{"id":"https://openalex.org/W3207356249","doi":"https://doi.org/10.1109/emc/si/pi/emceurope52599.2021.9559237","title":"Research on an EMC High and Low Voltage Coupling Test Method","display_name":"Research on an EMC High and Low Voltage Coupling Test Method","publication_year":2021,"publication_date":"2021-07-26","ids":{"openalex":"https://openalex.org/W3207356249","doi":"https://doi.org/10.1109/emc/si/pi/emceurope52599.2021.9559237","mag":"3207356249"},"language":"en","primary_location":{"id":"doi:10.1109/emc/si/pi/emceurope52599.2021.9559237","doi":"https://doi.org/10.1109/emc/si/pi/emceurope52599.2021.9559237","is_oa":false,"landing_page_url":"https://doi.org/10.1109/emc/si/pi/emceurope52599.2021.9559237","pdf_url":null,"source":{"id":"https://openalex.org/S4393918214","display_name":"IEEE International Symposium on Electromagnetic Compatibility","issn_l":"2158-110X","issn":["2158-110X"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5113177937","display_name":"Junjie Ma","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210094894","display_name":"China Automotive Technology and Research Center","ror":"https://ror.org/00r5r6807","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210094894"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Junjie Ma","raw_affiliation_strings":["CATARC Automotive Test Center(Tianjin) Co.,Ltd., Tianjin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CATARC Automotive Test Center(Tianjin) Co.,Ltd., Tianjin, China","institution_ids":["https://openalex.org/I4210094894"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101723038","display_name":"Zhe Xu","orcid":"https://orcid.org/0000-0003-3902-3309","observed_orcids":["https://orcid.org/0000-0003-3902-3309"]},"institutions":[{"id":"https://openalex.org/I4210094894","display_name":"China Automotive Technology and Research Center","ror":"https://ror.org/00r5r6807","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210094894"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhe Xu","raw_affiliation_strings":["CATARC Automotive Test Center(Tianjin) Co.,Ltd., Tianjin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CATARC Automotive Test Center(Tianjin) Co.,Ltd., Tianjin, China","institution_ids":["https://openalex.org/I4210094894"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091204381","display_name":"Deng-Yu Zhang","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210094894","display_name":"China Automotive Technology and Research Center","ror":"https://ror.org/00r5r6807","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210094894"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dengyu Zhang","raw_affiliation_strings":["CATARC Automotive Test Center(Tianjin) Co.,Ltd., Tianjin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CATARC Automotive Test Center(Tianjin) Co.,Ltd., Tianjin, China","institution_ids":["https://openalex.org/I4210094894"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100363278","display_name":"Haipeng Li","orcid":"https://orcid.org/0000-0003-4641-3938","observed_orcids":["https://orcid.org/0000-0003-4641-3938"]},"institutions":[{"id":"https://openalex.org/I4210094894","display_name":"China Automotive Technology and Research Center","ror":"https://ror.org/00r5r6807","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210094894"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haipeng Li","raw_affiliation_strings":["CATARC Automotive Test Center(Tianjin) Co.,Ltd., Tianjin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CATARC Automotive Test Center(Tianjin) Co.,Ltd., Tianjin, China","institution_ids":["https://openalex.org/I4210094894"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210094894"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.14595926,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"5","issue":null,"first_page":"132","last_page":"135"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9901999831199646,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9901999831199646,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.009700000286102295,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12759","display_name":"Vehicle Noise and Vibration Control","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electromagnetic-compatibility-testing","display_name":"electromagnetic compatibility testing","score":0.8920000195503235},{"id":"https://openalex.org/keywords/impedance-matching","display_name":"impedance matching","score":0.8759999871253967},{"id":"https://openalex.org/keywords/electric-vehicles","display_name":"electric vehicles","score":0.8809999823570251},{"id":"https://openalex.org/keywords/diagnostic-accuracy","display_name":"diagnostic