{"id":"https://openalex.org/W320749613","doi":null,"title":"High-k dielectrics as bioelectronic interface for field effect transistors","display_name":"High-k dielectrics as bioelectronic interface for field effect transistors","publication_year":2007,"publication_date":"2007-01-01","ids":{"openalex":"https://openalex.org/W320749613","mag":"320749613"},"language":"en","primary_location":{"id":"pmh:oai:juser.fz-juelich.de:52535","doi":null,"is_oa":false,"landing_page_url":"http://juser.fz-juelich.de/record/52535","pdf_url":null,"source":{"id":"https://openalex.org/S4306401090","display_name":"JuSER (Forschungszentrum J\u00fclich)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I171892758","host_organization_name":"Forschungszentrum J\u00fclich","host_organization_lineage":["https://openalex.org/I171892758"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"J\u00fclich : FZJ, Institut f\u00fcr Schichten und Grenzfl\u00e4chen, (2006). = Aachen, Techn. Hochsch., Diss., 2006","raw_type":"info:eu-repo/semantics/doctoralThesis"},"volume":null,"type":"dissertation","is_traditional":true,"indexed_in":[],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://juser.fz-juelich.de/record/58898/files/Juel_4247_Borstlap.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5008896928","display_name":"Dirk Borstlap","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Dirk Borstlap","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5045587732","display_name":"Andreas Offenh\u00e4usser","orcid":"https://orcid.org/0000-0001-6143-2702","observed_orcids":["https://orcid.org/0000-0001-6143-2702"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Andreas Offenh\u00e4usser","raw_affiliation_strings":[],"raw_orcid":"https://orcid.org/0000-0001-6143-2702","affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":true,"cited_by_count":3,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.5429999828338623,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.5429999828338623,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.3122999966144562,"subfield":{"id":"https://openalex.org/subfields/1602","display_name":"Analytical Chemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.02590000070631504,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/high-k-dielectrics","display_name":"high-k dielectrics","score":0.9509999752044678},{"id":"https://openalex.org/keywords/ion-sensitive-field-effect-transistor","display_name":"ion-sensitive field-effect transistor","score":0.9909999966621399},{"id":"https://openalex.org/keywords/bioelectronic-sensors","display_name":"bioelectronic sensors","score":0.8560000061988831},{"id":"https://openalex.org/keywords/dna-detection","display_name":"DNA detection","score":0.7940000295639038},{"id":"https://openalex.org/keywords/al2o3-gate-dielectric","display_name":"Al2O3 gate dielectric","score":0.8209999799728394},{"id":"https://openalex.org/keywords/yttria-stabilized-zirconia","display_name":"yttria-stabilized zirconia","score":0.8930000066757202},{"id":"https://openalex.org/keywords/dysco3","display_name":"DyScO3","score":0.968999981880188},{"id":"https://openalex.org/keywords/biocompatibility","display_name":"biocompatibility","score":0.5759999752044678},{"id":"https://openalex.org/keywords/input-capacitance","display_name":"input capacitance","score":0.7210000157356262},{"id":"https://openalex.org/keywords/signal-to-noise-ratio","display_name":"signal-to-noise ratio","score":0.9279999732971191},{"id":"https://openalex.org/keywords/ion-sensitivity","display_name":"ion sensitivity","score":0.8980000019073486},{"id":"https://openalex.org/keywords/transconductance","display_name":"transconductance","score":0.5770000219345093},{"id":"https://openalex.org/keywords/dielectric-breakdown-field","display_name":"dielectric breakdown field","score":0.6150000095367432}],"concepts":[{"id":"https://openalex.org/C113843644","wikidata":"https://www.wikidata.org/wiki/Q901882","display_name":"Interface (matter)","level":4,"score":0.6435677409172058},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.5850312113761902},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5376850962638855},{"id":"https://openalex.org/C16317505","wikidata":"https://www.wikidata.org/wiki/Q132013","display_name":"High-\u03ba dielectric","level":3,"score":0.5144650936126709},{"id":"https://openalex.org/C145598152","wikidata":"https://www.wikidata.org/wiki/Q176097","display_name":"Field-effect transistor","level":4,"score":0.5136627554893494},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5130306482315063},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4851475656032562},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.4218960404396057},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3694385886192322},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3642396628856659},{"id":"https://openalex.org/C61696701","wikidata":"https://www.wikidata.org/wiki/Q770766","display_name":"Engineering physics","level":1,"score":0.35334497690200806},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.3302499055862427},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21017488837242126},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.09391891956329346},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.08821231126785278},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.07467818260192871},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C196806460","wikidata":"https://www.wikidata.org/wiki/Q188603","display_name":"Capillary action","level":2,"score":0.0},{"id":"https://openalex.org/C28413391","wikidata":"https://www.wikidata.org/wiki/Q785542","display_name":"Capillary number","level":3,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"pmh:oai:juser.fz-juelich.de:52535","doi":null,"is_oa":false,"landing_page_url":"http://juser.fz-juelich.de/record/52535","pdf_url":null,"source":{"id":"https://openalex.org/S4306401090","display_name":"JuSER (Forschungszentrum J\u00fclich)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I171892758","host_organization_name":"Forschungszentrum J\u00fclich","host_organization_lineage":["https://openalex.org/I171892758"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"J\u00fclich : FZJ, Institut f\u00fcr Schichten und Grenzfl\u00e4chen, (2006). = Aachen, Techn. Hochsch., Diss., 2006","raw_type":"info:eu-repo/semantics/doctoralThesis"},{"id":"pmh:oai:juser.fz-juelich.de:58898","doi":null,"is_oa":true,"landing_page_url":"http://juser.fz-juelich.de/record/58898","pdf_url":"http://juser.fz-juelich.de/record/58898/files/Juel_4247_Borstlap.pdf","source":{"id":"https://openalex.org/S4306401090","display_name":"JuSER (Forschungszentrum J\u00fclich)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I171892758","host_organization_name":"Forschungszentrum J\u00fclich","host_organization_lineage":["https://openalex.org/I171892758"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"J\u00fclich : Forschungszentrum, Zentralbibliothek, Berichte des Forschungszentrums J\u00fclich, 4247, 128 p. (2007). = Aachen, RWTH, Diss., 2006","raw_type":"info:eu-repo/semantics/doctoralThesis"},{"id":"pmh:oai:publications.rwth-aachen.de:61757","doi":null,"is_oa":true,"landing_page_url":"https://publications.rwth-aachen.de/search?p=id:%22RWTH-CONV-009146%22","pdf_url":null,"source":{"id":"https://openalex.org/S4306401362","display_name":"RWTH Publications (RWTH Aachen)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I887968799","host_organization_name":"RWTH Aachen University","host_organization_lineage":["https://openalex.org/I887968799"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"J\u00fclich : Forschungszentrum J\u00fclich, Zentralbibl., Verl. [u.a.], Berichte des Forschungszentrums J\u00fclich 4247, 128 S. : Ill., graph. Darst. (2007). = Zugl.: Aachen, Techn. Hochsch., Diss., 2006","raw_type":"info:eu-repo/semantics/report"},{"id":"mag:320749613","doi":null,"is_oa":false,"landing_page_url":"https://publications.rwth-aachen.de/record/61757","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null}],"best_oa_location":{"id":"pmh:oai:juser.fz-juelich.de:58898","doi":null,"is_oa":true,"landing_page_url":"http://juser.fz-juelich.de/record/58898","pdf_url":"http://juser.fz-juelich.de/record/58898/files/Juel_4247_Borstlap.pdf","source":{"id":"https://openalex.org/S4306401090","display_name":"JuSER (Forschungszentrum J\u00fclich)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I171892758","host_organization_name":"Forschungszentrum J\u00fclich","host_organization_lineage":["https://openalex.org/I171892758"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"J\u00fclich : Forschungszentrum, Zentralbibliothek, Berichte des Forschungszentrums J\u00fclich, 4247, 128 p. (2007). = Aachen, RWTH, Diss., 2006","raw_type":"info:eu-repo/semantics/doctoralThesis"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W320749613.pdf","grobid_xml":"https://content.openalex.org/works/W320749613.grobid-xml"},"referenced_works_count":68,"referenced_works":["https://openalex.org/W1506545258","https://openalex.org/W1508531386","https://openalex.org/W1533614470","https://openalex.org/W1546772188","https://openalex.org/W1555050005","https://openalex.org/W1559674322","https://openalex.org/W1566916904","https://openalex.org/W1659914018","https://openalex.org/W1965337435","https://openalex.org/W1966055252","https://openalex.org/W1972407523","https://openalex.org/W1973783562","https://openalex.org/W1974123820","https://openalex.org/W1978003583","https://openalex.org/W1978267171","https://openalex.org/W1979127249","https://openalex.org/W1985940938","https://openalex.org/W1989512506","https://openalex.org/W1994446230","https://openalex.org/W1995202496","https://openalex.org/W1997064897","https://openalex.org/W1998991681","https://openalex.org/W2003645630","https://openalex.org/W2004769250","https://openalex.org/W2006376420","https://openalex.org/W2009667219","https://openalex.org/W2011145213","https://openalex.org/W2013951453","https://openalex.org/W2017916085","https://openalex.org/W2022265330","https://openalex.org/W2022690372","https://openalex.org/W2025772448","https://openalex.org/W2031889861","https://openalex.org/W2033129190","https://openalex.org/W2037648844","https://openalex.org/W2044296969","https://openalex.org/W2048908509","https://openalex.org/W2050753656","https://openalex.org/W2055708348","https://openalex.org/W2056618936","https://openalex.org/W2059425774","https://openalex.org/W2065507377","https://openalex.org/W2072424359","https://openalex.org/W2072931302","https://openalex.org/W2073564373","https://openalex.org/W2074915841","https://openalex.org/W2083050856","https://openalex.org/W2085187133","https://openalex.org/W2087467014","https://openalex.org/W2089076502","https://openalex.org/W2089246930","https://openalex.org/W2092182427","https://openalex.org/W2094328142","https://openalex.org/W2094949616","https://openalex.org/W2104471785","https://openalex.org/W2105802333","https://openalex.org/W2106390185","https://openalex.org/W2133591444","https://openalex.org/W2138409790","https://openalex.org/W2142579559","https://openalex.org/W2146211324","https://openalex.org/W2150694625","https://openalex.org/W2162123284","https://openalex.org/W2174225487","https://openalex.org/W2310418687","https://openalex.org/W2493581502","https://openalex.org/W2494166191","https://openalex.org/W2787330648"],"related_works":["https://openalex.org/W2029022042","https://openalex.org/W7066443196","https://openalex.org/W2775387815","https://openalex.org/W2967418550","https://openalex.org/W2019897206","https://openalex.org/W4390762981","https://openalex.org/W2997169603","https://openalex.org/W2123983088","https://openalex.org/W4413620513","https://openalex.org/W2396075280"],"abstract_inverted_index":{"Ion-sensitive":[0],"field-effect":[1,254],"transistors":[2],"(ISFETs)":[3],"are":[4,27,261,293],"employed":[5,259],"as":[6,29,148,336],"bioelectronic":[7,58,347],"sensors":[8],"for":[9,14,97,257,365],"the":[10,15,34,40,49,54,66,98,101,105,112,120,129,138,168,172,176,214,218,221,225,249,252,258,262,271,284,297,300,304,308,316,325,331,340,345,352,397,413],"cell-transistor":[11,309