{"id":"https://openalex.org/W3136035532","doi":"https://doi.org/10.24151/1561-5405-2021-26-1-30-39","title":"Investigation of Dynamic Range of Silicon Photoelectronic Multiplyers","display_name":"Investigation of Dynamic Range of Silicon Photoelectronic Multiplyers","publication_year":2021,"publication_date":"2021-02-01","ids":{"openalex":"https://openalex.org/W3136035532","doi":"https://doi.org/10.24151/1561-5405-2021-26-1-30-39","mag":"3136035532"},"language":"en","primary_location":{"id":"doi:10.24151/1561-5405-2021-26-1-30-39","doi":"https://doi.org/10.24151/1561-5405-2021-26-1-30-39","is_oa":false,"landing_page_url":"https://doi.org/10.24151/1561-5405-2021-26-1-30-39","pdf_url":null,"source":{"id":"https://openalex.org/S4210199805","display_name":"Proceedings of Universities ELECTRONICS","issn_l":"1561-5405","issn":["1561-5405","2587-9960"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["russia-white-list-2"],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of Universities. Electronics","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5072469889","display_name":"\u0410. \u041e. \u0417\u0435\u043d\u0435\u0432\u0438\u0447","orcid":"https://orcid.org/0000-0002-3534-3885","observed_orcids":["https://orcid.org/0000-0002-3534-3885"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"A.O. Zenevich","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5051027020","display_name":"O. V. Kochergina","orcid":"https://orcid.org/0000-0002-3597-0395","observed_orcids":["https://orcid.org/0000-0002-3597-0395"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"O.V. Kochergina","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.1175,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.43326503,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"26","issue":"1","first_page":"30","last_page":"39"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11044","display_name":"Particle Detector Development and Performance","score":0.3264000117778778,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11044","display_name":"Particle Detector Development and Performance","score":0.3264000117778778,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11216","display_name":"Radiation Detection and Scintillator Technologies","score":0.23839999735355377,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.13289999961853027,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/silicon-photomultipliers","display_name":"silicon photomultipliers","score":0.9700000286102295},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"dynamic range","score":0.9900000095367432},{"id":"https://openalex.org/keywords/supply-voltage","display_name":"supply voltage","score":0.9020000100135803},{"id":"https://openalex.org/keywords/threshold-intensity","display_name":"threshold intensity","score":0.906000018119812},{"id":"https://openalex.org/keywords/photomultiplier-tube","display_name":"photomultiplier tubes","score":0.6880000233650208}],"concepts":[{"id":"https://openalex.org/C113879476","wikidata":"https://www.wikidata.org/wiki/Q61897384","display_name":"Photomultiplier","level":3,"score":0.7534393668174744},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.7155249118804932},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6560137867927551},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.6431772112846375},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.6366953253746033},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.6214720010757446},{"id":"https://openalex.org/C104335537","wikidata":"https://www.wikidata.org/wiki/Q1085747","display_name":"Silicon photomultiplier","level":4,"score":0.5791028738021851},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.5598816275596619},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5407509803771973},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.5094097256660461},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4789507985115051},{"id":"https://openalex.org/C163752227","wikidata":"https://www.wikidata.org/wiki/Q1253365","display_name":"Radiant intensity","level":3,"score":0.46788614988327026},{"id":"https://openalex.org/C2776179129","wikidata":"https://www.wikidata.org/wiki/Q7998640","display_name":"Wide dynamic range","level":2,"score":0.45389530062675476},{"id":"https://openalex.org/C93038891","wikidata":"https://www.wikidata.org/wiki/Q1061524","display_name":"Intensity (physics)","level":2,"score":0.4148889183998108},{"id":"https://openalex.org/C161694136","wikidata":"https://www.wikidata.org/wiki/Q910990","display_name":"Scintillator","level":3,"score":0.3126536011695862},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.28400129079818726},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2637732923030853},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09002959728240967},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.24151/1561-5405-2021-26-1-30-39","doi":"https://doi.org/10.24151/1561-5405-2021-26-1-30-39","is_oa":false,"landing_page_url":"https://doi.org/10.24151/1561-5405-2021-26-1-30-39","pdf_url":null,"source":{"id":"https://openalex.org/S4210199805","display_name":"Proceedings of Universities ELECTRONICS","issn_l":"1561-5405","issn":["1561-5405","2587-9960"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["russia-white-list-2"],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of Universities. Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W4200367879","https://openalex.org/W3184471569","https://openalex.org/W4231429162","https://openalex.org/W1967562116","https://openalex.org/W3016136544","https://openalex.org/W3120815967","https://openalex.org/W3004980759","https://openalex.org/W4390729155","https://openalex.org/W3094339126","https://openalex.org/W2001563717"],"abstract_inverted_index":{"For":[0],"detecting":[1],"the":[2,6,32,38,41,45,48,51,72,93,98,110,119,127,130,134,142,149,154,162,180,185,189],"low-intensity":[3],"optical":[4,190],"radiation":[5,191],"silicon":[7,75,194],"photoelectronic":[8,20],"multiplyers":[9,21],"are":[10],"used":[11],"more":[12],"often.":[13],"However,":[14],"not":[15],"all":[16],"characteristics":[17],"of":[18,34,40,64,118,129,146,184],"these":[19],"have":[22,66],"been":[23,67,87,103,124],"thoroughly":[24],"studied.":[25],"So,":[26],"there":[27],"is":[28,158],"no":[29],"information":[30],"about":[31],"influence":[33],"supply":[35,94,111,135,164],"voltage":[36,95,112,136],"on":[37,133,153,193],"value":[39,117],"dynamic":[42,131,144],"range.":[43],"In":[44],"work":[46],"as":[47,69,71],"study":[49],"objects,":[50],"test":[52],"specimens":[53],"Si-PEM":[54],"with":[55],"a":[56,115,138],"p+\u2013p\u2013n+":[57],"structure,":[58],"produced":[59,74],"by":[60],"JSC":[61],"Integral":[62],"(Republik":[63],"Belarus),":[65],"used,":[68],"well":[70],"serially":[73],"photomultiplyers":[76],"Ketek":[77],"PM":[78],"3325":[79],"and":[80,182],"ON":[81],"Semi":[82],"FC":[83],"30035.":[84],"It":[85,101,122],"has":[86,102,123,137],"found":[88],"that":[89,105,126],"an":[90,106,108],"increase":[91,107],"in":[92,109,148,173,179],"leads":[96,113],"to":[97,114,160,167],"critical":[99],"decrease.":[100],"discovered":[104],"decreased":[116],"threshold":[120],"intensity.":[121],"proved":[125],"dependence":[128],"range":[132,145],"maximum.":[139,169],"To":[140],"ensure":[141],"maximum":[143],"registration":[147],"photo-detector":[150,163],"devices":[151,186],"based":[152,192],"Si-photomultiplier":[155],"tubes,":[156],"it":[157],"necessary":[159],"select":[161],"voltage,":[165],"corresponding":[166],"this":[168,174],"The":[170],"results":[171],"obtained":[172],"article":[175],"can":[176],"be":[177],"applied":[178],"development":[181],"design":[183],"for":[187],"recording":[188],"photomultiplier":[195],"tubes.":[196]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2}],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2021-03-29T00:00:00"}