accuracy","score":0.5649999976158142}],"concepts":[{"id":"https://openalex.org/C125470083","wikidata":"https://www.wikidata.org/wiki/Q747288","display_name":"Electromagnetic compatibility","level":2,"score":0.7019573450088501},{"id":"https://openalex.org/C612350","wikidata":"https://www.wikidata.org/wiki/Q1761108","display_name":"Impedance matching","level":3,"score":0.6704664826393127},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.6208615899085999},{"id":"https://openalex.org/C131584629","wikidata":"https://www.wikidata.org/wiki/Q4308705","display_name":"Coupling (piping)","level":2,"score":0.5496566891670227},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.529717206954956},{"id":"https://openalex.org/C132519959","wikidata":"https://www.wikidata.org/wiki/Q3077373","display_name":"Test method","level":2,"score":0.522377073764801},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.47891438007354736},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.47407951951026917},{"id":"https://openalex.org/C88182573","wikidata":"https://www.wikidata.org/wiki/Q1139740","display_name":"High voltage","level":3,"score":0.458903968334198},{"id":"https://openalex.org/C2776436953","wikidata":"https://www.wikidata.org/wiki/Q5163215","display_name":"Consistency (knowledge bases)","level":2,"score":0.43418365716934204},{"id":"https://openalex.org/C128624480","wikidata":"https://www.wikidata.org/wiki/Q1504817","display_name":"Low voltage","level":3,"score":0.4136175513267517},{"id":"https://openalex.org/C165064840","wikidata":"https://www.wikidata.org/wiki/Q1321061","display_name":"Matching (statistics)","level":2,"score":0.41137248277664185},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3810529112815857},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.36532047390937805},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.10397818684577942},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.09739351272583008},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.06796911358833313},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/emc/si/pi/emceurope52599.2021.9559237","doi":"https://doi.org/10.1109/emc/si/pi/emceurope52599.2021.9559237","is_oa":false,"landing_page_url":"https://doi.org/10.1109/emc/si/pi/emceurope52599.2021.9559237","pdf_url":null,"source":{"id":"https://openalex.org/S4393918214","display_name":"IEEE International Symposium on Electromagnetic Compatibility","issn_l":"2158-110X","issn":["2158-110X"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5378999710083008,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2139260084","https://openalex.org/W3150198402","https://openalex.org/W1520684232","https://openalex.org/W3085131872","https://openalex.org/W2988359330","https://openalex.org/W4386632181","https://openalex.org/W2100660725","https://openalex.org/W2046905812","https://openalex.org/W2126276829","https://openalex.org/W4412624258"],"abstract_inverted_index":{"At":[0],"present,":[1],"the":[2,17,21,28,31,37,46,69,75,95,99,107,126,129,152],"electromagnetic":[3],"compatibility(EMC)":[4],"high":[5,131,156],"and":[6,30,52,98,105,132,143,157],"low":[7,133,158],"voltage":[8,87,134,159],"coupling":[9,88,135,160],"network":[10,29,161],"test":[11,32,55,96,103,110,137,147,162],"for":[12,85,149],"automotive":[13],"electrical":[14],"sub-assembly(ESA)":[15],"in":[16,34,68],"standard":[18],"only":[19],"requires":[20],"use":[22],"of":[23,54,74,109,128,139],"an":[24,81],"adapter":[25],"to":[26,64],"connect":[27],"sample,":[33,100],"other":[35],"words,":[36],"impedance":[38,47,66,82,114],"matching":[39,67,83],"is":[40,62],"not":[41,49],"considered.":[42],"In":[43],"practice,":[44],"if":[45],"does":[48],"match,":[50],"accuracy":[51,108],"consistency":[53],"results":[56,118],"cannot":[57],"be":[58],"guaranteed.":[59],"But":[60],"it":[61],"difficult":[63],"achieve":[65],"whole":[70],"frequency":[71],"band.In":[72],"view":[73],"above":[76],"problem,":[77],"this":[78,121],"paper":[79],"proposes":[80],"method":[84,122],"high-low":[86],"test,":[89],"by":[90,113],"isolating":[91],"indirectly":[92],"contact":[93],"between":[94],"system":[97],"which":[101],"reduces":[102],"errors":[104],"improves":[106],"data":[111],"caused":[112],"mismatch.":[115],"The":[116],"experimental":[117],"prove":[119],"that":[120],"can":[123],"effectively":[124],"solve":[125],"shortcomings":[127],"existing":[130],"EMC":[136],"technology":[138],"electric":[140,153],"vehicle":[141,154],"ESA,":[142],"provide":[144],"a":[145],"reasonable":[146],"idea":[148],"accurately":[150],"testing":[151],"ESA":[155],"method.":[163]},"counts_by_year":[],"updated_date":"2026-10-30T12:39:25.321706","created_date":"2021-10-25T00:00:00"}