{"id":"https://openalex.org/W3132556083","doi":"https://doi.org/10.1007/978-3-030-62684-6_7","title":"An Overview of Interdigitated Microwave Resonance Sensors for Liquid Samples Permittivity Detection","display_name":"An Overview of Interdigitated Microwave Resonance Sensors for Liquid Samples Permittivity Detection","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3132556083","doi":"https://doi.org/10.1007/978-3-030-62684-6_7","mag":"3132556083"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-030-62684-6_7","doi":"https://doi.org/10.1007/978-3-030-62684-6_7","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-030-62684-6_7","pdf_url":null,"source":{"id":"https://openalex.org/S4210200033","display_name":"Smart sensors, measurement and instrumentation","issn_l":"2194-8402","issn":["2194-8402","2194-8410"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Smart Sensors, Measurement and Instrumentation","raw_type":"book-chapter"},"volume":{"id":"https://openalex.org/W4238043038","display_name":"Interdigital Sensors"},"type":"book-chapter","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5016540651","display_name":"Sina Kiani","orcid":"https://orcid.org/0000-0001-7978-6621","observed_orcids":["https://orcid.org/0000-0001-7978-6621"]},"institutions":[{"id":"https://openalex.org/I928334797","display_name":"Semnan University","ror":"https://ror.org/029gksw03","country_code":"IR","type":"education","lineage":["https://openalex.org/I928334797"]}],"countries":["IR"],"is_corresponding":true,"raw_author_name":"S. Kiani","raw_affiliation_strings":["Faculty of Electrical and Computer Engineering, Semnan University, Semnan, Iran"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Electrical and Computer Engineering, Semnan University, Semnan, Iran","institution_ids":["https://openalex.org/I928334797"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089076289","display_name":"Pejman Rezaei","orcid":"https://orcid.org/0000-0002-1266-3229","observed_orcids":["https://orcid.org/0000-0002-1266-3229"]},"institutions":[{"id":"https://openalex.org/I928334797","display_name":"Semnan University","ror":"https://ror.org/029gksw03","country_code":"IR","type":"education","lineage":["https://openalex.org/I928334797"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"P. Rezaei","raw_affiliation_strings":["Faculty of Electrical and Computer Engineering, Semnan University, Semnan, Iran"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Electrical and Computer Engineering, Semnan University, Semnan, Iran","institution_ids":["https://openalex.org/I928334797"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5072402458","display_name":"Mina Fakhr","orcid":"https://orcid.org/0000-0003-3741-1498","observed_orcids":["https://orcid.org/0000-0003-3741-1498"]},"institutions":[{"id":"https://openalex.org/I928334797","display_name":"Semnan University","ror":"https://ror.org/029gksw03","country_code":"IR","type":"education","lineage":["https://openalex.org/I928334797"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"M. Fakhr","raw_affiliation_strings":["Faculty of Electrical and Computer Engineering, Semnan University, Semnan, Iran"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Electrical and Computer Engineering, Semnan University, Semnan, Iran","institution_ids":["https://openalex.org/I928334797"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5016540651"],"corresponding_institution_ids":["https://openalex.org/I928334797"],"apc_list":null,"apc_paid":null,"fwci":13.9449,"has_fulltext":false,"cited_by_count":20,"citation_normalized_percentile":{"value":0.9940036,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":93,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"153","last_page":"197"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12270","display_name":"Microwave-Assisted Synthesis and Applications","score":0.0,"subfield":{"id":"https://openalex.org/subfields/1605","display_name":"Organic Chemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dielectric-permittivity-measurement","display_name":"dielectric permittivity measurement","score":0.7039999961853027},{"id":"https://openalex.org/keywords/planar-resonators","display_name":"planar resonators","score":0.7450000047683716},{"id":"https://openalex.org/keywords/electrically-small-resonators","display_name":"electrically small resonators","score":0.8050000071525574},{"id":"https://openalex.org/keywords/dielectric-loss","display_name":"dielectric loss","score":0.5839999914169312},{"id":"https://openalex.org/keywords/microfluidic-sensor","display_name":"microfluidic sensor","score":0.9269999861717224},{"id":"https://openalex.org/keywords/industrial-process-monitoring","display_name":"industrial process