{"id":"https://openalex.org/W3159727174","doi":"https://doi.org/10.1109/iaict52856.2021.9532584","title":"Automatic Visual Inspection of Rare Defects: A Framework based on GP-WGAN and Enhanced Faster R-CNN","display_name":"Automatic Visual Inspection of Rare Defects: A Framework based on GP-WGAN and Enhanced Faster R-CNN","publication_year":2021,"publication_date":"2021-07-27","ids":{"openalex":"https://openalex.org/W3159727174","doi":"https://doi.org/10.1109/iaict52856.2021.9532584","mag":"3159727174"},"language":"en","primary_location":{"id":"doi:10.1109/iaict52856.2021.9532584","doi":"https://doi.org/10.1109/iaict52856.2021.9532584","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iaict52856.2021.9532584","pdf_url":null,"source":{"id":"https://openalex.org/S7407087221","display_name":"IEEE International Conference on Industry 4.0, Artificial Intelligence, and Communications Technology (IAICT)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Conference on Industry 4.0, Artificial Intelligence, and Communications Technology (IAICT)","raw_type":"proceedings-article"},"parent_works":[],"lineage":["https://openalex.org/W3159727174"],"child_works_count":0,"type":"conference-paper","is_traditional":true,"indexed_in":["arxiv","crossref","datacite"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://arxiv.org/pdf/2105.00447","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5010044195","display_name":"Masoud Jalayer","orcid":"https://orcid.org/0000-0001-8013-8613","observed_orcids":["https://orcid.org/0000-0001-8013-8613"]},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Masoud Jalayer","raw_affiliation_strings":["Dept. Management, Economics and Industrial Engineering, Politecnico di Milano, Milan, Italy","Polytechnic University of Milan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. Management, Economics and Industrial Engineering, Politecnico di Milano, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"Polytechnic University of Milan","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017556012","display_name":"Reza Jalayer","orcid":"https://orcid.org/0000-0003-3440-5658","observed_orcids":["https://orcid.org/0000-0003-3440-5658"]},"institutions":[{"id":"https://openalex.org/I67009956","display_name":"Iran University of Science and Technology","ror":"https://ror.org/01jw2p796","country_code":"IR","type":"education","lineage":["https://openalex.org/I67009956"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Reza Jalayer","raw_affiliation_strings":["School of Mechanical Engineering, Iran University of Science and Technology Narmak, Tehran, Iran","School of Mechanical Engineering, Iran University of Science and Technology Narmak,Tehran,Iran,16846"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Iran University of Science and Technology Narmak, Tehran, Iran","institution_ids":["https://openalex.org/I67009956"]},{"raw_affiliation_string":"School of Mechanical Engineering, Iran University of Science and Technology Narmak,Tehran,Iran,16846","institution_ids":["https://openalex.org/I67009956"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078156022","display_name":"Amin Kaboli","orcid":"https://orcid.org/0000-0003-1076-4410","observed_orcids":["https://orcid.org/0000-0003-1076-4410"]},"institutions":[{"id":"https://openalex.org/I5124864","display_name":"\u00c9cole Polytechnique F\u00e9d\u00e9rale de Lausanne","ror":"https://ror.org/02s376052","country_code":"CH","type":"education","lineage":["https://openalex.org/I2799323385","https://openalex.org/I5124864"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Amin Kaboli","raw_affiliation_strings":["Institute of Mechanical Engineering, School of Engineering Swiss Federal Institute of Technology Lausanne (EPFL), Lausanne, Switzerland","\u00c9cole Polytechnique F\u00e9d\u00e9rale de Lausanne,"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Mechanical Engineering, School of Engineering Swiss Federal Institute of Technology Lausanne (EPFL), Lausanne, Switzerland","institution_ids":["https://openalex.org/I5124864"]},{"raw_affiliation_string":"\u00c9cole Polytechnique F\u00e9d\u00e9rale de Lausanne,","institution_ids":["https://openalex.org/I5124864"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088574693","display_name":"Carlotta Orsenigo","orcid":"https://orcid.org/0000-0001-8688-414X","observed_orcids":["https://orcid.org/0000-0001-8688-414X"]},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Carlotta Orsenigo","raw_affiliation_strings":["Dept. Management, Economics and Industrial Engineering, Politecnico di Milano, Milan, Italy","Polytechnic University of Milan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. Management, Economics and Industrial Engineering, Politecnico di Milano, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"Polytechnic University of