{"id":"https://openalex.org/W3209965576","doi":"https://doi.org/10.1016/j.matchar.2021.111553","title":"Indexation of electron diffraction patterns at grain boundaries","display_name":"Indexation of electron diffraction patterns at grain boundaries","publication_year":2021,"publication_date":"2021-10-30","ids":{"openalex":"https://openalex.org/W3209965576","doi":"https://doi.org/10.1016/j.matchar.2021.111553","mag":"3209965576"},"language":"en","primary_location":{"id":"doi:10.1016/j.matchar.2021.111553","doi":"https://doi.org/10.1016/j.matchar.2021.111553","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.matchar.2021.111553","pdf_url":null,"source":{"id":"https://openalex.org/S53842986","display_name":"Materials Characterization","issn_l":"1044-5803","issn":["1044-5803","1873-4189"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-a","jufo-1","ki-jl-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Materials Characterization","raw_type":"journal-article"},"volume":null,"type":"paratext","is_traditional":false,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://hal.science/hal-03410865","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5079404147","display_name":"Qiwei Shi","orcid":"https://orcid.org/0000-0002-0980-3315","observed_orcids":["https://orcid.org/0000-0002-0980-3315"]},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qiwei Shi","raw_affiliation_strings":["SJTU-Paris Elite Institute of Technology, Shanghai Jiao Tong University, Shanghai 200240, China","School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai 200240, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"SJTU-Paris Elite Institute of Technology, Shanghai Jiao Tong University, Shanghai 200240, China","institution_ids":["https://openalex.org/I183067930"]},{"raw_affiliation_string":"School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai 200240, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Ying Zhou","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ying Zhou","raw_affiliation_strings":["School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai 200240, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai 200240, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011340768","display_name":"Hongru Zhong","orcid":"https://orcid.org/0000-0001-5519-658X","observed_orcids":["https://orcid.org/0000-0001-5519-658X"]},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hongru Zhong","raw_affiliation_strings":["School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai 200240, China"],"raw_orcid":"https://orcid.org/0000-0001-5519-658X","affiliations":[{"raw_affiliation_string":"School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai 200240, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014942381","display_name":"Dominique Loisnard","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Dominique Loisnard","raw_affiliation_strings":["EdF R&D, Site des Renardi\u00e8res, avenue des Renardi\u00e8res, Ecuelles, F-77818 Moret-sur-Loing, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"EdF R&D, Site des Renardi\u00e8res, avenue des Renardi\u00e8res, Ecuelles, F-77818 Moret-sur-Loing, France","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068281529","display_name":"Chengyi Dan","orcid":"https://orcid.org/0000-0002-1994-5923","observed_orcids":["https://orcid.org/0000-0002-1994-5923"]},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chengyi Dan","raw_affiliation_strings":["School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai 200240, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai 200240, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101772723","display_name":"Fengguo Zhang","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Fengguo Zhang","raw_affiliation_strings":["School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai 200240, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai 200240, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100457760","display_name":"Zhe Chen","orcid":"https://orcid.org/0000-0003-3044-545X","observed_orcids":["https://orcid.org/0000-0003-3044-545X","https://orcid.org/0000-0003-2518-7687"]},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Zhe Chen","raw_affiliation_strings":["School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai 200240, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai 200240, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100369645","display_name":"Haowei Wang","orcid":"https://orcid.org/0000-0002-8484-1805","observed_orcids":["https://orcid.org/0000-0002-8484-1805","https://orcid.org/0000-0003-4866-9371","https://orcid.org/0009-0005-3391-1286","https://orcid.org/0000-0001-6946-4530"]},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haowei Wang","raw_affiliation_strings":["School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai 200240, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai 200240, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5043453686","display_name":"St\u00e9phane Roux","orcid":"https://orcid.org/0000-0003-4885-6732","observed_orcids":["https://orcid.org/0000-0003-4885-6732"]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I277688954","display_name":"Universit\u00e9 Paris-Saclay","ror":"https://ror.org/03xjwb503","country_code":"FR","type":"education","lineage":["https://openalex.org/I277688954"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"St\u00e9phane Roux","raw_affiliation_strings":["Universit\u00e9 Paris-Saclay, ENS Paris-Saclay, CNRS, LMT - Laboratoire de M\u00e9canique et Technologie, F-91190 Gif-sur-Yvette, France"],"raw_orcid":"https://orcid.org/0000-0003-4885-6732","affiliations":[{"raw_affiliation_string":"Universit\u00e9 Paris-Saclay, ENS Paris-Saclay, CNRS, LMT - Laboratoire de M\u00e9canique et Technologie, F-91190 Gif-sur-Yvette, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I277688954"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5100457760","https://openalex.org/A5101772723"],"corresponding_institution_ids":["https://openalex.org/I183067930"],"apc_list":{"value":3150,"currency":"USD","value_usd":3150},"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":16,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"182","issue":null,"first_page":"111553","last_page":"111553"},"is_retracted":false,"is_paratext":true,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13552","display_name":"Advanced Materials Characterization Techniques","score":0.9663000106811523,"subfield":{"id":"https://openalex.org/subfields/2500","display_name":"General Materials Science"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13552","display_name":"Advanced Materials Characterization Techniques","score":0.9663000106811523,"subfield":{"id":"https://openalex.org/subfields/2500","display_name":"General Materials