{"id":"https://openalex.org/W322194397","doi":null,"title":"Measuring refractive index and thickness of transparent thin films using Fresnel diffraction from phase step","display_name":"Measuring refractive index and thickness of transparent thin films using Fresnel diffraction from phase step","publication_year":2015,"publication_date":"2015-03-15","ids":{"openalex":"https://openalex.org/W322194397","mag":"322194397"},"language":"en","primary_location":{"id":"mag:322194397","doi":null,"is_oa":false,"landing_page_url":"http://opsi.ir/article-1-647-en.pdf","pdf_url":null,"source":{"id":"https://openalex.org/S4306536487","display_name":"\u0627\u0646\u062c\u0645\u0646 \u0627\u067e\u062a\u06cc\u06a9 \u0648 \u0641\u0648\u062a\u0648\u0646\u06cc\u06a9 \u0627\u06cc\u0631\u0627\u0646","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":"Optics and Photonics Society of Iran","raw_type":null},"volume":null,"type":"article","is_traditional":true,"indexed_in":[],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5009665451","display_name":"Morteza Jafari Siavashani","orcid":"https://orcid.org/0000-0002-3025-2968","observed_orcids":["https://orcid.org/0000-0002-3025-2968"]},"institutions":[{"id":"https://openalex.org/I161028277","display_name":"Institute for Advanced Studies in Basic Sciences","ror":"https://ror.org/00bzsst90","country_code":"IR","type":"education","lineage":["https://openalex.org/I161028277"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Morteza Jafari Siavashani","raw_affiliation_strings":["Institute for Advanced Studies in Basic Sciences"],"raw_orcid":"https://orcid.org/0000-0002-3025-2968","affiliations":[{"raw_affiliation_string":"Institute for Advanced Studies in Basic Sciences","institution_ids":["https://openalex.org/I161028277"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001403261","display_name":"Mohammad Taghi Tavassoly","orcid":"https://orcid.org/0000-0002-9921-1232","observed_orcids":["https://orcid.org/0000-0002-9921-1232"]},"institutions":[{"id":"https://openalex.org/I23946033","display_name":"University of Tehran","ror":"https://ror.org/05vf56z40","country_code":"IR","type":"education","lineage":["https://openalex.org/I23946033"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Mohammad Taghi Tavassoly","raw_affiliation_strings":["University\u00a0of\u00a0Tehran"],"raw_orcid":"https://orcid.org/0000-0002-9921-1232","affiliations":[{"raw_affiliation_string":"University\u00a0of\u00a0Tehran","institution_ids":["https://openalex.org/I23946033"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062798571","display_name":"Ehsan Ahadi Akhlaghi","orcid":"https://orcid.org/0000-0002-8211-3054","observed_orcids":["https://orcid.org/0000-0002-8211-3054"]},"institutions":[{"id":"https://openalex.org/I161028277","display_name":"Institute for Advanced Studies in Basic Sciences","ror":"https://ror.org/00bzsst90","country_code":"IR","type":"education","lineage":["https://openalex.org/I161028277"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Ehsan Ahadi Akhlaghi","raw_affiliation_strings":["Institute for Advanced Studies in Basic Sciences"],"raw_orcid":"https://orcid.org/0000-0002-8211-3054","affiliations":[{"raw_affiliation_string":"Institute for Advanced Studies in Basic Sciences","institution_ids":["https://openalex.org/I161028277"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084184297","display_name":"Seyed Roohollah Hosseini","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I23946033","display_name":"University of Tehran","ror":"https://ror.org/05vf56z40","country_code":"IR","type":"education","lineage":["https://openalex.org/I23946033"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Seyed Roohollah Hosseini","raw_affiliation_strings":["University\u00a0of\u00a0Tehran"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University\u00a0of\u00a0Tehran","institution_ids":["https://openalex.org/I23946033"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2006,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.52820092,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"21","issue":"7","first_page":"1473","last_page":"1476"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9326000213623047,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9326000213623047,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11723","display_name":"Optical Coatings and