Milan","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5064621729","display_name":"Carlo Vercellis","orcid":"https://orcid.org/0000-0002-5020-3688","observed_orcids":["https://orcid.org/0000-0002-5020-3688"]},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Carlo Vercellis","raw_affiliation_strings":["Dept. Management, Economics and Industrial Engineering, Politecnico di Milano, Milan, Italy","Polytechnic University of Milan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. Management, Economics and Industrial Engineering, Politecnico di Milano, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"Polytechnic University of Milan","institution_ids":["https://openalex.org/I93860229"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":4.7853,"has_fulltext":true,"cited_by_count":15,"citation_normalized_percentile":{"value":0.9640823,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":93,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"221","last_page":"227"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.000699999975040555,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automated-visual-inspection","display_name":"automated visual inspection","score":0.9700000286102295},{"id":"https://openalex.org/keywords/generative-adversarial-networks","display_name":"generative adversarial networks","score":0.734000027179718},{"id":"https://openalex.org/keywords/data-augmentation","display_name":"data augmentation","score":0.5809999704360962},{"id":"https://openalex.org/keywords/object-detection","display_name":"object detection","score":0.6420000195503235},{"id":"https://openalex.org/keywords/faster-r-cnn","display_name":"Faster R-CNN","score":0.9940000176429749},{"id":"https://openalex.org/keywords/feature-pyramid-network","display_name":"feature pyramid network","score":0.828000009059906},{"id":"https://openalex.org/keywords/class-imbalance","display_name":"class imbalance","score":0.8479999899864197},{"id":"https://openalex.org/keywords/semiconductor-inspection","display_name":"semiconductor inspection","score":0.6380000114440918}],"concepts":[{"id":"https://openalex.org/C142575187","wikidata":"https://www.wikidata.org/wiki/Q3358290","display_name":"Pyramid (geometry)","level":2,"score":0.777047336101532},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7385286092758179},{"id":"https://openalex.org/C19768560","wikidata":"https://www.wikidata.org/wiki/Q320727","display_name":"Dependency (UML)","level":2,"score":0.7247219085693359},{"id":"https://openalex.org/C155512373","wikidata":"https://www.wikidata.org/wiki/Q287450","display_name":"Residual","level":2,"score":0.6515997648239136},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6505932211875916},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.5856330394744873},{"id":"https://openalex.org/C168820333","wikidata":"https://www.wikidata.org/wiki/Q448889","display_name":"Visual inspection","level":2,"score":0.5333086848258972},{"id":"https://openalex.org/C2781238097","wikidata":"https://www.wikidata.org/wiki/Q175026","display_name":"Object (grammar)","level":2,"score":0.5330145955085754},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5184664130210876},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.5014297962188721},{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.4727165102958679},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.4677669405937195},{"id":"https://openalex.org/C2776151529","wikidata":"https://www.wikidata.org/wiki/Q3045304","display_name":"Object detection","level":3,"score":0.4539388120174408},{"id":"https://openalex.org/C2777212361","wikidata":"https://www.wikidata.org/wiki/Q5127848","display_name":"Class (philosophy)","level":2,"score":0.45086225867271423},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.44985613226890564},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.20957300066947937},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.06370958685874939},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1109/iaict52856.2021.9532584","doi":"https://doi.org/10.1109/iaict52856.2021.9532584","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iaict52856.2021.9532584","pdf_url":null,"source":{"id":"https://openalex.org/S7407087221","display_name":"IEEE International Conference on Industry 4.0, Artificial Intelligence, and Communications Technology (IAICT)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Conference on Industry 4.0, Artificial Intelligence, and Communications Technology (IAICT)","raw_type":"proceedings-article"},{"id":"pmh:oai:arXiv.org:2105.00447","doi":null,"is_oa":true,"landing_page_url":"http://arxiv.org/abs/2105.00447","pdf_url":"https://arxiv.org/pdf/2105.00447","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":"2331-8422","issn":["2331-8422"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"},{"id":"pmh:oai:re.public.polimi.it:11311/1207165","doi":null,"is_oa":true,"landing_page_url":"http://hdl.handle.net/11311/1207165","pdf_url":"https://re.public.polimi.it/bitstream/11311/1207165/2/11311-1207165%20Jalayer.pdf","source":{"id":"https://openalex.org/S4306400312","display_name":"Virtual