{"id":"https://openalex.org/W3127066288","doi":"https://doi.org/10.1109/icm50269.2020.9331777","title":"Parameter Identification of Flexible Supercapacitors with Fractional Cuckoo Search","display_name":"Parameter Identification of Flexible Supercapacitors with Fractional Cuckoo Search","publication_year":2020,"publication_date":"2020-12-14","ids":{"openalex":"https://openalex.org/W3127066288","doi":"https://doi.org/10.1109/icm50269.2020.9331777","mag":"3127066288"},"language":"en","primary_location":{"id":"doi:10.1109/icm50269.2020.9331777","doi":"https://doi.org/10.1109/icm50269.2020.9331777","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icm50269.2020.9331777","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 32nd International Conference on Microelectronics (ICM)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5013460054","display_name":"Amr M. AbdelAty","orcid":"https://orcid.org/0000-0001-8095-7627","observed_orcids":["https://orcid.org/0000-0001-8095-7627"]},"institutions":[{"id":"https://openalex.org/I66513531","display_name":"Fayoum University","ror":"https://ror.org/023gzwx10","country_code":"EG","type":"education","lineage":["https://openalex.org/I66513531"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"A.M. AbdelAty","raw_affiliation_strings":["Engineering Mathematics and Physics Dept., Faculty of Engineering, Fayoum University, Egypt"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Engineering Mathematics and Physics Dept., Faculty of Engineering, Fayoum University, Egypt","institution_ids":["https://openalex.org/I66513531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084829415","display_name":"Mohammed E. Fouda","orcid":"https://orcid.org/0000-0001-7139-3428","observed_orcids":["https://orcid.org/0000-0001-7139-3428"]},"institutions":[{"id":"https://openalex.org/I145487455","display_name":"Cairo University","ror":"https://ror.org/03q21mh05","country_code":"EG","type":"education","lineage":["https://openalex.org/I145487455"]},{"id":"https://openalex.org/I204250578","display_name":"University of California, Irvine","ror":"https://ror.org/04gyf1771","country_code":"US","type":"education","lineage":["https://openalex.org/I204250578"]}],"countries":["EG","US"],"is_corresponding":false,"raw_author_name":"M.E. Fouda","raw_affiliation_strings":["Electrical Engineering and Computer Science Dept., University of California-Irvine, Irvine, USA","Engineering Mathematics and Physics Dept., Faculty of Engineering, Cairo University, Egypt"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical Engineering and Computer Science Dept., University of California-Irvine, Irvine, USA","institution_ids":["https://openalex.org/I204250578"]},{"raw_affiliation_string":"Engineering Mathematics and Physics Dept., Faculty of Engineering, Cairo University, Egypt","institution_ids":["https://openalex.org/I145487455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046713436","display_name":"Menna T. M. M. Elbarawy","orcid":"https://orcid.org/0000-0002-6473-894X","observed_orcids":["https://orcid.org/0000-0002-6473-894X"]},"institutions":[{"id":"https://openalex.org/I66513531","display_name":"Fayoum University","ror":"https://ror.org/023gzwx10","country_code":"EG","type":"education","lineage":["https://openalex.org/I66513531"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"M.T.M.M. Elbarawy","raw_affiliation_strings":["Engineering Mathematics and Physics Dept., Faculty of Engineering, Fayoum University, Egypt"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Engineering Mathematics and Physics Dept., Faculty of Engineering, Fayoum University, Egypt","institution_ids":["https://openalex.org/I66513531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112363621","display_name":"H. A. Attia","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I66513531","display_name":"Fayoum University","ror":"https://ror.org/023gzwx10","country_code":"EG","type":"education","lineage":["https://openalex.org/I66513531"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"H.A. Attia","raw_affiliation_strings":["Engineering Mathematics and Physics Dept., Faculty of Engineering, Fayoum University, Egypt"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Engineering Mathematics and Physics Dept., Faculty of Engineering, Fayoum University, Egypt","institution_ids":["https://openalex.org/I66513531"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5069997789","display_name":"Ahmed Gomaa Radwan","orcid":"https://orcid.org/0000-0002-6119-8482","observed_orcids":["https://orcid.org/0000-0002-6119-8482","https://orcid.org/0000-0001-6079-4138"]},"institutions":[{"id":"https://openalex.org/I145487455","display_name":"Cairo University","ror":"https://ror.org/03q21mh05","country_code":"EG","type":"education","lineage":["https://openalex.org/I145487455"]},{"id":"https://openalex.org/I57629906","display_name":"Nile University","ror":"https://ror.org/03cg7cp61","country_code":"EG","type":"education","lineage":["https://openalex.org/I57629906"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"A.G. Radwan","raw_affiliation_strings":["Engineering Mathematics and Physics Dept., Faculty of Engineering, Cairo University, Egypt","School of Engineering and Applied Sciences, Nile University, Giza, Egypt"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Engineering Mathematics and Physics Dept., Faculty of Engineering, Cairo University, Egypt","institution_ids":["https://openalex.org/I145487455"]},{"raw_affiliation_string":"School of Engineering and Applied Sciences, Nile University, Giza, Egypt","institution_ids":["https://openalex.org/I57629906"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.7684,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.86758794,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10179","display_name":"Supercapacitor