{"id":"https://openalex.org/W3136399682","doi":null,"title":"Analysis of two alternative scaling strategies for sub-30 nm Double-Gate SOI MOSFETs","display_name":"Analysis of two alternative scaling strategies for sub-30 nm Double-Gate SOI MOSFETs","publication_year":2006,"publication_date":"2006-01-01","ids":{"openalex":"https://openalex.org/W3136399682","mag":"3136399682"},"language":"en","primary_location":{"id":"pmh:oai:cris.unibo.it:11585/36266","doi":null,"is_oa":false,"landing_page_url":"http://hdl.handle.net/11585/36266","pdf_url":null,"source":{"id":"https://openalex.org/S4306402579","display_name":"Archivio istituzionale della ricerca (Alma Mater Studiorum Universit\u00e0 di Bologna)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4210117483","host_organization_name":"Istituto di Ematologia di Bologna","host_organization_lineage":["https://openalex.org/I4210117483"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferenceObject"},"volume":null,"type":"conference-paper","indexed_in":[],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5067942277","display_name":"Nicola Barin","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"N. Barin","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011211508","display_name":"M. Braccioli","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"M. Braccioli","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040318538","display_name":"C. Fiegna","orcid":"https://orcid.org/0000-0001-7184-6570","observed_orcids":["https://orcid.org/0000-0001-7184-6570"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"C. Fiegna","raw_affiliation_strings":[],"raw_orcid":"https://orcid.org/0000-0001-7184-6570","affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5041741378","display_name":"ENRICO SANGIORGI","orcid":"https://orcid.org/0000-0001-7137-5852","observed_orcids":["https://orcid.org/0000-0001-7137-5852"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"E. Sangiorgi","raw_affiliation_strings":[],"raw_orcid":"https://orcid.org/0000-0001-7137-5852","affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.4084659,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"69","last_page":"70"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.002899999963119626,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/double-gate-mosfet","display_name":"double-gate MOSFET","score":0.8539999723434448},{"id":"https://openalex.org/keywords/soi-mosfet","display_name":"SOI MOSFET","score":0.8799999952316284},{"id":"https://openalex.org/keywords/scaling-strategies","display_name":"scaling strategies","score":0.8100000023841858},{"id":"https://openalex.org/keywords/short-channel-effects","display_name":"short-channel effects","score":0.7720000147819519},{"id":"https://openalex.org/keywords/substrate-bias","display_name":"substrate bias","score":0.32899999618530273},{"id":"https://openalex.org/keywords/threshold-voltage-scaling","display_name":"threshold voltage scaling","score":0.35600000619888306}],"concepts":[{"id":"https://openalex.org/C53143962","wikidata":"https://www.wikidata.org/wiki/Q1478788","display_name":"Silicon on insulator","level":3,"score":0.8554229736328125},{"id":"https://openalex.org/C3019885731","wikidata":"https://www.wikidata.org/wiki/Q48087455","display_name":"Double gate","level":5,"score":0.8196026682853699},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.7440536618232727},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.5676127076148987},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4851263463497162},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.46758031845092773},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.45442038774490356},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3946649730205536},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3209599256515503},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17180517315864563},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.16220784187316895},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.11630281805992126},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1090686023235321},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.09612324833869934},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"pmh:oai:cris.unibo.it:11585/36266","doi":null,"is_oa":false,"landing_page_url":"http://hdl.handle.net/11585/36266","pdf_url":null,"source":{"id":"https://openalex.org/S4306402579","display_name":"Archivio istituzionale della ricerca (Alma Mater Studiorum Universit\u00e0 di Bologna)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4210117483","host_organization_name":"Istituto di Ematologia di Bologna","host_organization_lineage":["https://openalex.org/I4210117483"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferenceObject"},{"id":"mag:3136399682","doi":null,"is_oa":false,"landing_page_url":"https://cris.unibo.it/handle/11585/36266","pdf_url":null,"source":{"id":"https://openalex.org/S4306418821","display_name":"IEEE Silicon Nanoelectronics Workshop","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":"IEEE Silicon Nanoelectronics Workshop","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"sustainable_development_goals_aurora":[{"display_name":"Affordable and clean energy","score":0.41999998688697815,"id":"https://metadata.un.org/sdg/7"}],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2102412728","https://openalex.org/W2468562587","https://openalex.org/W2727711980","https://openalex.org/W2015974818","https://openalex.org/W4317773456","https://openalex.org/W2598749498","https://openalex.org/W2460116740","https://openalex.org/W651999577","https://openalex.org/W1980748149","https://openalex.org/W7061974234"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-10-17T09:40:24.721904","created_date":"2021-03-29T00:00:00"}