{"id":"https://openalex.org/W3195681663","doi":"https://doi.org/10.1109/issre52982.2021.00036","title":"Ahead of Time Mutation Based Fault Localisation using Statistical Inference","display_name":"Ahead of Time Mutation Based Fault Localisation using Statistical Inference","publication_year":2021,"publication_date":"2021-10-01","ids":{"openalex":"https://openalex.org/W3195681663","doi":"https://doi.org/10.1109/issre52982.2021.00036","mag":"3195681663"},"language":"en","primary_location":{"id":"doi:10.1109/issre52982.2021.00036","doi":"https://doi.org/10.1109/issre52982.2021.00036","is_oa":false,"landing_page_url":"https://doi.org/10.1109/issre52982.2021.00036","pdf_url":null,"source":{"id":"https://openalex.org/S4210220341","display_name":"Proceedings/Proceedings - International Symposium on Software Reliability Engineering","issn_l":"1071-9458","issn":["1071-9458","2332-6549"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE 32nd International Symposium on Software Reliability Engineering (ISSRE)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["arxiv","crossref","datacite"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://arxiv.org/pdf/1902.09729","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5008473297","display_name":"Jin-Han Kim","orcid":"https://orcid.org/0000-0002-0140-7908","observed_orcids":["https://orcid.org/0000-0002-0140-7908"]},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jinhan Kim","raw_affiliation_strings":["School of Computing KAIST, Daejeon, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Computing KAIST, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048573106","display_name":"Gabin An","orcid":"https://orcid.org/0000-0002-6521-8858","observed_orcids":["https://orcid.org/0000-0002-6521-8858"]},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Gabin An","raw_affiliation_strings":["School of Computing KAIST, Daejeon, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Computing KAIST, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063787358","display_name":"ROBERT H. FELDT","orcid":"https://orcid.org/0000-0002-5179-4205","observed_orcids":["https://orcid.org/0000-0002-5179-4205"]},"institutions":[{"id":"https://openalex.org/I66862912","display_name":"Chalmers University of Technology","ror":"https://ror.org/040wg7k59","country_code":"SE","type":"education","lineage":["https://openalex.org/I66862912"]}],"countries":["SE"],"is_corresponding":false,"raw_author_name":"Robert Feldt","raw_affiliation_strings":["Chalmers University of Technology,Dept. of Computer Science and Engineering,Gothenburg,Sweden","Dept. of Computer Science and Engineering, Chalmers University of Technology, Gothenburg, Sweden"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chalmers University of Technology,Dept. of Computer Science and Engineering,Gothenburg,Sweden","institution_ids":["https://openalex.org/I66862912"]},{"raw_affiliation_string":"Dept. of Computer Science and Engineering, Chalmers University of Technology, Gothenburg, Sweden","institution_ids":["https://openalex.org/I66862912"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5070401254","display_name":"Shin Yoo","orcid":"https://orcid.org/0000-0002-0836-6993","observed_orcids":["https://orcid.org/0000-0002-0836-6993"]},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Shin Yoo","raw_affiliation_strings":["School of Computing KAIST, Daejeon, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Computing KAIST, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.2393,"has_fulltext":true,"cited_by_count":10,"citation_normalized_percentile":{"value":0.76251605,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"253","last_page":"263"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.0,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/mutation-analysis","display_name":"mutation analysis","score":0.828000009059906},{"id":"https://openalex.org/keywords/statistical-inference","display_name":"statistical inference","score":0.7170000076293945},{"id":"https://openalex.org/keywords/failure-patterns","display_name":"failure patterns","score":0.5299999713897705},{"id":"https://openalex.org/keywords/test-failure","display_name":"test failure","score":0.3959999978542328},{"id":"https://openalex.org/keywords/defects4j","display_name":"Defects4J","score":0.7519999742507935}],"concepts":[{"id":"https://openalex.org/C163565370","wikidata":"https://www.wikidata.org/wiki/Q4308623","display_name":"Mutation