],"coupling":[12,310],"and":[13,52,79,88,92,157,185,196,208,220,243,248,280,322,374,393,396],"detection":[16,380],"of":[17,37,42,57,100,104,111,137,175,213,224,251,299,303,330,344,357,407,412],"DNA":[18,366,379],"sequences.":[19],"For":[20],"these":[21],"applications,":[22],"thermally":[23],"grown":[24],"SiO$_{2}$":[25,131,179],"films":[26,118,143,333],"used":[28],"standard":[30,130,178],"gate":[31,50,150,305],"dielectric.":[32,151],"In":[33,171,312,339,377],"first":[35,378],"part":[36,174,343],"this":[38],"dissertation,":[39,177,346],"suitability":[41],"high-k":[43,68,106,186,226,353],"dielectrics":[44],"was":[45,216,368,402],"studied":[46],"to":[47,82,232,278,295],"increase":[48],"capacitance":[51,184],"hence":[53],"signal-to-noise":[55,203,222],"ratio":[56,223],"ISFETs:":[59],"Upon":[60],"culturing":[61],"primary":[62],"rat":[63],"neurons":[64],"on":[65],"corresponding":[67],"dielectrics,":[69],"$Al_{2}O_{3}$,":[70,114,139,188],"yttria":[71],"stabilised":[72],"zirkonia":[73],"(YSZ),":[74],"DyScO$_{3}$,":[75],"CeO$_{2}$,":[76],"LaAlO$_{3}$,":[77],"GdScO$_{3}$":[78],"LaScO$_{3}$":[80],"proved":[81],"be":[83],"biocompatible":[84],"substrates.":[85],"Comprehensive":[86],"electrical":[87],"electrochemical":[89],"current-voltage":[90],"measurements":[91,94,268],"capacitance-voltage":[93],"were":[95,162,193,274,349,388,416],"performed":[96,350,403],"determination":[99],"dielectric":[102,109,187,306],"properties":[103],"dielectrics.":[107],"High":[108],"constants":[110],"produced":[113],"YSZ":[115,140,189,272,291,317,332,392,422],"und":[116,141,190,287],"DyScO$_{3}$":[117,142,191,288,375,394],"facilitated":[119],"processingof":[121],"ISFETs":[122,180,192,227,260,273,292,318,395],"with":[123,181,198,351,372,382,421],"considerably":[124,275],"higher":[125,234],"input":[126,183,235],"capacitances":[127],"than":[128,283,324],"ISFETs.":[132,289,327,354,376],"The":[133,265,410],"achieved":[134],"breakdown":[135],"fields":[136],"ensured":[144],"their":[145,202,205,209,233],"reliable":[146],"employment":[147],"ISFET":[149],"Good":[152],"stability":[153],"against":[154],"electrostatic":[155],"charging":[156],"small":[158,165,385],"interface":[159],"state":[160],"densities":[161],"concluded":[163],"from":[164,418],"hysteresis":[166],"in":[167,307,405],"capacitancevoltage":[169],"measurements.":[170],"second":[173],"lower":[182],"comprehensively":[194],"characterised":[195],"compared":[197],"each":[199],"other":[200,326],"regarding":[201],"ratio,":[204],"ion":[206,266,301],"sensitivity":[207,267,302],"drift":[210,314],"behaviour.":[211],"One":[212],"results":[215],"that":[217,240,270],"transconductance":[219],"did":[228],"not":[229],"improve":[230],"according":[231],"capacitance.":[236],"It":[237],"is":[238,334],"assumed":[239,335],"high":[241],"source":[242],"drain":[244],"feed":[245],"line":[246,401],"resistances":[247],"invalidity":[250],"long-channel":[253],"transistor":[255],"equation":[256],"underlying":[263,337],"reasons.":[264],"showed":[269],"more":[276],"sensitive":[277],"K$^{+}$":[279],"Na$^{+}$":[281],"ions":[282],"SiO$_{2}$,":[285],"$Al_{2}O_{3}$":[286,373,383],"Hence":[290],"suited":[294],"study":[296],"impact":[298],"mechanism.":[311],"long-term":[313],"measurements,":[315],"drifted":[319],"much":[320],"longer":[321],"further":[323],"Higher":[328],"porosity":[329],"reason.":[338],"final":[341],"third":[342],"experiments":[348,381],"Alternating":[355],"deposition":[356],"oppositely":[358],"charged":[359],"polyelectrolyte":[360],"layers,":[361],"a":[362],"model":[363],"experiment":[364],"detection,":[367],"successfully":[369,404],"carried":[370],"out":[371],"ISFETs,":[384,423],"hybridisation":[386],"signals":[387],"measured.":[389],"Coupling":[390],"between":[391],"HL-1":[398,419],"heart":[399],"cell":[400],"proof":[406],"principle":[408],"experiments.":[409],"shape":[411],"signals,":[414],"which":[415],"measured":[417],"cells":[420],"differed":[424],"[...]":[425]},"counts_by_year":[{"year":2018,"cited_by_count":1}],"updated_date":"2026-09-26T08:19:03.415552","created_date":"2016-06-24T00:00:00"}