{"id":"https://openalex.org/W3169529677","doi":"https://doi.org/10.1002/9780470061596.risk0454","title":"Software Testing and Reliability","display_name":"Software Testing and Reliability","publication_year":2008,"publication_date":"2008-07-15","ids":{"openalex":"https://openalex.org/W3169529677","doi":"https://doi.org/10.1002/9780470061596.risk0454","mag":"3169529677"},"language":"en","primary_location":{"id":"doi:10.1002/9780470061596.risk0454","doi":"https://doi.org/10.1002/9780470061596.risk0454","is_oa":false,"landing_page_url":"https://doi.org/10.1002/9780470061596.risk0454","pdf_url":null,"source":{"id":"https://openalex.org/S4306464293","display_name":"Wiley eBooks","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"ebook platform"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Encyclopedia of Quantitative Risk Analysis and Assessment","raw_type":"other"},"volume":{"id":"https://openalex.org/W2104599430","display_name":"Encyclopedia of Quantitative Risk Analysis and Assessment"},"type":"reference-entry","is_traditional":false,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5108750745","display_name":"Andrew D. McGettrick","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I181647926","display_name":"University of Strathclyde","ror":"https://ror.org/00n3w3b69","country_code":"GB","type":"education","lineage":["https://openalex.org/I181647926"]}],"countries":["GB"],"is_corresponding":true,"raw_author_name":"Andrew D. McGettrick","raw_affiliation_strings":["University of Strathclyde, Glasgow, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Strathclyde, Glasgow, UK","institution_ids":["https://openalex.org/I181647926"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5108750745"],"corresponding_institution_ids":["https://openalex.org/I181647926"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9887999892234802,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9887999892234802,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.009999999776482582,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.00039999998989515007,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/software-testing","display_name":"software testing","score":0.9990000128746033},{"id":"https://openalex.org/keywords/software-reliability","display_name":"software reliability","score":0.9990000128746033},{"id":"https://openalex.org/keywords/software-reliability-engineering","display_name":"software reliability engineering","score":0.6480000019073486},{"id":"https://openalex.org/keywords/software-quality","display_name":"software quality","score":0.46299999952316284},{"id":"https://openalex.org/keywords/software-safety","display_name":"software safety","score":0.3070000112056732}],"concepts":[{"id":"https://openalex.org/C52928878","wikidata":"https://www.wikidata.org/wiki/Q7554226","display_name":"Software reliability testing","level":5,"score":0.7155091762542725},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6083493828773499},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.5814746022224426},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5795514583587646},{"id":"https://openalex.org/C2984328558","wikidata":"https://www.wikidata.org/wiki/Q188522","display_name":"Software testing","level":3,"score":0.5781439542770386},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.5575342774391174},{"id":"https://openalex.org/C111524372","wikidata":"https://www.wikidata.org/wiki/Q7663718","display_name":"System integration testing","level":5,"score":0.48671630024909973},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.48391109704971313},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.45978429913520813},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.45270511507987976},{"id":"https://openalex.org/C149091818","wikidata":"https://www.wikidata.org/wiki/Q2429814","display_name":"Software system","level":3,"score":0.4084147810935974},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.3045821785926819},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18645557761192322},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.1168716549873352},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1002/9780470061596.risk0454","doi":"https://doi.org/10.1002/9780470061596.risk0454","is_oa":false,"landing_page_url":"https://doi.org/10.1002/9780470061596.risk0454","pdf_url":null,"source":{"id":"https://openalex.org/S4306464293","display_name":"Wiley eBooks","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"ebook platform"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Encyclopedia of Quantitative Risk Analysis and Assessment","raw_type":"other"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W124052719","https://openalex.org/W1546746956","https://openalex.org/W1907753350","https://openalex.org/W1936022305","https://openalex.org/W1954327672","https://openalex.org/W1966017250","https://openalex.org/W1981060754","https://openalex.org/W2046451536","https://openalex.org/W2154897437","https://openalex.org/W2168845218"],"related_works":["https://openalex.org/W2378551195","https://openalex.org/W4250279001","https://openalex.org/W2380480378","https://openalex.org/W2354586700","https://openalex.org/W2346130824","https://openalex.org/W7098918366","https://openalex.org/W2362758831","https://openalex.org/W7218139262","https://openalex.org/W2361034606","https://openalex.org/W150084799"],"abstract_inverted_index":{"Abstract":[0],"Software,":[1],"increasingly,":[2],"forms":[3],"an":[4],"important":[5],"part":[6],"of":[7,20,22,38,40],"many":[8],"systems\u2014engineering,":[9],"medical,":[10],"administrative,":[11],"educational,":[12],"finance,":[13],"and":[14,42],"so":[15],"on.":[16],"Achieving":[17],"high":[18],"level":[19],"reliability":[21],"the":[23,36],"software":[24,41],"is":[25],"a":[26],"prerequisite":[27],"for":[28],"that":[29],"system":[30],"being":[31],"successful.":[32],"This":[33],"article":[34],"addresses":[35],"problem":[37],"testing":[39],"relates":[43],"it":[44],"to":[45],"issues":[46],"about":[47],"reliability.":[48]},"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2026-11-05T12:25:35.769452","created_date":"2021-06-22T00:00:00"}