{"id":"https://openalex.org/W3108885136","doi":"https://doi.org/10.1007/s42341-020-00256-2","title":"Analysis of Surface Potential and Electric Field for Fully Depleted Graded Channel Dual-Material-Double-Gate MOSFET through Modeling and Simulation","display_name":"Analysis of Surface Potential and Electric Field for Fully Depleted Graded Channel Dual-Material-Double-Gate MOSFET through Modeling and Simulation","publication_year":2020,"publication_date":"2020-11-24","ids":{"openalex":"https://openalex.org/W3108885136","doi":"https://doi.org/10.1007/s42341-020-00256-2","mag":"3108885136"},"language":"en","primary_location":{"id":"doi:10.1007/s42341-020-00256-2","doi":"https://doi.org/10.1007/s42341-020-00256-2","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s42341-020-00256-2","pdf_url":null,"source":{"id":"https://openalex.org/S35423755","display_name":"Transactions on Electrical and Electronic Materials","issn_l":"1229-7607","issn":["1229-7607","2092-7592"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","kci-registered","norway-1","poland-20","russia-white-list-2"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Transactions on Electrical and Electronic Materials","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5009715337","display_name":"Himeli Chakrabarti","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I195459967","display_name":"Mizoram University","ror":"https://ror.org/04b1m3e94","country_code":"IN","type":"education","lineage":["https://openalex.org/I195459967"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Himeli Chakrabarti","raw_affiliation_strings":["Department of Electronics & Communication Engineering, Mizoram University (A Central University), Aizawl, 796004, India","Department of Electronics and Communication Engineering, Regent Education and Research Foundation, Kolkata, 700121, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics & Communication Engineering, Mizoram University (A Central University), Aizawl, 796004, India","institution_ids":["https://openalex.org/I195459967"]},{"raw_affiliation_string":"Department of Electronics and Communication Engineering, Regent Education and Research Foundation, Kolkata, 700121, India","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089395601","display_name":"Reshmi Maity","orcid":"https://orcid.org/0000-0002-1254-3075","observed_orcids":["https://orcid.org/0000-0002-1254-3075"]},"institutions":[{"id":"https://openalex.org/I195459967","display_name":"Mizoram University","ror":"https://ror.org/04b1m3e94","country_code":"IN","type":"education","lineage":["https://openalex.org/I195459967"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Reshmi Maity","raw_affiliation_strings":["Department of Electronics & Communication Engineering, Mizoram University (A Central University), Aizawl, 796004, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics & Communication Engineering, Mizoram University (A Central University), Aizawl, 796004, India","institution_ids":["https://openalex.org/I195459967"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078411139","display_name":"Tijana Kevki\u0107","orcid":"https://orcid.org/0000-0002-0738-6685","observed_orcids":["https://orcid.org/0000-0002-0738-6685"]},"institutions":[{"id":"https://openalex.org/I4387155013","display_name":"University of Pri\u0161tina - Kosovska Mitrovica","ror":"https://ror.org/050p80d78","country_code":"XK","type":"education","lineage":["https://openalex.org/I4387155013"]}],"countries":["XK"],"is_corresponding":false,"raw_author_name":"Tijana Kevki\u0107","raw_affiliation_strings":["Department of Physics, University of Kosovska Mitrovica, Kosovska Mitrovica, Serbia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics, University of Kosovska Mitrovica, Kosovska Mitrovica, Serbia","institution_ids":["https://openalex.org/I4387155013"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016601923","display_name":"Vladica S. Stojanovi\u0107","orcid":"https://orcid.org/0000-0002-3819-4387","observed_orcids":["https://orcid.org/0000-0002-3819-4387"]},"institutions":[{"id":"https://openalex.org/I4387155013","display_name":"University of Pri\u0161tina - Kosovska Mitrovica","ror":"https://ror.org/050p80d78","country_code":"XK","type":"education","lineage":["https://openalex.org/I4387155013"]}],"countries":["XK"],"is_corresponding":false,"raw_author_name":"Vladica Stojanovi\u0107","raw_affiliation_strings":["Department of Mathematics, University of Kosovska Mitrovica, Kosovska Mitrovica, Serbia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mathematics, University of Kosovska Mitrovica, Kosovska Mitrovica, Serbia","institution_ids":["https://openalex.org/I4387155013"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5082695608","display_name":"N. P. Maity","orcid":"https://orcid.org/0000-0002-1256-5856","observed_orcids":["https://orcid.org/0000-0002-1256-5856"]},"institutions":[{"id":"https://openalex.org/I195459967","display_name":"Mizoram University","ror":"https://ror.org/04b1m3e94","country_code":"IN","type":"education","lineage":["https://openalex.org/I195459967"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"N. P. Maity","raw_affiliation_strings":["Department of Electronics & Communication Engineering, Mizoram University (A Central University), Aizawl, 796004, India"],"raw_orcid":"https://orcid.org/0000-0002-1256-5856","affiliations":[{"raw_affiliation_string":"Department of Electronics & Communication Engineering, Mizoram University (A Central University), Aizawl, 