{"id":"https://openalex.org/W3203306232","doi":"https://doi.org/10.1109/tdmr.2021.3118382","title":"Simulation Study of Stress Effect on Performance and Design Methodology of Proposed Si/SiGe Integrated Bragg Grating Filter","display_name":"Simulation Study of Stress Effect on Performance and Design Methodology of Proposed Si/SiGe Integrated Bragg Grating Filter","publication_year":2021,"publication_date":"2021-10-07","ids":{"openalex":"https://openalex.org/W3203306232","doi":"https://doi.org/10.1109/tdmr.2021.3118382","mag":"3203306232"},"language":"en","primary_location":{"id":"doi:10.1109/tdmr.2021.3118382","doi":"https://doi.org/10.1109/tdmr.2021.3118382","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tdmr.2021.3118382","pdf_url":null,"source":{"id":"https://openalex.org/S128536549","display_name":"IEEE Transactions on Device and Materials Reliability","issn_l":"1530-4388","issn":["1530-4388","1558-2574"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Device and Materials Reliability","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100656495","display_name":"Sneha Kumari","orcid":"https://orcid.org/0000-0003-1117-2206","observed_orcids":["https://orcid.org/0000-0003-1117-2206"]},"institutions":[{"id":"https://openalex.org/I132153292","display_name":"Indian Institute of Technology Patna","ror":"https://ror.org/01ft5vz71","country_code":"IN","type":"education","lineage":["https://openalex.org/I132153292"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Sneha Kumari","raw_affiliation_strings":["Department of Electrical Engineering, Indian Institute of Technology Patna, Patna, India"],"raw_orcid":"https://orcid.org/0000-0003-1117-2206","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Indian Institute of Technology Patna, Patna, India","institution_ids":["https://openalex.org/I132153292"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5002949875","display_name":"Sumanta Gupta","orcid":"https://orcid.org/0000-0001-8483-9572","observed_orcids":["https://orcid.org/0000-0001-8483-9572"]},"institutions":[{"id":"https://openalex.org/I132153292","display_name":"Indian Institute of Technology Patna","ror":"https://ror.org/01ft5vz71","country_code":"IN","type":"education","lineage":["https://openalex.org/I132153292"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Sumanta Gupta","raw_affiliation_strings":["Department of Electrical Engineering, Indian Institute of Technology Patna, Patna, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Indian Institute of Technology Patna, Patna, India","institution_ids":["https://openalex.org/I132153292"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I132153292"],"apc_list":{"value":2045,"currency":"USD","value_usd":2045},"apc_paid":null,"fwci":0.2203,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.38899139,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":95},"biblio":{"volume":"21","issue":"4","first_page":"569","last_page":"578"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13493","display_name":"Optical and Acousto-Optic Technologies","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11050","display_name":"Photorefractive and Nonlinear Optics","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/stress-effects","display_name":"stress effects","score":0.5730000138282776},{"id":"https://openalex.org/keywords/lattice-mismatch","display_name":"lattice mismatch","score":0.7080000042915344},{"id":"https://openalex.org/keywords/thermal-expansion-mismatch","display_name":"thermal expansion mismatch","score":0.9729999899864197},{"id":"https://openalex.org/keywords/silicon-strip-waveguide","display_name":"silicon strip waveguide","score":0.8510000109672546},{"id":"https://openalex.org/keywords/c-band","display_name":"C-band","score":0.5860000252723694},{"id":"https://openalex.org/keywords/3-db-bandwidth","display_name":"3-dB bandwidth","score":0.8149999976158142},{"id":"https://openalex.org/keywords/extinction-ratio","display_name":"extinction