{"id":"https://openalex.org/W33630165","doi":"https://doi.org/10.1016/b978-0-444-82334-2.50151-9","title":"The effect of boron doping on the thermal behaviour of EOR defects in Silicon","display_name":"The effect of boron doping on the thermal behaviour of EOR defects in Silicon","publication_year":1996,"publication_date":"1996-01-01","ids":{"openalex":"https://openalex.org/W33630165","doi":"https://doi.org/10.1016/b978-0-444-82334-2.50151-9","mag":"33630165"},"language":"en","primary_location":{"id":"doi:10.1016/b978-0-444-82334-2.50151-9","doi":"https://doi.org/10.1016/b978-0-444-82334-2.50151-9","is_oa":false,"landing_page_url":"https://doi.org/10.1016/b978-0-444-82334-2.50151-9","pdf_url":null,"source":{"id":"https://openalex.org/S4306463230","display_name":"Elsevier eBooks","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"ebook platform"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Ion Beam Modification of Materials","raw_type":"book-chapter"},"volume":{"id":"https://openalex.org/W4206117706","display_name":"Ion Beam Modification of Materials"},"type":"book-chapter","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5001412200","display_name":"Caroline Bonafos","orcid":"https://orcid.org/0000-0001-5140-6690","observed_orcids":["https://orcid.org/0000-0001-5140-6690"]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210135147","display_name":"Centre d\u2019\u00c9laboration de Mat\u00e9riaux et d\u2019\u00c9tudes Structurales","ror":"https://ror.org/03kwnqq69","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I196454796","https://openalex.org/I4210098836","https://openalex.org/I4210135147","https://openalex.org/I4405258862"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"C. Bonafos","raw_affiliation_strings":["CEMES CNRS, BP 4347, 31055 Toulouse cedex, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CEMES CNRS, BP 4347, 31055 Toulouse cedex, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210135147"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110850014","display_name":"Larbi La\u00e2nab","orcid":"https://orcid.org/0000-0001-9806-5205","observed_orcids":["https://orcid.org/0000-0001-9806-5205"]},"institutions":[{"id":"https://openalex.org/I126477371","display_name":"Mohammed V University","ror":"https://ror.org/00r8w8f84","country_code":"MA","type":"education","lineage":["https://openalex.org/I126477371"]}],"countries":["MA"],"is_corresponding":false,"raw_author_name":"L. La\u00e2nab","raw_affiliation_strings":["Centre de Microscopie Electron\u0131que, Facult\u00e9 des Sciences, Rabat, Maroc"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Centre de Microscopie Electron\u0131que, Facult\u00e9 des Sciences, Rabat, Maroc","institution_ids":["https://openalex.org/I126477371"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113007917","display_name":"M. M. Faye","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I96840727","display_name":"Cheikh Anta Diop University","ror":"https://ror.org/04je6yw13","country_code":"SN","type":"education","lineage":["https://openalex.org/I96840727"]}],"countries":["SN"],"is_corresponding":false,"raw_author_name":"M.M. Faye","raw_affiliation_strings":["UCAD, D\u00e9partement de Physique, Dakar, S\u00e9n\u00e9gal"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"UCAD, D\u00e9partement de Physique, Dakar, S\u00e9n\u00e9gal","institution_ids":["https://openalex.org/I96840727"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055755772","display_name":"Daniel Alquier","orcid":"https://orcid.org/0000-0003-1345-8195","observed_orcids":["https://orcid.org/0000-0003-1345-8195"]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I190497903","display_name":"Laboratoire d'Analyse et d'Architecture des Syst\u00e8mes","ror":"https://ror.org/03vcm6439","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I190497903","https://openalex.org/I193033237","https://openalex.org/I196454796","https://openalex.org/I205747304","https://openalex.org/I4210095849","https://openalex.org/I4210152422","https://openalex.org/I4210159245","https://openalex.org/I4405258862","https://openalex.org/I4405259414"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"D. Alqu\u0131er","raw_affiliation_strings":["LAAS-CNRS, 7 av. du colonel Roche, 31077 Toulouse Cedex, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"LAAS-CNRS, 7 av. du colonel Roche, 31077 Toulouse Cedex, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I190497903"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108926775","display_name":"A. Mart\u00ednez","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I190497903","display_name":"Laboratoire d'Analyse et d'Architecture des Syst\u00e8mes","ror":"https://ror.org/03vcm6439","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I190497903","https://openalex.org/I193033237","https://openalex.org/I196454796","https://openalex.org/I205747304","https://openalex.org/I4210095849","https://openalex.org/I4210152422","https://openalex.org/I4210159245","https://openalex.org/I4405258862","https://openalex.org/I4405259414"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"A. Martinez","raw_affiliation_strings":["LAAS-CNRS, 7 av. du colonel Roche, 31077 Toulouse Cedex, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"LAAS-CNRS, 7 av. du colonel Roche, 31077 Toulouse