796004, India","institution_ids":["https://openalex.org/I195459967"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5082695608"],"corresponding_institution_ids":["https://openalex.org/I195459967"],"apc_list":{"value":1990,"currency":"USD","value_usd":1990},"apc_paid":null,"fwci":0.6884,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.64642354,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":87,"max":98},"biblio":{"volume":"22","issue":"4","first_page":"489","last_page":"501"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9901999831199646,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9901999831199646,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.008200000040233135,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/surface-potential","display_name":"surface potential","score":0.652999997138977},{"id":"https://openalex.org/keywords/electric-field-distribution","display_name":"electric field distribution","score":0.8650000095367432},{"id":"https://openalex.org/keywords/short-channel-effects","display_name":"short-channel effects","score":0.9490000009536743},{"id":"https://openalex.org/keywords/drain-induced-barrier-lowering","display_name":"drain-induced barrier lowering","score":0.8140000104904175},{"id":"https://openalex.org/keywords/hot-carrier-effects","display_name":"hot carrier effects","score":0.8050000071525574},{"id":"https://openalex.org/keywords/interface-charge","display_name":"interface charge","score":0.7829999923706055},{"id":"https://openalex.org/keywords/temperature-effects","display_name":"temperature effects","score":0.7710000276565552},{"id":"https://openalex.org/keywords/silicon-on-insulator","display_name":"silicon-on-insulator","score":0.8989999890327454},{"id":"https://openalex.org/keywords/two-dimensional-device-simulation","display_name":"two-dimensional device simulation","score":0.6660000085830688}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8196821212768555},{"id":"https://openalex.org/C60799052","wikidata":"https://www.wikidata.org/wiki/Q46221","display_name":"Electric field","level":2,"score":0.7001935839653015},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.6809654235839844},{"id":"https://openalex.org/C53143962","wikidata":"https://www.wikidata.org/wiki/Q1478788","display_name":"Silicon on insulator","level":3,"score":0.5703219771385193},{"id":"https://openalex.org/C73118932","wikidata":"https://www.wikidata.org/wiki/Q5305541","display_name":"Drain-induced barrier lowering","level":5,"score":0.5317182540893555},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5112075805664062},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.5106585621833801},{"id":"https://openalex.org/C171291426","wikidata":"https://www.wikidata.org/wiki/Q5072499","display_name":"Channel length modulation","level":5,"score":0.4705493748188019},{"id":"https://openalex.org/C145598152","wikidata":"https://www.wikidata.org/wiki/Q176097","display_name":"Field-effect transistor","level":4,"score":0.4594039022922516},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.4428623914718628},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.4389199912548065},{"id":"https://openalex.org/C58570533","wikidata":"https://www.wikidata.org/wiki/Q55451","display_name":"Electric potential","level":3,"score":0.4307105839252472},{"id":"https://openalex.org/C2780358262","wikidata":"https://www.wikidata.org/wiki/Q1540423","display_name":"Surface charge","level":2,"score":0.42652827501296997},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.2935348153114319},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2027009129524231},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1964116394519806},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.13345909118652344},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10240224003791809},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.07005491852760315},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s42341-020-00256-2","doi":"https://doi.org/10.1007/s42341-020-00256-2","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s42341-020-00256-2","pdf_url":null,"source":{"id":"https://openalex.org/S35423755","display_name":"Transactions on Electrical and Electronic Materials","issn_l":"1229-7607","issn":["1229-7607","2092-7592"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","kci-registered","norway-1","poland-20","russia-white-list-2"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Transactions on Electrical and Electronic Materials","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":34,"referenced_works":["https://openalex.org/W1659914018","https://openalex.org/W1970440025","https://openalex.org/W1992926203","https://openalex.org/W1992981913","https://openalex.org/W2004835443","https://openalex.org/W2007832534","https://openalex.org/W2014311523","https://openalex.org/W2020472674","https://openalex.org/W2025516544","https://openalex.org/W2046631890","https://openalex.org/W2055282314","https://openalex.org/W2090904958","https://openalex.org/W2096227378","https://openalex.org/W2108519226","https://openalex.org/W2108776537","https://openalex.org/W2112013721","https://openalex.org/W2121996242","https://openalex.org/W2126810113","https://openalex.org/W2134775505","https://openalex.org/W2135232328","https://openalex.org/W2142148560","https://openalex.org/W2143156378","https://openalex.org/W2156057417","https://openalex.org/W2170208081","https://openalex.org/W2291358460","https://openalex.org/W2315663305","https://openalex.org/W2342668896","https://openalex.org/W2394886833","https://openalex.org/W2728265602","https://openalex.org/W2779034390","https://openalex.org/W2883856988","https://openalex.org/W2903133467","https://openalex.org/W2907703940","https://openalex.org/W2922309590"],"related_works":["https://openalex.org/W2922309590","https://openalex.org/W1155936829","https://openalex.org/W2105729875","https://openalex.org/W2799765558","https://openalex.org/W2546153998","https://openalex.org/W2134775505","https://openalex.org/W2140447226","https://openalex.org/W2050289747","https://openalex.org/W2108776537","https://openalex.org/W3186764364"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":1}],"updated_date":"2026-10-27T15:51:10.671819","created_date":"2020-12-07T00:00:00"}