{"id":"https://openalex.org/W3205693045","doi":"https://doi.org/10.24425/mms.2021.137128","title":"Surrogate synthesis of frame eddy current probes with uniform sensitivity in the testing zone","display_name":"Surrogate synthesis of frame eddy current probes with uniform sensitivity in the testing zone","publication_year":2021,"publication_date":"2021-04-21","ids":{"openalex":"https://openalex.org/W3205693045","doi":"https://doi.org/10.24425/mms.2021.137128","mag":"3205693045"},"language":"en","primary_location":{"id":"doi:10.24425/mms.2021.137128","doi":"https://doi.org/10.24425/mms.2021.137128","is_oa":true,"landing_page_url":"https://doi.org/10.24425/mms.2021.137128","pdf_url":"http://journals.pan.pl/Content/120623/art10_i.pdf","source":{"id":"https://openalex.org/S185842587","display_name":"Metrology and Measurement Systems","issn_l":"0860-8229","issn":["0860-8229","2080-9050","2300-1941"],"is_oa":true,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","ddh","dongbi-d","poland-100","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320322","host_organization_name":"De Gruyter Open","host_organization_lineage":["https://openalex.org/P4310320322","https://openalex.org/P4310313990"],"host_organization_lineage_names":["De Gruyter Open","De Gruyter"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Metrology and Measurement Systems","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref","datacite","doaj"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"http://journals.pan.pl/Content/120623/art10_i.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5031922335","display_name":"Volodymyr Halchenko","orcid":"https://orcid.org/0000-0003-0304-372X","observed_orcids":["https://orcid.org/0000-0003-0304-372X"]},"institutions":[{"id":"https://openalex.org/I4210108895","display_name":"Cherkasy State Technological University","ror":"https://ror.org/01m54ds80","country_code":"UA","type":"education","lineage":["https://openalex.org/I4210108895"]}],"countries":["UA"],"is_corresponding":false,"raw_author_name":"Volodymyr Ya. Halchenko","raw_affiliation_strings":["Cherkasy State Technological University, Instrumentation, Mechatronics and Computer Technologies Department, Blvd. Shevchenka, 460, 18006, Cherkasy, Ukraine"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Cherkasy State Technological University, Instrumentation, Mechatronics and Computer Technologies Department, Blvd. Shevchenka, 460, 18006, Cherkasy, Ukraine","institution_ids":["https://openalex.org/I4210108895"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110763934","display_name":"\u0420\u0443\u0441\u043b\u0430\u043d\u0430 \u0412\u043e\u043b\u043e\u0434\u0438\u043c\u0438\u0440\u0456\u0432\u043d\u0430 \u0422\u0440\u0435\u043c\u0431\u043e\u0432\u0435\u0446\u044c\u043a\u0430","orcid":"https://orcid.org/0000-0002-2308-6690","observed_orcids":["https://orcid.org/0000-0002-2308-6690"]},"institutions":[{"id":"https://openalex.org/I4210108895","display_name":"Cherkasy State Technological University","ror":"https://ror.org/01m54ds80","country_code":"UA","type":"education","lineage":["https://openalex.org/I4210108895"]}],"countries":["UA"],"is_corresponding":false,"raw_author_name":"Ruslana Trembovetska","raw_affiliation_strings":["Cherkasy State Technological University, Instrumentation, Mechatronics and Computer Technologies Department, Blvd. Shevchenka, 460, 18006, Cherkasy, Ukraine"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Cherkasy State Technological University, Instrumentation, Mechatronics and Computer Technologies Department, Blvd. Shevchenka, 460, 18006, Cherkasy, Ukraine","institution_ids":["https://openalex.org/I4210108895"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5069386827","display_name":"Volodymyr Tychkov","orcid":"https://orcid.org/0000-0001-9997-307X","observed_orcids":["https://orcid.org/0000-0001-9997-307X"]},"institutions":[{"id":"https://openalex.org/I4210108895","display_name":"Cherkasy State Technological University","ror":"https://ror.org/01m54ds80","country_code":"UA","type":"education","lineage":["https://openalex.org/I4210108895"]}],"countries":["UA"],"is_corresponding":false,"raw_author_name":"Volodymyr Tychkov","raw_affiliation_strings":["Cherkasy State Technological