ratio","score":0.7540000081062317},{"id":"https://openalex.org/keywords/insertion-loss","display_name":"insertion loss","score":0.8759999871253967},{"id":"https://openalex.org/keywords/soi-platform","display_name":"SOI platform","score":0.7229999899864197},{"id":"https://openalex.org/keywords/photonic-device-design","display_name":"photonic device design","score":0.6669999957084656}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.822273313999176},{"id":"https://openalex.org/C2777813233","wikidata":"https://www.wikidata.org/wiki/Q1527816","display_name":"Grating","level":2,"score":0.5667382478713989},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5264533162117004},{"id":"https://openalex.org/C21036866","wikidata":"https://www.wikidata.org/wiki/Q181767","display_name":"Stress (linguistics)","level":2,"score":0.5252527594566345},{"id":"https://openalex.org/C96137627","wikidata":"https://www.wikidata.org/wiki/Q1385099","display_name":"Extinction ratio","level":3,"score":0.49206632375717163},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.4768039882183075},{"id":"https://openalex.org/C119423029","wikidata":"https://www.wikidata.org/wiki/Q3749103","display_name":"Silicon photonics","level":3,"score":0.4743424952030182},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.47321170568466187},{"id":"https://openalex.org/C45613198","wikidata":"https://www.wikidata.org/wiki/Q1134091","display_name":"Optical filter","level":2,"score":0.45078858733177185},{"id":"https://openalex.org/C200687136","wikidata":"https://www.wikidata.org/wiki/Q11233438","display_name":"Waveguide","level":2,"score":0.4446674585342407},{"id":"https://openalex.org/C53143962","wikidata":"https://www.wikidata.org/wiki/Q1478788","display_name":"Silicon on insulator","level":3,"score":0.4371309280395508},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.38370153307914734},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3310278654098511},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10770180821418762},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.09866392612457275},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C6260449","wikidata":"https://www.wikidata.org/wiki/Q41364","display_name":"Wavelength","level":2,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tdmr.2021.3118382","doi":"https://doi.org/10.1109/tdmr.2021.3118382","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tdmr.2021.3118382","pdf_url":null,"source":{"id":"https://openalex.org/S128536549","display_name":"IEEE Transactions on Device and Materials Reliability","issn_l":"1530-4388","issn":["1530-4388","1558-2574"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Device and Materials Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320325255","display_name":"Ministry of Electronics and Information technology","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W1963876903","https://openalex.org/W1964604659","https://openalex.org/W1965915529","https://openalex.org/W1979647131","https://openalex.org/W1986493823","https://openalex.org/W2016741124","https://openalex.org/W2034304009","https://openalex.org/W2042541106","https://openalex.org/W2051002619","https://openalex.org/W2071454067","https://openalex.org/W2072077821","https://openalex.org/W2074256944","https://openalex.org/W2088214229","https://openalex.org/W2099610951","https://openalex.org/W2162673220","https://openalex.org/W2169059556","https://openalex.org/W2235383466","https://openalex.org/W2338352381","https://openalex.org/W2518729053","https://openalex.org/W2522827047","https://openalex.org/W2525523245","https://openalex.org/W2589832793","https://openalex.org/W2613357406","https://openalex.org/W2741571441","https://openalex.org/W2805984785","https://openalex.org/W2809922942","https://openalex.org/W2811441510","https://openalex.org/W2898848280","https://openalex.org/W2974444211","https://openalex.org/W4231301731","https://openalex.org/W4249088889"],"related_works":["https://openalex.org/W4207067784","https://openalex.org/W