{"id":"https://openalex.org/W3208298044","doi":"https://doi.org/10.1049/ell2.12358","title":"A novel study of the resistance of thermopile for thermoelectric MEMS microwave power sensors","display_name":"A novel study of the resistance of thermopile for thermoelectric MEMS microwave power sensors","publication_year":2021,"publication_date":"2021-10-26","ids":{"openalex":"https://openalex.org/W3208298044","doi":"https://doi.org/10.1049/ell2.12358","mag":"3208298044"},"language":"en","primary_location":{"id":"doi:10.1049/ell2.12358","doi":"https://doi.org/10.1049/ell2.12358","is_oa":true,"landing_page_url":"https://doi.org/10.1049/ell2.12358","pdf_url":"https://onlinelibrary.wiley.com/doi/pdfdirect/10.1049/ell2.12358","source":{"id":"https://openalex.org/S149016011","display_name":"Electronics Letters","issn_l":"0013-5194","issn":["0013-5194","1350-911X"],"is_oa":true,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","doaj","dongbi-d","jufo-1","norway-1","oarl","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":"cc-by-nc","license_id":"https://openalex.org/licenses/cc-by-nc","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Electronics Letters","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://onlinelibrary.wiley.com/doi/pdfdirect/10.1049/ell2.12358","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5115594145","display_name":"Shiran Zhang","orcid":"https://orcid.org/0000-0001-5680-1470","observed_orcids":["https://orcid.org/0000-0001-5680-1470"]},"institutions":[{"id":"https://openalex.org/I41198531","display_name":"Nanjing University of Posts and Telecommunications","ror":"https://ror.org/043bpky34","country_code":"CN","type":"education","lineage":["https://openalex.org/I41198531"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shiran Zhang","raw_affiliation_strings":["College of Electronic and Optical Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Electronic and Optical Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China","institution_ids":["https://openalex.org/I41198531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100553254","display_name":"Wenting Yu","orcid":"https://orcid.org/0000-0002-1137-4759","observed_orcids":["https://orcid.org/0000-0002-1137-4759"]},"institutions":[{"id":"https://openalex.org/I41198531","display_name":"Nanjing University of Posts and Telecommunications","ror":"https://ror.org/043bpky34","country_code":"CN","type":"education","lineage":["https://openalex.org/I41198531"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenting Yu","raw_affiliation_strings":["College of Electronic and Optical Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Electronic and Optical Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China","institution_ids":["https://openalex.org/I41198531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112307109","display_name":"Qingying Ren","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I41198531","display_name":"Nanjing University of Posts and Telecommunications","ror":"https://ror.org/043bpky34","country_code":"CN","type":"education","lineage":["https://openalex.org/I41198531"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Qingying Ren","raw_affiliation_strings":["College of Electronic and Optical Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Electronic and Optical Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China","institution_ids":["https://openalex.org/I41198531"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089990856","display_name":"Debo Wang","orcid":"https://orcid.org/0000-0002-1032-8793","observed_orcids":["https://orcid.org/0000-0002-1032-8793"]},"institutions":[{"id":"https://openalex.org/I41198531","display_name":"Nanjing University of Posts and Telecommunications","ror":"https://ror.org/043bpky34","country_code":"CN","type":"education","lineage":["https://openalex.org/I41198531"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Debo Wang","raw_affiliation_strings":["College of Electronic and Optical Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China"],"raw_orcid":"https://orcid.org/0000-0002-1032-8793","affiliations":[{"raw_affiliation_string":"College of Electronic and Optical Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China","institution_ids":["https://openalex.org/I41198531"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5089990856","https://openalex.org/A5112307109"],"corresponding_institution_ids":["https://openalex.org/I41198531"],"apc_list":{"value":2200,"currency":"USD","value_usd":2200},"apc_paid":{"value":2200,"currency":"USD","value_usd":2200},"fwci":0.0734,"has_fulltext":true,"cited_by_count":1,"citation_normalized_percentile":{"value":0.30730886,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"58","issue":"2","first_page":"73","last_page":"75"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.9824000000953674,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.9824000000953674,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13928","display_name":"Advanced Sensor Technologies Research","score":0.006800000090152025,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.00139999995008111,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/thermopile","display_name":"thermopile","score":0.9259999990463257},{"id":"https://openalex.org/keywords/microwave-power-sensor","display_name":"microwave power sensor","score":0.9390000104904175},{"id":"https://openalex.org/keywords/n-type-gaas","display_name":"n-type GaAs","score":0.8240000009536743},{"id":"https://openalex.org/keywords/electron-mobility","display_name":"electron mobility","score":0.9980000257492065},{"id":"https://openalex.org/keywords/return-loss","display_name":"return loss","score":0.7039999961853027},{"id":"https://openalex.org/keywords/sensor-sensitivity","display_name":"sensor sensitivity","score":0.8809999823570251},{"id":"https://openalex.org/keywords/frequency-dependence","display_name":"frequency dependence","score":0.7149999737739563},{"id":"https://openalex.org/keywords/power-dependence","display_name":"power