monitoring","score":0.8100000023841858}],"concepts":[{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.7428578734397888},{"id":"https://openalex.org/C44838205","wikidata":"https://www.wikidata.org/wiki/Q127995","display_name":"Microwave","level":2,"score":0.7324067950248718},{"id":"https://openalex.org/C134786449","wikidata":"https://www.wikidata.org/wiki/Q3391255","display_name":"Planar","level":2,"score":0.7288082242012024},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7026185393333435},{"id":"https://openalex.org/C168651791","wikidata":"https://www.wikidata.org/wiki/Q211569","display_name":"Permittivity","level":3,"score":0.6995154619216919},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.6976012587547302},{"id":"https://openalex.org/C97126364","wikidata":"https://www.wikidata.org/wiki/Q349669","display_name":"Resonator","level":2,"score":0.6610569357872009},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5309590697288513},{"id":"https://openalex.org/C8673954","wikidata":"https://www.wikidata.org/wiki/Q138845","display_name":"Microfluidics","level":2,"score":0.48236721754074097},{"id":"https://openalex.org/C139210041","wikidata":"https://www.wikidata.org/wiki/Q2145840","display_name":"Resonance (particle physics)","level":2,"score":0.44652843475341797},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.43129271268844604},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.39697688817977905},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.3058147728443146},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.11273089051246643},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1035933792591095},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.06393218040466309},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.059290289878845215},{"id":"https://openalex.org/C109214941","wikidata":"https://www.wikidata.org/wiki/Q18334","display_name":"Particle physics","level":1,"score":0.0},{"id":"https://openalex.org/C121684516","wikidata":"https://www.wikidata.org/wiki/Q7600677","display_name":"Computer graphics (images)","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-030-62684-6_7","doi":"https://doi.org/10.1007/978-3-030-62684-6_7","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-030-62684-6_7","pdf_url":null,"source":{"id":"https://openalex.org/S4210200033","display_name":"Smart sensors, measurement and instrumentation","issn_l":"2194-8402","issn":["2194-8402","2194-8410"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Smart Sensors, Measurement and Instrumentation","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":70,"referenced_works":["https://openalex.org/W1977229577","https://openalex.org/W2005296435","https://openalex.org/W2028742086","https://openalex.org/W2038662321","https://openalex.org/W2050429880","https://openalex.org/W2078938639","https://openalex.org/W2085701031","https://openalex.org/W2097618543","https://openalex.org/W2099507006","https://openalex.org/W2107599280","https://openalex.org/W2140365037","https://openalex.org/W2157195367","https://openalex.org/W2300909924","https://openalex.org/W2323935702","https://openalex.org/W2345135975","https://openalex.org/W2513075044","https://openalex.org/W2522919358","https://openalex.org/W2543096292","https://openalex.org/W2562110770","https://openalex.org/W2563388735","https://openalex.org/W2565523550","https://openalex.org/W2602507424","https://openalex.org/W2607489812","https://openalex.org/W2616249061","https://openalex.org/W2739785959","https://openalex.org/W2742873232","https://openalex.org/W2746135190","https://openalex.org/W2751632613","https://openalex.org/W2752911626","https://openalex.org/W2756353886","https://openalex.org/W2757862686","https://openalex.org/W2768681626","https://openalex.org/W2779567389","https://openalex.org/W2786021999","https://openalex.org/W2788492325","https://openalex.org/W2791401334","https://openalex.org/W2791723920","https://openalex.org/W2792491785","https://openalex.org/W2803213393","https://openalex.org/W2809182693","https://openalex.org/W2884621615","https://openalex.org/W2885391321","https://openalex.org/W2885411295","https://openalex.org/W2887127220","https://openalex.org/W2889679641","https://openalex.org/W2891048357","https://openalex.org/W2891262528","https://openalex.org/W2892671372","https://openalex.org/W2894707677","https://openalex.org/W2895014741","https://openalex.org/W2895018648","https://openalex.org/W2900302013","https://openalex.org/W2900755450","https://openalex.org/W2906593357","https://openalex.org/W2914624221","https://openalex.org/W2921128827","https://openalex.org/W2922477337","https://openalex.org/W2928195733","https://openalex.org/W2932927300","https://openalex.org/W2942088738","https://openalex.org/W2968679804","https://openalex.org/W2971019436","https://openalex.org/W2972582741","https://openalex.org/W2985230291","https://openalex.org/W3003878362","https://openalex.org/W3004759265","https://openalex.org/W3014560949","https://openalex.org/W3015880608","https://openalex.org/W3035009775","https://openalex.org/W3097265871"],"related_works":["https://openalex.org/W3016336783","https://openalex.org/W2621337230","https://openalex.org/W4310449188","https://openalex.org/W4283752354","https://openalex.org/W4388095423","https://openalex.org/W4413886773","https://openalex.org/W2942088738","https://openalex.org/W4400916130","https://openalex.org/W4405232390","https://openalex.org/W3088720743"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":6},{"year":2022,"cited_by_count":9}],"updated_date":"2026-10-16T09:59:22.235173","created_date":"2021-03-01T00:00:00"}