3195241271","https://openalex.org/W4210770709","https://openalex.org/W3200619381","https://openalex.org/W3006323991","https://openalex.org/W2083275164","https://openalex.org/W3096539417","https://openalex.org/W7095457141","https://openalex.org/W2593944972","https://openalex.org/W3154650849"],"abstract_inverted_index":{"The":[0,88,143,167,202],"stress-induced":[1],"due":[2,84,172],"to":[3,32,85,173],"thermal":[4,177],"and":[5,35,93,112,155,163,176,219,244,329,334],"intrinsic":[6],"mismatch":[7,178],"between":[8],"different":[9,114,157],"layers":[10],"in":[11,77,139,165,182,191,241,280],"silicon":[12,140],"photonic":[13,302],"devices":[14,29],"critically":[15],"affect":[16],"the":[17,22,39,49,63,75,78,82,105,121,124,146,174,272,288,292,297,311],"device":[18,83,303],"performance.":[19],"This":[20,284],"makes":[21],"inclusion":[23],"of":[24,38,52,65,81,110,123,145,265,271,282,325],"stress":[25,66,86,168],"while":[26],"designing":[27,210],"such":[28,229],"absolutely":[30],"necessary":[31],"ensure":[33],"reliable":[34],"predictable":[36],"operation":[37,111],"eventually":[40],"fabricated":[41],"device.":[42],"In":[43],"this":[44,46],"regard,":[45],"paper":[47,285],"presents":[48],"design":[50,204,304],"methodology":[51,89,147,205],"a":[53,183],"proposed":[54,106,125,203,253,293,312],"Si/SiGe":[55],"integrated":[56],"Bragg":[57],"grating":[58],"(IBG)":[59],"filter":[60,69,126],"that":[61,251,275,310],"includes":[62],"influence":[64],"effect":[67],"during":[68],"design.":[70],"Moreover,":[71],"it":[72],"also":[73,286],"reports":[74],"variation":[76,119],"optical":[79,320],"performance":[80],"effect.":[87],"utilizes":[90],"both":[91],"analytical":[92],"numerical":[94],"approaches.":[95],"IBG":[96,212,273,316],"filters":[97,213,274,317],"realized":[98],"over":[99],"SOI":[100],"platform":[101],"are":[102,137],"designed":[103],"using":[104],"method":[107,187,313],"for":[108,151,209,331],"C-band":[109],"having":[113,214,318],"3-dB":[115],"bandwidths.":[116],"Refractive":[117],"index":[118],"along":[120,223],"length":[122],"has":[127,148,179,206,248,307],"been":[128,149,180,207,249,308],"achieved":[129],"by":[130,291],"introducing":[131],"SiGe":[132,242,268],"alloy":[133],"filled":[134],"grooves,":[135],"which":[136,189,255],"corrugated":[138],"strip":[141],"waveguide.":[142],"efficacy":[144],"demonstrated":[150],"varying":[152],"waveguide":[153],"width":[154],"three":[156,211],"Ge":[158,239],"fractions,":[159],"i.e.,":[160],"0.10,":[161],"0.15":[162],"0.20":[164],"SiGe.":[166],"at":[169],"Si-SiGe":[170],"interface":[171],"lattice":[175],"incorporated":[181],"modified":[184,259,294],"transfer":[185],"matrix":[186],"(TMM),":[188],"is":[190,256],"its":[192],"unmodified":[193],"form":[194],"can":[195,261,314],"only":[196],"be":[197],"used":[198],"under":[199],"no-stress":[200],"condition.":[201],"tested":[208],"10":[215],"nm,":[216],"5":[217],"nm":[218,221],"1.6":[220],"bandwidths":[222],"with":[224,296,322],"other":[225],"suitable":[226],"user-defined":[227,277],"parameters;":[228],"as":[230],"maximum":[231],"insertion":[232],"loss":[233],"(IL),":[234],"minimum":[235],"extinction":[236],"ratio":[237],"(ER),":[238],"fraction":[240],"alloy,":[243],"center":[245],"wavelength.":[246],"It":[247,306],"found":[250,309],"our":[252],"methodology,":[254],"based":[257],"on":[258],"TMM,":[260],"find":[262],"possible":[263],"combinations":[264],"width,":[266],"length,":[267],"groove":[269],"depth":[270],"meet":[276],"specifications":[278],"even":[279],"presence":[281],"stress.":[283],"compares":[287],"results":[289,298],"generated":[290],"TMM":[295],"from":[299],"commercially":[300],"available":[301],"tool.":[305],"result":[315],"estimated":[319],"performances":[321],"an":[323],"accuracy":[324],"<":[326],"10%,":[327],"<8%,":[328],"<0.01%":[330],"ER,":[332],"bandwidth,":[333],"resonance":[335],"wavelength,":[336],"respectively.":[337]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2}],"updated_date":"2026-10-16T09:59:22.235173","created_date":"2021-10-11T00:00:00"}