testing","level":4,"score":0.7936415672302246},{"id":"https://openalex.org/C501734568","wikidata":"https://www.wikidata.org/wiki/Q42918","display_name":"Mutation","level":3,"score":0.7727441191673279},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6877098679542542},{"id":"https://openalex.org/C2776214188","wikidata":"https://www.wikidata.org/wiki/Q408386","display_name":"Inference","level":2,"score":0.6742882132530212},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5314449667930603},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.46596458554267883},{"id":"https://openalex.org/C19768560","wikidata":"https://www.wikidata.org/wiki/Q320727","display_name":"Dependency (UML)","level":2,"score":0.461550235748291},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.4165147840976715},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3625904619693756},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.33594226837158203},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3317625820636749},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1819678246974945},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.11351323127746582},{"id":"https://openalex.org/C54355233","wikidata":"https://www.wikidata.org/wiki/Q7162","display_name":"Genetics","level":1,"score":0.08812594413757324},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.08011749386787415},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1109/issre52982.2021.00036","doi":"https://doi.org/10.1109/issre52982.2021.00036","is_oa":false,"landing_page_url":"https://doi.org/10.1109/issre52982.2021.00036","pdf_url":null,"source":{"id":"https://openalex.org/S4210220341","display_name":"Proceedings/Proceedings - International Symposium on Software Reliability Engineering","issn_l":"1071-9458","issn":["1071-9458","2332-6549"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE 32nd International Symposium on Software Reliability Engineering (ISSRE)","raw_type":"proceedings-article"},{"id":"pmh:oai:arXiv.org:1902.09729","doi":null,"is_oa":true,"landing_page_url":"http://arxiv.org/abs/1902.09729","pdf_url":"https://arxiv.org/pdf/1902.09729","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":"2331-8422","issn":["2331-8422"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"},{"id":"pmh:oai:research.chalmers.se:529158","doi":null,"is_oa":false,"landing_page_url":"https://research.chalmers.se/en/publication/529158","pdf_url":null,"source":{"id":"https://openalex.org/S4306402469","display_name":"Chalmers Research (Chalmers University of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I66862912","host_organization_name":"Chalmers University of Technology","host_organization_lineage":["https://openalex.org/I66862912"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":null},{"id":"doi:10.48550/arxiv.1902.09729","doi":"https://doi.org/10.48550/arxiv.1902.09729","is_oa":true,"landing_page_url":"https://doi.org/10.48550/arxiv.1902.09729","pdf_url":null,"source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":"2331-8422","issn":["2331-8422"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"article-journal"}],"best_oa_location":{"id":"pmh:oai:arXiv.org:1902.09729","doi":null,"is_oa":true,"landing_page_url":"http://arxiv.org/abs/1902.09729","pdf_url":"https://arxiv.org/pdf/1902.09729","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":"2331-8422","issn":["2331-8422"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"},"sustainable_development_goals":[],"study_designs":[],"awards":[{"id":"https://openalex.org/G5748061725","display_name":null,"funder_award_id":"IO201210-07969-01","funder_id":"https://openalex.org/F4320332195","funder_display_name":"Samsung"},{"id":"https://openalex.org/G6259344361","display_name":null,"funder_award_id":"NRF-2020R1A2C1013629","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"}],"funders":[{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"},{"id":"https://openalex.org/F4320322581","display_name":"Vetenskapsr\u00e5det","ror":"https://ror.org/03zttf063"},{"id":"https://openalex.org/F4320324891","display_name":"Iran Telecommunication Research Center","ror":"https://ror.org/01a3g2z22"},{"id":"https://openalex.org/F4320328359","display_name":"Ministry of Science and ICT, South Korea","ror":"https://ror.org/01wpjm123"},{"id":"https://openalex.org/F4320332195","display_name":"Samsung","ror":"https://ror.org/04w3jy968"},{"id":"https://openalex.org/F4320335489","display_name":"Institute for Information and Communications Technology