Community of Pathological Anatomy (University of Castilla La Mancha)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I79189158","host_organization_name":"University of Castilla-La Mancha","host_organization_lineage":["https://openalex.org/I79189158"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"},{"id":"doi:10.48550/arxiv.2105.00447","doi":"https://doi.org/10.48550/arxiv.2105.00447","is_oa":true,"landing_page_url":"https://doi.org/10.48550/arxiv.2105.00447","pdf_url":null,"source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":"2331-8422","issn":["2331-8422"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"article-journal"}],"best_oa_location":{"id":"pmh:oai:arXiv.org:2105.00447","doi":null,"is_oa":true,"landing_page_url":"http://arxiv.org/abs/2105.00447","pdf_url":"https://arxiv.org/pdf/2105.00447","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":"2331-8422","issn":["2331-8422"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"},"sustainable_development_goals":[{"score":0.7207000255584717,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3159727174.pdf","grobid_xml":"https://content.openalex.org/works/W3159727174.grobid-xml"},"referenced_works_count":33,"referenced_works":["https://openalex.org/W234388709","https://openalex.org/W639708223","https://openalex.org/W1536680647","https://openalex.org/W1884984464","https://openalex.org/W1975551334","https://openalex.org/W1991589289","https://openalex.org/W2061680500","https://openalex.org/W2080610171","https://openalex.org/W2102605133","https://openalex.org/W2162431052","https://openalex.org/W2200889235","https://openalex.org/W2418691539","https://openalex.org/W2579985080","https://openalex.org/W2769962601","https://openalex.org/W2796347433","https://openalex.org/W2888407265","https://openalex.org/W2898545436","https://openalex.org/W2936599103","https://openalex.org/W2964229212","https://openalex.org/W2984463702","https://openalex.org/W3006938707","https://openalex.org/W3034713821","https://openalex.org/W3037567775","https://openalex.org/W3037921770","https://openalex.org/W3083743696","https://openalex.org/W3084325977","https://openalex.org/W3087568033","https://openalex.org/W3087751617","https://openalex.org/W3116250684","https://openalex.org/W3122799380","https://openalex.org/W3135077060","https://openalex.org/W4211263593","https://openalex.org/W6750227808"],"related_works":["https://openalex.org/W4210836960","https://openalex.org/W7206177764","https://openalex.org/W4399056069","https://openalex.org/W7166214159","https://openalex.org/W7211953070","https://openalex.org/W6888007639","https://openalex.org/W7163513154","https://openalex.org/W4398198026","https://openalex.org/W4388918358","https://openalex.org/W7203697494"],"abstract_inverted_index":{"A":[0],"current":[1],"trend":[2],"in":[3],"industries":[4],"such":[5],"as":[6],"semiconductors":[7],"and":[8,28,71,79,104,125],"foundry":[9],"is":[10,51,108,123],"to":[11,17,23,53,75,110,149],"shift":[12],"their":[13,25],"visual":[14],"inspection":[15],"processes":[16],"Automatic":[18],"Visual":[19],"Inspection":[20],"(AVI)":[21],"systems,":[22],"reduce":[24],"costs,":[26],"mistakes,":[27],"dependency":[29],"on":[30,58,97,114,127],"human":[31],"experts.":[32],"This":[33],"paper":[34],"proposes":[35],"a":[36,48,105,136],"two-staged":[37],"fault":[38],"diagnosis":[39],"framework":[40,147],"for":[41],"AVI":[42],"systems.":[43],"In":[44,87],"the":[45,68,81,84,88,115,121,142,145],"first":[46],"stage,":[47,90],"generation":[49],"model":[50],"designed":[52],"synthesize":[54],"new":[55,77],"samples":[56,70,78],"based":[57,96],"real":[59,69],"samples.":[60],"The":[61,118,131],"proposed":[62,109,146],"augmentation":[63],"algorithm":[64,122],"extracts":[65],"objects":[66],"from":[67],"blends":[72],"them":[73],"randomly,":[74],"generate":[76],"enhance":[80],"performance":[82,119],"of":[83,120,138,144],"image":[85],"processor.":[86],"second":[89],"an":[91],"improved":[92],"deep":[93],"learning":[94],"architecture":[95],"Faster":[98],"R-CNN,":[99],"Feature":[100],"Pyramid":[101],"Network":[102,107],"(FPN),":[103],"Residual":[106],"perform":[111],"object":[112],"detection":[113],"enhanced":[116],"dataset.":[117],"validated":[124],"evaluated":[126],"two":[128],"multi-class":[129],"datasets.":[130],"experimental":[132],"results":[133],"performed":[134],"over":[135],"range":[137],"imbalance":[139],"severities":[140],"demonstrate":[141],"superiority":[143],"compared":[148],"other":[150],"solutions.":[151]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":6}],"updated_date":"2026-11-14T11:04:58.165337","created_date":"2021-05-10T00:00:00"}