{"id":"https://openalex.org/W3205099819","doi":"https://doi.org/10.1109/indin45523.2021.9557516","title":"An Ensemble of Benchmarks for the Evaluation of AI Methods for Fault Handling in CPPS","display_name":"An Ensemble of Benchmarks for the Evaluation of AI Methods for Fault Handling in CPPS","publication_year":2021,"publication_date":"2021-07-21","ids":{"openalex":"https://openalex.org/W3205099819","doi":"https://doi.org/10.1109/indin45523.2021.9557516","mag":"3205099819"},"language":"en","primary_location":{"id":"doi:10.1109/indin45523.2021.9557516","doi":"https://doi.org/10.1109/indin45523.2021.9557516","is_oa":false,"landing_page_url":"https://doi.org/10.1109/indin45523.2021.9557516","pdf_url":null,"source":{"id":"https://openalex.org/S4363608444","display_name":"IEEE International Conference on Industrial Informatics (INDIN)","issn_l":"1935-4576","issn":["1935-4576","2378-3621","2378-363X"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["jufo-1","norway-1"],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE 19th International Conference on Industrial Informatics (INDIN)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5090392622","display_name":"Kaja Balzereit","orcid":"https://orcid.org/0000-0001-9203-5902","observed_orcids":["https://orcid.org/0000-0001-9203-5902"]},"institutions":[{"id":"https://openalex.org/I4210111500","display_name":"Fraunhofer Institute of Optronics, System Technologies and Image Exploitation","ror":"https://ror.org/01zx97922","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210111500","https://openalex.org/I4923324"]},{"id":"https://openalex.org/I4923324","display_name":"Fraunhofer-Gesellschaft","ror":"https://ror.org/05hkkdn48","country_code":"DE","type":"government","lineage":["https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Kaja Balzereit","raw_affiliation_strings":["Fraunhofer Center for Machine Learning,Fraunhofer IOSB, Industrial Automation Branch (IOSB-INA),Lemgo,Germany","Fraunhofer IOSB, Industrial Automation Branch (IOSB-INA), Fraunhofer Center for Machine Learning, Lemgo, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fraunhofer Center for Machine Learning,Fraunhofer IOSB, Industrial Automation Branch (IOSB-INA),Lemgo,Germany","institution_ids":["https://openalex.org/I4210111500","https://openalex.org/I4923324"]},{"raw_affiliation_string":"Fraunhofer IOSB, Industrial Automation Branch (IOSB-INA), Fraunhofer Center for Machine Learning, Lemgo, Germany","institution_ids":["https://openalex.org/I4210111500","https://openalex.org/I4923324"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057069946","display_name":"Alexander Diedrich","orcid":"https://orcid.org/0000-0002-8674-6895","observed_orcids":["https://orcid.org/0000-0002-8674-6895"]},"institutions":[{"id":"https://openalex.org/I4210111500","display_name":"Fraunhofer Institute of Optronics, System Technologies and Image Exploitation","ror":"https://ror.org/01zx97922","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210111500","https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Alexander Diedrich","raw_affiliation_strings":["Fraunhofer Center for Machine Learning,Fraunhofer IOSB-INA,Lemgo,Germany","Fraunhofer IOSB-INA, Fraunhofer Center for Machine Learning, Lemgo, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fraunhofer Center for Machine Learning,Fraunhofer IOSB-INA,Lemgo,Germany","institution_ids":["https://openalex.org/I4210111500"]},{"raw_affiliation_string":"Fraunhofer IOSB-INA, Fraunhofer Center for Machine Learning, Lemgo, Germany","institution_ids":["https://openalex.org/I4210111500"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079275172","display_name":"Jonas Ginster","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210111500","display_name":"Fraunhofer Institute of Optronics, System Technologies and Image Exploitation","ror":"https://ror.org/01zx97922","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210111500","https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Jonas Ginster","raw_affiliation_strings":["Fraunhofer Center for Machine Learning,Fraunhofer IOSB-INA,Lemgo,Germany","Fraunhofer IOSB-INA, Fraunhofer Center for Machine Learning, Lemgo, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fraunhofer Center for Machine Learning,Fraunhofer IOSB-INA,Lemgo,Germany","institution_ids":["https://openalex.org/I4210111500"]},{"raw_affiliation_string":"Fraunhofer IOSB-INA, Fraunhofer Center for Machine Learning, Lemgo, Germany","institution_ids":["https://openalex.org/I4210111500"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017548759","display_name":"Stefan Windmann","orcid":"https://orcid.org/0000-0002-4030-0839","observed_orcids":["https://orcid.org/0000-0002-4030-0839"]},"institutions":[{"id":"https://openalex.org/I4210111500","display_name":"Fraunhofer Institute of Optronics, System Technologies and Image