Promotion","ror":"https://ror.org/01g0hqq23"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3195681663.pdf","grobid_xml":"https://content.openalex.org/works/W3195681663.grobid-xml"},"referenced_works_count":46,"referenced_works":["https://openalex.org/W1564363189","https://openalex.org/W1873022895","https://openalex.org/W1950030762","https://openalex.org/W1963679610","https://openalex.org/W1990785546","https://openalex.org/W1991097419","https://openalex.org/W1992862603","https://openalex.org/W2010833880","https://openalex.org/W2028990673","https://openalex.org/W2033644368","https://openalex.org/W2075194522","https://openalex.org/W2101819268","https://openalex.org/W2105776892","https://openalex.org/W2108712612","https://openalex.org/W2108862644","https://openalex.org/W2119136132","https://openalex.org/W2122947685","https://openalex.org/W2133482825","https://openalex.org/W2133575467","https://openalex.org/W2135841285","https://openalex.org/W2135937266","https://openalex.org/W2151666086","https://openalex.org/W2156723666","https://openalex.org/W2162045655","https://openalex.org/W2172154252","https://openalex.org/W2174442795","https://openalex.org/W2176028050","https://openalex.org/W2242274110","https://openalex.org/W2343875716","https://openalex.org/W2467903332","https://openalex.org/W2471516951","https://openalex.org/W2536479894","https://openalex.org/W2578469907","https://openalex.org/W2620081107","https://openalex.org/W2725449579","https://openalex.org/W2733797843","https://openalex.org/W2736091366","https://openalex.org/W2762786131","https://openalex.org/W2795030435","https://openalex.org/W2795223920","https://openalex.org/W2803652181","https://openalex.org/W2809410441","https://openalex.org/W2820802326","https://openalex.org/W2962715466","https://openalex.org/W3022436500","https://openalex.org/W3103568582"],"related_works":["https://openalex.org/W2916880568","https://openalex.org/W4380185174","https://openalex.org/W4390279902","https://openalex.org/W2744254414","https://openalex.org/W2075445701","https://openalex.org/W2900455437","https://openalex.org/W4403864696","https://openalex.org/W3081485108","https://openalex.org/W4404291163","https://openalex.org/W4312838691"],"abstract_inverted_index":{"Mutation":[0,18],"analysis":[1,38,72,85,173,187],"can":[2,139,188],"effectively":[3],"capture":[4],"the":[5,29,33,40,70,81,84,97,127,152,159,169,179,204],"de-pendency":[6],"between":[7],"source":[8],"code":[9],"and":[10,93,154],"test":[11,101,180],"results.":[12],"This":[13],"has":[14,175],"been":[15,176],"exploited":[16],"by":[17,192],"Based":[19],"Fault":[20,60],"Localisation":[21],"(MBFL)":[22],"techniques.":[23],"However,":[24],"MBFL":[25,63,165],"techniques":[26,166],"suffer":[27],"from":[28],"need":[30],"to":[31,68,95,143,215],"expend":[32],"high":[34],"cost":[35,122,184],"of":[36,42,83,106,146,171,185,199,211],"mutation":[37,71,172,186,193],"after":[39],"observation":[41],"failures,":[43],"which":[44],"may":[45],"present":[46],"a":[47,76,109],"challenge":[48],"for":[49,58,123],"its":[50,200],"practical":[51],"adoption.":[52],"We":[53],"introduce":[54],"SIMFL":[55,87,113,138,195],"(Statistical":[56],"Inference":[57],"Mutation-based":[59],"Localisation),":[61],"an":[62],"technique":[64],"that":[65,137,174],"allows":[66],"users":[67],"perform":[69],"in":[73],"advance":[74],"before":[75,178],"failure":[77,98,110],"is":[78,111],"observed,":[79,112],"allowing":[80],"amortisation":[82],"cost.":[86],"uses":[88],"mutants":[89],"as":[90],"artificial":[91],"faults":[92,149,157],"aims":[94],"learn":[96],"patterns":[99],"among":[100],"cases":[102],"against":[103],"different":[104],"locations":[105],"mutations.":[107],"Once":[108],"requires":[114],"either":[115],"almost":[116],"no":[117],"or":[118],"very":[119],"small":[120],"additional":[121],"analysis,":[124],"depending":[125],"on":[126],"used":[128],"inference":[129],"model.":[130],"An":[131],"empirical":[132],"evaluation":[133],"using":[134,168,208],"DEFECTS4J":[135],"shows":[136],"successfully":[140],"localise":[141],"up":[142],"113":[144],"out":[145],"203":[147],"studied":[148],"(55%)":[150],"at":[151,203],"top,":[153],"159":[155],"(78%)":[156],"within":[158],"top":[160,205],"five,":[161],"significantly":[162],"outperforming":[163],"existing":[164],"while":[167],"results":[170,216],"undertaken":[177],"failure.":[181],"The":[182],"amortised":[183],"be":[189],"further":[190],"reduced":[191],"sampling:":[194],"retains":[196],"80":[197],"%":[198],"localisation":[201],"accuracy":[202],"rank":[206],"when":[207],"only":[209],"10%":[210],"generated":[212],"mutants,":[213],"compared":[214],"obtained":[217],"without":[218],"sampling.":[219]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":1}],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2021-08-30T00:00:00"}