{"id":"https://openalex.org/W34182967","doi":null,"title":"Scattering parameter models. Final report","display_name":"Scattering parameter models. Final report","publication_year":1976,"publication_date":"1976-02-01","ids":{"openalex":"https://openalex.org/W34182967","mag":"34182967"},"language":"en","primary_location":{"id":"mag:34182967","doi":null,"is_oa":false,"landing_page_url":"http://www.osti.gov/scitech/biblio/7118577","pdf_url":null,"source":{"id":"https://openalex.org/S4306402487","display_name":"OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I139351228","host_organization_name":"Office of Scientific and Technical Information","host_organization_lineage":["https://openalex.org/I139351228"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null},"volume":null,"type":"article","is_traditional":true,"indexed_in":[],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5074729304","display_name":"S. Wong","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"S. Wong","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045030945","display_name":"J. I . Lubell","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"J. I . Lubell","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5060979397","display_name":"G. E. Ching","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"G. E. Ching","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.00554419,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.2816999852657318,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.2816999852657318,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.0729999989271164,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11175","display_name":"Gyrotron and Vacuum Electronics Research","score":0.05939999967813492,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/s-parameters","display_name":"S-parameters","score":0.7210000157356262},{"id":"https://openalex.org/keywords/device-modeling","display_name":"device modeling","score":0.5669999718666077},{"id":"https://openalex.org/keywords/diodes","display_name":"diodes","score":0.6940000057220459},{"id":"https://openalex.org/keywords/transistors","display_name":"transistors","score":0.996999979019165},{"id":"https://openalex.org/keywords/model-accuracy-verification","display_name":"model accuracy verification","score":0.8399999737739563},{"id":"https://openalex.org/keywords/ionizing-radiation-effects","display_name":"ionizing radiation effects","score":0.8399999737739563},{"id":"https://openalex.org/keywords/neutron-irradiation","display_name":"neutron irradiation","score":0.9380000233650208},{"id":"https://openalex.org/keywords/scepter","display_name":"scepter","score":0.8610000014305115}],"concepts":[{"id":"https://openalex.org/C195266298","wikidata":"https://www.wikidata.org/wiki/Q2165620","display_name":"Scattering parameters","level":2,"score":0.6766639351844788},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.6123592257499695},{"id":"https://openalex.org/C44838205","wikidata":"https://www.wikidata.org/wiki/Q127995","display_name":"Microwave","level":2,"score":0.5640606880187988},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.48026323318481445},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4702284038066864},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.4627525806427002},{"id":"https://openalex.org/C167928553","wikidata":"https://www.wikidata.org/wiki/Q1376021","display_name":"Estimation theory","level":2,"score":0.461284339427948},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.4542936682701111},{"id":"https://openalex.org/C191486275","wikidata":"https://www.wikidata.org/wiki/Q210028","display_name":"Scattering","level":2,"score":0.4479411244392395},{"id":"https://openalex.org/C79635011","wikidata":"https://www.wikidata.org/wiki/Q175805","display_name":"Semiconductor device","level":3,"score":0.4289613962173462},{"id":"https://openalex.org/C103824480","wikidata":"https://www.wikidata.org/wiki/Q185889","display_name":"Time domain","level":2,"score":0.4167676866054535},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.28181350231170654},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.2727857232093811},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.27174362540245056},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.24919486045837402},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22016558051109314},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.18552303314208984},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.17537277936935425},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1261121928691864},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"mag:34182967","doi":null,"is_oa":false,"landing_page_url":"http://www.osti.gov/scitech/biblio/7118577","pdf_url":null,"source":{"id":"https://openalex.org/S4306402487","display_name":"OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I139351228","host_organization_name":"Office of Scientific and Technical Information","host_organization_lineage":["https://openalex.org/I139351228"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[{"id":"https://openalex.org/G2845082398","display_name":null,"funder_award_id":"81771103","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W120430968"],"related_works":["https://openalex.org/W1485534282","https://openalex.org/W339577288","https://openalex.org/W2187053718","https://openalex.org/W2900020616","https://openalex.org/W1674491244","https://openalex.org/W2099566505","https://openalex.org/W2105464753","https://openalex.org/W1884257971","https://openalex.org/W7097897922","https://openalex.org/W4248705225"],"abstract_inverted_index":{"The":[0,85],"technique":[1],"of":[2,41,49],"modeling":[3,53],"semiconductor":[4],"microwave":[5,42],"devices":[6,90],"using":[7],"scattering":[8],"parameter":[9,52],"(or":[10],"'s'":[11,51],"parameter)":[12],"and":[13,26,47,55,68,72,75],"other":[14],"supplemental":[15],"measurements":[16],"is":[17],"presented.":[18],"Nonlinear":[19],"time-domain":[20,95],"models":[21,96],"that":[22],"are":[23],"computationally":[24],"efficient":[25],"compatible":[27],"with":[28],"circuit":[29],"analysis":[30],"codes":[31],"such":[32],"as":[33],"SCEPTRE":[34],"have":[35],"been":[36],"developed":[37,64],"for":[38,65],"six":[39],"types":[40],"devices,":[43],"demonstrating":[44],"the":[45,50,66,82],"usefulness":[46],"practicality":[48],"techniques":[54,62],"approach.":[56],"Two":[57],"different":[58],"model":[59],"accuracy":[60],"verification":[61],"were":[63,79,91],"diodes":[67],"transistors,":[69],"respectively.":[70],"Ionizing":[71],"neutron":[73],"irradiation":[74],"post-radiation":[76],"characterization":[77],"tests":[78],"performed":[80],"on":[81,88],"modeled":[83],"devices.":[84],"radiation":[86],"effects":[87],"these":[89],"incorporated":[92],"into":[93],"their":[94],"where":[97],"significant.":[98]},"counts_by_year":[],"updated_date":"2026-08-08T07:41:36.138363","created_date":"2016-06-24T00:00:00"}