University, Instrumentation, Mechatronics and Computer Technologies Department, Blvd. Shevchenka, 460, 18006, Cherkasy, Ukraine"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Cherkasy State Technological University, Instrumentation, Mechatronics and Computer Technologies Department, Blvd. Shevchenka, 460, 18006, Cherkasy, Ukraine","institution_ids":["https://openalex.org/I4210108895"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210108895"],"apc_list":null,"apc_paid":null,"fwci":0.7512,"has_fulltext":true,"cited_by_count":15,"citation_normalized_percentile":{"value":0.63690632,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":93,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"551","last_page":"564"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10848","display_name":"Advanced Multi-Objective Optimization Algorithms","score":0.000699999975040555,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/eddy-current-sensors","display_name":"eddy current sensors","score":0.8240000009536743},{"id":"https://openalex.org/keywords/metamodel","display_name":"meta-model","score":0.7639999985694885},{"id":"https://openalex.org/keywords/nonlinear-programming","display_name":"nonlinear programming","score":0.6600000262260437},{"id":"https://openalex.org/keywords/metaheuristic-algorithms","display_name":"metaheuristic algorithms","score":0.9330000281333923},{"id":"https://openalex.org/keywords/global-optimization","display_name":"global optimization","score":0.46000000834465027},{"id":"https://openalex.org/keywords/non-destructive-testing","display_name":"non-destructive testing","score":0.7179999947547913}],"concepts":[{"id":"https://openalex.org/C131357438","wikidata":"https://www.wikidata.org/wiki/Q208598","display_name":"Eddy current","level":2,"score":0.6464170217514038},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.5586211681365967},{"id":"https://openalex.org/C83581075","wikidata":"https://www.wikidata.org/wiki/Q1361503","display_name":"Excitation","level":2,"score":0.53073650598526},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.5023496150970459},{"id":"https://openalex.org/C126042441","wikidata":"https://www.wikidata.org/wiki/Q1324888","display_name":"Frame (networking)","level":2,"score":0.49730947613716125},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.47196733951568604},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.43839210271835327},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.4264923334121704},{"id":"https://openalex.org/C6441794","wikidata":"https://www.wikidata.org/wiki/Q1420867","display_name":"Eddy-current testing","level":3,"score":0.41311779618263245},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.36550867557525635},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2676087021827698},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2576141953468323},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22489136457443237},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.12156590819358826},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.08195209503173828},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.24425/mms.2021.137128","doi":"https://doi.org/10.24425/mms.2021.137128","is_oa":true,"landing_page_url":"https://doi.org/10.24425/mms.2021.137128","pdf_url":"http://journals.pan.pl/Content/120623/art10_i.pdf","source":{"id":"https://openalex.org/S185842587","display_name":"Metrology and Measurement Systems","issn_l":"0860-8229","issn":["0860-8229","2080-9050","2300-1941"],"is_oa":true,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","ddh","dongbi-d","poland-100","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320322","host_organization_name":"De Gruyter Open","host_organization_lineage":["https://openalex.org/P4310320322","https://openalex.org/P4310313990"],"host_organization_lineage_names":["De Gruyter Open","De Gruyter"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Metrology and Measurement Systems","raw_type":"journal-article"},{"id":"pmh:oai:er.chdtu.edu.ua:ChSTU/2649","doi":null,"is_oa":true,"landing_page_url":"https://er.chdtu.edu.ua/handle/ChSTU/2649","pdf_url":"https://er.chdtu.edu.ua/bitstream/ChSTU/2649/1/art10_i.pdf","source":{"id":"https://openalex.org/S7407055196","display_name":"Cherkasy State