{"id":"https://openalex.org/W3167779700","doi":null,"title":"A novel Deep-Learning Approach for Automated Non-Destructive Testing in Quality Assurance based on Convolutional Neural Networks","display_name":"A novel Deep-Learning Approach for Automated Non-Destructive Testing in Quality Assurance based on Convolutional Neural Networks","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W3167779700","mag":"3167779700"},"language":"en","primary_location":{"id":"pmh:oai:opus-htw-aalen.bsz-bw.de:1064","doi":null,"is_oa":false,"landing_page_url":"https://opus-htw-aalen.bsz-bw.de/frontdoor/index/index/docId/1064","pdf_url":null,"source":{"id":"https://openalex.org/S4306401044","display_name":"OPUS (Aalen University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"conferenceobject"},"volume":null,"type":"article","is_traditional":true,"indexed_in":[],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5032394209","display_name":"Hermann Baumgartl","orcid":"https://orcid.org/0000-0001-8918-3197","observed_orcids":["https://orcid.org/0000-0001-8918-3197"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Baumgartl, Hermann","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047651567","display_name":"Josef Tomas","orcid":"https://orcid.org/0000-0002-9589-1840","observed_orcids":["https://orcid.org/0000-0002-9589-1840"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Tomas, Josef","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027678089","display_name":"Ricardo B\u00fcttner","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"B\u00fcttner, Ricardo","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5065208582","display_name":"Markus Merkel","orcid":"https://orcid.org/0000-0003-4005-7354","observed_orcids":["https://orcid.org/0000-0003-4005-7354"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Merkel, Markus","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.1032,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.88026006,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":92,"max":99},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.6273999810218811,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.6273999810218811,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.35989999771118164,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.004800000227987766,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automated-non-destructive-testing","display_name":"automated non-destructive testing","score":0.9190000295639038},{"id":"https://openalex.org/keywords/convolutional-neural-networks","display_name":"convolutional neural networks","score":0.8880000114440918},{"id":"https://openalex.org/keywords/quality-assurance","display_name":"quality assurance","score":0.9559999704360962},{"id":"https://openalex.org/keywords/defect-detection","display_name":"defect detection","score":0.6340000033378601},{"id":"https://openalex.org/keywords/automated-inspection","display_name":"automated inspection","score":0.4259999990463257}],"concepts":[{"id":"https://openalex.org/C106436119","wikidata":"https://www.wikidata.org/wiki/Q836575","display_name":"Quality assurance","level":3,"score":0.7580606937408447},{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.7580414414405823},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5794963836669922},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.5372493267059326},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5203051567077637},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.45683711767196655},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.42880839109420776},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.349712073802948},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22714555263519287},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0602644681930542},{"id":"https://openalex.org/C2778618615","wikidata":"https://www.wikidata.org/wiki/Q4008393","display_name":"External quality assessment","level":2,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"pmh:oai:opus-htw-aalen.bsz-bw.de:1064","doi":null,"is_oa":false,"landing_page_url":"https://opus-htw-aalen.bsz-bw.de/frontdoor/index/index/docId/1064","pdf_url":null,"source":{"id":"https://openalex.org/S4306401044","display_name":"OPUS (Aalen University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"conferenceobject"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W2097117768","https://openalex.org/W2117539524","https://openalex.org/W2175342987","https://openalex.org/W2531409750","https://openalex.org/W2613000917","https://openalex.org/W2619665115","https://openalex.org/W2774565851"],"related_works":["https://openalex.org/W6941083099","https://openalex.org/W4256348220","https://openalex.org/W7027326080","https://openalex.org/W2959918577","https://openalex.org/W7217671713","https://openalex.org/W1995925762","https://openalex.org/W4412937868","https://openalex.org/W4213338188","https://openalex.org/W7203496908","https://openalex.org/W4400182234"],"abstract_inverted_index":null,"counts_by_year":[{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":8},{"year":2019,"cited_by_count":4}],"updated_date":"2026-07-14T23:32:53.992493","created_date":"2025-10-10T00:00:00"}