{"id":"https://openalex.org/W3135598951","doi":null,"title":"Top-down meets bottom-up: nano-engineering for link between nm-and mu-scale","display_name":"Top-down meets bottom-up: nano-engineering for link between nm-and mu-scale","publication_year":2002,"publication_date":"2002-06-19","ids":{"openalex":"https://openalex.org/W3135598951","mag":"3135598951"},"language":"en","primary_location":{"id":"pmh:oai:ris.utwente.nl:openaire_cris_publications/ec1a647e-8914-4f31-a1a0-7dccb18cfb31","doi":null,"is_oa":false,"landing_page_url":"https://research.utwente.nl/en/publications/ec1a647e-8914-4f31-a1a0-7dccb18cfb31","pdf_url":null,"source":{"id":"https://openalex.org/S4406922991","display_name":"University of Twente Research Information","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Kim, G M, Kim, B J, Holleman, J, Huskens, J, ten Have, E S, Kovalgin, A Y, Liebau, M, Reinhoudt, D, van Hulst, N F & Brugger, J 2002, 'Top-down meets bottom-up : nano-engineering for link between nm-and mu-scale', pp. 71-78.","raw_type":"info:eu-repo/semantics/conferenceObject"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":[],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5081697360","display_name":"G.M. Kim","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"G.M. Kim","raw_affiliation_strings":["Optical Sciences"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Optical Sciences","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100661069","display_name":"Beomjoon Kim","orcid":"https://orcid.org/0000-0001-9565-299X","observed_orcids":["https://orcid.org/0000-0001-9565-299X"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"B.J. Kim","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030899340","display_name":"Jisk Holleman","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"J. Holleman","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059965487","display_name":"Jurriaan Huskens","orcid":"https://orcid.org/0000-0002-4596-9179","observed_orcids":["https://orcid.org/0000-0002-4596-9179"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jurriaan Huskens","raw_affiliation_strings":[],"raw_orcid":"https://orcid.org/0000-0002-4596-9179","affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012506646","display_name":"Eric S. ten Have","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"E.S. ten Have","raw_affiliation_strings":["Optical Sciences"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Optical Sciences","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109875235","display_name":"Alexeij Y. Kovalgin","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Alexeij Y. Kovalgin","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043252077","display_name":"M. Liebau","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"M. Liebau","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112298693","display_name":"David N. Reinhoudt","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"David N. Reinhoudt","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059424153","display_name":"N.F. van Hulst","orcid":"https://orcid.org/0000-0003-4630-1776","observed_orcids":["https://orcid.org/0000-0003-4630-1776"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"N.F. van Hulst","raw_affiliation_strings":["Optical Sciences"],"raw_orcid":"https://orcid.org/0000-0003-4630-1776","affiliations":[{"raw_affiliation_string":"Optical Sciences","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5107195137","display_name":"Juergen Br\u00fcgger","orcid":"https://orcid.org/0000-0002-7710-5930","observed_orcids":["https://orcid.org/0000-0002-7710-5930"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Juergen Br\u00fcgger","raw_affiliation_strings":[],"raw_orcid":"https://orcid.org/0000-0002-7710-5930","affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.48051948,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14089","display_name":"Nanotechnology research and applications","score":0.6958000063896179,"subfield":{"id":"https://openalex.org/subfields/2500","display_name":"General Materials Science"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14089","display_name":"Nanotechnology research and applications","score":0.6958000063896179,"subfield":{"id":"https://openalex.org/subfields/2500","display_name":"General Materials Science"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12224","display_name":"Nanofabrication and Lithography Techniques","score":0.07649999856948853,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.024800000712275505,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/nanoengineering","display_name":"nanoengineering","score":0.859000027179718},{"id":"https://openalex.org/keywords/nanoscale","display_name":"nanoscale","score":0.49399998784065247},{"id":"https://openalex.org/keywords/top-down-fabrication","display_name":"top-down fabrication","score":0.6650000214576721},{"id":"https://openalex.org/keywords/bottom-up-fabrication","display_name":"bottom-up fabrication","score":0.9829999804496765},{"id":"https://openalex.org/keywords/nanofabrication","display_name":"nanofabrication","score":0.5820000171661377}],"concepts":[{"id":"https://openalex.org/C2778755073","wikidata":"https://www.wikidata.org/wiki/Q10858537","display_name":"Scale (ratio)","level":2,"score":0.5031856894493103},{"id":"https://openalex.org/C2780357685","wikidata":"https://www.wikidata.org/wiki/Q154357","display_name":"Nano-","level":2,"score":0.4501965045928955},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.3663315773010254},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3549017310142517},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3376156687736511},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.30847132205963135},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.14230450987815857},{"id":"https://openalex.org/C58640448","wikidata":"https://www.wikidata.org/wiki/Q42515","display_name":"Cartography","level":1,"score":0.09568363428115845},{"id":"https://openalex.org/C42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","level":1,"score":0.08164438605308533}],"mesh":[],"locations_count":3,"locations":[{"id":"pmh:oai:ris.utwente.nl:openaire_cris_publications/ec1a647e-8914-4f31-a1a0-7dccb18cfb31","doi":null,"is_oa":false,"landing_page_url":"https://research.utwente.nl/en/publications/ec1a647e-8914-4f31-a1a0-7dccb18cfb31","pdf_url":null,"source":{"id":"https://openalex.org/S4406922991","display_name":"University of Twente Research Information","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Kim, G M, Kim, B J, Holleman, J, Huskens, J, ten Have, E S, Kovalgin, A Y, Liebau, M, Reinhoudt, D, van Hulst, N F & Brugger, J 2002, 'Top-down meets bottom-up : nano-engineering for link between nm-and mu-scale', pp. 71-78.","raw_type":"info:eu-repo/semantics/conferenceObject"},{"id":"pmh:ut:oai:ris.utwente.nl:publications/ec1a647e-8914-4f31-a1a0-7dccb18cfb31","doi":null,"is_oa":false,"landing_page_url":"https://research.utwente.nl/en/publications/ec1a647e-8914-4f31-a1a0-7dccb18cfb31","pdf_url":null,"source":{"id":"https://openalex.org/S4406922991","display_name":"University of Twente Research Information","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"STARTPAGE=71;ENDPAGE=78;TITLE=None","raw_type":"info:eu-repo/semantics/conferencepaper"},{"id":"mag:3135598951","doi":null,"is_oa":false,"landing_page_url":"https://research.utwente.nl/en/publications/top-down-meets-bottom-up-nano-engineering-for-link-between-nm-and","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W7015454635","https://openalex.org/W6987738805","https://openalex.org/W7058272584","https://openalex.org/W2573860254","https://openalex.org/W1603524461","https://openalex.org/W7038718219","https://openalex.org/W6991868832","https://openalex.org/W2976951352","https://openalex.org/W7027240153","https://openalex.org/W146946972"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-10-12T09:40:04.860316","created_date":"2021-03-15T00:00:00"}