Science"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","score":0.012299999594688416,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T10204","display_name":"Microstructure and mechanical properties","score":0.01209999993443489,"subfield":{"id":"https://openalex.org/subfields/2506","display_name":"Metals and Alloys"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electron-backscatter-diffraction","display_name":"electron backscatter diffraction","score":0.921999990940094},{"id":"https://openalex.org/keywords/grain-boundaries","display_name":"grain boundaries","score":0.8569999933242798},{"id":"https://openalex.org/keywords/digital-image-correlation","display_name":"digital image correlation","score":0.7789999842643738},{"id":"https://openalex.org/keywords/crystal-orientation-measurement","display_name":"crystal orientation measurement","score":0.6000000238418579},{"id":"https://openalex.org/keywords/euler-angles","display_name":"Euler angles","score":0.734000027179718},{"id":"https://openalex.org/keywords/grain-boundary-triple-points","display_name":"grain boundary triple points","score":0.6389999985694885},{"id":"https://openalex.org/keywords/orientation-uncertainty","display_name":"orientation uncertainty","score":0.41200000047683716}],"concepts":[{"id":"https://openalex.org/C27805521","wikidata":"https://www.wikidata.org/wiki/Q1326017","display_name":"Electron backscatter diffraction","level":3,"score":0.9328135251998901},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7816488742828369},{"id":"https://openalex.org/C47908070","wikidata":"https://www.wikidata.org/wiki/Q900515","display_name":"Grain boundary","level":3,"score":0.6326259970664978},{"id":"https://openalex.org/C2781285689","wikidata":"https://www.wikidata.org/wiki/Q21921428","display_name":"Crystal (programming language)","level":2,"score":0.4863434433937073},{"id":"https://openalex.org/C186311912","wikidata":"https://www.wikidata.org/wiki/Q2038409","display_name":"Indexation","level":3,"score":0.4861449897289276},{"id":"https://openalex.org/C207114421","wikidata":"https://www.wikidata.org/wiki/Q133900","display_name":"Diffraction","level":2,"score":0.4520646035671234},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4025109112262726},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.35103052854537964},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.3476826548576355},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.17397332191467285},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.1722198724746704},{"id":"https://openalex.org/C87976508","wikidata":"https://www.wikidata.org/wiki/Q1498213","display_name":"Microstructure","level":2,"score":0.15139439702033997},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.1347661316394806},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C556758197","wikidata":"https://www.wikidata.org/wiki/Q580018","display_name":"Monetary economics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C126285488","wikidata":"https://www.wikidata.org/wiki/Q178476","display_name":"Monetary policy","level":2,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1016/j.matchar.2021.111553","doi":"https://doi.org/10.1016/j.matchar.2021.111553","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.matchar.2021.111553","pdf_url":null,"source":{"id":"https://openalex.org/S53842986","display_name":"Materials Characterization","issn_l":"1044-5803","issn":["1044-5803","1873-4189"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-a","jufo-1","ki-jl-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Materials Characterization","raw_type":"journal-article"},{"id":"pmh:oai:HAL:hal-03410865v1","doi":null,"is_oa":true,"landing_page_url":"https://hal.science/hal-03410865","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4405252976","host_organization_name":"Centre pour la Communication Scientifique Directe","host_organization_lineage":["https://openalex.org/I4405252976"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Materials Characterization, In press","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"pmh:oai:HAL:hal-03410865v1","doi":null,"is_oa":true,"landing_page_url":"https://hal.science/hal-03410865","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4405252976","host_organization_name":"Centre pour la Communication Scientifique Directe","host_organization_lineage":["https://openalex.org/I4405252976"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Materials Characterization, In press","raw_type":"info:eu-repo/semantics/article"},"sustainable_development_goals":[],"study_designs":[],"awards":[{"id":"https://openalex.org/G2778726817","display_name":null,"funder_award_id":"51701120","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7703981054","display_name":null,"funder_award_id":"51901132","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":45,"referenced_works":["https://openalex.org/W181039978","https://openalex.org/W231861835","https://openalex.org/W747114614","https://openalex.org/W1522378413","https://openalex.org/W1561894790","https://openalex.org/W1570213400","https://openalex.org/W1967561357","https://openalex.org/W1973546445","https://openalex.org/W1976888082","https://openalex.org/W1995035427","https://openalex.org/W2048644960","https://openalex.org/W2065225987","https://openalex.org/W2071073583","https://openalex.org/W2092872386","https://openalex.org/W2093049956","https://openalex.org/W2100464486","https://openalex.org/W2112732289","https://openalex.org/W2124834868","https://openalex.org/W2144903822","https://openalex.org/W2587730525","https://openalex.org/W2608671614","https://openalex.org/W2743547990","https://openalex.org/W2747493615","https://openalex.org/W2764273258","https://openalex.org/W2766687959","https://openalex.org/W2795709860","https://openalex.org/W2799813231","https://openalex.org/W2888697764","https://openalex.org/W2889274883","https://openalex.org/W2896057896","https://openalex.org/W2913541075","https://openalex.org/W2921312790","https://openalex.org/W2923545799","https://openalex.org/W2939913613","https://openalex.org/W2945174714","https://openalex.org/W2970610102","https://openalex.org/W2971489860","https://openalex.org/W3003930600","https://openalex.org/W3008654081","https://openalex.org/W3080686369","https://openalex.org/W3096035978","https://openalex.org/W3097383033","https://openalex.org/W3157941678","https://openalex.org/W3166615250","https://openalex.org/W4255564502"],"related_works":["https://openalex.org/W1551465514","https://openalex.org/W3166615250","https://openalex.org/W747114614","https://openalex.org/W2124834868","https://openalex.org/W2608671614","https://openalex.org/W4224277407","https://openalex.org/W2057124005","https://openalex.org/W4377696032","https://openalex.org/W2543681205","https://openalex.org/W2072405901"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":4}],"updated_date":"2026-11-06T12:05:46.655746","created_date":"2021-11-08T00:00:00"}