Technological University repository","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Article"},{"id":"pmh:oai:doaj.org/article:3b978ba22b924b4890a6ca6ae64b0234","doi":null,"is_oa":true,"landing_page_url":"https://doaj.org/article/3b978ba22b924b4890a6ca6ae64b0234","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Metrology and Measurement Systems, Vol vol. 28, Iss No 3, Pp 551-564 (2021)","raw_type":"article"},{"id":"doi:10.24425/mms.2021.137128","doi":"https://doi.org/10.24425/mms.2021.137128","is_oa":true,"landing_page_url":"https://doi.org/10.24425/mms.2021.137128","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Other"}],"best_oa_location":{"id":"doi:10.24425/mms.2021.137128","doi":"https://doi.org/10.24425/mms.2021.137128","is_oa":true,"landing_page_url":"https://doi.org/10.24425/mms.2021.137128","pdf_url":"http://journals.pan.pl/Content/120623/art10_i.pdf","source":{"id":"https://openalex.org/S185842587","display_name":"Metrology and Measurement Systems","issn_l":"0860-8229","issn":["0860-8229","2080-9050","2300-1941"],"is_oa":true,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","ddh","dongbi-d","poland-100","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320322","host_organization_name":"De Gruyter Open","host_organization_lineage":["https://openalex.org/P4310320322","https://openalex.org/P4310313990"],"host_organization_lineage_names":["De Gruyter Open","De Gruyter"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Metrology and Measurement Systems","raw_type":"journal-article"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3205693045.pdf","grobid_xml":"https://content.openalex.org/works/W3205693045.grobid-xml"},"referenced_works_count":23,"referenced_works":["https://openalex.org/W147377413","https://openalex.org/W1211027026","https://openalex.org/W1595797227","https://openalex.org/W2028576808","https://openalex.org/W2043528138","https://openalex.org/W2048995131","https://openalex.org/W2115579527","https://openalex.org/W2133985096","https://openalex.org/W2344393454","https://openalex.org/W2495396925","https://openalex.org/W2521368581","https://openalex.org/W2531130153","https://openalex.org/W2741433865","https://openalex.org/W2805510165","https://openalex.org/W2971515454","https://openalex.org/W2981882068","https://openalex.org/W3039453437","https://openalex.org/W3039673306","https://openalex.org/W3043053073","https://openalex.org/W3109833140","https://openalex.org/W3158411867","https://openalex.org/W7018999146","https://openalex.org/W7070947009"],"related_works":["https://openalex.org/W3118917178","https://openalex.org/W4375943880","https://openalex.org/W3159117856","https://openalex.org/W2971515454","https://openalex.org/W3176364614","https://openalex.org/W7219247887","https://openalex.org/W7219180436","https://openalex.org/W7219364007","https://openalex.org/W2347974561","https://openalex.org/W3109833140"],"abstract_inverted_index":{"A":[0],"mathematical":[1],"method":[2],"for":[3,44,67],"nonlinear":[4,53],"surrogate":[5,45],"synthesis":[6,47,54],"of":[7,28,51,55,61,76,83,93,103,107],"frame":[8,30],"surface":[9,102],"eddy":[10,16,95],"current":[11,17,96],"probes":[12],"providing":[13],"a":[14,29,35,52],"uniform":[15],"density":[18,97],"distribution":[19,98],"in":[20,41,110],"the":[21,42,59,62,69,77,84,91,94,101,104,108],"testing":[22],"object":[23,109],"area":[24],"is":[25],"proposed.A":[26],"metamodel":[27],"movable":[31],"eddy-current":[32],"probe":[33],"with":[34,58,112],"planar":[36],"excitation":[37,56,86],"system":[38],"structure,":[39],"used":[40],"algorithm":[43],"optimal":[46],"was":[48,88],"created.The":[49],"examples":[50],"systems":[57],"application":[60],"modern":[63],"metaheuristic":[64],"stochastic":[65],"algorithms":[66],"finding":[68],"global":[70],"extremum":[71],"are":[72,80],"considered.The":[73],"numerical":[74],"findings":[75],"problem":[78],"analyses":[79],"presented.The":[81],"efficiency":[82],"synthesized":[85],"structures":[87],"demonstrated":[89],"on":[90,100],"basis":[92],"graphs":[99],"control":[105],"zone":[106],"comparison":[111],"classical":[113],"analogues.":[114]},"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":5},{"year":2022,"cited_by_count":2}],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2021-10-25T00:00:00"}