{"id":"https://openalex.org/W3207569997","doi":null,"title":"Development of the evaluation method for crack propagation due to thermal striping","display_name":"Development of the evaluation method for crack propagation due to thermal striping","publication_year":1989,"publication_date":"1989-01-01","ids":{"openalex":"https://openalex.org/W3207569997","mag":"3207569997"},"language":"en","primary_location":{"id":"mag:3207569997","doi":null,"is_oa":false,"landing_page_url":"https://inis.iaea.org/Search/search.aspx?orig_q=RN:21054189","pdf_url":null,"source":{"id":"https://openalex.org/S4306559694","display_name":"\u96fb\u529b\u4e2d\u592e\u7814\u7a76\u6240\u5831\u544a \u7814\u7a76\u5831\u544a","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":"Denryoku Chuo Kenkyusho Hokoku","raw_type":null},"volume":null,"type":"article","is_traditional":true,"indexed_in":[],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5026203315","display_name":"Kohji Take","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Kohji Take","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101013724","display_name":"Yukio Takahashi","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yukio Takahashi","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071598217","display_name":"Naoki Miura","orcid":"https://orcid.org/0000-0002-4625-5231","observed_orcids":["https://orcid.org/0000-0002-4625-5231"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Naoki Miura","raw_affiliation_strings":[],"raw_orcid":"https://orcid.org/0000-0002-4625-5231","affiliations":[]},{"author_position":"middle","author":{"id":null,"display_name":"Kazutaka Yano","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Kazutaka Yano","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110020329","display_name":"Takashi Shimakawa","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Takashi Shimakawa","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5103527492","display_name":"Masayoshi Uno","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I130416959","display_name":"Central Research Institute of Electric Power Industry","ror":"https://ror.org/041jswc25","country_code":"JP","type":"nonprofit","lineage":["https://openalex.org/I130416959"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masayoshi Uno","raw_affiliation_strings":["Central Research Inst. of Electric Power Industry, Komae, Tokyo (Japan). Komae Research lab"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Central Research Inst. of Electric Power Industry, Komae, Tokyo (Japan). Komae Research lab","institution_ids":["https://openalex.org/I130416959"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.47578744,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"209"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10396","display_name":"Fatigue and fracture mechanics","score":0.8515999913215637,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10396","display_name":"Fatigue and fracture mechanics","score":0.8515999913215637,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12560","display_name":"Nuclear Engineering Thermal-Hydraulics","score":0.023800000548362732,"subfield":{"id":"https://openalex.org/subfields/2104","display_name":"Nuclear Energy and Engineering"},"field":{"id":"https://openalex.org/fields/21","display_name":"Energy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11242","display_name":"Nuclear Materials and Properties","score":0.016899999231100082,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/crack-propagation","display_name":"crack propagation","score":0.8339999914169312},{"id":"https://openalex.org/keywords/thermal-striping","display_name":"thermal striping","score":0.9700000286102295},{"id":"https://openalex.org/keywords/assessment-methods","display_name":"assessment methods","score":0.675000011920929},{"id":"https://openalex.org/keywords/thermal-fatigue","display_name":"thermal fatigue","score":0.5}],"concepts":[{"id":"https://openalex.org/C83489325","wikidata":"https://www.wikidata.org/wiki/Q1332256","display_name":"Data striping","level":2,"score":0.9015325307846069},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.4555368423461914},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4300849437713623},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1353771984577179},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.08580228686332703},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"mag:3207569997","doi":null,"is_oa":false,"landing_page_url":"https://inis.iaea.org/Search/search.aspx?orig_q=RN:21054189","pdf_url":null,"source":{"id":"https://openalex.org/S4306559694","display_name":"\u96fb\u529b\u4e2d\u592e\u7814\u7a76\u6240\u5831\u544a \u7814\u7a76\u5831\u544a","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":"Denryoku Chuo Kenkyusho Hokoku","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W3193095784","https://openalex.org/W3208597522","https://openalex.org/W2609604749","https://openalex.org/W2588842958","https://openalex.org/W7046855869","https://openalex.org/W2621301335","https://openalex.org/W2998487723","https://openalex.org/W3187878761","https://openalex.org/W2615969040","https://openalex.org/W2884282043"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-10-31T12:09:11.096373","created_date":"2021-10-25T00:00:00"}