dependence","score":0.453000009059906}],"concepts":[{"id":"https://openalex.org/C47279676","wikidata":"https://www.wikidata.org/wiki/Q915693","display_name":"Thermopile","level":3,"score":0.9949603080749512},{"id":"https://openalex.org/C168068576","wikidata":"https://www.wikidata.org/wiki/Q190241","display_name":"Thermocouple","level":2,"score":0.8280876278877258},{"id":"https://openalex.org/C44838205","wikidata":"https://www.wikidata.org/wiki/Q127995","display_name":"Microwave","level":2,"score":0.7679987549781799},{"id":"https://openalex.org/C37977207","wikidata":"https://www.wikidata.org/wiki/Q175561","display_name":"Microelectromechanical systems","level":2,"score":0.747382640838623},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6858814358711243},{"id":"https://openalex.org/C63024428","wikidata":"https://www.wikidata.org/wiki/Q552456","display_name":"Thermoelectric effect","level":2,"score":0.6857815980911255},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5222504734992981},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4627898037433624},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4581109881401062},{"id":"https://openalex.org/C117127486","wikidata":"https://www.wikidata.org/wiki/Q11569191","display_name":"Thermoelectric generator","level":3,"score":0.4195367097854614},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.4158622622489929},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.1901036500930786},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15141654014587402},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.10003265738487244},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.09921762347221375},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09274378418922424},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C158355884","wikidata":"https://www.wikidata.org/wiki/Q11388","display_name":"Infrared","level":2,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1049/ell2.12358","doi":"https://doi.org/10.1049/ell2.12358","is_oa":true,"landing_page_url":"https://doi.org/10.1049/ell2.12358","pdf_url":"https://onlinelibrary.wiley.com/doi/pdfdirect/10.1049/ell2.12358","source":{"id":"https://openalex.org/S149016011","display_name":"Electronics Letters","issn_l":"0013-5194","issn":["0013-5194","1350-911X"],"is_oa":true,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","doaj","dongbi-d","jufo-1","norway-1","oarl","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":"cc-by-nc","license_id":"https://openalex.org/licenses/cc-by-nc","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Electronics Letters","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:96b6cb5df3504d4f9e306acce753fcfe","doi":null,"is_oa":true,"landing_page_url":"https://doaj.org/article/96b6cb5df3504d4f9e306acce753fcfe","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Electronics Letters, Vol 58, Iss 2, Pp 73-75 (2022)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1049/ell2.12358","doi":"https://doi.org/10.1049/ell2.12358","is_oa":true,"landing_page_url":"https://doi.org/10.1049/ell2.12358","pdf_url":"https://onlinelibrary.wiley.com/doi/pdfdirect/10.1049/ell2.12358","source":{"id":"https://openalex.org/S149016011","display_name":"Electronics Letters","issn_l":"0013-5194","issn":["0013-5194","1350-911X"],"is_oa":true,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","doaj","dongbi-d","jufo-1","norway-1","oarl","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":"cc-by-nc","license_id":"https://openalex.org/licenses/cc-by-nc","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Electronics Letters","raw_type":"journal-article"},"sustainable_development_goals":[],"study_designs":[],"awards":[{"id":"https://openalex.org/G3667503803","display_name":null,"funder_award_id":"61904089","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320323268","display_name":"Nanjing University of Posts and Telecommunications","ror":"https://ror.org/043bpky34"},{"id":"https://openalex.org/F4320324852","display_name":"Nanjing University","ror":"https://ror.org/01rxvg760"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3208298044.pdf","grobid_xml":"https://content.openalex.org/works/W3208298044.grobid-xml"},"referenced_works_count":8,"referenced_works":["https://openalex.org/W2035184351","https://openalex.org/W2043514677","https://openalex.org/W2132937321","https://openalex.org/W2146311027","https://openalex.org/W2751745648","https://openalex.org/W2907348291","https://openalex.org/W3093687777","https://openalex.org/W3160536632"],"related_works":["https://openalex.org/W2020211532","https://openalex.org/W2331363910","https://openalex.org/W4210612121","https://openalex.org/W2534362719","https://openalex.org/W2093853018","https://openalex.org/W3037723414","https://openalex.org/W2905512452","https://openalex.org/W2328534916","https://openalex.org/W2146311027","https://openalex.org/W2064273871"],"abstract_inverted_index":{"Abstract":[0],"In":[1],"order":[2],"to":[3,108,118],"study":[4],"the":[5,8,13,24,27,31,39,42,48,62,69,73,81,84,99,102,111,136],"effect":[6],"of":[7,10,16,26,44,64,72,83,92,113,139],"resistance":[9,32,43,91,112],"thermopile":[11,93,114],"on":[12],"output":[14,137],"performance":[15,138],"thermoelectric":[17,140],"microelectromechanical":[18],"system":[19],"(MEMS)":[20],"microwave":[21,50,141],"power":[22,51,104,142],"sensors,":[23],"relationship":[25],"electron":[28],"mobility":[29],"and":[30,38,52,80,121],"in":[33,61],"n+\u2010type":[34],"GaAs":[35],"is":[36,54,75,86],"studied,":[37],"reason":[40],"why":[41],"thermocouple":[45],"changes":[46],"with":[47,98],"input":[49,103],"frequency":[53],"analyzed.":[55],"The":[56,90],"experimental":[57],"results":[58],"show":[59],"that":[60],"range":[63,105],"8":[65],"\u223c":[66],"12":[67],"GHz,":[68],"return":[70],"loss":[71],"sensor":[74,85],"less":[76],"than":[77],"\u221227.75":[78],"dB,":[79],"sensitivity":[82],"0.055":[87],"mV/mW@10":[88],"GHz.":[89],"shows":[94],"a":[95,130],"downward":[96],"trend":[97],"frequency.":[100],"With":[101],"from":[106,116],"0":[107],"300":[109],"mW,":[110],"increases":[115],"55.51":[117],"71.17":[119],"k\u03a9,":[120],"it":[122],"has":[123,129],"good":[124],"linearity.":[125],"Therefore,":[126],"this":[127],"work":[128],"certain":[131],"reference":[132],"value":[133],"for":[134],"improving":[135],"sensors.":[143]},"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2026-10-30T12:39:25.321706","created_date":"2021-11-08T00:00:00"}