{"id":"https://openalex.org/W3106562365","doi":"https://doi.org/10.1109/icsmd50554.2020.9261655","title":"Theoretical Calculation of Photoemission Yield Spectrum of Space Metal Materials","display_name":"Theoretical Calculation of Photoemission Yield Spectrum of Space Metal Materials","publication_year":2020,"publication_date":"2020-10-15","ids":{"openalex":"https://openalex.org/W3106562365","doi":"https://doi.org/10.1109/icsmd50554.2020.9261655","mag":"3106562365"},"language":"en","primary_location":{"id":"doi:10.1109/icsmd50554.2020.9261655","doi":"https://doi.org/10.1109/icsmd50554.2020.9261655","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsmd50554.2020.9261655","pdf_url":null,"source":{"id":"https://openalex.org/S4306498722","display_name":"International Conference on Sensing, Measurement & Data Analytics in the era of Artificial Intelligence (ICSMD)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 International Conference on Sensing, Measurement & Data Analytics in the era of Artificial Intelligence (ICSMD)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101814200","display_name":"Changxi Li","orcid":"https://orcid.org/0000-0003-2040-4021","observed_orcids":["https://orcid.org/0000-0003-2040-4021"]},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Changxi Li","raw_affiliation_strings":["School of Electrical Engineering, Xi \u2019an Jiaotong University, Xi\u2019an, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Xi \u2019an Jiaotong University, Xi\u2019an, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100401985","display_name":"Yu Chen","orcid":"https://orcid.org/0000-0001-9928-6130","observed_orcids":["https://orcid.org/0000-0001-9928-6130","https://orcid.org/0009-0000-0834-2310","https://orcid.org/0009-0008-3782-4384"]},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yu Chen","raw_affiliation_strings":["School of Electrical Engineering, Xi \u2019an Jiaotong University, Xi\u2019an, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Xi \u2019an Jiaotong University, Xi\u2019an, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100636738","display_name":"Yan Yang","orcid":"https://orcid.org/0000-0002-9858-1426","observed_orcids":["https://orcid.org/0000-0002-9858-1426"]},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yan Yang","raw_affiliation_strings":["School of Electrical Engineering, Xi \u2019an Jiaotong University, Xi\u2019an, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Xi \u2019an Jiaotong University, Xi\u2019an, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065622323","display_name":"Zecai Chen","orcid":"https://orcid.org/0000-0002-8726-5153","observed_orcids":["https://orcid.org/0000-0002-8726-5153"]},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zecai Chen","raw_affiliation_strings":["School of Electrical Engineering, Xi \u2019an Jiaotong University, Xi\u2019an, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Xi \u2019an Jiaotong University, Xi\u2019an, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087579143","display_name":"Hanzhi Li","orcid":"https://orcid.org/0000-0001-9042-4349","observed_orcids":["https://orcid.org/0000-0001-9042-4349"]},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hanzhi Li","raw_affiliation_strings":["School of Electrical Engineering, Xi \u2019an Jiaotong University, Xi\u2019an, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Xi \u2019an Jiaotong University, Xi\u2019an, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100375611","display_name":"Shuang Wang","orcid":"https://orcid.org/0000-0003-3391-7651","observed_orcids":["https://orcid.org/0000-0003-3391-7651"]},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shuang Wang","raw_affiliation_strings":["School of Electrical Engineering, Xi \u2019an Jiaotong University, Xi\u2019an, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Xi \u2019an Jiaotong University, Xi\u2019an, China","institution_ids":["https://openalex.org/I87445476"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I87445476"],"apc_list":null,"apc_paid":null,"fwci":1.1708,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.68391867,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":87,"max":93},"biblio":{"volume":"64","issue":null,"first_page":"156","last_page":"159"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.6470000147819519,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.6470000147819519,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13418","display_name":"Photocathodes and Microchannel Plates","score":0.336899995803833,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11175","display_name":"Gyrotron and Vacuum Electronics Research","score":0.004000000189989805,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/free-electron-model","display_name":"free electron model","score":0.8999999761581421},{"id":"https://openalex.org/keywords/quantum-efficiency","display_name":"quantum efficiency","score":0.6840000152587891},{"id":"https://openalex.org/keywords/copper","display_name":"copper","score":0.7689999938011169},{"id":"https://openalex.org/keywords/gold","display_name":"gold","score":0.9959999918937683},{"id":"https://openalex.org/keywords/external-electric-field","display_name":"external electric field","score":0.8709999918937683},{"id":"https://openalex.org/keywords/vacuum-ultraviolet","display_name":"vacuum