doi":"https://doi.org/10.2172/5126571","is_oa":true,"landing_page_url":"https://doi.org/10.2172/5126571","pdf_url":"https://www.osti.gov/servlets/purl/5126571","source":{"id":"https://openalex.org/S4306402487","display_name":"OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I139351228","host_organization_name":"Office of Scientific and Technical Information","host_organization_lineage":["https://openalex.org/I139351228"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lawrence Berkeley National Laboratory (LBNL)","raw_type":"report"},"volume":null,"type":"report","is_traditional":false,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://www.osti.gov/servlets/purl/5126571","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"H.G. Jackson","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I148283060","display_name":"Lawrence Berkeley National Laboratory","ror":"https://ror.org/02jbv0t02","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I148283060","https://openalex.org/I39565521"]},{"id":"https://openalex.org/I95457486","display_name":"University of California, Berkeley","ror":"https://ror.org/01an7q238","country_code":"US","type":"education","lineage":["https://openalex.org/I95457486"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"H.G. Jackson","raw_affiliation_strings":["Berkeley Laboratory University of California Berkeley , California 94720","Lawrence Berkeley Laboratory University of California Berkeley, California 94720"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Berkeley Laboratory University of California Berkeley , California 94720","institution_ids":["https://openalex.org/I95457486"]},{"raw_affiliation_string":"Lawrence Berkeley Laboratory University of California Berkeley, California 94720","institution_ids":["https://openalex.org/I148283060","https://openalex.org/I95457486"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068220239","display_name":"Takase Shimizu","orcid":"https://orcid.org/0000-0002-8104-4237","observed_orcids":["https://orcid.org/0000-0002-8104-4237"]},"institutions":[{"id":"https://openalex.org/I148283060","display_name":"Lawrence Berkeley National Laboratory","ror":"https://ror.org/02jbv0t02","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I148283060","https://openalex.org/I39565521"]},{"id":"https://openalex.org/I95457486","display_name":"University of California, Berkeley","ror":"https://ror.org/01an7q238","country_code":"US","type":"education","lineage":["https://openalex.org/I95457486"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"T.T. Shimizu","raw_affiliation_strings":["Berkeley Laboratory University of California Berkeley , California 94720","Lawrence Berkeley Laboratory University of California Berkeley, California 94720"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Berkeley Laboratory University of California Berkeley , California 94720","institution_ids":["https://openalex.org/I95457486"]},{"raw_affiliation_string":"Lawrence Berkeley Laboratory University of California Berkeley, California 94720","institution_ids":["https://openalex.org/I148283060","https://openalex.org/I95457486"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5016865643","display_name":"Branko Leskovar","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I148283060","display_name":"Lawrence Berkeley National Laboratory","ror":"https://ror.org/02jbv0t02","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I148283060","https://openalex.org/I39565521"]},{"id":"https://openalex.org/I95457486","display_name":"University of California, Berkeley","ror":"https://ror.org/01an7q238","country_code":"US","type":"education","lineage":["https://openalex.org/I95457486"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"B. Leskovar","raw_affiliation_strings":["Berkeley Laboratory University of California Berkeley , California 94720","Lawrence Berkeley Laboratory University of California Berkeley, California 94720"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Berkeley Laboratory University of California Berkeley , California 94720","institution_ids":["https://openalex.org/I95457486"]},{"raw_affiliation_string":"Lawrence Berkeley Laboratory University of California Berkeley, California 94720","institution_ids":["https://openalex.org/I148283060","https://openalex.org/I95457486"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9663000106811523,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9663000106811523,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11044","display_name":"Particle