Materials and Fabrication","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10179","display_name":"Supercapacitor Materials and Fabrication","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11608","display_name":"Dielectric materials and actuators","score":0.0003000000142492354,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10663","display_name":"Battery Modeling and Management","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/flexible-supercapacitors","display_name":"flexible supercapacitors","score":0.9940000176429749},{"id":"https://openalex.org/keywords/parameter-estimation","display_name":"parameter estimation","score":0.9800000190734863},{"id":"https://openalex.org/keywords/reduced-graphene-oxide","display_name":"reduced graphene oxide","score":0.7900000214576721},{"id":"https://openalex.org/keywords/equivalent-circuit-model","display_name":"equivalent circuit model","score":0.7409999966621399},{"id":"https://openalex.org/keywords/time-domain-data","display_name":"time-domain data","score":0.7409999966621399},{"id":"https://openalex.org/keywords/supercapacitor-modeling","display_name":"supercapacitor modeling","score":0.6209999918937683}],"concepts":[{"id":"https://openalex.org/C6585489","wikidata":"https://www.wikidata.org/wiki/Q754523","display_name":"Supercapacitor","level":4,"score":0.9086275696754456},{"id":"https://openalex.org/C30080830","wikidata":"https://www.wikidata.org/wiki/Q169917","display_name":"Graphene","level":2,"score":0.8750325441360474},{"id":"https://openalex.org/C117241572","wikidata":"https://www.wikidata.org/wiki/Q5192379","display_name":"Cuckoo search","level":3,"score":0.7559459209442139},{"id":"https://openalex.org/C2779851234","wikidata":"https://www.wikidata.org/wiki/Q50690","display_name":"Oxide","level":2,"score":0.5957911610603333},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5582263469696045},{"id":"https://openalex.org/C103824480","wikidata":"https://www.wikidata.org/wiki/Q185889","display_name":"Time domain","level":2,"score":0.5367416739463806},{"id":"https://openalex.org/C2776810535","wikidata":"https://www.wikidata.org/wiki/Q26381","display_name":"Cuckoo","level":2,"score":0.4250907897949219},{"id":"https://openalex.org/C2778152352","wikidata":"https://www.wikidata.org/wiki/Q5165061","display_name":"Content (measure theory)","level":2,"score":0.419597327709198},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.36469030380249023},{"id":"https://openalex.org/C186060115","wikidata":"https://www.wikidata.org/wiki/Q30336093","display_name":"Biological system","level":1,"score":0.3473198115825653},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.27730244398117065},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.2706214189529419},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.22761014103889465},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.20132973790168762},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.16735175251960754},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.16404590010643005},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.08294016122817993},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.060084909200668335},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C90856448","wikidata":"https://www.wikidata.org/wiki/Q431","display_name":"Zoology","level":1,"score":0.0},{"id":"https://openalex.org/C85617194","wikidata":"https://www.wikidata.org/wiki/Q2072794","display_name":"Particle swarm optimization","level":2,"score":0.0},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icm50269.2020.9331777","doi":"https://doi.org/10.1109/icm50269.2020.9331777","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icm50269.2020.9331777","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 32nd International Conference on Microelectronics (ICM)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W2003890325","https://openalex.org/W2134937546","https://openalex.org/W2259227674","https://openalex.org/W2285624864","https://openalex.org/W2433963379","https://openalex.org/W2613444522","https://openalex.org/W2888195640","https://openalex.org/W2929114446","https://openalex.org/W2954860292","https://openalex.org/W3006609207","https://openalex.org/W3017957321","https://openalex.org/W3039025594"],"related_works":["https://openalex.org/W1988747363","https://openalex.org/W3008934672","https://openalex.org/W3110482093","https://openalex.org/W2944968067","https://openalex.org/W1990427148","https://openalex.org/W3033743287","https://openalex.org/W2759261707","https://openalex.org/W2884515978","https://openalex.org/W4323022383","https://openalex.org/W2105218484"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"we":[3],"identify":[4],"the":[5,46,64],"model":[6,77],"parameters":[7,47,60],"of":[8,27,48,66],"flexible":[9,31],"supercapacitors":[10],"from":[11],"time-domain":[12,19,42],"data":[13,20],"using":[14],"fractional":[15],"cuckoo":[16],"search.":[17],"The":[18,58],"are":[21,44,61],"five":[22],"galvanostatic":[23],"charging/discharging":[24],"(GCD)":[25],"curves":[26,43],"reduced":[28],"graphene":[29,36],"oxide-based":[30],"supercapacitor":[32,51],"at":[33],"different":[34],"exfoliated-graphene-mediated":[35],"oxide":[37],"(EGM-rGO)":[38],"relative":[39,68,83],"content.":[40,84],"These":[41],"used":[45],"three":[49],"well-known":[50],"models:":[52],"Rs-CPE,":[53],"Rp-Rs-CPE,":[54],"and":[55,63],"Rs-":[56],"C-CPE.":[57],"extracted":[59],"summarized,":[62],"effect":[65],"EGM-rGO":[67,82],"content":[69],"is":[70,78],"discussed.":[71],"Based":[72],"on":[73],"these":[74],"discussions,":[75],"one":[76],"recommended":[79],"for":[80],"each":[81]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":2}],"updated_date":"2026-11-10T11:39:43.021295","created_date":"2021-02-15T00:00:00"}