ultraviolet","score":0.48100000619888306}],"concepts":[{"id":"https://openalex.org/C134121241","wikidata":"https://www.wikidata.org/wiki/Q899301","display_name":"Yield (engineering)","level":2,"score":0.6269551515579224},{"id":"https://openalex.org/C2776798109","wikidata":"https://www.wikidata.org/wiki/Q11391","display_name":"Ultraviolet","level":2,"score":0.5840476155281067},{"id":"https://openalex.org/C544778455","wikidata":"https://www.wikidata.org/wiki/Q753","display_name":"Copper","level":2,"score":0.5749514102935791},{"id":"https://openalex.org/C171001562","wikidata":"https://www.wikidata.org/wiki/Q2856048","display_name":"Quantum yield","level":3,"score":0.5315985679626465},{"id":"https://openalex.org/C60799052","wikidata":"https://www.wikidata.org/wiki/Q46221","display_name":"Electric field","level":2,"score":0.5048449635505676},{"id":"https://openalex.org/C544153396","wikidata":"https://www.wikidata.org/wiki/Q11426","display_name":"Metal","level":2,"score":0.46556854248046875},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.45417970418930054},{"id":"https://openalex.org/C51286037","wikidata":"https://www.wikidata.org/wiki/Q1139350","display_name":"Photoemission spectroscopy","level":3,"score":0.41604113578796387},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3687794804573059},{"id":"https://openalex.org/C184779094","wikidata":"https://www.wikidata.org/wiki/Q26383","display_name":"Atomic physics","level":1,"score":0.36015671491622925},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.36013275384902954},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.34410372376441956},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.21240025758743286},{"id":"https://openalex.org/C4839761","wikidata":"https://www.wikidata.org/wiki/Q212111","display_name":"Spectral line","level":2,"score":0.2073628008365631},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.17317447066307068},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.09812915325164795},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.084225594997406},{"id":"https://openalex.org/C91881484","wikidata":"https://www.wikidata.org/wiki/Q191807","display_name":"Fluorescence","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icsmd50554.2020.9261655","doi":"https://doi.org/10.1109/icsmd50554.2020.9261655","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsmd50554.2020.9261655","pdf_url":null,"source":{"id":"https://openalex.org/S4306498722","display_name":"International Conference on Sensing, Measurement & Data Analytics in the era of Artificial Intelligence (ICSMD)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 International Conference on Sensing, Measurement & Data Analytics in the era of Artificial Intelligence (ICSMD)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1967980347","https://openalex.org/W2011942938","https://openalex.org/W2028422407","https://openalex.org/W2032214331","https://openalex.org/W2048192167","https://openalex.org/W2048531892","https://openalex.org/W2074808950","https://openalex.org/W2083926174","https://openalex.org/W2095090488","https://openalex.org/W2260720532","https://openalex.org/W3023905230","https://openalex.org/W4251625568","https://openalex.org/W6662865326"],"related_works":["https://openalex.org/W4394829831","https://openalex.org/W6987429869","https://openalex.org/W3190835279","https://openalex.org/W2095330603","https://openalex.org/W1594278415","https://openalex.org/W2076655582","https://openalex.org/W2052402700","https://openalex.org/W4324118509","https://openalex.org/W2139373814","https://openalex.org/W280155411"],"abstract_inverted_index":{"In":[0],"the":[1,5,13,27,38,46,63,73,77,92,111,118,121,129,132,134,137,144,148,153,156,158,161],"theoretical":[2],"calculation":[3],"of":[4,9,23,40,65,68,94,113,120,136,160],"photoemission":[6,24,41],"yield":[7,42,140,164],"spectrum":[8,43],"space":[10],"metal":[11,28],"materials,":[12],"mathematical":[14],"model":[15],"is":[16,57,126],"found":[17],"based":[18],"upon":[19],"three":[20],"steps":[21],"process":[22],"combined":[25],"with":[26,49,110,152],"free-electron":[29],"gas":[30],"model.":[31],"We":[32],"take":[33],"Cu":[34,69],"as":[35],"an":[36],"example,":[37],"variation":[39],"caused":[44],"by":[45,147],"electric":[47,123],"field":[48,51],"different":[50,54],"strength":[52],"and":[53,70,102,104],"incidence":[55],"angle":[56,145],"calculated.":[58],"This":[59],"paper":[60],"shows":[61],"that":[62],"regions":[64,93],"quantum":[66,107],"efficiency":[67,108],"Au":[71],"when":[72],"materials":[74],"are":[75,82,98],"in":[76],"vacuum,":[78],"under":[79],"certain":[80],"conditions,":[81],"respectively":[83,99],"calculated":[84,138,162],"between":[85,100],"8\u00d710-8and":[86],"2.6\u00d710-3,":[87],"8.53\u00d710-6and":[88],"3.8\u00d710-3,":[89],"corresponding":[90],"to":[91,128],"incident":[95,114,149],"ultraviolet":[96,150],"wavelength":[97],"138nm":[101],"287nm,108nm":[103],"249nm.":[105],"Its":[106],"decreases":[109],"increase":[112],"wavelength.":[115],"The":[116,142],"greater":[117,133,143],"intensity":[119],"applied":[122],"field,":[124],"which":[125],"perpendicular":[127],"copper":[130,139,154,163],"surface,":[131,155],"value":[135,159],"spectrum.":[141,165],"formed":[146],"light":[151],"smaller":[157]},"counts_by_year":[{"year":2021,"cited_by_count":1}],"updated_date":"2026-10-30T12:39:25.321706","created_date":"2020-12-07T00:00:00"}