Detector Development and Performance","score":0.007799999788403511,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.003100000089034438,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/gamma-radiation-effects","display_name":"gamma radiation effects","score":0.9829999804496765},{"id":"https://openalex.org/keywords/gaas-field-effect-transistors","display_name":"GaAs field-effect transistors","score":0.9610000252723694},{"id":"https://openalex.org/keywords/low-noise-amplifier","display_name":"low noise amplifier","score":0.9599999785423279},{"id":"https://openalex.org/keywords/gain-degradation","display_name":"gain degradation","score":0.6790000200271606},{"id":"https://openalex.org/keywords/noise-figure","display_name":"noise figure","score":0.9739999771118164},{"id":"https://openalex.org/keywords/radiation-hardness","display_name":"radioresistance","score":0.6660000085830688},{"id":"https://openalex.org/keywords/cryogenic-operation","display_name":"cryogenic operation","score":0.777999997138977},{"id":"https://openalex.org/keywords/spacecraft-electronics","display_name":"space electronics","score":0.36800000071525574}],"concepts":[{"id":"https://openalex.org/C14245642","wikidata":"https://www.wikidata.org/wiki/Q399804","display_name":"Preamplifier","level":4,"score":0.9663527011871338},{"id":"https://openalex.org/C44838205","wikidata":"https://www.wikidata.org/wiki/Q127995","display_name":"Microwave","level":2,"score":0.6517248749732971},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.6194530725479126},{"id":"https://openalex.org/C112806910","wikidata":"https://www.wikidata.org/wiki/Q746825","display_name":"Noise figure","level":4,"score":0.5402618646621704},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5390452742576599},{"id":"https://openalex.org/C145598152","wikidata":"https://www.wikidata.org/wiki/Q176097","display_name":"Field-effect transistor","level":4,"score":0.534125566482544},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.5206019878387451},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5205156207084656},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.485927015542984},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.39862728118896484},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.33268484473228455},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3102060556411743},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.13046619296073914},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09718894958496094},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.07740330696105957},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.0},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":5,"locations":[{"id":"doi:10.2172/5126571","doi":"https://doi.org/10.2172/5126571","is_oa":true,"landing_page_url":"https://doi.org/10.2172/5126571","pdf_url":"https://www.osti.gov/servlets/purl/5126571","source":{"id":"https://openalex.org/S4306402487","display_name":"OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I139351228","host_organization_name":"Office of Scientific and Technical Information","host_organization_lineage":["https://openalex.org/I139351228"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lawrence Berkeley National Laboratory (LBNL)","raw_type":"report"},{"id":"pmh:oai:osti.gov:5126571","doi":null,"is_oa":true,"landing_page_url":"https://www.osti.gov/biblio/5126571","pdf_url":"https://www.osti.gov/servlets/purl/5126571","source":{"id":"https://openalex.org/S4306402487","display_name":"OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I139351228","host_organization_name":"Office of Scientific and Technical Information","host_organization_lineage":["https://openalex.org/I139351228"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null},{"id":"pmh:info:ark/67531/metadc1057566","doi":null,"is_oa":false,"landing_page_url":"https://digital.library.unt.edu/ark:/67531/metadc1057566/","pdf_url":null,"source":{"id":"https://openalex.org/S4306400792","display_name":"University of North Texas Digital Library (University of North Texas)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I123534392","host_organization_name":"University of North