Exploitation","ror":"https://ror.org/01zx97922","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210111500","https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Stefan Windmann","raw_affiliation_strings":["Fraunhofer Center for Machine Learning,Fraunhofer IOSB-INA,Lemgo,Germany","Fraunhofer IOSB-INA, Fraunhofer Center for Machine Learning, Lemgo, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fraunhofer Center for Machine Learning,Fraunhofer IOSB-INA,Lemgo,Germany","institution_ids":["https://openalex.org/I4210111500"]},{"raw_affiliation_string":"Fraunhofer IOSB-INA, Fraunhofer Center for Machine Learning, Lemgo, Germany","institution_ids":["https://openalex.org/I4210111500"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5012395966","display_name":"Oliver Niggemann","orcid":"https://orcid.org/0000-0001-8747-3596","observed_orcids":["https://orcid.org/0000-0001-8747-3596"]},"institutions":[{"id":"https://openalex.org/I190134885","display_name":"Helmut Schmidt University","ror":"https://ror.org/04e8jbs38","country_code":"DE","type":"education","lineage":["https://openalex.org/I190134885"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Oliver Niggemann","raw_affiliation_strings":["Helmut-Schmidt-University,Faculty of Machine Construction,Hamburg,Germany","Faculty of Machine Construction, Helmut-Schmidt-University, Hamburg, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Helmut-Schmidt-University,Faculty of Machine Construction,Hamburg,Germany","institution_ids":["https://openalex.org/I190134885"]},{"raw_affiliation_string":"Faculty of Machine Construction, Helmut-Schmidt-University, Hamburg, Germany","institution_ids":["https://openalex.org/I190134885"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.6414,"has_fulltext":false,"cited_by_count":16,"citation_normalized_percentile":{"value":0.90543293,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":91,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10763","display_name":"Digital Transformation in Industry","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11512","display_name":"Anomaly Detection Techniques and Applications","score":0.0,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-management","display_name":"fault management","score":0.7269999980926514},{"id":"https://openalex.org/keywords/cyber-physical-production-systems","display_name":"cyber-physical production systems","score":0.9810000061988831},{"id":"https://openalex.org/keywords/benchmark-systems","display_name":"benchmark systems","score":0.8339999914169312},{"id":"https://openalex.org/keywords/tank-system","display_name":"tank system","score":0.7680000066757202},{"id":"https://openalex.org/keywords/process-engineering","display_name":"process engineering","score":0.7770000100135803},{"id":"https://openalex.org/keywords/anomaly-detection","display_name":"anomaly detection","score":0.9779999852180481},{"id":"https://openalex.org/keywords/fault-diagnosis","display_name":"fault diagnosis","score":0.8360000252723694},{"id":"https://openalex.org/keywords/root-cause-diagnosis","display_name":"root cause diagnosis","score":0.8709999918937683},{"id":"https://openalex.org/keywords/automated-repair","display_name":"automated repair","score":0.9440000057220459},{"id":"https://openalex.org/keywords/reconfiguration","display_name":"reconfiguration","score":0.718999981880188},{"id":"https://openalex.org/keywords/ai-evaluation","display_name":"AI evaluation","score":0.4480000138282776}],"concepts":[{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.7265838384628296},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6707521677017212},{"id":"https://openalex.org/C119701452","wikidata":"https://www.wikidata.org/wiki/Q5165881","display_name":"Control reconfiguration","level":2,"score":0.6394979953765869},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5841780304908752},{"id":"https://openalex.org/C45942800","wikidata":"https://www.wikidata.org/wiki/Q245652","display_name":"Ensemble learning","level":2,"score":0.5540018081665039},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.5518463850021362},{"id":"https://openalex.org/C84945661","wikidata":"https://www.wikidata.org/wiki/Q7366567","display_name":"Root cause","level":2,"score":0.5489353537559509},{"id":"https://openalex.org/C739882","wikidata":"https://www.wikidata.org/wiki/Q3560506","display_name":"Anomaly detection","level":2,"score":0.5411086082458496},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5300853848457336},{"id":"https://openalex.org/C119898033","wikidata":"https://www.wikidata.org/wiki/Q3433888","display_name":"Ensemble