Cedex, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I190497903"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032500954","display_name":"D. Mathiot","orcid":"https://orcid.org/0000-0003-2845-3776","observed_orcids":["https://orcid.org/0000-0003-2845-3776"]},"institutions":[{"id":"https://openalex.org/I19370010","display_name":"Orange (France)","ror":"https://ror.org/035j0tq82","country_code":"FR","type":"company","lineage":["https://openalex.org/I19370010"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"D. Mathiot","raw_affiliation_strings":["CNET-Grenoble (France T\u00e9l\u00e9com), BP 98, F-38243 Meylan, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CNET-Grenoble (France T\u00e9l\u00e9com), BP 98, F-38243 Meylan, France","institution_ids":["https://openalex.org/I19370010"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5024168567","display_name":"A. Claverie","orcid":"https://orcid.org/0000-0003-2211-4618","observed_orcids":["https://orcid.org/0000-0003-2211-4618"]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210135147","display_name":"Centre d\u2019\u00c9laboration de Mat\u00e9riaux et d\u2019\u00c9tudes Structurales","ror":"https://ror.org/03kwnqq69","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I196454796","https://openalex.org/I4210098836","https://openalex.org/I4210135147","https://openalex.org/I4405258862"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"A. Claverie","raw_affiliation_strings":["CEMES CNRS, BP 4347, 31055 Toulouse cedex, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CEMES CNRS, BP 4347, 31055 Toulouse cedex, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210135147"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"789","last_page":"792"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.41019999980926514,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.41019999980926514,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.3386000096797943,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","score":0.1136000007390976,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/boron-doping","display_name":"boron doping","score":0.7820000052452087},{"id":"https://openalex.org/keywords/end-of-range-defects","display_name":"end-of-range defects","score":0.8799999952316284},{"id":"https://openalex.org/keywords/silicon","display_name":"silicon","score":0.593999981880188},{"id":"https://openalex.org/keywords/amorphization","display_name":"amorphization","score":0.7179999947547913},{"id":"https://openalex.org/keywords/annealing","display_name":"annealing","score":0.6380000114440918},{"id":"https://openalex.org/keywords/loop-density","display_name":"loop density","score":0.5680000185966492},{"id":"https://openalex.org/keywords/self-diffusion","display_name":"self-diffusion","score":0.7289999723434448},{"id":"https://openalex.org/keywords/transient-enhanced-diffusion","display_name":"transient enhanced diffusion","score":0.9649999737739563},{"id":"https://openalex.org/keywords/boron-diffusion","display_name":"boron diffusion","score":0.7770000100135803}],"concepts":[{"id":"https://openalex.org/C501308230","wikidata":"https://www.wikidata.org/wiki/Q618","display_name":"Boron","level":2,"score":0.7781115174293518},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.6773441433906555},{"id":"https://openalex.org/C57863236","wikidata":"https://www.wikidata.org/wiki/Q1130571","display_name":"Doping","level":2,"score":0.658794641494751},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5185254812240601},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.42154112458229065},{"id":"https://openalex.org/C42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","level":1,"score":0.38451892137527466},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.34099870920181274},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.21785658597946167},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.17705616354942322},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08633825182914734},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.08385676145553589},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07999056577682495},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.052189648151397705}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/b978-0-444-82334-2.50151-9","doi":"https://doi.org/10.1016/b978-0-444-82334-2.50151-9","is_oa":false,"landing_page_url":"https://doi.org/10.1016/b978-0-444-82334-2.50151-9","pdf_url":null,"source":{"id":"https://openalex.org/S4306463230","display_name":"Elsevier eBooks","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"ebook platform"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Ion Beam Modification of Materials","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1969554448","https://openalex.org/W1982281375","https://openalex.org/W1999361937","https://openalex.org/W2019976417","https://openalex.org/W2022308914","https://openalex.org/W2048648585","https://openalex.org/W2055084674","https://openalex.org/W2056255616","https://openalex.org/W2086504994","https://openalex.org/W2091143923","https://openalex.org/W2149563821","https://openalex.org/W2611656678"],"related_works":["https://openalex.org/W1996143157","https://openalex.org/W2664106836","https://openalex.org/W2086504994","https://openalex.org/W2061795059","https://openalex.org/W2067550055","https://openalex.org/W2153905049","https://openalex.org/W2028182768","https://openalex.org/W2040152431","https://openalex.org/W2088511608","https://openalex.org/W2012339330"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-11-05T12:25:35.769452","created_date":"2016-06-24T00:00:00"}