Gratings","score":0.0414000004529953,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12050","display_name":"Optical Polarization and Ellipsometry","score":0.012000000104308128,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/refractive-index-measurement","display_name":"refractive index measurement","score":0.9129999876022339},{"id":"https://openalex.org/keywords/thin-film-thickness","display_name":"thin film thickness","score":0.8840000033378601},{"id":"https://openalex.org/keywords/fresnel-diffraction","display_name":"Fresnel diffraction","score":0.9670000076293945},{"id":"https://openalex.org/keywords/phase-step","display_name":"phase step","score":0.9520000219345093},{"id":"https://openalex.org/keywords/incident-angle-dependence","display_name":"incident angle dependence","score":0.656000018119812}],"concepts":[{"id":"https://openalex.org/C42067758","wikidata":"https://www.wikidata.org/wiki/Q174102","display_name":"Refractive index","level":2,"score":0.8184694051742554},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.7897915840148926},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7391788959503174},{"id":"https://openalex.org/C207114421","wikidata":"https://www.wikidata.org/wiki/Q133900","display_name":"Diffraction","level":2,"score":0.6994513273239136},{"id":"https://openalex.org/C123403432","wikidata":"https://www.wikidata.org/wiki/Q654068","display_name":"Visibility","level":2,"score":0.5962274074554443},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.518462598323822},{"id":"https://openalex.org/C153837357","wikidata":"https://www.wikidata.org/wiki/Q838055","display_name":"Fresnel equations","level":3,"score":0.4990355968475342},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.49496525526046753},{"id":"https://openalex.org/C20788544","wikidata":"https://www.wikidata.org/wiki/Q467054","display_name":"Photonics","level":2,"score":0.45445728302001953},{"id":"https://openalex.org/C50282329","wikidata":"https://www.wikidata.org/wiki/Q2286895","display_name":"Fresnel diffraction","level":3,"score":0.4263514578342438},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.4122791886329651},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.2995498478412628},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12460258603096008},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.0732363760471344},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"mag:322194397","doi":null,"is_oa":false,"landing_page_url":"http://opsi.ir/article-1-647-en.pdf","pdf_url":null,"source":{"id":"https://openalex.org/S4306536487","display_name":"\u0627\u0646\u062c\u0645\u0646 \u0627\u067e\u062a\u06cc\u06a9 \u0648 \u0641\u0648\u062a\u0648\u0646\u06cc\u06a9 \u0627\u06cc\u0631\u0627\u0646","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":"Optics and Photonics Society of Iran","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2778841817","https://openalex.org/W2078324995","https://openalex.org/W2885752601","https://openalex.org/W6922069881","https://openalex.org/W2133889024","https://openalex.org/W4387060469","https://openalex.org/W7211915008","https://openalex.org/W1992490220","https://openalex.org/W3183041372","https://openalex.org/W2376785624"],"abstract_inverted_index":{"Measuring":[0],"optical":[1],"parameters":[2],"of":[3,28,57,80,87,89],"thin":[4],"films":[5],"with":[6],"high":[7],"accuracy":[8],"is":[9,34,62,83],"a":[10,19],"challenge":[11],"in":[12,43],"modern":[13],"science":[14],"and":[15,26,47,78,92,97],"industry.":[16],"We":[17],"introduce":[18],"new":[20],"method":[21,33],"to":[22,69],"obtain":[23],"refractive":[24,76,90],"index":[25,77,91],"thickness":[27,93],"transparent":[29],"dielectric":[30],"layer.":[31],"This":[32],"based":[35],"on":[36],"Fresnel":[37],"diffraction":[38,50],"from":[39],"the":[40,49,55],"phase":[41,81],"step":[42,82],"transmission.":[44],"By":[45],"recording":[46],"analyzing":[48],"pattern":[51],"versus":[52,59,73],"incident":[53,60,74],"angle,":[54],"diagram":[56],"visibility":[58],"angle":[61],"obtained.":[63],"Therefore":[64],"by":[65],"fitting":[66],"simulated":[67],"data":[68],"experimental":[70],"ones":[71],"(visibility":[72],"angle),":[75],"height":[79],"determined.":[84],"The":[85],"uncertainties":[86],"determination":[88],"are":[94],"about":[95],"0550":[96],"0510,":[98],"respectively.":[99]},"counts_by_year":[{"year":2018,"cited_by_count":1}],"updated_date":"2026-10-31T12:09:11.096373","created_date":"2016-06-24T00:00:00"}