forecasting","level":2,"score":0.4945649802684784},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.39009755849838257},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3772831857204437},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3499966859817505},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.33203834295272827},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23973780870437622},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.12890952825546265},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/indin45523.2021.9557516","doi":"https://doi.org/10.1109/indin45523.2021.9557516","is_oa":false,"landing_page_url":"https://doi.org/10.1109/indin45523.2021.9557516","pdf_url":null,"source":{"id":"https://openalex.org/S4363608444","display_name":"IEEE International Conference on Industrial Informatics (INDIN)","issn_l":"1935-4576","issn":["1935-4576","2378-3621","2378-363X"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["jufo-1","norway-1"],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE 19th International Conference on Industrial Informatics (INDIN)","raw_type":"proceedings-article"},{"id":"pmh:oai:fraunhofer.de:N-642658","doi":null,"is_oa":false,"landing_page_url":"http://publica.fraunhofer.de/documents/N-642658.html","pdf_url":null,"source":{"id":"https://openalex.org/S4306400801","display_name":"Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4923324","host_organization_name":"Fraunhofer-Gesellschaft","host_organization_lineage":["https://openalex.org/I4923324"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Fraunhofer IOSB","raw_type":"Conference Paper"},{"id":"pmh:oai:publica.fraunhofer.de:publica/412753","doi":null,"is_oa":false,"landing_page_url":"https://publica.fraunhofer.de/handle/publica/412753","pdf_url":null,"source":{"id":"https://openalex.org/S4306400318","display_name":"Fraunhofer-Publica (Fraunhofer-Gesellschaft)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4923324","host_organization_name":"Fraunhofer-Gesellschaft","host_organization_lineage":["https://openalex.org/I4923324"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"conference paper"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.5378999710083008}],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W98416746","https://openalex.org/W192669884","https://openalex.org/W1480776897","https://openalex.org/W1480909796","https://openalex.org/W1834133138","https://openalex.org/W1899291908","https://openalex.org/W1983043530","https://openalex.org/W1988499271","https://openalex.org/W2004186751","https://openalex.org/W2029772508","https://openalex.org/W2073178151","https://openalex.org/W2110227608","https://openalex.org/W2112173236","https://openalex.org/W2113443505","https://openalex.org/W2126053898","https://openalex.org/W2132983290","https://openalex.org/W2166674795","https://openalex.org/W2202179777","https://openalex.org/W2210059676","https://openalex.org/W2403047023","https://openalex.org/W2761901158","https://openalex.org/W2904899322","https://openalex.org/W3112580989","https://openalex.org/W3128780189","https://openalex.org/W3180315077","https://openalex.org/W4231980343","https://openalex.org/W4293186481","https://openalex.org/W4298263761"],"related_works":["https://openalex.org/W4312699559","https://openalex.org/W4415399352","https://openalex.org/W2215414066","https://openalex.org/W4321462155","https://openalex.org/W3112580989","https://openalex.org/W4409390938","https://openalex.org/W2415823668","https://openalex.org/W4386065768","https://openalex.org/W4210386990","https://openalex.org/W2766039369"],"abstract_inverted_index":{"AI":[0,88,124],"methods":[1,27,52,89,125],"for":[2,28,83,90,126],"fault":[3,91,127],"handling":[4,128],"in":[5],"Cyber-Physical":[6],"Production":[7],"Systems":[8],"(CPPS)":[9],"such":[10,129],"as":[11,130],"production":[12],"plants":[13],"and":[14,33,41,107,109,134],"tank":[15,99],"systems":[16,61,78,100],"are":[17,53],"an":[18,73],"emerging":[19],"research":[20],"topic.":[21],"In":[22,70],"the":[23,29,35,38,42,51,119],"last":[24],"years":[25],"many":[26],"detection":[30],"of":[31,37,50,60,75,87,96,118],"anomalies":[32],"faults,":[34],"diagnosis":[36,133],"root":[39],"cause":[40],"automated":[43],"repair":[44],"have":[45],"been":[46],"developed.":[47],"However,":[48],"most":[49],"barely":[54],"evaluated":[55],"using":[56,66,123],"a":[57,84],"wide":[58],"range":[59],"but":[62],"applicability":[63],"is":[64,79,110,121],"shown":[65,122],"single":[67],"use":[68],"cases.":[69],"this":[71],"paper,":[72],"ensemble":[74,94,120],"simulated":[76],"benchmark":[77],"presented,":[80],"which":[81],"allows":[82],"broad":[85],"evaluation":[86],"handling.":[92],"The":[93,116],"consists":[95],"seven":[97],"different":[98],"from":[101],"process":[102],"engineering":[103],"with":[104],"varying":[105],"sizes":[106],"complexities":[108],"made":[111],"publicly":[112],"available":[113],"on":[114],"Github.":[115],"suitability":[117],"anomaly":[131],"detection,":[132],"reconfiguration.":[135]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":2}],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2021-10-25T00:00:00"}