Texas","host_organization_lineage":["https://openalex.org/I123534392"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Report"},{"id":"pmh:oai:escholarship.org/ark:/13030/qt0b7237h8","doi":null,"is_oa":false,"landing_page_url":"https://escholarship.org/uc/item/0b7237h8","pdf_url":null,"source":{"id":"https://openalex.org/S4306400115","display_name":"eScholarship (California Digital Library)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I2801248553","host_organization_name":"California Digital Library","host_organization_lineage":["https://openalex.org/I2801248553"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"article"},{"id":"pmh:qt0b7237h8","doi":null,"is_oa":false,"landing_page_url":"http://www.escholarship.org/uc/item/0b7237h8","pdf_url":null,"source":{"id":"https://openalex.org/S4306400115","display_name":"eScholarship (California Digital Library)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I2801248553","host_organization_name":"California Digital Library","host_organization_lineage":["https://openalex.org/I2801248553"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Jackson, H.G.; Shimizu, T.T.; & Leskovar, B.(1985). PRELIMINARY MEASUREMENTS OF GAMMA RAY EFFECTS ON CHARACTERISTICS OF BROAD-BAND GaAs FIELD-EFFECT TRANSISTOR PREAMPLIFIERS. Lawrence Berkeley National Laboratory: Lawrence Berkeley National Laboratory. Retrieved from: http://www.escholarship.org/uc/item/0b7237h8","raw_type":"article"}],"best_oa_location":{"id":"doi:10.2172/5126571","doi":"https://doi.org/10.2172/5126571","is_oa":true,"landing_page_url":"https://doi.org/10.2172/5126571","pdf_url":"https://www.osti.gov/servlets/purl/5126571","source":{"id":"https://openalex.org/S4306402487","display_name":"OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I139351228","host_organization_name":"Office of Scientific and Technical Information","host_organization_lineage":["https://openalex.org/I139351228"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lawrence Berkeley National Laboratory (LBNL)","raw_type":"report"},"sustainable_development_goals":[],"study_designs":[],"awards":[{"id":"https://openalex.org/G1398330795","display_name":null,"funder_award_id":"DE-AC03-?","funder_id":"https://openalex.org/F4320306084","funder_display_name":"U.S. Department of Energy"},{"id":"https://openalex.org/G1643223109","display_name":null,"funder_award_id":"AC03-76SF00098","funder_id":"https://openalex.org/F4320306084","funder_display_name":"U.S. Department of Energy"},{"id":"https://openalex.org/G193590374","display_name":null,"funder_award_id":"DEAC03-76SF00098","funder_id":"https://openalex.org/F4320306084","funder_display_name":"U.S. Department of Energy"}],"funders":[{"id":"https://openalex.org/F4320306084","display_name":"U.S. Department of Energy","ror":"https://ror.org/01bj3aw27"},{"id":"https://openalex.org/F4320337512","display_name":"Nuclear Physics","ror":"https://ror.org/02atag894"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W344840985.pdf","grobid_xml":"https://content.openalex.org/works/W344840985.grobid-xml"},"referenced_works_count":5,"referenced_works":["https://openalex.org/W1976212918","https://openalex.org/W1998669924","https://openalex.org/W2005418167","https://openalex.org/W2041929442","https://openalex.org/W2077139689"],"related_works":["https://openalex.org/W2041929442","https://openalex.org/W1655235906","https://openalex.org/W298165058","https://openalex.org/W2057860509","https://openalex.org/W2011946810","https://openalex.org/W2006649422","https://openalex.org/W2051472520","https://openalex.org/W2070033586","https://openalex.org/W1523161296","https://openalex.org/W1644220871"],"abstract_inverted_index":{"The":[0,19,51],"effect":[1],"of":[2,8,27,61],"gamma":[3,39],"radiation":[4],"on":[5],"electrical":[6],"characteristics":[7],"cryogenically":[9],"cooled":[10],"broad-band":[11],"low-noise":[12],"microwave":[13,34],"preamplifiers":[14],"has":[15],"been":[16],"preliminarily":[17],"evaluated.":[18],"change":[20],"in":[21],"the":[22],"gain":[23,52],"and":[24,53,64],"noise":[25,54],"figure":[26,55],"a":[28],"1-2":[29],"GHz":[30],"preamplifier":[31],"using":[32],"GaAs":[33],"transistors":[35],"was":[36,56],"determined":[37],"at":[38,58],"doses":[40],"between":[41],"10/sup":[42,48],"5/":[43],"rad":[44],"to":[45],"5":[46],"/times/":[47],"8/":[49],"rad.":[50],"measured":[57],"ambient":[59],"temperatures":[60],"300":[62],"K":[63],"80":[65],"K.":[66],"8":[67],"refs.,":[68],"2":[69],"figs.":[70]},"counts_by_year":[],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2016-06-24T00:00:00"}